JPS642335A - Manufacture of semiconductor device - Google Patents

Manufacture of semiconductor device

Info

Publication number
JPS642335A
JPS642335A JP15806287A JP15806287A JPS642335A JP S642335 A JPS642335 A JP S642335A JP 15806287 A JP15806287 A JP 15806287A JP 15806287 A JP15806287 A JP 15806287A JP S642335 A JPS642335 A JP S642335A
Authority
JP
Japan
Prior art keywords
region
contact part
etched away
opening
oxide film
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP15806287A
Other languages
Japanese (ja)
Other versions
JPH012335A (en
Inventor
Yoshizo Hagimoto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP15806287A priority Critical patent/JPS642335A/en
Publication of JPH012335A publication Critical patent/JPH012335A/en
Publication of JPS642335A publication Critical patent/JPS642335A/en
Pending legal-status Critical Current

Links

Landscapes

  • Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)

Abstract

PURPOSE: To prevent the step disconnection of an aluminum electrode from occurring by a method wherein a phosphorus glass at high etching rate is previously etched away within the range wider than an electric contact part and after forming oxide films etc., an opening is made in the contact part.
CONSTITUTION: A P-type region 1 is formed into a gate region while an N type region 2 is formed into a channel region, a source region 3 and a drain region. An oxide film 41 is formed on a region 2 to form a phosphorus glass layer 5 on the oxide film 41. First, an opening is made in the region 3 for connection to an aluminum electrode 7 and then a layer 5 on a region to be an electric contact part 10 is selectively etched away wider than the contact part 10. Second, another oxide film 42 is formed and further etched away to remove the oxide films 42 and 41 in the region where the layer 5 is selectively etched away for making an opening as the contact part 10 reaching the region 3. Through these procedures, only the homogenous part comprising the oxide films 42, 41 can be etched away to avoid inverse tapering so that the step disconnection of the electrode 7 may be prevented from occurring.
COPYRIGHT: (C)1989,JPO&Japio
JP15806287A 1987-06-24 1987-06-24 Manufacture of semiconductor device Pending JPS642335A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15806287A JPS642335A (en) 1987-06-24 1987-06-24 Manufacture of semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15806287A JPS642335A (en) 1987-06-24 1987-06-24 Manufacture of semiconductor device

Publications (2)

Publication Number Publication Date
JPH012335A JPH012335A (en) 1989-01-06
JPS642335A true JPS642335A (en) 1989-01-06

Family

ID=15663466

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15806287A Pending JPS642335A (en) 1987-06-24 1987-06-24 Manufacture of semiconductor device

Country Status (1)

Country Link
JP (1) JPS642335A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH044837A (en) * 1990-04-23 1992-01-09 Rheon Autom Mach Co Ltd Preparation of baking dough sheet and machine therefor
US6740584B2 (en) 1997-03-27 2004-05-25 Mitsubishi Denki Kabushiki Kaisha Semiconductor device and method of fabricating the same
JP2005317932A (en) * 2004-03-29 2005-11-10 Yamaha Corp Semiconductor device and its manufacturing method
US7728423B2 (en) 2004-03-29 2010-06-01 Yamaha Corporation Semiconductor device having step-wise connection structures for thin film elements
JP2017059785A (en) * 2015-09-18 2017-03-23 サンケン電気株式会社 Semiconductor device

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57199237A (en) * 1981-06-01 1982-12-07 Matsushita Electric Ind Co Ltd Manufacture of semiconductor device
JPS634646A (en) * 1986-06-24 1988-01-09 Matsushita Electric Works Ltd Manufacture of semiconductor device

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57199237A (en) * 1981-06-01 1982-12-07 Matsushita Electric Ind Co Ltd Manufacture of semiconductor device
JPS634646A (en) * 1986-06-24 1988-01-09 Matsushita Electric Works Ltd Manufacture of semiconductor device

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH044837A (en) * 1990-04-23 1992-01-09 Rheon Autom Mach Co Ltd Preparation of baking dough sheet and machine therefor
US6740584B2 (en) 1997-03-27 2004-05-25 Mitsubishi Denki Kabushiki Kaisha Semiconductor device and method of fabricating the same
US7084508B2 (en) 1997-03-27 2006-08-01 Renesas Technology Corp. Semiconductor device with multiple layer insulating film
JP2005317932A (en) * 2004-03-29 2005-11-10 Yamaha Corp Semiconductor device and its manufacturing method
US7728423B2 (en) 2004-03-29 2010-06-01 Yamaha Corporation Semiconductor device having step-wise connection structures for thin film elements
US8008127B2 (en) 2004-03-29 2011-08-30 Yamaha Corporation Method of fabricating an integrated circuit having a multi-layer structure with a seal ring
JP2017059785A (en) * 2015-09-18 2017-03-23 サンケン電気株式会社 Semiconductor device

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