JPWO2020217651A1 - - Google Patents

Info

Publication number
JPWO2020217651A1
JPWO2020217651A1 JP2021515813A JP2021515813A JPWO2020217651A1 JP WO2020217651 A1 JPWO2020217651 A1 JP WO2020217651A1 JP 2021515813 A JP2021515813 A JP 2021515813A JP 2021515813 A JP2021515813 A JP 2021515813A JP WO2020217651 A1 JPWO2020217651 A1 JP WO2020217651A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2021515813A
Other versions
JPWO2020217651A5 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPWO2020217651A1 publication Critical patent/JPWO2020217651A1/ja
Publication of JPWO2020217651A5 publication Critical patent/JPWO2020217651A5/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2513—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object with several lines being projected in more than one direction, e.g. grids, patterns
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/245—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures using a plurality of fixed, simultaneously operating transducers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2545—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object with one projection direction and several detection directions, e.g. stereo

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Length Measuring Devices By Optical Means (AREA)
JP2021515813A 2019-04-25 2020-02-13 Pending JPWO2020217651A1 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2019084305 2019-04-25
PCT/JP2020/005503 WO2020217651A1 (ja) 2019-04-25 2020-02-13 寸法測定装置及び荷物発送用ロッカー

Publications (2)

Publication Number Publication Date
JPWO2020217651A1 true JPWO2020217651A1 (ja) 2020-10-29
JPWO2020217651A5 JPWO2020217651A5 (ja) 2022-01-14

Family

ID=72942030

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2021515813A Pending JPWO2020217651A1 (ja) 2019-04-25 2020-02-13

Country Status (3)

Country Link
EP (1) EP3961148A4 (ja)
JP (1) JPWO2020217651A1 (ja)
WO (1) WO2020217651A1 (ja)

Citations (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH11325833A (ja) * 1998-05-14 1999-11-26 Mitsubishi Heavy Ind Ltd パレタイズシステム用位置決め装置
JP2001143073A (ja) * 1999-11-10 2001-05-25 Nippon Telegr & Teleph Corp <Ntt> 物体の位置姿勢決定の方法
JP2006505784A (ja) * 2002-11-11 2006-02-16 キネティック リミテッド 測距装置
JP2006322906A (ja) * 2005-05-20 2006-11-30 Sumitomo Osaka Cement Co Ltd 三次元位置測定装置及びソフトウエアプログラム
US20120113250A1 (en) * 2010-09-30 2012-05-10 Neopost Technologies Apparatus for determining the three dimensions of a parcel
WO2013190772A1 (ja) * 2012-06-20 2013-12-27 パナソニック株式会社 空間情報検出装置、人位置検出装置
JP2015165420A (ja) * 2013-05-31 2015-09-17 パナソニックＩｐマネジメント株式会社 モデリング装置、３次元モデル生成装置、モデリング方法、プログラム、レイアウトシミュレータ
JP2016217941A (ja) * 2015-05-22 2016-12-22 株式会社東芝 ３次元データ評価装置、３次元データ測定システム、および３次元計測方法
JP2017026488A (ja) * 2015-07-23 2017-02-02 株式会社東芝 距離計測装置、距離計測システム、距離計測方法及び距離計測プログラム
JP2017116482A (ja) * 2015-12-25 2017-06-29 パナソニックＩｐマネジメント株式会社 測定装置、宅配ボックス装置
JP2017150907A (ja) * 2016-02-23 2017-08-31 パナソニックＩｐマネジメント株式会社 寸法測定装置
JP2018511034A (ja) * 2015-01-29 2018-04-19 ヘプタゴン・マイクロ・オプティクス・プライベート・リミテッドＨｅｐｔａｇｏｎ Ｍｉｃｒｏ Ｏｐｔｉｃｓ Ｐｔｅ． Ｌｔｄ． パターン化された照射を生成するための装置
JP2019028022A (ja) * 2017-08-03 2019-02-21 東芝テック株式会社 寸法測定装置

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3747599B2 (ja) * 1997-11-20 2006-02-22 日産自動車株式会社 車両用障害物検出装置
JP6624563B2 (ja) * 2016-02-23 2019-12-25 パナソニックＩｐマネジメント株式会社 寸法測定方法
JP6602323B2 (ja) * 2017-01-13 2019-11-06 株式会社オプトエレクトロニクス 寸法測定装置、情報読取装置及び寸法測定方法

Patent Citations (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH11325833A (ja) * 1998-05-14 1999-11-26 Mitsubishi Heavy Ind Ltd パレタイズシステム用位置決め装置
JP2001143073A (ja) * 1999-11-10 2001-05-25 Nippon Telegr & Teleph Corp <Ntt> 物体の位置姿勢決定の方法
JP2006505784A (ja) * 2002-11-11 2006-02-16 キネティック リミテッド 測距装置
JP2006322906A (ja) * 2005-05-20 2006-11-30 Sumitomo Osaka Cement Co Ltd 三次元位置測定装置及びソフトウエアプログラム
US20120113250A1 (en) * 2010-09-30 2012-05-10 Neopost Technologies Apparatus for determining the three dimensions of a parcel
WO2013190772A1 (ja) * 2012-06-20 2013-12-27 パナソニック株式会社 空間情報検出装置、人位置検出装置
JP2015165420A (ja) * 2013-05-31 2015-09-17 パナソニックＩｐマネジメント株式会社 モデリング装置、３次元モデル生成装置、モデリング方法、プログラム、レイアウトシミュレータ
JP2018511034A (ja) * 2015-01-29 2018-04-19 ヘプタゴン・マイクロ・オプティクス・プライベート・リミテッドＨｅｐｔａｇｏｎ Ｍｉｃｒｏ Ｏｐｔｉｃｓ Ｐｔｅ． Ｌｔｄ． パターン化された照射を生成するための装置
JP2016217941A (ja) * 2015-05-22 2016-12-22 株式会社東芝 ３次元データ評価装置、３次元データ測定システム、および３次元計測方法
JP2017026488A (ja) * 2015-07-23 2017-02-02 株式会社東芝 距離計測装置、距離計測システム、距離計測方法及び距離計測プログラム
JP2017116482A (ja) * 2015-12-25 2017-06-29 パナソニックＩｐマネジメント株式会社 測定装置、宅配ボックス装置
JP2017150907A (ja) * 2016-02-23 2017-08-31 パナソニックＩｐマネジメント株式会社 寸法測定装置
JP2019028022A (ja) * 2017-08-03 2019-02-21 東芝テック株式会社 寸法測定装置

Also Published As

Publication number Publication date
EP3961148A1 (en) 2022-03-02
EP3961148A4 (en) 2022-09-21
WO2020217651A1 (ja) 2020-10-29

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