JPS6472730A - High resolving power x ray tomographic imaging apparatus - Google Patents
High resolving power x ray tomographic imaging apparatusInfo
- Publication number
- JPS6472730A JPS6472730A JP62228416A JP22841687A JPS6472730A JP S6472730 A JPS6472730 A JP S6472730A JP 62228416 A JP62228416 A JP 62228416A JP 22841687 A JP22841687 A JP 22841687A JP S6472730 A JPS6472730 A JP S6472730A
- Authority
- JP
- Japan
- Prior art keywords
- examined
- rays
- dimensional projection
- projection image
- resolving power
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000003384 imaging method Methods 0.000 title abstract 4
- 230000004304 visual acuity Effects 0.000 title abstract 3
- 238000005259 measurement Methods 0.000 abstract 1
Landscapes
- Analysing Materials By The Use Of Radiation (AREA)
- Measurement Of Radiation (AREA)
- Apparatus For Radiation Diagnosis (AREA)
Abstract
PURPOSE:To measure a plurality of tomographic images with the optimum resolving power at every size of an object to be examined, by mounting an X-ray detector having function capable of changing position resolving power to the size of the object to be examined. CONSTITUTION:The X-rays emitted from a synchrotron emitting light source 16 pass through a slit 17 to be brought to monochromatic X-rays having an arbitrary wavelength and high parallelization by a spectroscope 18. X-rays (two-dimensional projection image) after transmitted through an object to be examined are detected by an X-ray imaging tube 3 to be taken in a computer 10 through an X-ray imaging tube control apparatus 8 and a sequencer 9 and subsequently passed through a mechanism 7 for supporting and rotating the object to be examined from the computer 10 to rotate the object to be examined at an equal angle interval to again detect the two-dimensional projection image of the object to be examined. This operation is repeated until the angle of rotation of the object to be examined becomes 180 deg. or 360 deg.. From the obtained two-dimensional projection image group, image reconstituting operational processing is performed at every XY plane and a plurality of tomographic images are displayed on an image display apparatus 11. As mentioned above, since two-dimensional projection image measurement can be performed within one exposure time by the X-ray imaging tube, a plurality of tomographic images due to X-rays can be obtained within a short time.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62228416A JPH0619457B2 (en) | 1987-09-14 | 1987-09-14 | High resolution X-ray tomography system |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62228416A JPH0619457B2 (en) | 1987-09-14 | 1987-09-14 | High resolution X-ray tomography system |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS6472730A true JPS6472730A (en) | 1989-03-17 |
JPH0619457B2 JPH0619457B2 (en) | 1994-03-16 |
Family
ID=16876134
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP62228416A Expired - Lifetime JPH0619457B2 (en) | 1987-09-14 | 1987-09-14 | High resolution X-ray tomography system |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0619457B2 (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH06258259A (en) * | 1993-03-04 | 1994-09-16 | Hitachi Ltd | In-plane distribution measuring method and device |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4665019B2 (en) * | 2008-08-18 | 2011-04-06 | 株式会社東芝 | X-ray computed tomography system |
-
1987
- 1987-09-14 JP JP62228416A patent/JPH0619457B2/en not_active Expired - Lifetime
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH06258259A (en) * | 1993-03-04 | 1994-09-16 | Hitachi Ltd | In-plane distribution measuring method and device |
Also Published As
Publication number | Publication date |
---|---|
JPH0619457B2 (en) | 1994-03-16 |
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