JPWO2022064665A1 - - Google Patents

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Publication number
JPWO2022064665A1
JPWO2022064665A1 JP2022551071A JP2022551071A JPWO2022064665A1 JP WO2022064665 A1 JPWO2022064665 A1 JP WO2022064665A1 JP 2022551071 A JP2022551071 A JP 2022551071A JP 2022551071 A JP2022551071 A JP 2022551071A JP WO2022064665 A1 JPWO2022064665 A1 JP WO2022064665A1
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JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Application number
JP2022551071A
Other versions
JP7452681B2 (ja
JPWO2022064665A5 (ja
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Publication of JPWO2022064665A1 publication Critical patent/JPWO2022064665A1/ja
Publication of JPWO2022064665A5 publication Critical patent/JPWO2022064665A5/ja
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Publication of JP7452681B2 publication Critical patent/JP7452681B2/ja
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Anticipated expiration legal-status Critical

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01SRADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S17/00Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
    • G01S17/88Lidar systems specially adapted for specific applications
    • G01S17/89Lidar systems specially adapted for specific applications for mapping or imaging
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/002Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/02Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/03Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by measuring coordinates of points
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01SRADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S7/00Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
    • G01S7/48Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
    • G01S7/4808Evaluating distance, position or velocity data
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T1/00General purpose image data processing
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01SRADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S7/00Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
    • G01S7/48Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
    • G01S7/497Means for monitoring or calibrating
    • G01S7/4972Alignment of sensor

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Theoretical Computer Science (AREA)
  • Electromagnetism (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Image Processing (AREA)
JP2022551071A 2020-09-28 2020-09-28 測定装置、情報処理装置、位置合わせ方法、及びプログラム Active JP7452681B2 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2020/036507 WO2022064665A1 (ja) 2020-09-28 2020-09-28 測定装置、情報処理装置、位置合わせ方法、及びコンピュータ可読媒体

Publications (3)

Publication Number Publication Date
JPWO2022064665A1 true JPWO2022064665A1 (ja) 2022-03-31
JPWO2022064665A5 JPWO2022064665A5 (ja) 2023-05-30
JP7452681B2 JP7452681B2 (ja) 2024-03-19

Family

ID=80846300

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2022551071A Active JP7452681B2 (ja) 2020-09-28 2020-09-28 測定装置、情報処理装置、位置合わせ方法、及びプログラム

Country Status (3)

Country Link
US (1) US20230358528A1 (ja)
JP (1) JP7452681B2 (ja)
WO (1) WO2022064665A1 (ja)

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011099742A (ja) * 2009-11-05 2011-05-19 Mitsubishi Heavy Ind Ltd 対象物検出装置および対象物検出方法
WO2012176249A1 (ja) * 2011-06-21 2012-12-27 国立大学法人奈良先端科学技術大学院大学 自己位置推定装置、自己位置推定方法、自己位置推定プログラム、及び移動体
JP2016045330A (ja) * 2014-08-22 2016-04-04 株式会社Ihi 3次元点群データの位置合わせ方法と装置及びその移動体システム
US20160187130A1 (en) * 2014-12-19 2016-06-30 Leica Geosystems Ag Method for determining a position and orientation offset of a geodetic surveying device and such a surveying device
US20190188872A1 (en) * 2017-12-18 2019-06-20 Samsung Electronics Co., Ltd. Image processing with iterative closest point (icp) technique

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011099742A (ja) * 2009-11-05 2011-05-19 Mitsubishi Heavy Ind Ltd 対象物検出装置および対象物検出方法
WO2012176249A1 (ja) * 2011-06-21 2012-12-27 国立大学法人奈良先端科学技術大学院大学 自己位置推定装置、自己位置推定方法、自己位置推定プログラム、及び移動体
JP2016045330A (ja) * 2014-08-22 2016-04-04 株式会社Ihi 3次元点群データの位置合わせ方法と装置及びその移動体システム
US20160187130A1 (en) * 2014-12-19 2016-06-30 Leica Geosystems Ag Method for determining a position and orientation offset of a geodetic surveying device and such a surveying device
US20190188872A1 (en) * 2017-12-18 2019-06-20 Samsung Electronics Co., Ltd. Image processing with iterative closest point (icp) technique

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
ARMESTO, LEOPOLDO ET AL.: ""A Generalization of the Metric-Based Iterative Closest Point Technique for 3D Scan Matching"", 2010 IEEE INTERNATIONAL CONFERENCE ON ROBOTICS AND AUTOMATION, JPN6023040757, 2010, pages 1367 - 1372, ISSN: 0005167406 *

Also Published As

Publication number Publication date
JP7452681B2 (ja) 2024-03-19
WO2022064665A1 (ja) 2022-03-31
US20230358528A1 (en) 2023-11-09

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