KR0148420B1 - Piezoelectric device using thin metal film - Google Patents

Piezoelectric device using thin metal film

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Publication number
KR0148420B1
KR0148420B1 KR1019940022872A KR19940022872A KR0148420B1 KR 0148420 B1 KR0148420 B1 KR 0148420B1 KR 1019940022872 A KR1019940022872 A KR 1019940022872A KR 19940022872 A KR19940022872 A KR 19940022872A KR 0148420 B1 KR0148420 B1 KR 0148420B1
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South Korea
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piezoelectric
film
piezoelectric film
metal
effect
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KR1019940022872A
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Korean (ko)
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KR960012587A (en
Inventor
이성재
박경완
신민철
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양승택
한국전자통신연구원
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Priority to KR1019940022872A priority Critical patent/KR0148420B1/en
Priority to JP6297194A priority patent/JP2660166B2/en
Publication of KR960012587A publication Critical patent/KR960012587A/en
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Publication of KR0148420B1 publication Critical patent/KR0148420B1/en

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    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10NELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N30/00Piezoelectric or electrostrictive devices
    • H10N30/20Piezoelectric or electrostrictive devices with electrical input and mechanical output, e.g. functioning as actuators or vibrators
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10NELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N30/00Piezoelectric or electrostrictive devices
    • H10N30/30Piezoelectric or electrostrictive devices with mechanical input and electrical output, e.g. functioning as generators or sensors

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  • Thin Film Transistor (AREA)

Abstract

본 발명은 압전 효과(piezo-electric effect)를 이용한 트랜지스터에 관한 것으로서, 특히 금속초박막으로 구성된 압전소자에 관한 것이다.BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a transistor using a piezo-electric effect, and more particularly to a piezoelectric element composed of an ultrathin metal film.

본 발명의 압전소자는 소정 전압에 의해 소정의 역학적인 힘을 발생시킬 수 있는 압전막과, 상기 압전막의 역학적인 힘에 의해 전기저항이 변화되어 전자의 흐름을 제어할 수 있도록 상기 압전막 하부에 형성된 금속초박막으로 이루어진 전자 통로와, 상기 압전막 상부에 형성되어 압전막에 압전 효과를 일으킬 수 있도록 소정 전압을 인가하기 위한 전극으로 구성되어, 상기 전극과 초박막 금속 사이에 전기장을 인가할 때, 압전효과에 의한 역학적인 힘이 압전막 하부의 전자 통로의 저항을 변화시킴으로써, 통상의 트랜지스터와 같은 효과를 발휘할 수 있다.The piezoelectric element of the present invention includes a piezoelectric film capable of generating a predetermined dynamic force by a predetermined voltage, and a lower portion of the piezoelectric film so as to control the flow of electrons by changing the electrical resistance by the dynamic force of the piezoelectric film. An electron path formed of the formed ultra thin metal film and an electrode formed on the piezoelectric film to apply a predetermined voltage to cause a piezoelectric effect to the piezoelectric film, and when the electric field is applied between the electrode and the ultra thin metal, The mechanical force by the effect changes the resistance of the electron passage in the lower part of the piezoelectric film, whereby an effect similar to that of a normal transistor can be obtained.

Description

금속초박막을 이용한 압전소자Piezoelectric element using ultra thin metal

제1도는 본 발명의 제1의 바람직한 실시예에 따른 금속박막 압전소자 트랜지스터의 구조를 나타낸 단면도.1 is a cross-sectional view showing the structure of a metal thin film piezoelectric element transistor according to a first preferred embodiment of the present invention.

제2도는 본 발명의 제2의 바람직한 실시예에 따른 금속박막 압전소자의 구조를 나타낸 평면도.2 is a plan view showing the structure of a metal thin film piezoelectric element according to a second preferred embodiment of the present invention.

제2도(b)는 제2(a)도의 A-A선 단면도이다.FIG. 2B is a cross-sectional view taken along the line A-A of FIG. 2A.

* 도면의 주요부분에 대한 부호의 설명* Explanation of symbols for main parts of the drawings

12,22 : 금속초박막 14,24 : 압전막12,22: ultra thin metal film 14,24: piezoelectric film

16,26 : 전극16,26: electrode

본 발명은 압전효과(piezo-electric effect)를 이용한 트랜지스터에 관한 것으로서, 특히 금속초박막으로 구성된 압전효과 트랜지스터에 관한 것이다.BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a transistor using a piezo-electric effect, and more particularly to a piezoelectric effect transistor composed of an ultrathin metal film.

현재 개발되어 상용되고 있는 거의 모든 전자 소자는 반도체 재료, 특히 실리콘을 주 재료로 만들어지고 있다.Almost all electronic devices currently developed and commercially made are mainly made of semiconductor materials, especially silicon.

그러나, 금속을 전자 소자의 재료로 이용하는 경우, 반도체 재료에 비하여 여러 가지 장점이 있다.However, when metal is used as a material for electronic devices, there are various advantages over semiconductor materials.

즉, 금속의 전자 밀도가 반도체에 비하여 약 백만배 이상 크기 때문에 훨씬 작은 크기의 소자가 가능하다.That is, a much smaller device is possible because the electron density of the metal is about one million times larger than that of the semiconductor.

또한, 금속을 이용한 전자소자는 밴드 갭을 이용하지 않아 반도체 소자에서 요구하는 정도의 고결정성이 필요하지 않기 때문에 기판을 직접 전자소자의 한 부분으로 이용하지 않고, 평평한 절연막 위에 쉽게 박막을 입혀 가공, 예를 들어 리소그래피, 리프트-오프(lift-off), 재증착 또는 열처리 등의 공정을 함으로써 제작될 수 있다.In addition, since the electronic device using the metal does not use the band gap and does not require the high crystallinity required by the semiconductor device, the substrate is not directly used as a part of the electronic device. For example, it may be manufactured by a process such as lithography, lift-off, redeposition or heat treatment.

따라서, 초박막의 금속으로 이루어진 단층의 회로들에 절연층을 피복하고 이를 한 단위를 하여, 다수의 단위구조를 연속적으로 적층하여 직접회로를 제조할 수도 있다.Accordingly, an integrated circuit may be manufactured by coating an insulating layer on single-layer circuits made of ultra-thin metal and using the unit as one unit to successively stack a plurality of unit structures.

이와 같이, 금속을 이용한 소자는 한 단위의 집적도가 전술한 이유로 반도체 재료의 소자에 비하여 훨씬 증가할 수 있을뿐만 아니라, 이를 적층하여 삼차원화 할 수 있기 때문에 적층의 갯수 만큼 집적도를 배가시킬 수 있다.As described above, the device using a metal can increase the integration degree by the number of stacks because the integration degree of one unit can not only be much higher than that of the semiconductor material, but can also be stacked three-dimensionally.

이러한 삼차원 구조가 가능하려면, 금속 박막을 주 재료로 하는 능동 소자, 즉 트랜지스터가 필요하다.In order to enable such a three-dimensional structure, an active element mainly made of a metal thin film, that is, a transistor is required.

지금까지 널리 상용되고 있는 트랜지스터의 두가지 유형 가운데, 금속박막을 이용한 능동소자에 적용 가능한 것은 전계효과 트랜지스터(field effect transistor)이다.Of the two types of transistors that are widely used so far, field effect transistors are applicable to active devices using metal thin films.

그러나, 전자 밀도가 반도체 재료에 비해 훨씬 큰 금속 재료의 특성상, 전계효과에 의하여 에너지 밴드가 휘는 표면으로의 깊이가 수 옹스트롬(0.1nm) 정도에 불과하기 때문에, 금속 박막의 두께 역시 그 정도로 얇아야 만족할 만한 정도의 전계효과를 거둘 수 있다.However, the thickness of the metal thin film should also be as thin as the depth of the energy band bends only a few angstroms (0.1 nm) due to the characteristics of the metal material having a much higher electron density than the semiconductor material. A satisfactory field effect can be achieved.

현재의 공정 기술로 이러한 초박막을 균일하게 증착할 수 있는 장비와 금속재료는 흔하지 않다.Equipment and metal materials capable of uniformly depositing such ultra thin films with current process technology are not common.

따라서, 본 발명은 상기 전계효과 트랜지스터 이외의 금속초박막 재료에 적합한 새로운 개념의 소자의 요구에 부응하기 위하여 안출된 것으로서, 그 목적은 압전효과를 이용한 금속초박막으로 구성된 압전소자(piezo electric device)를 제공하는데 있다.Accordingly, the present invention has been made to meet the demand of a new concept of a device suitable for a metal ultra thin film material other than the field effect transistor, the object of which is to provide a piezo electric device (piezo electric device) composed of a metal ultra thin film using a piezoelectric effect. It is.

상기 목적을 달성하기 위한 본 발명의 금속초박막으로 구성된 압전소자는, 소정 전압에 의해 소정의 역학적인 힘을 발생시킬 수 있는 압전막, 상기 압전막의 역학적인 힘에 의해 전기 저항이 변화되어 전자의 흐름을 제어할 수 있도록 상기 압전막 하부에 형성된 금속초박막으로 이루어진 전자 통로, 및 상기 압전막 상부에 형성되어 압전막에 압전효과를 일으킬 수 있도록 소정 전압을 인가하기 위한 전극으로 구성된다.The piezoelectric element composed of the ultra-thin metal film of the present invention for achieving the above object is a piezoelectric film that can generate a predetermined mechanical force by a predetermined voltage, the electrical resistance is changed by the mechanical force of the piezoelectric film, the flow of electrons An electron passage formed of an ultra-thin metal film formed under the piezoelectric film so as to control the electrode, and an electrode for applying a predetermined voltage formed on the piezoelectric film to cause a piezoelectric effect to the piezoelectric film.

이하, 본 발명의 바람직한 실시예를 첨부도면을 참조하여 보다 상세히 설명한다.Hereinafter, preferred embodiments of the present invention will be described in detail with reference to the accompanying drawings.

압전효과란 소정의 재료(또는 결정)에 전장을 인가하면 일정한 방향으로 역학적인 힘(strain)이 발생하는 현상으로서, 압전효과가 발생하는 대표적인 물질로는 quartz, LiNbo3, BaTiO3, PbTio3, 등과 같은 절연체와 ZNS, DdTe, InSb, CdS와 같은 반도체 등이 있다.The piezoelectric effect is a phenomenon in which a dynamic force is generated in a predetermined direction when an electric field is applied to a predetermined material (or crystal). Representative materials for generating a piezoelectric effect include quartz, LiNbo 3 , BaTiO 3 , PbTio 3 , and the like. And insulators such as ZNS, semiconductors such as DdTe, InSb, and CdS.

금속초박막에서 주어진 한 원자의 위치에서 그 인근의 원자로의 전자 수송은 두 원자를 중심으로 한 전자 파동 함수들의 중첩에 아주 민감하게 좌우된다.The transport of electrons to a nearby reactor at a given atom's position in an ultrathin metal layer is very sensitive to the superposition of electron wave functions around two atoms.

이 파동 함수의 중첩된 양은 두 원자 사이의 거리에 또한 지수함수적으로 변하기 때문에, 만일 금속초박막 금속내의 원자 사이의 거리를 조절할 수 있으면, 전자 수송, 즉 전기 저항을 변하게 할 수 있다.Since the overlapped amount of this wave function varies exponentially with the distance between the two atoms, it is possible to change the electron transport, ie the electrical resistance, if the distance between the atoms in the ultrathin metal can be controlled.

더욱이, 금속을 초박막으로 만들 수 있으면, 상대적으로 적은 역학적인 힘으로서 원하는 금속 박막내의 원자 사이의 거리를 쉽게 변하게 할 수 있다.Moreover, if the metal can be made into an ultra thin film, it is possible to easily change the distance between atoms in the desired metal thin film with relatively little mechanical force.

따라서, 압전소자를 이용한 역학적인 힘을 사용하면 통상의 트랜지스터와 같은 기능을 구현할 수 있다.Therefore, by using a dynamic force using a piezoelectric element it is possible to implement the same function as a conventional transistor.

제1도는 본 발명의 제1의 바람직한 실시예에 따른 금속박막 압전소자 트랜지스터의 구조를 나타낸 도면으로서, 금속초박막(12)을 전자 통로인 채널로 하고, 상기 금속초박막(12) 상부에 순차적으로 형성된 압전막(14)과 전극(16)으로 구성된다.FIG. 1 is a diagram showing the structure of a metal thin film piezoelectric transistor according to a first preferred embodiment of the present invention, in which a metal ultra thin film 12 is a channel serving as an electron passage, and is sequentially formed on the metal ultra thin film 12. The piezoelectric film 14 and the electrode 16 are comprised.

이러한 구성을 갖는 본 발명의 압전소자는 게이트 역할을 수행하는 상기 전극(16)과 소스 및 드레인 역할을 수행하는 금속초박막(12)사이에 전기장을 인가할 때, 압전막(14)에 압전효과에 의한 역학적인 힘, 예를 들어 스트레스(stress) 또는 스트레인(strain)이 발생하고, 이 힘에 의해 압전막(14) 하부에 형성된 금속초박막(12)인 전자 통로의 저항을 변화시키는 것이다.The piezoelectric element of the present invention having such a configuration has a piezoelectric effect on the piezoelectric film 14 when an electric field is applied between the electrode 16 serving as a gate and the ultra-thin metal film 12 serving as a source and a drain. A dynamic force, for example, stress or strain, is generated, and this force changes the resistance of the electron passage, which is the ultra-thin metal film 12 formed under the piezoelectric film 14.

제2도(a)는 본 발명의 제2의 바람직한 실시예에 따른 금속 박막 압전소자의 구조를 나타낸 평면도이고, 제2도(b)는 제2(a)도의 A-A선 단면 구조를 도시한 것이다. 제2도(a), (b)에서 도시된 압전소자는 금속초박막(22)을 전자 통로로 하고, 그 위에 압전막(24)을 형성하며 그리고 이 압전막(24)위에서 서로 전기적으로 격리되어 있는 두 전극(26a, 26b)을 마주 보도록 형성시킨 구조를 갖고 있다. 이러한 압전소자에 있어서, 이 두 전극(26a, 26b)에 전압을 인가하여 전극 사이의 압전막(24)에 역학적 힘이 인가되도록 하고, 그 힘이 압전막(24) 하부의 금속초박막(22)에 작용하여, 그 부분의 전자통로의 저항을 변화시킨다.FIG. 2 (a) is a plan view showing the structure of the metal thin film piezoelectric element according to the second preferred embodiment of the present invention, and FIG. 2 (b) shows the AA line cross-sectional structure of FIG. 2 (a). . The piezoelectric elements shown in Figs. 2 (a) and 2 (b) use the ultrathin metal film 22 as an electron path, form a piezoelectric film 24 thereon, and are electrically isolated from each other on the piezoelectric film 24. It has a structure in which two electrodes 26a and 26b are formed to face each other. In such a piezoelectric element, a voltage is applied to the two electrodes 26a and 26b so that a mechanical force is applied to the piezoelectric film 24 between the electrodes, and the force is applied to the metal ultrathin film 22 under the piezoelectric film 24. It acts on and changes the resistance of the electron path in that part.

이상 설명한 바와 같이, 본 발명은 차세대 전자 소자의 주 재료로 사용될 수 있는 금속초박막을 이용하여 압전소자를 제조 함으로써, 통상의 반도체로 이루어진 압전소자와 동일한 효과를 발휘하면서도 고속화 및 삼차원화 집적이 가능하다.As described above, the present invention manufactures a piezoelectric element by using a metal ultra-thin film that can be used as a main material of next-generation electronic devices, thereby achieving high speed and three-dimensional integration while exhibiting the same effect as a piezoelectric element made of a conventional semiconductor. .

Claims (1)

압전소자를 이용하는 압전소자에 있어서, 소정 전압에 의해 소정의 역학적인 힘을 발생시킬 수 있는 압전막, 상기 압전막의 역학적인 힘에 의해 전기 저항이 변화되어 전자의 흐름을 제어할 수 있도록 상기 압전막 하부에 형성된 금속초박막으로 이루어진 전자 통로, 및 상기 압전막 상부에 형성되어 압전막에 압전효과를 일으킬 수 있도록 소정 전압을 인가하기 위한 전극으로 구성된 것을 특징으로 하는 금속초박막을 이용한 압전소자.In a piezoelectric element using a piezoelectric element, a piezoelectric film capable of generating a predetermined dynamic force by a predetermined voltage, and the piezoelectric film so that electric resistance is changed by the dynamic force of the piezoelectric film to control the flow of electrons. The piezoelectric element using an ultrathin metal thin film formed of an electron passage formed of an ultra-thin metal film formed below, and an electrode formed on the piezoelectric film to apply a predetermined voltage to the piezoelectric film.
KR1019940022872A 1994-09-10 1994-09-10 Piezoelectric device using thin metal film KR0148420B1 (en)

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KR1019940022872A KR0148420B1 (en) 1994-09-10 1994-09-10 Piezoelectric device using thin metal film
JP6297194A JP2660166B2 (en) 1994-09-10 1994-11-30 Piezoelectric element using ultra-thin metal film

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JP2005347364A (en) * 2004-06-01 2005-12-15 National Institute Of Advanced Industrial & Technology Extendible and contractible piezoelectric element

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JPH0812935B2 (en) * 1988-02-09 1996-02-07 日本電気株式会社 Superconductor electronic device

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102008008931B3 (en) * 2008-02-13 2009-07-16 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Device for operating electrical signal of integrated circuit, has component, which has p-doped area with connection and n-doped area with another connection, and another component is provided, which is coupled with former component
US7892859B2 (en) 2008-02-13 2011-02-22 Fraunhofer-Gesellschaft Zur Foerderung Der Angewandten Forschung E.V. Device and method for switching electric signals and powers

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KR960012587A (en) 1996-04-20
JPH0888418A (en) 1996-04-02
JP2660166B2 (en) 1997-10-08

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