JPS6455797A - Semiconductor storage device - Google Patents

Semiconductor storage device

Info

Publication number
JPS6455797A
JPS6455797A JP21252687A JP21252687A JPS6455797A JP S6455797 A JPS6455797 A JP S6455797A JP 21252687 A JP21252687 A JP 21252687A JP 21252687 A JP21252687 A JP 21252687A JP S6455797 A JPS6455797 A JP S6455797A
Authority
JP
Japan
Prior art keywords
transistor
ram
volatile
memory
data
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP21252687A
Other languages
Japanese (ja)
Inventor
Kazuo Kobayashi
Takeshi Nakayama
Yasushi Terada
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP21252687A priority Critical patent/JPS6455797A/en
Publication of JPS6455797A publication Critical patent/JPS6455797A/en
Pending legal-status Critical Current

Links

Landscapes

  • Dram (AREA)
  • Read Only Memory (AREA)

Abstract

PURPOSE:To facilitate the high integration of a high speed memory element by being equipped with first and second transistors to select respectively input data with a word signal and an erasing signal, a memory transistor and a capacity for reading, writing and transferring the data. CONSTITUTION:Between a bit line BL and a clock signal line phiP, a memory cell selecting transistor T1, an FLOTOX type memory transistor M1 for a non- volatile storage, an erasing mode selecting transistor T2 and an MOS capacitor C1 to execute the storing at the time of a RAM action are serially connected. The MOS capacitor C1 executes the function to raise a node N1 to a high voltage with a clock signal phiP, and for this reason, the tunnel area of the memory transistor M1 is provided at the transistor T2 side. Thus, a non-volatile RAM is usually operated at a high speed as the RAM, the data of the RAM are stored into a non-volatile memory as needed, the non-volatile of the storage data after the power source is lost is assured and the high integration can be facilitated.
JP21252687A 1987-08-26 1987-08-26 Semiconductor storage device Pending JPS6455797A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP21252687A JPS6455797A (en) 1987-08-26 1987-08-26 Semiconductor storage device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP21252687A JPS6455797A (en) 1987-08-26 1987-08-26 Semiconductor storage device

Publications (1)

Publication Number Publication Date
JPS6455797A true JPS6455797A (en) 1989-03-02

Family

ID=16624131

Family Applications (1)

Application Number Title Priority Date Filing Date
JP21252687A Pending JPS6455797A (en) 1987-08-26 1987-08-26 Semiconductor storage device

Country Status (1)

Country Link
JP (1) JPS6455797A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005071563A (en) * 2003-08-22 2005-03-17 Hynix Semiconductor Inc Driving circuit for nonvolatile dynamic random access memory and driving method therefor

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005071563A (en) * 2003-08-22 2005-03-17 Hynix Semiconductor Inc Driving circuit for nonvolatile dynamic random access memory and driving method therefor

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