JPS63314837A - Semiconductor manufacturing equipment - Google Patents

Semiconductor manufacturing equipment

Info

Publication number
JPS63314837A
JPS63314837A JP15172387A JP15172387A JPS63314837A JP S63314837 A JPS63314837 A JP S63314837A JP 15172387 A JP15172387 A JP 15172387A JP 15172387 A JP15172387 A JP 15172387A JP S63314837 A JPS63314837 A JP S63314837A
Authority
JP
Japan
Prior art keywords
equipment
wire bonding
die
wire
die bonding
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP15172387A
Other languages
Japanese (ja)
Inventor
Masahisa Ogura
正久 小倉
Haruo Yoshida
吉田 治男
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP15172387A priority Critical patent/JPS63314837A/en
Priority to US07/207,623 priority patent/US4987673A/en
Publication of JPS63314837A publication Critical patent/JPS63314837A/en
Pending legal-status Critical Current

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  • Die Bonding (AREA)

Abstract

PURPOSE:To enable the through assembling of a semiconductor applying a small equipment, by linking and unifying a die bonding equipment, a wire bonding equipment and a molding equipment, and covering a die bonding part and a wire bonding part with a cleaning equipment. CONSTITUTION:A die bonding unit 2 and a wire bonding unit 3 are isolated from the external atmosphere by a trestle 1, a cleaning equipment 4 and a cover 5. The cleaning equipment 4 sucks the external air, and blows the clean air 10 through a filter against the die bonding unit 2 and the wire bonding unit 3. The air in the inside separated by the cover 6 is discharged outward from a vent of the cover 5. Therefore, the die bonding unit 2 and the wire bonding unit 3 are always kept in a clear air atmosphere, and not affected by dust and the like output from a molding equipment 7. At the time of die bonding and wire bonding, the contamination and damage of a chip surface can be avoided. A through assembling of semiconductor applying a small equip ment is enabled, thereby.

Description

【発明の詳細な説明】 〔l業上の利用分野〕 この発明は、半導体の製造に使用する半導体製造装置に
関するものである。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a semiconductor manufacturing apparatus used for manufacturing semiconductors.

[従来の技術] 第2図は従来の半導体製造に於ける、−貫組立ライン装
置の斜視図であり、図中、(12はダイボンダ、日はバ
ッファ1,14)はワイヤボンダ、uSはバッファ2.
116)はモールドプレスであり各々単体装置をバッフ
ァ131Bを介して連結している。又、モールドプレス
ullilは、ワーク搬送部を除き、バッファ20Sと
の間を壁σηで支切られている。
[Prior Art] Fig. 2 is a perspective view of a through assembly line device in conventional semiconductor manufacturing. ..
Reference numeral 116) denotes a mold press, and each unit is connected to each other via a buffer 131B. In addition, the mold press ulil is separated from the buffer 20S by a wall ση, except for the workpiece conveyance section.

次に動作について説明する。ワークをダイボンダq2に
投入すると−ダイボンダ(2)でダイボンドされたワー
クは、バッファ1113を通してワイヤボンダ[14)
に送られワイヤボンドされる。ワイヤボンド後のワーク
は更にバッファ2115)を通して、モールドプレス(
1eに搬送されて樹脂モールドされる。装置間のバッフ
ァ1 (13,2(2)はダイボンダ(12或いはワイ
ヤボンダUΦの処理時間の変化に対応してワークを一時
待期させることができる。又、ダイボンダ@、ワイヤボ
ンダuaは、チップ表面への粉塵、異物の付着を防止す
る為クリーンルーム内に設置し、モールド時に発塵する
モールドプレスは、クリーンルームと別室に設置してい
る。
Next, the operation will be explained. When the workpiece is put into the die bonder q2, the workpiece die-bonded by the die bonder (2) is transferred to the wire bonder [14] through the buffer 1113.
and wire bonded. The workpiece after wire bonding is further passed through the buffer 2115) and mold press (2115).
It is transported to 1e and molded with resin. The buffer 1 (13, 2 (2) between the devices can temporarily hold the workpiece in response to changes in the processing time of the die bonder (12 or wire bonder UΦ). In addition, the die bonder @ and wire bonder ua can The mold press, which generates dust during molding, is installed in a separate room from the clean room.

〔発明が解決しようとする問題点] 従来の半導体製造装置は、以上のように構成されており
、装置か大形である上に、設置場所のクリーン化や、モ
ールド装置部と他の装置との仕切り等−付帯設備に多額
の費用を要するなどの問題点があった。
[Problems to be Solved by the Invention] Conventional semiconductor manufacturing equipment is configured as described above, and in addition to being large, it is necessary to keep the installation location clean and to connect the molding equipment section with other equipment. There were problems such as the large amount of expense required for the partitions and other ancillary equipment.

この発明は、上記のような問題点を解消する為に、製造
装置自体にクリーンシステムを備え、設置場所を選ばな
い半導体製造装置を得ることを目的とする。
In order to solve the above-mentioned problems, the present invention aims to provide a semiconductor manufacturing apparatus which is equipped with a clean system and can be installed anywhere.

〔問題点を解決するための手段〕[Means for solving problems]

この発明に係る半導体製造装置は、ダイボンダ部とワイ
ヤボンダ部をクリーン装置で包み、各ダイボンダ装置と
ワイヤボンダ装置をモールド装置と連結したものである
In the semiconductor manufacturing apparatus according to the present invention, a die bonder section and a wire bonder section are wrapped in a clean device, and each die bonder device and wire bonder device are connected to a molding device.

〔作用〕[Effect]

この発明に於ける半導体製造装置は、クリーンシステム
を備えることにより、周囲の塵埃を含む外気からダイボ
ンダワイヤボンダは隔離され、半導体チップ表面への異
物等の付着を防止する。
The semiconductor manufacturing apparatus according to the present invention is equipped with a clean system, so that the die bonder and wire bonder are isolated from the surrounding air containing dust, thereby preventing foreign matter from adhering to the surface of the semiconductor chip.

[発明の実施例] 以下、この発明の一実施例を図について説明する。第1
図に於いて、(1)は−ダイボンド、ワイヤボンドの架
台、(2)はダイボンドユニット、(3)はワイヤボン
ドユニット、(4)はダイボンドユニット鵡)と、ワイ
ヤボンドユニット(3)の上部に設けたフイールタを有
するクリーン装置、(5)は、ダイボンドユニット(2
)とワイヤボンドユニット(3)を外気からしゃ断する
一カバー、(6)はワイヤボンド後のワークを次工程へ
搬送処理するインローダ、(7)はモールド装置、(8
)は、モールド後の製品を処理するアウトローダ、(9
)は外気、GOはクリーン装置(4)で清浄されるクリ
ーンエア、(Illはダイボンドユニット(2)、ワイ
ボンドユニット(3)部から外気へ排出される排気であ
る。
[Embodiment of the Invention] Hereinafter, an embodiment of the present invention will be described with reference to the drawings. 1st
In the figure, (1) is the die bond and wire bond stand, (2) is the die bond unit, (3) is the wire bond unit, (4) is the die bond unit (2), and the upper part of the wire bond unit (3). The clean device (5) has a filter installed in the die bond unit (2
) and a cover that isolates the wire bonding unit (3) from the outside air, (6) is an inloader that transports the workpiece after wire bonding to the next process, (7) is a molding device, and (8)
) is an outloader that processes the product after molding, (9
) is the outside air, GO is the clean air cleaned by the clean device (4), and (Ill is the exhaust gas discharged from the die bond unit (2) and the die bond unit (3) to the outside air.

次に作用について説明する。Next, the effect will be explained.

ダイボンドユニット(2)とワイヤボンドユニット13
)部は、架台(1)とクリーン装fit +4)、カバ
ー(5)により外気からしゃ断され、クリーン装置t 
+47は外気(9)を吸い込みフィルターを通してダイ
ボンドユニット<2)、ワイヤボンドユニット(3)へ
クリーンエア(1(1を吹き付ける。カバーで支切られ
た内部の空気は、カバー(5)の排気口から外気へ排出
している。このようにダイボンドユニット(2)、ワイ
ヤボンドユニット(3)へは常時クリーンエアー雰囲気
が保たれ、モールド装置(7)から出る塵埃等の影響を
受けず、ダイボンド、ワイヤボンド時にチップ表面を汚
したり、ダメージを与えることかない。
Die bond unit (2) and wire bond unit 13
) section is cut off from outside air by the mount (1), clean equipment fit +4), and cover (5), and the clean equipment t
+47 sucks in outside air (9) and blows clean air (1) through the filter to the die bond unit <2) and wire bond unit (3).The internal air separated by the cover is passed through the exhaust port of the cover (5). In this way, a clean air atmosphere is always maintained in the die bond unit (2) and wire bond unit (3), and the die bond unit (2) and wire bond unit (3) are not affected by dust etc. from the molding device (7). No contamination or damage to the chip surface during wire bonding.

上記実施例では、ダイボンドユニット(2)及びワイヤ
ボンドユニット(3)の上部へクリーン装置(4)を設
けたが、クリーン装置! (41の設置位置は横でもよ
い。
In the above embodiment, the clean device (4) was provided above the die bond unit (2) and the wire bond unit (3), but the clean device! (The installation position of 41 may be horizontal.

〔発明の効果〕〔Effect of the invention〕

以上のように、この発明によれは、クリーンシステムを
備えたことで、−貫組立装置が小形に出来、クリーンル
ームのような部屋を必要とせず。
As described above, since the present invention includes a clean system, the through-hole assembly device can be made compact and does not require a room such as a clean room.

投資費用も安価で済み、装置の配置が自由になるなどの
効果かある。
Investment costs are low, and equipment can be placed freely.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図はこの発明の一実施例による半導体製造装置を示
す正面図、第2図は従来の装置を示す斜視図である。図
中、(1)は架台%(2)はダイボンドユニット、(3
)はワイヤボンドユニット、(4)はクリーン装置、(
5)はカバー、+61はインローダ、(7)はモールド
装置、(8)はアウトローダである。
FIG. 1 is a front view showing a semiconductor manufacturing apparatus according to an embodiment of the present invention, and FIG. 2 is a perspective view showing a conventional apparatus. In the figure, (1) is the frame percentage (2) is the die bond unit, (3
) is the wire bond unit, (4) is the clean device, (
5) is a cover, +61 is an inloader, (7) is a molding device, and (8) is an outloader.

Claims (1)

【特許請求の範囲】[Claims]  半導体製造装置に於いて、ダイボンダ装置、ワイヤボ
ンダ装置、及びモールド装置を連結した、複合一体化装
置とし、ダイボンダ部とワイヤボンダ部をクリーン装置
で覆つたことを特徴とする半導体製造装置。
What is claimed is: 1. A semiconductor manufacturing device comprising a composite integrated device in which a die bonder device, a wire bonder device, and a mold device are connected, and the die bonder section and the wire bonder section are covered with a clean device.
JP15172387A 1987-06-18 1987-06-18 Semiconductor manufacturing equipment Pending JPS63314837A (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP15172387A JPS63314837A (en) 1987-06-18 1987-06-18 Semiconductor manufacturing equipment
US07/207,623 US4987673A (en) 1987-06-18 1988-06-16 Apparatus for packaging semiconductor devices

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15172387A JPS63314837A (en) 1987-06-18 1987-06-18 Semiconductor manufacturing equipment

Publications (1)

Publication Number Publication Date
JPS63314837A true JPS63314837A (en) 1988-12-22

Family

ID=15524878

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15172387A Pending JPS63314837A (en) 1987-06-18 1987-06-18 Semiconductor manufacturing equipment

Country Status (1)

Country Link
JP (1) JPS63314837A (en)

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5739543A (en) * 1980-08-21 1982-03-04 Toshiba Corp Manufacture of semiconductor device
JPS5763833A (en) * 1980-10-07 1982-04-17 Toshiba Corp Fabrication of semicondutor device
JPS5925232A (en) * 1982-07-31 1984-02-09 Shinkawa Ltd Bonding device
JPS6197937A (en) * 1984-10-19 1986-05-16 Toshiba Corp Method for assembling semiconductor element

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5739543A (en) * 1980-08-21 1982-03-04 Toshiba Corp Manufacture of semiconductor device
JPS5763833A (en) * 1980-10-07 1982-04-17 Toshiba Corp Fabrication of semicondutor device
JPS5925232A (en) * 1982-07-31 1984-02-09 Shinkawa Ltd Bonding device
JPS6197937A (en) * 1984-10-19 1986-05-16 Toshiba Corp Method for assembling semiconductor element

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