JPWO2022064665A1 - - Google Patents
Info
- Publication number
- JPWO2022064665A1 JPWO2022064665A1 JP2022551071A JP2022551071A JPWO2022064665A1 JP WO2022064665 A1 JPWO2022064665 A1 JP WO2022064665A1 JP 2022551071 A JP2022551071 A JP 2022551071A JP 2022551071 A JP2022551071 A JP 2022551071A JP WO2022064665 A1 JPWO2022064665 A1 JP WO2022064665A1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S17/00—Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
- G01S17/88—Lidar systems specially adapted for specific applications
- G01S17/89—Lidar systems specially adapted for specific applications for mapping or imaging
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/002—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/03—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by measuring coordinates of points
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
- G01S7/48—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
- G01S7/4808—Evaluating distance, position or velocity data
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T1/00—General purpose image data processing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
- G01S7/48—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
- G01S7/497—Means for monitoring or calibrating
- G01S7/4972—Alignment of sensor
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Networks & Wireless Communication (AREA)
- Radar, Positioning & Navigation (AREA)
- Remote Sensing (AREA)
- Theoretical Computer Science (AREA)
- Electromagnetism (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Image Processing (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/JP2020/036507 WO2022064665A1 (ja) | 2020-09-28 | 2020-09-28 | 測定装置、情報処理装置、位置合わせ方法、及びコンピュータ可読媒体 |
Publications (3)
Publication Number | Publication Date |
---|---|
JPWO2022064665A1 true JPWO2022064665A1 (ja) | 2022-03-31 |
JPWO2022064665A5 JPWO2022064665A5 (ja) | 2023-05-30 |
JP7452681B2 JP7452681B2 (ja) | 2024-03-19 |
Family
ID=80846300
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2022551071A Active JP7452681B2 (ja) | 2020-09-28 | 2020-09-28 | 測定装置、情報処理装置、位置合わせ方法、及びプログラム |
Country Status (3)
Country | Link |
---|---|
US (1) | US20230358528A1 (ja) |
JP (1) | JP7452681B2 (ja) |
WO (1) | WO2022064665A1 (ja) |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2011099742A (ja) * | 2009-11-05 | 2011-05-19 | Mitsubishi Heavy Ind Ltd | 対象物検出装置および対象物検出方法 |
WO2012176249A1 (ja) * | 2011-06-21 | 2012-12-27 | 国立大学法人奈良先端科学技術大学院大学 | 自己位置推定装置、自己位置推定方法、自己位置推定プログラム、及び移動体 |
JP2016045330A (ja) * | 2014-08-22 | 2016-04-04 | 株式会社Ihi | 3次元点群データの位置合わせ方法と装置及びその移動体システム |
US20160187130A1 (en) * | 2014-12-19 | 2016-06-30 | Leica Geosystems Ag | Method for determining a position and orientation offset of a geodetic surveying device and such a surveying device |
US20190188872A1 (en) * | 2017-12-18 | 2019-06-20 | Samsung Electronics Co., Ltd. | Image processing with iterative closest point (icp) technique |
-
2020
- 2020-09-28 JP JP2022551071A patent/JP7452681B2/ja active Active
- 2020-09-28 US US18/026,026 patent/US20230358528A1/en active Pending
- 2020-09-28 WO PCT/JP2020/036507 patent/WO2022064665A1/ja active Application Filing
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2011099742A (ja) * | 2009-11-05 | 2011-05-19 | Mitsubishi Heavy Ind Ltd | 対象物検出装置および対象物検出方法 |
WO2012176249A1 (ja) * | 2011-06-21 | 2012-12-27 | 国立大学法人奈良先端科学技術大学院大学 | 自己位置推定装置、自己位置推定方法、自己位置推定プログラム、及び移動体 |
JP2016045330A (ja) * | 2014-08-22 | 2016-04-04 | 株式会社Ihi | 3次元点群データの位置合わせ方法と装置及びその移動体システム |
US20160187130A1 (en) * | 2014-12-19 | 2016-06-30 | Leica Geosystems Ag | Method for determining a position and orientation offset of a geodetic surveying device and such a surveying device |
US20190188872A1 (en) * | 2017-12-18 | 2019-06-20 | Samsung Electronics Co., Ltd. | Image processing with iterative closest point (icp) technique |
Non-Patent Citations (1)
Title |
---|
ARMESTO, LEOPOLDO ET AL.: ""A Generalization of the Metric-Based Iterative Closest Point Technique for 3D Scan Matching"", 2010 IEEE INTERNATIONAL CONFERENCE ON ROBOTICS AND AUTOMATION, JPN6023040757, 2010, pages 1367 - 1372, ISSN: 0005167406 * |
Also Published As
Publication number | Publication date |
---|---|
JP7452681B2 (ja) | 2024-03-19 |
WO2022064665A1 (ja) | 2022-03-31 |
US20230358528A1 (en) | 2023-11-09 |
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