JPS6438673A - Semiconductor integrated circuit - Google Patents

Semiconductor integrated circuit

Info

Publication number
JPS6438673A
JPS6438673A JP62196106A JP19610687A JPS6438673A JP S6438673 A JPS6438673 A JP S6438673A JP 62196106 A JP62196106 A JP 62196106A JP 19610687 A JP19610687 A JP 19610687A JP S6438673 A JPS6438673 A JP S6438673A
Authority
JP
Japan
Prior art keywords
circuit
signal
test
pulse data
test mode
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP62196106A
Other languages
Japanese (ja)
Other versions
JPH0833439B2 (en
Inventor
Kazuhiro Kosugi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC IC Microcomputer Systems Co Ltd
Original Assignee
NEC IC Microcomputer Systems Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC IC Microcomputer Systems Co Ltd filed Critical NEC IC Microcomputer Systems Co Ltd
Priority to JP62196106A priority Critical patent/JPH0833439B2/en
Publication of JPS6438673A publication Critical patent/JPS6438673A/en
Publication of JPH0833439B2 publication Critical patent/JPH0833439B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

PURPOSE:To miniaturize the package of a semiconductor integrated circuit, by constituting the title circuit of an electronic circuit having at least one kind of a test mode and composed of at least one functional block, an input terminal having at least one test mode setting function along with a usual function and a pulse data decoding circuit. CONSTITUTION:When a pulse data having frequency exceeding the upper limit of the frequency of the signal used at a usual function time is inputted to an input terminal 2, a pulse data decoding circuit 11 decodes said data. When the decoding result is judged to be a signal for setting a test mode, either one of test circuit selection signals 12-14 is outputted. Either one of test circuits 8-10 is selected by said signal to perform the test of either one of the function blocks 5-7 corresponding thereto. When the pulse data is discriminated to be a signal of usual function, the circuit 11 outputs a usual function signal 15 and an electronic circuit performs usual operation. Therefore, since it is unnecessary to provide an exclusive terminal for setting a test mode, the use efficiency of a terminal is enhanced and the package of a semiconductor integrated circuit can be miniaturized.
JP62196106A 1987-08-04 1987-08-04 Semiconductor integrated circuit Expired - Lifetime JPH0833439B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62196106A JPH0833439B2 (en) 1987-08-04 1987-08-04 Semiconductor integrated circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62196106A JPH0833439B2 (en) 1987-08-04 1987-08-04 Semiconductor integrated circuit

Publications (2)

Publication Number Publication Date
JPS6438673A true JPS6438673A (en) 1989-02-08
JPH0833439B2 JPH0833439B2 (en) 1996-03-29

Family

ID=16352334

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62196106A Expired - Lifetime JPH0833439B2 (en) 1987-08-04 1987-08-04 Semiconductor integrated circuit

Country Status (1)

Country Link
JP (1) JPH0833439B2 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5868620A (en) * 1995-09-12 1999-02-09 Konami Co., Ltd. Multidirectional switch and a driving game machine using the same
KR20170069510A (en) * 2015-12-11 2017-06-21 에스케이하이닉스 주식회사 Circuit for setting test mode and semiconductor device including the same

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5794940B2 (en) * 2012-03-22 2015-10-14 三菱電機株式会社 Integrated circuit device

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5745943A (en) * 1980-09-02 1982-03-16 Toshiba Corp Semiconductor integrated circuit device

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5745943A (en) * 1980-09-02 1982-03-16 Toshiba Corp Semiconductor integrated circuit device

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5868620A (en) * 1995-09-12 1999-02-09 Konami Co., Ltd. Multidirectional switch and a driving game machine using the same
KR20170069510A (en) * 2015-12-11 2017-06-21 에스케이하이닉스 주식회사 Circuit for setting test mode and semiconductor device including the same

Also Published As

Publication number Publication date
JPH0833439B2 (en) 1996-03-29

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