JPS6384507U - - Google Patents
Info
- Publication number
- JPS6384507U JPS6384507U JP17919086U JP17919086U JPS6384507U JP S6384507 U JPS6384507 U JP S6384507U JP 17919086 U JP17919086 U JP 17919086U JP 17919086 U JP17919086 U JP 17919086U JP S6384507 U JPS6384507 U JP S6384507U
- Authority
- JP
- Japan
- Prior art keywords
- reference axis
- measured
- axis
- light emitting
- emitting source
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000003287 optical effect Effects 0.000 claims description 2
- 238000001514 detection method Methods 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 6
- 238000005259 measurement Methods 0.000 description 1
Landscapes
- Length Measuring Devices By Optical Means (AREA)
Description
第1図、第2図及び第3図はこの考案のそれぞ
れ第1、第2及び第3の実施例の要部の構成を示
す原理図、第4図は従来提案されている表面三次
元形状測定装置の側面図、第5図は第4図の測定
装置の測定原理の説明に供するための原理図、第
6図は第4図の測定装置で使用される電子回路部
のブロツク図、第7図は第6図の要部の動作波形
図、第8図は第4図の測定装置において検出器の
光軸上の所要な被写界深度の説明に供するための
原理図、第9図は第4図の測定装置で測定したと
き、被測定点からの反射光が被測定体の一部で遮
られて検出できない場合の説明に供するための原
理図である。
Figures 1, 2, and 3 are principle diagrams showing the configuration of the main parts of the first, second, and third embodiments of this invention, respectively, and Figure 4 is a three-dimensional surface shape that has been proposed in the past. 5 is a principle diagram for explaining the measurement principle of the measuring device shown in FIG. 4, and FIG. 6 is a block diagram of the electronic circuit used in the measuring device shown in FIG. 4. Figure 7 is an operational waveform diagram of the main part of Figure 6, Figure 8 is a principle diagram for explaining the required depth of field on the optical axis of the detector in the measuring device of Figure 4, and Figure 9. 4 is a principle diagram for explaining a case where reflected light from a point to be measured cannot be detected because it is blocked by a part of the object to be measured when measuring with the measuring device shown in FIG. 4. FIG.
Claims (1)
、前記基準軸上の複数位置に向けて光波を照射す
る発光源が前記基準軸を軸心とする回転面上に配
設され、 前記被測定体と前記発光源とは前記基準軸の廻
りに相対的に回動可能に取り付けられ、 前記発光源は前記複数位置への光波の照射に対
応して前記回転面上において前記基準軸に対して
ほぼ平行な線上に位置し、 前記被測定体の照射位置からの反射光が検出器
で受光検出され、 この検出器の検出出力に基づいて前記基準軸か
ら前記被測定体表面の照射位置までの距離が測定
され、 前記発光源の光軸は前記基準軸に対し斜めとな
つている表面三次元形状測定装置。[Claims for Utility Model Registration] A light emitting source that irradiates light waves toward a plurality of positions on the reference axis of an object to be measured, which is positioned with the reference axis as the axis, is a rotating surface with the reference axis as the axis. the object to be measured and the light emitting source are mounted so as to be relatively rotatable around the reference axis, and the light emitting source rotates in response to the irradiation of light waves to the plurality of positions. located on a line substantially parallel to the reference axis on the surface, the reflected light from the irradiation position of the object to be measured is received and detected by a detector, and based on the detection output of this detector, from the reference axis to the A three-dimensional surface shape measuring device, wherein a distance to an irradiation position on a surface of a measured object is measured, and an optical axis of the light emitting source is oblique to the reference axis.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP17919086U JPS6384507U (en) | 1986-11-21 | 1986-11-21 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP17919086U JPS6384507U (en) | 1986-11-21 | 1986-11-21 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS6384507U true JPS6384507U (en) | 1988-06-02 |
Family
ID=31122030
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP17919086U Pending JPS6384507U (en) | 1986-11-21 | 1986-11-21 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6384507U (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2008518219A (en) * | 2004-11-02 | 2008-05-29 | シーメンス アクチエンゲゼルシヤフト | Illumination device and light measurement system for detecting an object |
JP2008224631A (en) * | 2007-03-15 | 2008-09-25 | Kawasaki Heavy Ind Ltd | Railroad rail fastening bolt slackness inspection apparatus |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59180413A (en) * | 1983-03-31 | 1984-10-13 | Nok Corp | Surface-defect inspecting method |
JPS6058650A (en) * | 1983-09-12 | 1985-04-04 | Nec Kansai Ltd | Electronic component |
-
1986
- 1986-11-21 JP JP17919086U patent/JPS6384507U/ja active Pending
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59180413A (en) * | 1983-03-31 | 1984-10-13 | Nok Corp | Surface-defect inspecting method |
JPS6058650A (en) * | 1983-09-12 | 1985-04-04 | Nec Kansai Ltd | Electronic component |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2008518219A (en) * | 2004-11-02 | 2008-05-29 | シーメンス アクチエンゲゼルシヤフト | Illumination device and light measurement system for detecting an object |
JP2008224631A (en) * | 2007-03-15 | 2008-09-25 | Kawasaki Heavy Ind Ltd | Railroad rail fastening bolt slackness inspection apparatus |
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