JPS6462899A - Semiconductor integrated memory - Google Patents
Semiconductor integrated memoryInfo
- Publication number
- JPS6462899A JPS6462899A JP62219453A JP21945387A JPS6462899A JP S6462899 A JPS6462899 A JP S6462899A JP 62219453 A JP62219453 A JP 62219453A JP 21945387 A JP21945387 A JP 21945387A JP S6462899 A JPS6462899 A JP S6462899A
- Authority
- JP
- Japan
- Prior art keywords
- error
- bit
- address
- chip
- defective chip
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- For Increasing The Reliability Of Semiconductor Memories (AREA)
- Techniques For Improving Reliability Of Storages (AREA)
Abstract
PURPOSE:To recognize bit error information and to change a defective chip to a non-defective chip by utilizing a redundant bit when the number of bit errors is small, by providing a register to store the address of an error bit. CONSTITUTION:In a semiconductor integrated memory to have an on-chip built-in self test function, a register 8 is equipped to store the error bit address. The address information of the error bit are accumulated in the error bit address register 8 and the defective chip to have a preliminary memory cell can be operated as the non-defective chip by using these error address information. For example, when the semiconductor integrated memory has A pieces of preliminary memory cells, an error chip of the <=A pieces of error bits can be changed to the non-defective chip by using the error bit address 8 accumulated after self-test and replacing the memory cell of the error bit with the preliminary memory cell.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62219453A JPS6462899A (en) | 1987-09-01 | 1987-09-01 | Semiconductor integrated memory |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62219453A JPS6462899A (en) | 1987-09-01 | 1987-09-01 | Semiconductor integrated memory |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS6462899A true JPS6462899A (en) | 1989-03-09 |
Family
ID=16735657
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP62219453A Pending JPS6462899A (en) | 1987-09-01 | 1987-09-01 | Semiconductor integrated memory |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6462899A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0684393A (en) * | 1992-03-17 | 1994-03-25 | Internatl Business Mach Corp <Ibm> | Built-in array type self-test system |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6047299A (en) * | 1983-08-26 | 1985-03-14 | Hitachi Ltd | Semiconductor integrated circuit |
JPS60109099A (en) * | 1983-11-18 | 1985-06-14 | Nippon Telegr & Teleph Corp <Ntt> | Defect detection and switching system of semiconductor memory device |
-
1987
- 1987-09-01 JP JP62219453A patent/JPS6462899A/en active Pending
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6047299A (en) * | 1983-08-26 | 1985-03-14 | Hitachi Ltd | Semiconductor integrated circuit |
JPS60109099A (en) * | 1983-11-18 | 1985-06-14 | Nippon Telegr & Teleph Corp <Ntt> | Defect detection and switching system of semiconductor memory device |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0684393A (en) * | 1992-03-17 | 1994-03-25 | Internatl Business Mach Corp <Ibm> | Built-in array type self-test system |
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