JPS647311Y2 - - Google Patents
Info
- Publication number
- JPS647311Y2 JPS647311Y2 JP6550083U JP6550083U JPS647311Y2 JP S647311 Y2 JPS647311 Y2 JP S647311Y2 JP 6550083 U JP6550083 U JP 6550083U JP 6550083 U JP6550083 U JP 6550083U JP S647311 Y2 JPS647311 Y2 JP S647311Y2
- Authority
- JP
- Japan
- Prior art keywords
- discharge chamber
- spark discharge
- sample
- pipe
- plasma torch
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 239000012159 carrier gas Substances 0.000 claims description 10
- 239000007789 gas Substances 0.000 claims description 8
- 239000007787 solid Substances 0.000 claims description 8
- 238000004458 analytical method Methods 0.000 claims description 7
- 238000011144 upstream manufacturing Methods 0.000 claims description 2
- 239000002245 particle Substances 0.000 description 9
- 239000000443 aerosol Substances 0.000 description 6
- 230000032258 transport Effects 0.000 description 6
- 238000009616 inductively coupled plasma Methods 0.000 description 5
- 238000000034 method Methods 0.000 description 3
- 238000011109 contamination Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000004993 emission spectroscopy Methods 0.000 description 1
- 231100000989 no adverse effect Toxicity 0.000 description 1
- 238000010926 purge Methods 0.000 description 1
Landscapes
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
Description
【考案の詳細な説明】
(イ) 産業上の利用分野
本考案は高周波誘導結合プラズマ発光分析
（ICP分析と略記）において固体試料を扱うため
の装置に関する。[Detailed description of the invention] (a) Industrial application field The present invention relates to an apparatus for handling solid samples in high-frequency inductively coupled plasma emission spectrometry (abbreviated as ICP analysis).
(ロ) 従来技術
ICP分析では試料は気体又はエーロゾルの形で
プラズマ炎に供給する。このため固体試料の場
合、スパーク放電によつて試料を一旦蒸発させて
エーロゾル化し、細管を通してキヤリヤガスによ
つてプラズマトーチまで搬送すると云う方法が用
いられている。この方法を用いる場合、エーロゾ
ルをプラズマトーチまで搬送する細管、即ち搬送
管内にエーロゾル粒子が付着して、試料を変えた
後でも、前の試料の粒子が搬送管内に残留し、微
量ずつ新しい試料に混入すると云う問題がある。
このため試料を変える前に搬送管内にパルス状に
大量のキヤリヤガスを通して管内に付着残留して
いる粒子を追い出す方法が採られてきたが、ガス
流量、ガス圧を飛躍的に変えるため、ガスもれ等
管系のトラブルが起り易いと云う難点があつた。(b) Prior art In ICP analysis, a sample is supplied to a plasma flame in the form of a gas or an aerosol. For this reason, in the case of a solid sample, a method is used in which the sample is once evaporated by spark discharge to form an aerosol, and then transported through a thin tube to a plasma torch by a carrier gas. When using this method, aerosol particles adhere to the thin tube that transports the aerosol to the plasma torch, that is, the transport pipe, and even after changing samples, particles from the previous sample remain in the transport pipe, and small amounts are transferred to the new sample. There is a problem of contamination.
For this reason, before changing the sample, a method has been adopted in which a large amount of carrier gas is pulsed into the transport tube to drive out the particles remaining inside the tube. The problem was that problems with the isotube system were likely to occur.
(ハ) 目的
本考案はICP分析における従来の固体試料エー
ロゾル化供給装置の上述した難点を解決しようと
するものである。(c) Purpose The present invention is an attempt to solve the above-mentioned difficulties of the conventional solid sample aerosol supply device for ICP analysis.
(ニ) 構成
本考案ICP分析用固体試料導入装置は試料搬送
用のキヤリヤガス流路において、スパーク放電室
より上流側に音波導入部を設け、更に要すれば上
記スパーク放電室からプラズマトーチに至る搬送
管の適所に加振装置を取付けた点に特徴を有し、
管内に付着した粒子を管内のガスの音波により、
更には管そのものの振動を加えて払い落すもので
ある。(D) Structure The solid sample introduction device for ICP analysis of the present invention is provided with a sound wave introduction section upstream of the spark discharge chamber in the carrier gas flow path for sample transportation, and if necessary, a sound wave introduction section is installed in the carrier gas flow path for sample conveyance from the spark discharge chamber to the plasma torch. The feature is that the vibration device is attached to the appropriate location of the pipe.
Particles attached to the inside of the pipe are removed by the sound waves of the gas inside the pipe.
Furthermore, the pipe itself is vibrated to shake it off.
(ホ) 実施例
図は本考案の一実施例を示す。１は固体試料、
２はスパーク放電室で、３は電極で試料１に対し
て正の電圧が印加される。放電室２は電極３に対
向する面が開口になつており、試料１がこの開口
をふさぐようにセツトされる。もつとも、放電室
２の構造としては試料が放電室２内にセツトされ
るようにしてもよい。４は搬送管でスパーク放電
室２とプラズマトーチ６との間を連通させてい
る。５はプラズマトーチの上に形成されているプ
ラズマ炎である。１０はスパーク放電室２にキヤ
リヤガスを送る管路であり、途中に音響室１１が
設けてある。音響室１１には圧電振動子が取付け
てあり、この圧電振動子はスイープ発振器８によ
つて駆動され、或る周波数から他の或る周波数ま
で周波数が周期的に変化する振動を行い、この振
動は管４及び１０よりなる管系内のガスに伝わ
り、この管系内に音場を形成する。９は搬送管４
に取付けられたバイブレータであり、１２はこれ
らのバイブレータを駆動する発振器である。(E) Example The figure shows an example of the present invention. 1 is a solid sample,
2 is a spark discharge chamber, and 3 is an electrode to which a positive voltage is applied to the sample 1. The discharge chamber 2 has an opening on the surface facing the electrode 3, and the sample 1 is set so as to close this opening. However, the structure of the discharge chamber 2 may be such that the sample is set within the discharge chamber 2. Reference numeral 4 is a conveying tube that communicates between the spark discharge chamber 2 and the plasma torch 6. 5 is a plasma flame formed above the plasma torch. Reference numeral 10 is a conduit for sending carrier gas to the spark discharge chamber 2, and an acoustic chamber 11 is provided along the way. A piezoelectric vibrator is attached to the acoustic chamber 11, and this piezoelectric vibrator is driven by the sweep oscillator 8, and vibrates in a frequency that changes periodically from a certain frequency to another certain frequency. is transmitted to the gas in the tube system consisting of tubes 4 and 10 and forms a sound field within this tube system. 9 is the conveyor pipe 4
12 is an oscillator that drives these vibrators.
管系１０，４を通してキヤリヤガスを流しなが
ら試料１と放電電極３との間に電極３を正とする
電圧を印加すると試料と電極との間にスパーク放
電が行われ、蒸発した試料は冷えてエーロゾルと
なりキヤリヤガスにより搬送管４内を運ばれてプ
ラズマトーチ６に送られる。発振器８を作動させ
ると振動子７が振動して管系１０，４内のガスが
音場を形成し、このガスの振動により搬送管４の
内面に付着していた粒子が剥離され、キヤリヤガ
スの流れによつて運ばれプラズマトーチ６を経て
排出される。このとき音場の周波数が或る範囲で
変化しているので、或る周波数ではとれなかつた
粒子も他の周波数ではとれる。しかしこのことは
必要条件ではなく、管系の長さとか太さ等の条件
及びスパーク放電の条件で異る最適周波数が求め
られれば、その周波数に固定しておいてよいもの
である。バイブレータ９を作動させると搬送管４
の管壁が振動することによつて内面に付着してい
る粒子を落すことができ、音場の作用と併用する
ことにより、管４内面の付着粒子のパージに要す
る時間を短縮することができる。 When a voltage is applied between the sample 1 and the discharge electrode 3 with the electrode 3 being positive while flowing a carrier gas through the tube systems 10 and 4, a spark discharge occurs between the sample and the electrode, and the evaporated sample cools and becomes an aerosol. Then, it is carried through the transport pipe 4 by the carrier gas and sent to the plasma torch 6. When the oscillator 8 is activated, the vibrator 7 vibrates, and the gas in the pipe systems 10 and 4 forms a sound field.The vibration of this gas peels off the particles attached to the inner surface of the carrier pipe 4, and the carrier gas It is carried by the flow and discharged through the plasma torch 6. At this time, since the frequency of the sound field is changing within a certain range, particles that cannot be detected at a certain frequency can be detected at other frequencies. However, this is not a necessary condition, and if an optimum frequency that differs depending on the conditions such as the length and thickness of the tube system and the conditions of spark discharge can be determined, the frequency may be fixed to that frequency. When the vibrator 9 is activated, the conveyor pipe 4
By vibrating the pipe wall, particles adhering to the inner surface of the pipe can be removed, and when combined with the action of a sound field, the time required to purge the particles adhering to the inner surface of the pipe 4 can be shortened. .
(ヘ) 効果
本考案装置は上述したような構成で、振動によ
つて管系内面に付着した粒子を除去するのでキヤ
リヤガスの流量は変化させなくてもよくガス圧の
急変がないから、ガスもれ等の管系のトラブルが
起らずプラズマトーチへの悪影響もなくなる。(f) Effect The device of the present invention has the above-mentioned configuration and removes particles attached to the inner surface of the pipe system through vibration, so there is no need to change the flow rate of the carrier gas and there is no sudden change in gas pressure, so the gas Such problems with the pipe system do not occur, and there is no adverse effect on the plasma torch.
図面は本考案の一実施例装置の側面図である。
１……試料、２……スパーク放電室、３……ス
パーク電極、４……搬送管、６……プラズマトー
チ、７……振動子、８……発振器、９……バイブ
レータ、１２……発振器。
The drawing is a side view of an apparatus according to an embodiment of the present invention. DESCRIPTION OF SYMBOLS 1... Sample, 2... Spark discharge chamber, 3... Spark electrode, 4... Transport tube, 6... Plasma torch, 7... Vibrator, 8... Oscillator, 9... Vibrator, 12... Oscillator .
Claims (1)
ス流路管系の途中に試料がセツトされるスパー
ク放電室を設け、上記管系のスパーク放電室よ
り上流側に同管系内のガスに音波を伝達するよ
うに振動子を配置したICP分析用固体試料導入
装置。 (2) 振動子の振動周期をスイープさせるようにし
た実用新案登録請求の範囲第１項記載のICP分
析用固体試料導入装置。 (3) スパーク放電室からプラズマトーチに至る管
系部分にバイブレータを取付けた実用新案登録
請求の範囲第１項記載のICP分析用固体試料導
入装置。[Scope of Claim for Utility Model Registration] (1) A spark discharge chamber in which a sample is set is provided in the middle of a carrier gas flow pipe system that conveys a sample to a plasma torch, and a spark discharge chamber is provided in the pipe system upstream of the spark discharge chamber. A solid sample introduction device for ICP analysis with a vibrator arranged to transmit sound waves to the gas within the system. (2) A solid sample introduction device for ICP analysis as set forth in claim 1 of the utility model registration, wherein the vibration period of the vibrator is swept. (3) The solid sample introduction device for ICP analysis as set forth in claim 1 of the utility model registration claim, which has a vibrator attached to the tube system from the spark discharge chamber to the plasma torch.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP6550083U JPS59172364U (en) | 1983-04-30 | 1983-04-30 | Solid sample introduction device for ICP analysis |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP6550083U JPS59172364U (en) | 1983-04-30 | 1983-04-30 | Solid sample introduction device for ICP analysis |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS59172364U JPS59172364U (en) | 1984-11-17 |
| JPS647311Y2 true JPS647311Y2 (en) | 1989-02-27 |
Family
ID=30195700
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP6550083U Granted JPS59172364U (en) | 1983-04-30 | 1983-04-30 | Solid sample introduction device for ICP analysis |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS59172364U (en) |
-
1983
- 1983-04-30 JP JP6550083U patent/JPS59172364U/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS59172364U (en) | 1984-11-17 |
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