JPS6418262A - Depletion mode metal-oxide semiconductor device - Google Patents

Depletion mode metal-oxide semiconductor device

Info

Publication number
JPS6418262A
JPS6418262A JP17514787A JP17514787A JPS6418262A JP S6418262 A JPS6418262 A JP S6418262A JP 17514787 A JP17514787 A JP 17514787A JP 17514787 A JP17514787 A JP 17514787A JP S6418262 A JPS6418262 A JP S6418262A
Authority
JP
Japan
Prior art keywords
layer
depletion mode
semiconductor device
oxide semiconductor
implanted
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP17514787A
Other languages
Japanese (ja)
Inventor
Akira Machida
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sanyo Electric Co Ltd
Original Assignee
Sanyo Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sanyo Electric Co Ltd filed Critical Sanyo Electric Co Ltd
Priority to JP17514787A priority Critical patent/JPS6418262A/en
Publication of JPS6418262A publication Critical patent/JPS6418262A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To suppress an increase in a drain current with the boost of a drain voltage by implanting arsenic in a channel layer to provide a deep ion implantation layer having the same conductivity type as a substrate. CONSTITUTION:After masking the surface of an element formation region 4 wherein a field oxide film 3 and an enhancement type MOS transistor are formed with a resist layer 6, <11>B<+> is ion-implanted in the element formation region 4 of an exposed depletion MOS transistor and a deep ion implantation layer 7 is formed. Then using a mask of the same resist layer 6, <75>As<+> is ion- implanted and a shallow depletion mode N-type channel layer 8 is formed. In this way, an increase in a drain current which takes place in response to a drain voltage can be suppressed.
JP17514787A 1987-07-14 1987-07-14 Depletion mode metal-oxide semiconductor device Pending JPS6418262A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17514787A JPS6418262A (en) 1987-07-14 1987-07-14 Depletion mode metal-oxide semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17514787A JPS6418262A (en) 1987-07-14 1987-07-14 Depletion mode metal-oxide semiconductor device

Publications (1)

Publication Number Publication Date
JPS6418262A true JPS6418262A (en) 1989-01-23

Family

ID=15991098

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17514787A Pending JPS6418262A (en) 1987-07-14 1987-07-14 Depletion mode metal-oxide semiconductor device

Country Status (1)

Country Link
JP (1) JPS6418262A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2371911A1 (en) 2010-03-29 2011-10-05 Fujifilm Corporation Active radiation curable ink composition for inkjet recording, printed matter, method of manufacturing printed matter, molded article of printed matter, and method of manufacturing molded article of printed matter

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5350683A (en) * 1976-10-19 1978-05-09 Mitsubishi Electric Corp Mos type semiconductor device
JPS6089972A (en) * 1983-10-24 1985-05-20 Nec Corp Mis type semiconductor device

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5350683A (en) * 1976-10-19 1978-05-09 Mitsubishi Electric Corp Mos type semiconductor device
JPS6089972A (en) * 1983-10-24 1985-05-20 Nec Corp Mis type semiconductor device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2371911A1 (en) 2010-03-29 2011-10-05 Fujifilm Corporation Active radiation curable ink composition for inkjet recording, printed matter, method of manufacturing printed matter, molded article of printed matter, and method of manufacturing molded article of printed matter

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