JPS6462899A - Semiconductor integrated memory - Google Patents

Semiconductor integrated memory

Info

Publication number
JPS6462899A
JPS6462899A JP62219453A JP21945387A JPS6462899A JP S6462899 A JPS6462899 A JP S6462899A JP 62219453 A JP62219453 A JP 62219453A JP 21945387 A JP21945387 A JP 21945387A JP S6462899 A JPS6462899 A JP S6462899A
Authority
JP
Japan
Prior art keywords
error
bit
address
chip
defective chip
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP62219453A
Other languages
Japanese (ja)
Inventor
Tadahide Takada
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP62219453A priority Critical patent/JPS6462899A/en
Publication of JPS6462899A publication Critical patent/JPS6462899A/en
Pending legal-status Critical Current

Links

Landscapes

  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)

Abstract

PURPOSE:To recognize bit error information and to change a defective chip to a non-defective chip by utilizing a redundant bit when the number of bit errors is small, by providing a register to store the address of an error bit. CONSTITUTION:In a semiconductor integrated memory to have an on-chip built-in self test function, a register 8 is equipped to store the error bit address. The address information of the error bit are accumulated in the error bit address register 8 and the defective chip to have a preliminary memory cell can be operated as the non-defective chip by using these error address information. For example, when the semiconductor integrated memory has A pieces of preliminary memory cells, an error chip of the <=A pieces of error bits can be changed to the non-defective chip by using the error bit address 8 accumulated after self-test and replacing the memory cell of the error bit with the preliminary memory cell.
JP62219453A 1987-09-01 1987-09-01 Semiconductor integrated memory Pending JPS6462899A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62219453A JPS6462899A (en) 1987-09-01 1987-09-01 Semiconductor integrated memory

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62219453A JPS6462899A (en) 1987-09-01 1987-09-01 Semiconductor integrated memory

Publications (1)

Publication Number Publication Date
JPS6462899A true JPS6462899A (en) 1989-03-09

Family

ID=16735657

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62219453A Pending JPS6462899A (en) 1987-09-01 1987-09-01 Semiconductor integrated memory

Country Status (1)

Country Link
JP (1) JPS6462899A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0684393A (en) * 1992-03-17 1994-03-25 Internatl Business Mach Corp <Ibm> Built-in array type self-test system

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6047299A (en) * 1983-08-26 1985-03-14 Hitachi Ltd Semiconductor integrated circuit
JPS60109099A (en) * 1983-11-18 1985-06-14 Nippon Telegr & Teleph Corp <Ntt> Defect detection and switching system of semiconductor memory device

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6047299A (en) * 1983-08-26 1985-03-14 Hitachi Ltd Semiconductor integrated circuit
JPS60109099A (en) * 1983-11-18 1985-06-14 Nippon Telegr & Teleph Corp <Ntt> Defect detection and switching system of semiconductor memory device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0684393A (en) * 1992-03-17 1994-03-25 Internatl Business Mach Corp <Ibm> Built-in array type self-test system

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