JPS6483155A - Detecting circuit of fluctuation of external power supply voltage for semiconductor device - Google Patents
Detecting circuit of fluctuation of external power supply voltage for semiconductor deviceInfo
- Publication number
- JPS6483155A JPS6483155A JP62241935A JP24193587A JPS6483155A JP S6483155 A JPS6483155 A JP S6483155A JP 62241935 A JP62241935 A JP 62241935A JP 24193587 A JP24193587 A JP 24193587A JP S6483155 A JPS6483155 A JP S6483155A
- Authority
- JP
- Japan
- Prior art keywords
- circuit
- constructed
- voltage
- power supply
- external power
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Protection Of Static Devices (AREA)
- Control Of Voltage And Current In General (AREA)
- Measurement Of Current Or Voltage (AREA)
- Power Sources (AREA)
- Semiconductor Integrated Circuits (AREA)
- Emergency Protection Circuit Devices (AREA)
- Stand-By Power Supply Arrangements (AREA)
Abstract
PURPOSE:To simplify the construction of a circuit and to enable the incorporation thereof in a semiconductor element, by constructing the same of a reference voltage forming circuit composed of diodes and a resistor, a voltage divider circuit composed of two resistors and a comparator circuit constructed of a differential amplifier. CONSTITUTION:A detecting circuit is constructed by providing a reference voltage forming circuit 9 constructed of diodes 6 and 7 and a resistor 8, connected to an external power supply and outputting a reference voltage VR to a common of the diodes 6 and 7 and the resistor 8, a voltage divider circuit 12 constructed of a series circuit of two resistors 10 and 11, connected to the external power supply and outputting a divided voltage VD obtained by dividing an external supply voltage VCC to a common node of the two resistors 10 and 11, and a comparator circuit 14 constructed of a differential amplifier 13 and comparing the reference voltage VR with the divided voltage VD. According to this constitution, the fluctuation of the external voltage can be detected by a simple circuit construction, and the circuit can be incorporated easily in a semiconductor element such as a SRAM element without complicating manufacturing processes. When a circuit element is constructed of MOS FET, mounting of the circuit on MOS IC such as SRAM. is facilitated.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62241935A JPS6483155A (en) | 1987-09-25 | 1987-09-25 | Detecting circuit of fluctuation of external power supply voltage for semiconductor device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62241935A JPS6483155A (en) | 1987-09-25 | 1987-09-25 | Detecting circuit of fluctuation of external power supply voltage for semiconductor device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS6483155A true JPS6483155A (en) | 1989-03-28 |
Family
ID=17081760
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP62241935A Pending JPS6483155A (en) | 1987-09-25 | 1987-09-25 | Detecting circuit of fluctuation of external power supply voltage for semiconductor device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6483155A (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0698923A1 (en) * | 1994-08-19 | 1996-02-28 | Seiko Instruments Inc. | Semiconductor integrated circuit |
| JP2001306165A (en) * | 2000-04-18 | 2001-11-02 | Seiko Instruments Inc | Voltage detecting circuit |
| JP2008259300A (en) * | 2007-04-04 | 2008-10-23 | Mitsubishi Electric Corp | Source voltage drop protective circuit |
| JP2015176229A (en) * | 2014-03-13 | 2015-10-05 | セイコーインスツル株式会社 | voltage detection circuit |
-
1987
- 1987-09-25 JP JP62241935A patent/JPS6483155A/en active Pending
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0698923A1 (en) * | 1994-08-19 | 1996-02-28 | Seiko Instruments Inc. | Semiconductor integrated circuit |
| JP2001306165A (en) * | 2000-04-18 | 2001-11-02 | Seiko Instruments Inc | Voltage detecting circuit |
| JP2008259300A (en) * | 2007-04-04 | 2008-10-23 | Mitsubishi Electric Corp | Source voltage drop protective circuit |
| JP2015176229A (en) * | 2014-03-13 | 2015-10-05 | セイコーインスツル株式会社 | voltage detection circuit |
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