JPS6459081A - Handler - Google Patents
HandlerInfo
- Publication number
- JPS6459081A JPS6459081A JP62216008A JP21600887A JPS6459081A JP S6459081 A JPS6459081 A JP S6459081A JP 62216008 A JP62216008 A JP 62216008A JP 21600887 A JP21600887 A JP 21600887A JP S6459081 A JPS6459081 A JP S6459081A
- Authority
- JP
- Japan
- Prior art keywords
- elements
- kinds
- measured
- semiconductors
- plural kinds
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Abstract
PURPOSE:To measure and classify plural kinds of elements to be measured by the same handler by providing a conveying mechanism which has many holders for containing the elements to be measured by the kinds of the elements. CONSTITUTION:Many IC conveyance plates 11 equipped with the holders for storing plural kinds of elements, e.g. four kinds of semiconductors IC-A3, IC-B4, IC-C5, and IC-D6, e.g. IC sockets A7, B8, C9, and D10 are mounted on a chain 2. The chain 2 is driven to convey the conveyance plate 11 to the measurement positions of the respective semiconductors IC-A3, IC-B4, IC-C5, and IC-D6 of an IC test part 20. An electric signal is applied to the respective semiconductors IC16 through a measuring terminal 14 contacting a contact 15 connected to an IC tester and an IC socket 12 to measure their electric characteristics, and their categories are decided. Consequently, plural kinds of elements are measured and classified by the same handler.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62216008A JPS6459081A (en) | 1987-08-28 | 1987-08-28 | Handler |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62216008A JPS6459081A (en) | 1987-08-28 | 1987-08-28 | Handler |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS6459081A true JPS6459081A (en) | 1989-03-06 |
Family
ID=16681863
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP62216008A Pending JPS6459081A (en) | 1987-08-28 | 1987-08-28 | Handler |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6459081A (en) |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH02129565A (en) * | 1988-11-10 | 1990-05-17 | Hitachi Electron Eng Co Ltd | Device conveyer for ic handler |
| JPH02129566A (en) * | 1988-11-10 | 1990-05-17 | Hitachi Electron Eng Co Ltd | Device conveyer for ic handler |
| US5220991A (en) * | 1991-08-21 | 1993-06-22 | Tsubakimoto Chain Co. | Conveying apparatus for coating line |
| US5242044A (en) * | 1991-08-06 | 1993-09-07 | Tsubakimoto Chain Co. | Apparatus for rotating and conveying an article to be painted on coating line |
| WO2004001429A1 (en) * | 2002-06-25 | 2003-12-31 | Xilinx, Inc. | Multi-socket board for open/short tester |
| JP2013525812A (en) * | 2010-05-04 | 2013-06-20 | エレクトロ サイエンティフィック インダストリーズ インコーポレーテッド | Improved test system and method for electronic equipment |
-
1987
- 1987-08-28 JP JP62216008A patent/JPS6459081A/en active Pending
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH02129565A (en) * | 1988-11-10 | 1990-05-17 | Hitachi Electron Eng Co Ltd | Device conveyer for ic handler |
| JPH02129566A (en) * | 1988-11-10 | 1990-05-17 | Hitachi Electron Eng Co Ltd | Device conveyer for ic handler |
| US5242044A (en) * | 1991-08-06 | 1993-09-07 | Tsubakimoto Chain Co. | Apparatus for rotating and conveying an article to be painted on coating line |
| US5220991A (en) * | 1991-08-21 | 1993-06-22 | Tsubakimoto Chain Co. | Conveying apparatus for coating line |
| WO2004001429A1 (en) * | 2002-06-25 | 2003-12-31 | Xilinx, Inc. | Multi-socket board for open/short tester |
| US6891384B2 (en) | 2002-06-25 | 2005-05-10 | Xilinx, Inc. | Multi-socket board for open/short tester |
| JP2013525812A (en) * | 2010-05-04 | 2013-06-20 | エレクトロ サイエンティフィック インダストリーズ インコーポレーテッド | Improved test system and method for electronic equipment |
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