JPS6411526A - Sight examination apparatus - Google Patents

Sight examination apparatus

Info

Publication number
JPS6411526A
JPS6411526A JP62167376A JP16737687A JPS6411526A JP S6411526 A JPS6411526 A JP S6411526A JP 62167376 A JP62167376 A JP 62167376A JP 16737687 A JP16737687 A JP 16737687A JP S6411526 A JPS6411526 A JP S6411526A
Authority
JP
Japan
Prior art keywords
sight
examination
mark
display
correct
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP62167376A
Other languages
Japanese (ja)
Inventor
Naoko Fujii
Yuri Ariga
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sharp Corp
Original Assignee
Sharp Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sharp Corp filed Critical Sharp Corp
Priority to JP62167376A priority Critical patent/JPS6411526A/en
Publication of JPS6411526A publication Critical patent/JPS6411526A/en
Pending legal-status Critical Current

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  • Eye Examination Apparatus (AREA)

Abstract

PURPOSE:To examine sight by the remote operation of an examinee himself, by a method wherein a sight examination mark is indicated by a sight operation means to judge whether the signal outputted from a remote operation means is correct and a display means is controlled so as to continue the examination of sight when judgement is correct and the sight is operated when judgement is erroneous to be outputted to an information means. CONSTITUTION:When the sight examination key 2a of a remote operating means 2 is pushed to start the examination of sight, a sight examination mark is displayed on the display means 3 of a sight examination main unit 1. When an operating key 2b is pushed to respond to the sight examination mark, a sight operation means 4 judges whether said mark is correct. When the sight examination mark is correct, the sight operation means 4 erases the sight examination mark during the display on a display examination contracted by one stage as compared with the displayed sight examination mark on said display means 3. When said sight examination mark is erroneous, the sight operation means 4 calculates the size of the sight examination mark during the display on the display means 3 and the distance between the remote operating means 2 and the sight examination main unit 1 to operate sight. The sight calculated by operation is outputted to an information means 5 which in turn informs an examinee of the sight.
JP62167376A 1987-07-03 1987-07-03 Sight examination apparatus Pending JPS6411526A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62167376A JPS6411526A (en) 1987-07-03 1987-07-03 Sight examination apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62167376A JPS6411526A (en) 1987-07-03 1987-07-03 Sight examination apparatus

Publications (1)

Publication Number Publication Date
JPS6411526A true JPS6411526A (en) 1989-01-17

Family

ID=15848567

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62167376A Pending JPS6411526A (en) 1987-07-03 1987-07-03 Sight examination apparatus

Country Status (1)

Country Link
JP (1) JPS6411526A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000262476A (en) * 1999-03-15 2000-09-26 Carl Zeiss Jena Gmbh Lighting system in optometric three-dimensional microscope and method therefor
JP2007268169A (en) * 2006-03-31 2007-10-18 Nidek Co Ltd Automatic optometer
JP2008023129A (en) * 2006-07-21 2008-02-07 Nidek Co Ltd Visual target presentation apparatus

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000262476A (en) * 1999-03-15 2000-09-26 Carl Zeiss Jena Gmbh Lighting system in optometric three-dimensional microscope and method therefor
JP2007268169A (en) * 2006-03-31 2007-10-18 Nidek Co Ltd Automatic optometer
JP2008023129A (en) * 2006-07-21 2008-02-07 Nidek Co Ltd Visual target presentation apparatus

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