JPS6367815A - Output circuit - Google Patents

Output circuit

Info

Publication number
JPS6367815A
JPS6367815A JP61213161A JP21316186A JPS6367815A JP S6367815 A JPS6367815 A JP S6367815A JP 61213161 A JP61213161 A JP 61213161A JP 21316186 A JP21316186 A JP 21316186A JP S6367815 A JPS6367815 A JP S6367815A
Authority
JP
Japan
Prior art keywords
transistor
potential
output
gate
threshold voltage
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP61213161A
Other languages
Japanese (ja)
Inventor
Takashi Yamanaka
隆 山中
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP61213161A priority Critical patent/JPS6367815A/en
Publication of JPS6367815A publication Critical patent/JPS6367815A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K19/00Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
    • H03K19/003Modifications for increasing the reliability for protection
    • H03K19/00369Modifications for compensating variations of temperature, supply voltage or other physical parameters
    • H03K19/00384Modifications for compensating variations of temperature, supply voltage or other physical parameters in field effect transistor circuits

Landscapes

  • Logic Circuits (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Computing Systems (AREA)
  • General Engineering & Computer Science (AREA)
  • Mathematical Physics (AREA)

Abstract

PURPOSE:To prevent a substrate potential from floating and transistor(TR) characteristics from varying owing to an increase in substrate current by connecting a TR in series of an output TR and connecting its gate to the source through another TR. CONSTITUTION:An enhancement TR 3 is connected in series to the power source side of output TRs 1 and 2. The TRs 1-3 are off at the time of writing, so an output terminal is in a high impedance state. At this time, if the potential at an output terminal Dout drops below the ground potential owing to an external noise and its value is larger than a threshold voltage, the TR 2 turns on and the potential at a contact A drops down to the same potential with the Dont. A TR 4 turns on earlier than the TR 3 because its threshold voltage is lower and its gate voltage is lowered according to the potential at the contact A, so the TR 3 is still off and no current flows from a power source.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明はMO5型トランジスターを用いた半纏〔従来の
技術〕 従来、MOS型トランジスターを用いた半導体装置では
出力回路としては、通常2つのNチャンネル・MOS型
トランジスターを直列に接続してこの両トランジスター
の接点を出力端子に接続していた。第2図に示すように
2つのトランジスター11.12のゲートは出力情報を
増巾するセンス・ア/グ13に接続され情報に応じて高
電位又は低電位を出力端子Doutへ出力する。靜端子
はデータ書き込み時には出力端子を高インピーダンス状
態に保つため、トランジスター14.15を通して、ト
ランジスター31.12のゲートを低電圧にしてこのト
ランジスターをオフにする。
[Detailed Description of the Invention] [Industrial Field of Application] The present invention relates to a semiconductor device using MO5 type transistors [Prior Art] Conventionally, in semiconductor devices using MOS type transistors, output circuits usually have two N-channels. - MOS transistors were connected in series and the contacts of both transistors were connected to the output terminal. As shown in FIG. 2, the gates of the two transistors 11 and 12 are connected to a sense amplifier 13 that amplifies the output information, and outputs either a high potential or a low potential to the output terminal Dout depending on the information. In order to keep the output terminal in a high impedance state during data writing, the silent terminal applies a low voltage to the gate of transistor 31.12 through transistor 14.15, turning this transistor off.

〔発明が解決しようとする問題点〕[Problem that the invention seeks to solve]

上述した従来の出力回路1言、高インピーダンス状態時
に出力端子が接地電位以下になると種々の不良を引き起
こしている。高インピーダンス状態ではトランジスター
12のゲートは接地電位である。ドレインには電源電圧
が印力Dσれているが、Ov以上ではこのトランジスタ
ーに電流が流れない。Dou を端子がマイナスになり
、しきい値電圧よりも低くなるとトランジスターがオン
して電流が流れ始める。この時ソース−ドレイン間の電
圧は電源電圧グラスしきい値電圧以上となり、大規模集
積回路で用いられているショート−チャンネル、トラン
ジスターの場合、基板電流が大巾に増加する程に高電圧
となる。この基板電流は基板電位発生回路を用いた装置
の場合は、基板電位発生回路の能力以上の電流となり基
板電位が上昇して装置全体の正電動作の妨げとなる。又
、この基板電流はMOS型トランジスター回路中に存在
する寄生バイポーラ−回路のペース電流として作用し、
異常電流の発生源となる場合もある。更に基板電流の増
大はホット・エレクトロンのゲート絶縁膜中へのトラ、
グ確率の増大をも意味する。ホット・エレクトロンのト
ラ、グにより出力トランジスターの特性が変化して装置
の信頼性へも影響を与える。
In short, the conventional output circuit described above causes various defects when the output terminal becomes lower than the ground potential in a high impedance state. In the high impedance state, the gate of transistor 12 is at ground potential. A power supply voltage Dσ is applied to the drain, but no current flows through this transistor above Ov. When the Dou terminal becomes negative and becomes lower than the threshold voltage, the transistor turns on and current begins to flow. At this time, the voltage between the source and drain exceeds the power supply voltage glass threshold voltage, and in the case of short-channel transistors used in large-scale integrated circuits, the voltage becomes so high that the substrate current increases significantly. . In the case of a device using a substrate potential generation circuit, this substrate current exceeds the capability of the substrate potential generation circuit, causing the substrate potential to rise and hindering the positive current operation of the entire device. In addition, this substrate current acts as a pace current for the parasitic bipolar circuit existing in the MOS transistor circuit,
It may also become a source of abnormal current. Furthermore, the increase in substrate current causes hot electrons to enter the gate insulating film.
It also means an increase in the probability of failure. The characteristics of the output transistor change due to hot electron flux, which also affects the reliability of the device.

〔問題点を暦法するための手段〕[Means for calculating problems]

本発明の出力回路は、2つの出力トランジスターの電源
側に新らたな第1のトランジスターを直列に有し、この
トランジスターのゲートに第2のトランジスタのドレイ
7を接続し、そのゲートは接地電位とし、又、ソースは
第1のトランジスタのソースと接続した構成を有してお
り、第2のトランジスターのしきい値電圧が第2のトラ
ンジスターのしきい値電圧よりも低い事を特徴としてい
る0 〔実施例〕 次に、本発明について図面を参照して説明する0第1図
は本発明の一実施例の回路図である0ことで出力トラン
ジスター1.2の電源側にエノハンスメント・トランジ
スター3を直列に接続する0このゲート(マ]のインバ
ーター回路6の信号で動作するインバーター回路7に接
続されており、トランジスター1.2と同様に書き込み
時にはオフする。読み出し時はトランジスター1.2の
ゲートをオフしていたトランジスター8.8′がオフす
る為、センス・アンプ5の出力信号に従ってトランジス
ター1.2はオン、オフを行う0この時トランジスター
3はWEの信号によシ定常的にオンとなっている事から
出力端子Dou tには内部データに従って高1位又は
低電位が出力される。
The output circuit of the present invention has a new first transistor in series on the power supply side of the two output transistors, and the drain 7 of the second transistor is connected to the gate of this transistor, and the gate is connected to the ground potential. The source is connected to the source of the first transistor, and the threshold voltage of the second transistor is lower than the threshold voltage of the second transistor. [Embodiment] Next, the present invention will be explained with reference to the drawings. Fig. 1 is a circuit diagram of an embodiment of the present invention. 3 is connected in series to the inverter circuit 7 that operates with the signal from the inverter circuit 6 of this gate (Ma), and is turned off during writing like the transistor 1.2.When reading, the transistor 1.2 is turned off. Transistor 8.8', whose gate was turned off, turns off, so transistor 1.2 turns on and off according to the output signal of sense amplifier 5. At this time, transistor 3 is constantly turned on according to the WE signal. Therefore, a high potential or a low potential is output to the output terminal Dout according to the internal data.

書き込み時にはトランジスター1.2.3+’:オフし
ているので出力端子は高インピーダンス状態になってい
る。この時外部からのノイズにより出力端子Doutが
接地電位以下に下がり、その値がしきい値電圧以上であ
るとトランジスター2はオンして接点AがDoutと同
位になるまで下がる。
During writing, transistors 1, 2, and 3+' are off, so the output terminal is in a high impedance state. At this time, the output terminal Dout falls below the ground potential due to external noise, and if that value is above the threshold voltage, the transistor 2 is turned on and the voltage falls until the contact A becomes at the same level as Dout.

接点Aがトランジスター3のしきい値電圧値以上にOV
より下がるとこのゲート電圧がOvのままだとトランジ
スター3はオンをして電源より[流が流れて上記した、
種々の不良を引き起こしてしマウ。今、トラノンスター
4はトランジスター3よシもしきい値電圧が低いのでト
ランジスター3が先にオンをしてそのゲート電圧を接点
への電位に従って下げるのでトランジスター3はオフし
たままであり、電源からの電流は流れない。
Contact A is OV above the threshold voltage value of transistor 3
If the gate voltage is lower than Ov, transistor 3 will turn on and the current will flow from the power supply, as described above.
It causes various defects. Now, since the threshold voltage of Tranon Star 4 is lower than that of transistor 3, transistor 3 turns on first and lowers its gate voltage according to the potential to the contact, so transistor 3 remains off, and the voltage from the power supply is lowered. No current flows.

〔発明の効果〕〔Effect of the invention〕

以上説明したように本発明は、出力トランジスターに直
列にトランジスターをつなぎ、そのゲートヲ他のトラン
ジスターを介してソースと接続することで、基板電流を
減らす事ができる0出力端子が高インピーダンス時に接
地電位以下になってもトランジスター4の働きでトラン
ジスター3はオフしたままであり、電源以上の電圧がか
かったトランジスターのオンを防いで、基板電流の増加
を無くす事ができる0従って基板電流の増加に起因する
基板電位の浮きや、寄生バイポーラ効果及びホットエレ
クトロンのトラ、グによるトランジスター特性の変動を
防ぐことができる0
As explained above, the present invention is capable of reducing substrate current by connecting a transistor in series with an output transistor and connecting its gate to the source through another transistor. Even if the voltage is increased, transistor 3 remains off due to the action of transistor 4, which prevents the transistor with a voltage higher than the power supply from turning on, and eliminates the increase in substrate current. It can prevent fluctuations in transistor characteristics due to fluctuations in substrate potential, parasitic bipolar effects, and hot electron turbulence.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の出力回路の回路図であり、第2図は従
来の回路図である。 ここで1.2,3,4,8.8’、11.12゜14.
14’・・・・・・MOS型トランジスター、5゜13
・・・・・・センス・アン7’、6,7.15・・・・
・・インバーターである。 矛←禰人 −卯↓  由 百   1′扉た〉、茅 2
 回
FIG. 1 is a circuit diagram of an output circuit according to the present invention, and FIG. 2 is a conventional circuit diagram. Here 1.2, 3, 4, 8.8', 11.12°14.
14'...MOS type transistor, 5゜13
...Sense Anne 7', 6, 7.15...
...It is an inverter. Spear←Nehito - Rabbit↓ Yu Hyaku 1'Doorta〉, Kaya 2
times

Claims (1)

【特許請求の範囲】[Claims] MOS型トランジスターを用いた半導体装置において、
2つの出力トランジスターの電源側に直列に第1のトラ
ンジスターを設け、該トランジスターのゲートに第2の
トランジスタのソースを接続し、該第2のトランジスタ
ーのゲートは接地し更にドレインを該第1のトランジス
ターのドレインと接続した構成で、第2のトランジスタ
ーのしきい値電圧が第1のトランジスターのしきい値よ
り低い事を特徴とする出力回路。
In semiconductor devices using MOS transistors,
A first transistor is provided in series on the power supply side of the two output transistors, the source of the second transistor is connected to the gate of the transistor, the gate of the second transistor is grounded, and the drain is connected to the first transistor. An output circuit characterized in that the threshold voltage of the second transistor is lower than the threshold voltage of the first transistor.
JP61213161A 1986-09-09 1986-09-09 Output circuit Pending JPS6367815A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP61213161A JPS6367815A (en) 1986-09-09 1986-09-09 Output circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP61213161A JPS6367815A (en) 1986-09-09 1986-09-09 Output circuit

Publications (1)

Publication Number Publication Date
JPS6367815A true JPS6367815A (en) 1988-03-26

Family

ID=16634575

Family Applications (1)

Application Number Title Priority Date Filing Date
JP61213161A Pending JPS6367815A (en) 1986-09-09 1986-09-09 Output circuit

Country Status (1)

Country Link
JP (1) JPS6367815A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0714545A1 (en) * 1994-06-01 1996-06-05 Micron Technology, Inc. Improved data output buffer

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0714545A1 (en) * 1994-06-01 1996-06-05 Micron Technology, Inc. Improved data output buffer
EP0714545A4 (en) * 1994-06-01 1997-02-26 Micron Technology Inc Improved data output buffer
US6072728A (en) * 1994-06-01 2000-06-06 Micron Technology, Inc. Data output buffer
US6351421B1 (en) 1994-06-01 2002-02-26 Micron Technology, Inc. Data output buffer

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