JPWO2022254854A1 - - Google Patents
Info
- Publication number
- JPWO2022254854A1 JPWO2022254854A1 JP2023525409A JP2023525409A JPWO2022254854A1 JP WO2022254854 A1 JPWO2022254854 A1 JP WO2022254854A1 JP 2023525409 A JP2023525409 A JP 2023525409A JP 2023525409 A JP2023525409 A JP 2023525409A JP WO2022254854 A1 JPWO2022254854 A1 JP WO2022254854A1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
- G01C3/00—Measuring distances in line of sight; Optical rangefinders
- G01C3/10—Measuring distances in line of sight; Optical rangefinders using a parallactic triangle with variable angles and a base of fixed length in the observation station, e.g. in the instrument
- G01C3/14—Measuring distances in line of sight; Optical rangefinders using a parallactic triangle with variable angles and a base of fixed length in the observation station, e.g. in the instrument with binocular observation at a single point, e.g. stereoscopic type
- G01C3/16—Measuring marks
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/245—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures using a plurality of fixed, simultaneously operating transducers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
- G01B11/2545—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object with one projection direction and several detection directions, e.g. stereo
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Electromagnetism (AREA)
- Radar, Positioning & Navigation (AREA)
- Remote Sensing (AREA)
- Length Measuring Devices By Optical Means (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2021091601 | 2021-05-31 | ||
| PCT/JP2022/009884 WO2022254854A1 (ja) | 2021-05-31 | 2022-03-08 | ３次元計測装置 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPWO2022254854A1 true JPWO2022254854A1 (ja) | 2022-12-08 |
Family
ID=84324220
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2023525409A Pending JPWO2022254854A1 (ja) | 2021-05-31 | 2022-03-08 |
Country Status (3)
| Country | Link |
|---|---|
| EP (1) | EP4350280A1 (ja) |
| JP (1) | JPWO2022254854A1 (ja) |
| WO (1) | WO2022254854A1 (ja) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2023167162A1 (ja) * | 2022-03-01 | 2023-09-07 | 興和株式会社 | ドットパターン生成方法及び３次元計測装置 |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2841103B2 (ja) | 1990-05-22 | 1998-12-24 | 日立ソフトウェアエンジニアリング株式会社 | 蛍光パターン読み取り方法および装置 |
| JP4110501B2 (ja) * | 1999-11-22 | 2008-07-02 | ソニー株式会社 | ランダムパターン生成装置とその方法、距離画像生成装置とその方法、およびプログラム提供媒体 |
| JP2014052307A (ja) * | 2012-09-07 | 2014-03-20 | Sanyo Electric Co Ltd | 情報取得装置および物体検出装置 |
| JP2014106000A (ja) * | 2012-11-22 | 2014-06-09 | Sanyo Electric Co Ltd | 情報取得装置および物体検出装置 |
| WO2015148604A1 (en) * | 2014-03-25 | 2015-10-01 | Massachusetts Institute Of Technology | Space-time modulated active 3d imager |
| JP2019505884A (ja) * | 2015-12-10 | 2019-02-28 | キアゲン ゲーエムベーハー | デジタル画像内の少なくとも１つのオブジェクトの全体的明るさを判定するための方法 |
-
2022
- 2022-03-08 WO PCT/JP2022/009884 patent/WO2022254854A1/ja active Application Filing
- 2022-03-08 JP JP2023525409A patent/JPWO2022254854A1/ja active Pending
- 2022-03-08 EP EP22815611.3A patent/EP4350280A1/en active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| EP4350280A1 (en) | 2024-04-10 |
| WO2022254854A1 (ja) | 2022-12-08 |
Similar Documents
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A821 Effective date: 20231110 |