JPS6352694B2 - - Google Patents

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Publication number
JPS6352694B2
JPS6352694B2 JP57042584A JP4258482A JPS6352694B2 JP S6352694 B2 JPS6352694 B2 JP S6352694B2 JP 57042584 A JP57042584 A JP 57042584A JP 4258482 A JP4258482 A JP 4258482A JP S6352694 B2 JPS6352694 B2 JP S6352694B2
Authority
JP
Japan
Prior art keywords
polarization
optical
optical fiber
light
maintaining
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP57042584A
Other languages
Japanese (ja)
Other versions
JPS58160848A (en
Inventor
Kyobumi Mochizuki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
KDDI Corp
Original Assignee
Kokusai Denshin Denwa KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kokusai Denshin Denwa KK filed Critical Kokusai Denshin Denwa KK
Priority to JP57042584A priority Critical patent/JPS58160848A/en
Priority to GB8307262A priority patent/GB2117132B/en
Publication of JPS58160848A publication Critical patent/JPS58160848A/en
Publication of JPS6352694B2 publication Critical patent/JPS6352694B2/ja
Granted legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
    • G01J9/02—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
    • G01N21/45—Refractivity; Phase-affecting properties, e.g. optical path length using interferometric methods; using Schlieren methods
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02015—Interferometers characterised by the beam path configuration
    • G01B9/02024—Measuring in transmission, i.e. light traverses the object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
    • G01J9/02—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods
    • G01J2009/0226—Fibres

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  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Health & Medical Sciences (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)
  • Measuring Temperature Or Quantity Of Heat (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

An interferometer, characterized by a polarization-maintaining optical fiber (312) for transmitting incident light while preserving planes of polarization in two perpendicularly crossing principal axes, a constant temperature bath (311) for maintaining the polarization- maintaining optical fiber at an arbitrary temperature, and combining means (313) for receiving light emitted from the polarization- maintaining optical fiber to combine components along the two perpendicularly crossing principal axes. An optical path difference is introduced between the 2 polarization states by passage through the fibre, which is proportional to the temp. of the fibre, and therefore the 2 states can be considered to follow 2 independent optical paths, the difference between which can be varied by changing the temp. of the bath. <IMAGE>

Description

【発明の詳細な説明】 本発明は光干渉計に関するものである。[Detailed description of the invention] The present invention relates to an optical interferometer.

従来光干渉計としては第１図に示すようなもの
が用いられていた。図の干渉計は通常マツハ・ツ
エンダ・干渉計と呼ばれているものである。図に
おいて、光波１１はビーム・スプリツタ１２によ
つて２分岐され、光波１３と光波１４とに別れ
る。これらの２光波はミラ１５及び光遅延路１
９、ミラ１６で折り返され、再びビーム・スプリ
ツタ１７で合成されて合成波１８となる。この干
渉計において、一方を試験光路、他方を参照光路
とする。この場合、光遅延路１９の遅延時間の調
整は機械的に行なうため、高精度の測定は不可能
であつた。 Conventionally, an optical interferometer as shown in FIG. 1 has been used. The interferometer shown in the figure is commonly called a Matsuha-Zenda interferometer. In the figure, a light wave 11 is split into two by a beam splitter 12 and separated into a light wave 13 and a light wave 14. These two light waves are connected to mirror 15 and optical delay path 1.
9, is turned back by the mirror 16 and combined again by the beam splitter 17 to become a composite wave 18. In this interferometer, one side is used as a test optical path and the other side is used as a reference optical path. In this case, since the delay time of the optical delay path 19 is mechanically adjusted, highly accurate measurement is not possible.

本発明は、光フアイバを用いてその光フアイバ
の雰囲気温度を変えることによつて２光波の光路
長を高精度に変えることのできる光干渉計を提供
するものである。 The present invention provides an optical interferometer that can change the optical path length of two light waves with high precision by using an optical fiber and changing the ambient temperature of the optical fiber.

以下図面を用いて本発明を詳細に説明する。 The present invention will be explained in detail below using the drawings.

第２図に本発明の基本構成を示す。図におい
て、偏光子２１によつて直線偏光にされた光波２
２は、半波長板２３によつて直線偏光の状態で、
直交する２つの光軸において偏波面を保存して光
を伝送する偏波面保存光フアイバ２９の直交する
２つの光軸２５，２６の中間に位置するように回
転される。偏波面保存光フアイバ２９は２つの直
交する直線偏光波２７，２８が互いにモード結合
することなく独立に伝搬するように作られた光フ
アイバであり、光軸２５及び光軸２６を独立した
２つの光路として１本の光フアイバで作つている
と考えることができる。半波長板２３によつて２
つの光軸２５，２６の中間に入るように回転され
た光波２４は、偏波面保存光フアイバ２９に入る
と光波２７及び光波２８に別れそれぞれ独立に伝
搬する。出力側では、検光子２１０によつて光波
２７及び光波２８の１部が合成され光波２１１と
なる。 FIG. 2 shows the basic configuration of the present invention. In the figure, a light wave 2 is made linearly polarized by a polarizer 21.
2 is linearly polarized by the half-wave plate 23,
The polarization-maintaining optical fiber 29 transmits light while maintaining the polarization plane on two orthogonal optical axes, and is rotated so as to be located between two orthogonal optical axes 25 and 26. The polarization maintaining optical fiber 29 is an optical fiber made so that two orthogonal linearly polarized waves 27 and 28 propagate independently without mode coupling with each other, and the optical axis 25 and the optical axis 26 are connected to two independent optical fibers. It can be considered that the optical path is made of a single optical fiber. 2 by the half-wave plate 23
The light wave 24 rotated so as to fall between the two optical axes 25 and 26 enters the polarization maintaining optical fiber 29 and is separated into a light wave 27 and a light wave 28, each of which propagates independently. On the output side, a portion of the light wave 27 and the light wave 28 are combined by the analyzer 210 to form a light wave 211 .

一方、偏波面保存光フアイバ２９の直交する２
つの光軸の屈折率は互いに異なるため、２つの光
波２７，２８は、互いに異なる速度で伝搬するこ
とになる。このため、偏波面保存光フアイバ２９
の出力側では光波２７と光波２８との間に位相差
が生じる。この位相差は次式で与えられる。 On the other hand, two orthogonal polarization maintaining optical fibers 29
Since the refractive indices of the two optical axes are different from each other, the two light waves 27 and 28 propagate at different speeds. For this reason, the polarization maintaining optical fiber 29
A phase difference occurs between the light waves 27 and 28 on the output side. This phase difference is given by the following equation.

＝2π／λ・Ｌ・Cp・ａ・（T0−Ｔ） (1) ここで、λは光波２４の波長、Ｌは偏波面保存
光フアイバ２９の長さ、Cpは偏波面光フアイバ
２９の光弾性定数、ａは偏波面保存光フアイバ２
９のヤング率とポアソン比及び熱膨張係数に関係
する比例係数、T0はドーパントを含むシリカガ
ラスの軟化温度で約1000℃、また、Ｔは偏波面保
存光フアイバ２９の置かれている雰囲気温度であ
る。(1)式より、光波２７と光波２８との位相差
は温度変化と線型の関係にあることが分る。この
ことは、温度変化が第１図における干渉計の光遅
延路１９の動きに相当することを意味している。
第１図におけるビーム・スプリツタ１２及びビー
ム・スプリツタ１７は第２図においては、偏波面
保存光フアイバ２９の入力側端面２１２及び検光
子２１０に対応している。ここで偏波面保存光フ
アイバ２９を任意の温度に設定可能な恒温槽に収
納する。偏波面保存光フアイバの雰囲気温度変化
に対する検光子の出力変化の実測結果の１例を第
５図に示す。温度変化に対して光出力が正弦波状
に変化している様子が分かる。なお、破線は偏波
面保存光フアイバの長さＬが短かい場合における
検光子の出力変化である。 =2π/λ・L・Cp・a・(T 0 −T) (1) Here, λ is the wavelength of the light wave 24, L is the length of the polarization-maintaining optical fiber 29, and Cp is the length of the polarization-maintaining optical fiber 29. Photoelastic constant, a is polarization maintaining optical fiber 2
9, a proportionality coefficient related to Young's modulus, Poisson's ratio, and thermal expansion coefficient, T 0 is the softening temperature of silica glass containing a dopant, which is approximately 1000°C, and T is the ambient temperature in which the polarization preserving optical fiber 29 is placed. It is. From equation (1), it can be seen that the phase difference between the light waves 27 and 28 has a linear relationship with the temperature change. This means that the temperature change corresponds to the movement of the optical delay path 19 of the interferometer in FIG.
The beam splitter 12 and beam splitter 17 in FIG. 1 correspond to the input end face 212 of the polarization-maintaining optical fiber 29 and the analyzer 210 in FIG. Here, the polarization preserving optical fiber 29 is housed in a constant temperature bath that can be set to any temperature. FIG. 5 shows an example of actual measurement results of changes in the output of the analyzer with respect to changes in the ambient temperature of the polarization preserving optical fiber. It can be seen that the optical output changes sinusoidally in response to temperature changes. Note that the broken line shows the change in the output of the analyzer when the length L of the polarization-maintaining optical fiber is short.

本発明の実施例を第３図に示した。図におい
て、光波３１はビーム・スプリツタ３２によつて
２分岐され、光波３３、光波３４に別れる。この
２光波は各々が直線偏光波であるときは半波長板
によりそうでないときは偏光子３５，３６および
半波長板３８，３９によつて互いに直交する直線
偏光波になり、ビーム・スプリツタ３７によつて
再び合成される。直交した２光波の合成波３１６
は半波長板３１０によつて偏波面保存光フアイバ
３１２の直交する２軸に合せられ、偏波面保存光
フアイバ３１２を伝搬する。直交した２光波は、
検光子３１３により検光子３１３の軸方向成分だ
けが出力される。この干渉計の遅延路としては、
先に述べたように偏波面保存光フアイバ３１２の
温度を設定温度可変の恒温槽３１１の雰囲気温度
を変えることで作られる。この変化量は、偏波面
保存光フアイバの単位長さ、単位温度変化あたり
光波３１がHe―Neレーザ（波長0.6328μｍ）の
場合0.1μｍ／℃・ｍ以下にすることは容易で連続
的に変化することができる。 An embodiment of the invention is shown in FIG. In the figure, a light wave 31 is split into two by a beam splitter 32 and separated into a light wave 33 and a light wave 34. When these two light waves are linearly polarized waves, they are turned into mutually orthogonal linearly polarized waves by a half-wave plate; otherwise, they are turned into mutually orthogonal linearly polarized waves by polarizers 35 and 36 and half-wave plates 38 and 39, and then sent to a beam splitter 37. It is then synthesized again. Combined wave 316 of two orthogonal light waves
is aligned with two orthogonal axes of the polarization-maintaining optical fiber 312 by the half-wave plate 310, and propagates through the polarization-maintaining optical fiber 312. Two orthogonal light waves are
The analyzer 313 outputs only the axial component of the analyzer 313. The delay path of this interferometer is
As mentioned above, the temperature of the polarization preserving optical fiber 312 is made by changing the ambient temperature of the constant temperature bath 311 whose set temperature is variable. If the light wave 31 is a He-Ne laser (wavelength 0.6328 μm), this amount of change can be easily reduced to less than 0.1 μm/℃・m per unit length and unit temperature change of the polarization-maintaining optical fiber, and it changes continuously. can do.

以上の説明においては、偏波面保存光フアイバ
とマツハ・ツエンダ・干渉計との組合せのものに
ついてのみあつかつたが、その他の干渉計と偏波
面保存光フアイバとを組合せ、上述したものと同
様な干渉計を作ることが可能である。この干渉計
において、一方を試験光路、他方を参照光路とし
て用いれば、物質の屈折率測定または光源の可干
渉度の測定等を高精度に測定することができる。
物質の屈折率測定の場合には、例えば、第３図に
おいて、光波３３が伝搬する光路（ビーム・スプ
リツタ３２―半波長板３８―偏光子３５―ビー
ム・スプリツタ３７間）内に屈折率を測定すべき
物質を配置して、試験光路とし、光波３４が伝搬
する光路（ビーム・スプリツタ３２―偏光子３６
―半波長板３９―ビーム・スプリツタ３７間）内
に屈折率が既知の物質（又は空間）を配置して参
照光路とすると、物質の屈折率ｎによつて伝搬速
度（ｖ＝ｃ／ｎ，但しｃは真空中における光速）
が異なるので伝搬速度ｖの差（位相差）から、屈
折率を得ることができる。また、光源の可干渉度
の測定の際には、第３図の恒温槽３１１の温度を
変え、受光器３１４からの出力の最大値（Inax）
と最小値（Inio）とから、次式によつて求められ
る。 In the above explanation, only the combination of a polarization-maintaining optical fiber and a Matsuha-Zehnder interferometer has been discussed, but other interferometers and polarization-maintaining optical fibers can be combined to be used in combinations similar to those described above. It is possible to make an interferometer. In this interferometer, if one side is used as a test optical path and the other as a reference optical path, it is possible to measure the refractive index of a substance or the coherence of a light source with high precision.
In the case of measuring the refractive index of a substance, for example, in FIG. 3, the refractive index is measured within the optical path in which the light wave 33 propagates (between the beam splitter 32 - half-wave plate 38 - polarizer 35 - beam splitter 37). The material to be tested is arranged as a test optical path, and the optical path along which the light wave 34 propagates (beam splitter 32 - polarizer 36
If a material (or space) with a known refractive index is placed in the space (between the half-wave plate 39 and the beam splitter 37) as a reference optical path, the propagation velocity (v=c/n, However, c is the speed of light in vacuum)
Since they are different, the refractive index can be obtained from the difference in propagation velocity v (phase difference). In addition, when measuring the coherence of the light source, the temperature of the thermostatic chamber 311 shown in FIG .
and the minimum value (I nio ), using the following equation.

可干渉度＝Inax−Inio／Inax＋Inio ……(2) なお、位相差の測定方法として、受光器３１４
を用いて可干渉度変化から求める方法や、受光器
３１４の代りにスクリーンを置き干渉縞の変位量
から求める方法等がある。 Coherence = I nax - I nio / I nax + I nio ... (2) As a method of measuring the phase difference, the optical receiver 314
There is a method of determining from the change in coherence using the method, a method of placing a screen in place of the light receiver 314 and determining from the amount of displacement of interference fringes, etc.

第３図においてビーム・スプリツタ３２からビ
ーム・スプリツタ３７の間で構成される干渉計の
一部は第４図のように構成することも可能であ
る。第４図において、４１及び４２は偏光子及び
半波長板、または、偏光子及び1/4波長板の組合
せで、前者の場合には半波長板４２の出力光は偏
光ビーム・スプリツタ４３の光軸に対して45゜傾
くように調整され、後者の場合には、1/4波長板
４２の出力は円偏光に調整される。４４，４５は
ミラであり、４６は偏光ビーム・スプリツタであ
る。 A part of the interferometer constructed between beam splitter 32 and beam splitter 37 in FIG. 3 can also be constructed as shown in FIG. 4. In FIG. 4, 41 and 42 are a combination of a polarizer and a half-wave plate, or a polarizer and a quarter-wave plate; in the former case, the output light of the half-wave plate 42 is the light of the polarizing beam splitter 43. In the latter case, the output of the quarter-wave plate 42 is adjusted to be circularly polarized. 44 and 45 are mirrors, and 46 is a polarizing beam splitter.

以上のように、本発明は偏波面保存光フアイバ
の直交する２つの伝送路を干渉計の２つの光路ま
たは光路の１部として用い、この２つの光路長差
が温度によつて高精度に変えられることを利用し
たもので、高精度に動く光遅延路を有する光フア
イバ干渉計を実現するものである。 As described above, the present invention uses two orthogonal transmission paths of a polarization-maintaining optical fiber as two optical paths or a part of an optical path of an interferometer, and changes the length difference between the two optical paths with high precision depending on the temperature. The purpose is to realize an optical fiber interferometer with an optical delay path that moves with high precision.

【図面の簡単な説明】[Brief explanation of the drawing]

第１図は従来の光干渉計の１例を示す構成系統
図、第２図は本発明の基本的構成を示す斜視図、
第３図は本発明の実施例を示す構成系統図、第４
図は第３図の実施例の一部変形例を示す構成系統
図、第５図は本発明に用いる偏波面保存光フアイ
バの雰囲気温度変化に対する検光子の出力変化を
示す特性例図である。 １１，１３，１４…光波、１２，１７…ビー
ム・スプリツタ、１５，１６…ミラ、１８…合成
波、１９…光遅延路、２１…偏光子、２２，２
４，２７，２８…光波、２３…半波長板、２５，
２６…光軸、２９…偏波面保存光フアイバ、２１
０…検光子、２１１…光波、２１２…入力側端
面、３１，３３，３４…光波、３２，３７…ビー
ム・スプリツタ、３５，３６…偏光子、３８，３
９，３１０…半波長板、３１１…恒温槽、３１２
…偏波面保存光フアイバ、３１３…検光子、３１
４…受光器、３１６…合成波、４１…偏光子、４
２…半波長板又は1/4波長板、４３…偏光ビー
ム・スプリツタ、４４，４５…ミラ、４６…ビー
ム・スプリツタ。 FIG. 1 is a structural diagram showing an example of a conventional optical interferometer, and FIG. 2 is a perspective view showing the basic structure of the present invention.
Fig. 3 is a configuration system diagram showing an embodiment of the present invention;
This figure is a structural diagram showing a partial modification of the embodiment shown in FIG. 3, and FIG. 5 is a characteristic diagram showing changes in the output of the analyzer with respect to changes in the ambient temperature of the polarization-maintaining optical fiber used in the present invention. 11, 13, 14... Light wave, 12, 17... Beam splitter, 15, 16... Mira, 18... Combined wave, 19... Optical delay path, 21... Polarizer, 22, 2
4, 27, 28...light wave, 23...half wave plate, 25,
26... Optical axis, 29... Polarization maintaining optical fiber, 21
0... Analyzer, 211... Light wave, 212... Input side end face, 31, 33, 34... Light wave, 32, 37... Beam splitter, 35, 36... Polarizer, 38, 3
9,310...Half-wave plate, 311...Thermostat, 312
...Polarization preserving optical fiber, 313...Analyzer, 31
4... Light receiver, 316... Combined wave, 41... Polarizer, 4
2... Half-wave plate or quarter-wave plate, 43... Polarizing beam splitter, 44, 45... Mira, 46... Beam splitter.

Claims (1)

【特許請求の範囲】[Claims] １ 互いに直交する２つの光軸において偏波面を
保存して入射光を伝送する偏波面保存光フアイバ
と、該偏波面保存光フアイバを任意所望の温度に
保つ恒温槽と、前記偏波面保存光フアイバの出射
光を入射して前記直交する２つの光軸に沿う成分
を合成する合成手段とを備え、前記直交する２つ
の光軸を２つの独立した光路とし前記恒温槽内の
雰囲気温度変化により前記光路間の光路長差を変
えるように構成されたことを特徴とする光干渉
計。1. A polarization-preserving optical fiber that transmits incident light while preserving the polarization plane on two mutually orthogonal optical axes, a constant temperature chamber that maintains the polarization-preserving optical fiber at any desired temperature, and the polarization-preserving optical fiber. and a synthesizing means for inputting the emitted light and synthesizing the components along the two orthogonal optical axes, the two orthogonal optical axes being made into two independent optical paths, and the two orthogonal optical axes being made into two independent optical paths, An optical interferometer characterized by being configured to change the optical path length difference between optical paths.
JP57042584A 1982-03-19 1982-03-19 Photointerferometer Granted JPS58160848A (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP57042584A JPS58160848A (en) 1982-03-19 1982-03-19 Photointerferometer
GB8307262A GB2117132B (en) 1982-03-19 1983-03-16 Interferometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57042584A JPS58160848A (en) 1982-03-19 1982-03-19 Photointerferometer

Publications (2)

Publication Number Publication Date
JPS58160848A JPS58160848A (en) 1983-09-24
JPS6352694B2 true JPS6352694B2 (en) 1988-10-19

Family

ID=12640111

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57042584A Granted JPS58160848A (en) 1982-03-19 1982-03-19 Photointerferometer

Country Status (2)

Country Link
JP (1) JPS58160848A (en)
GB (1) GB2117132B (en)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3578211D1 (en) * 1984-06-30 1990-07-19 Kent Scient Ind Projects INTERFEROMETRIC SENSOR.
US4852106A (en) * 1987-02-19 1989-07-25 Brother Kogyo Kabushiki Kaisha Optical system for producing controlled beat frequency
JP2507790B2 (en) * 1988-12-20 1996-06-19 富士通株式会社 Semiconductor laser FM modulation characteristic measuring device
JP2802390B2 (en) * 1989-06-02 1998-09-24 日本電信電話株式会社 Optical frequency modulation characteristics measurement device
JPH0359428A (en) * 1989-07-28 1991-03-14 Fujitsu Ltd Method and device for measuring frequency modulation characteristic of semiconductor laser
FR2697336B1 (en) * 1992-10-28 1994-12-16 Inst Francais Du Petrole Method and device for differential measurement of refractive indices and associated use.
DE102005041491A1 (en) * 2005-09-01 2007-03-08 Robert Bosch Gmbh Interferometric measuring device
KR101358091B1 (en) * 2012-01-11 2014-02-06 주식회사 고영테크놀러지 An Interferometer using asymmetric polarization and Optical Apparatus using the Interferometer
CN104330162A (en) * 2014-11-17 2015-02-04 中国科学院光电研究院 Portable Fourier transformation spectrograph

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1175855A (en) * 1966-08-25 1970-01-01 American Optical Corp Improvements in or relating to information processors

Also Published As

Publication number Publication date
GB2117132A (en) 1983-10-05
JPS58160848A (en) 1983-09-24
GB8307262D0 (en) 1983-04-20
GB2117132B (en) 1986-01-22

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