JPS6449038A - Positive type photoresist composition - Google Patents
Positive type photoresist compositionInfo
- Publication number
- JPS6449038A JPS6449038A JP20578787A JP20578787A JPS6449038A JP S6449038 A JPS6449038 A JP S6449038A JP 20578787 A JP20578787 A JP 20578787A JP 20578787 A JP20578787 A JP 20578787A JP S6449038 A JPS6449038 A JP S6449038A
- Authority
- JP
- Japan
- Prior art keywords
- compd
- titled composition
- quinone diazide
- contg
- chromatographic analysis
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/022—Quinonediazides
Abstract
PURPOSE:To improve the shelf stability of the titled composition by controlling a specified impurity contg. in the titled composition contg. a four functional quinone diazide type photosensitive compd. to less than a prescribed amount. CONSTITUTION:The titled composition comprises the component of the quinone diazide type photosensitive compd. in which the peak area of said compd. having 0.75-0.9 times retention time against that of the peak of a quinone diazide compd. composed of sulfonates formed by substituting the all four hydroxy groups of tetrahydroxy benzophenone, is <=3% the total peak area in a liquid chromatographic analysis. In said liquid chromatographic analysis, a porous silica gel which is allowed to chemically bond with octadecylsilane, is merely used for a column, and a mixture of acetonitrile, water and acetic acid is used for an elute. Thus, the deterioration of the application property of the titled composition can be prevented after storage for a long period.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP20578787A JPS6449038A (en) | 1987-08-19 | 1987-08-19 | Positive type photoresist composition |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP20578787A JPS6449038A (en) | 1987-08-19 | 1987-08-19 | Positive type photoresist composition |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS6449038A true JPS6449038A (en) | 1989-02-23 |
JPH0346814B2 JPH0346814B2 (en) | 1991-07-17 |
Family
ID=16512666
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP20578787A Granted JPS6449038A (en) | 1987-08-19 | 1987-08-19 | Positive type photoresist composition |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6449038A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5358823A (en) * | 1991-04-09 | 1994-10-25 | Hoechst Aktiengesellschaft | Radiation-sensitive composition containing esterification product of (1,2-naphthoquinone-2-diazide)-sulfonic acid with 2,3,4,4'-tetrahydroxybenzophenone and a di- or tri-hydroxybenzophenone |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3825344B2 (en) | 2002-03-15 | 2006-09-27 | 富士写真フイルム株式会社 | Organic EL element and organic EL display |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3148983A (en) * | 1959-08-29 | 1964-09-15 | Azoplate Corp | Light sensitive omicron-quinone diazides and the photomechanical preparation of printing plates therewith |
JPS61118744A (en) * | 1984-11-15 | 1986-06-06 | Tokyo Ohka Kogyo Co Ltd | Positive photoresist composition |
JPS61185741A (en) * | 1985-02-13 | 1986-08-19 | Mitsubishi Chem Ind Ltd | Positive type photoresist composition |
JPS62280737A (en) * | 1986-05-29 | 1987-12-05 | Japan Synthetic Rubber Co Ltd | Positive type radiation sensitive resin composition |
JPS63249143A (en) * | 1987-04-04 | 1988-10-17 | Mitsubishi Kasei Corp | Positive type photoresist composition |
-
1987
- 1987-08-19 JP JP20578787A patent/JPS6449038A/en active Granted
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3148983A (en) * | 1959-08-29 | 1964-09-15 | Azoplate Corp | Light sensitive omicron-quinone diazides and the photomechanical preparation of printing plates therewith |
JPS61118744A (en) * | 1984-11-15 | 1986-06-06 | Tokyo Ohka Kogyo Co Ltd | Positive photoresist composition |
JPS61185741A (en) * | 1985-02-13 | 1986-08-19 | Mitsubishi Chem Ind Ltd | Positive type photoresist composition |
JPS62280737A (en) * | 1986-05-29 | 1987-12-05 | Japan Synthetic Rubber Co Ltd | Positive type radiation sensitive resin composition |
JPS63249143A (en) * | 1987-04-04 | 1988-10-17 | Mitsubishi Kasei Corp | Positive type photoresist composition |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5358823A (en) * | 1991-04-09 | 1994-10-25 | Hoechst Aktiengesellschaft | Radiation-sensitive composition containing esterification product of (1,2-naphthoquinone-2-diazide)-sulfonic acid with 2,3,4,4'-tetrahydroxybenzophenone and a di- or tri-hydroxybenzophenone |
Also Published As
Publication number | Publication date |
---|---|
JPH0346814B2 (en) | 1991-07-17 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
LAPS | Cancellation because of no payment of annual fees |