JPS63295979A - Self-diagnostic apparatus for electronic circuit package - Google Patents
Self-diagnostic apparatus for electronic circuit packageInfo
- Publication number
- JPS63295979A JPS63295979A JP62132116A JP13211687A JPS63295979A JP S63295979 A JPS63295979 A JP S63295979A JP 62132116 A JP62132116 A JP 62132116A JP 13211687 A JP13211687 A JP 13211687A JP S63295979 A JPS63295979 A JP S63295979A
- Authority
- JP
- Japan
- Prior art keywords
- output
- input
- electronic circuit
- diagnostic
- circuit package
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000004092 self-diagnosis Methods 0.000 claims description 11
- 238000002405 diagnostic procedure Methods 0.000 claims description 8
- 238000012795 verification Methods 0.000 claims description 7
- 230000006870 function Effects 0.000 abstract description 13
- 238000003745 diagnosis Methods 0.000 abstract description 4
- 238000010586 diagram Methods 0.000 description 2
Landscapes
- Tests Of Electronic Circuits (AREA)
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は電子回路パッケージ自己診断装置に関し、特に
電子回路パッケージ単体での自己診断試験を行う電子回
路パッケージ自己診断装置に関する。DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to an electronic circuit package self-diagnosis device, and more particularly to an electronic circuit package self-diagnosis device that performs a self-diagnosis test on a single electronic circuit package.
従来、この種の電子回路パッケージ自己診断装置は、メ
モリの擬正常試験等電子回路パッケージの機能の一部の
みを試験するようになっている。Conventionally, this type of electronic circuit package self-diagnosis device tests only a part of the functions of the electronic circuit package, such as a pseudo-normal test of a memory.
上述した従来の電子回路パッケージ自己診断装置は、診
断試験の開始等を指定するメインプロセッサにより制ｉ
されているため、メインプロセッサから直接制御できな
い部分の機能を有する電子回路パッケージの障害判定を
行うことが困難であり、そのようなパッケージを含む数
枚を障害と判断してしまうという欠点がある。The conventional electronic circuit package self-diagnosis device described above is controlled by a main processor that specifies the start of a diagnostic test, etc.
Therefore, it is difficult to determine the failure of electronic circuit packages that have functions that cannot be directly controlled by the main processor, and there is a drawback that several packages containing such packages are determined to be failures.
本発明の目的は上述した欠点を除去し、電子回路パッケ
ージの入出力を利用して診断試験を行ない、必要なすべ
ての機能診断を電子回路パッケージ単位で実施すること
ができる電子回路パッケージ自己診断装置を提供するこ
とにある。An object of the present invention is to provide an electronic circuit package self-diagnosis device that eliminates the above-mentioned drawbacks, performs diagnostic tests using the input and output of the electronic circuit package, and is capable of performing all necessary functional diagnoses for each electronic circuit package. Our goal is to provide the following.
本発明の装置は、電子回路パッケージ自己診断装置にお
いて、電子回路パッケージ入力信号と診断用入力データ
との入力切替ならびにこの入力切替に対応する電子回路
パッケージの出力切替を行なう入力ならびに出力セレク
タ回路と、前記診断用入力データとしての特定データパ
ターンを格納する入力パタンメモリと、前記診断用入力
データを入力した場合に前記電子回路パッケージから出
力されるべき標準の出力データパターンを診断用・
出力データとしてあらかじめ格納する出力パターンメモ
リと、電子回路パッケージの入出力の制御を行なう制御
部と、電子回路パッケージの前記診断用入力データによ
る出力と前記診断用出力データとの比較照合を行なう照
合回路とを備えて構成される。The device of the present invention is an electronic circuit package self-diagnosis device, and includes an input and output selector circuit that performs input switching between an electronic circuit package input signal and diagnostic input data, and output switching of the electronic circuit package corresponding to this input switching; an input pattern memory for storing a specific data pattern as the diagnostic input data; and a diagnostic memory for storing a standard output data pattern to be output from the electronic circuit package when the diagnostic input data is input.
an output pattern memory that is stored in advance as output data; a control unit that controls input and output of the electronic circuit package; and a verification circuit that compares and verifies the output of the electronic circuit package based on the diagnostic input data and the diagnostic output data. It is composed of:
次に図面を参照して本発明の詳細な説明する。 Next, the present invention will be described in detail with reference to the drawings.
第１図は本発明の一実施例を示すブロック図である。第
１図に示す実施例は、電子回路パッケージ入力信号と診
断用入力データとの入力切替を行なう入力セレクタ回路
１−１〜１−Ｎ、電子回路パーケージの出力切替を行な
う出力セレクタ回路２−１〜２−Ｎ１診断用入力データ
としての特定データパターンを格納する入カバターンメ
モリ３゜入カバターンメモリ３の診断用入力データを入
力した場合に電子回路パッケージから出力されるべき標
準の出力データパターンを格納する出力パターンメモリ
４．電子回路パッケージの入出力の制御を行なう制御部
５．診断用入力データによる出力と診断用出力データと
の比較照合を行なう照合回路６を備え、第１図にはこの
他に診断されるべき電子回路パッケージの主たる機能部
分としてのパッケージ機能部１０．電子回路パッケージ
の入出力端子１１−１〜１１−Ｎ、および１２−１〜１
２−Ｎ、電子回路パッケージ自己診断装置の障害発生表
示端子１３２診断試験指示端子１４等を併記して示す。FIG. 1 is a block diagram showing one embodiment of the present invention. The embodiment shown in FIG. 1 includes input selector circuits 1-1 to 1-N that perform input switching between an electronic circuit package input signal and diagnostic input data, and an output selector circuit 2-1 that performs output switching of the electronic circuit package. ~2-N1 Input pattern memory 3 that stores specific data patterns as input data for diagnosis Standard output data pattern that should be output from the electronic circuit package when input data for diagnosis of input pattern memory 3 is input Output pattern memory for storing 4. A control unit 5 that controls input and output of the electronic circuit package. It is equipped with a verification circuit 6 that compares and verifies the output based on the diagnostic input data and the diagnostic output data. In addition, FIG. 1 also shows a package function section 10. Input/output terminals 11-1 to 11-N and 12-1 to 1 of the electronic circuit package
2-N, a failure occurrence display terminal 132, a diagnostic test instruction terminal 14, etc. of the electronic circuit package self-diagnosis device are also shown.
次に第１図の実施例における自己診断試験の動作につい
て説明する。Next, the operation of the self-diagnosis test in the embodiment shown in FIG. 1 will be explained.
通常、入力セレクタ回路１−１〜１−Ｎは入力端子１１
−１〜１１−Ｎを介して受ける入力をセレクタしパッケ
ージ機能部１０に供給する。また、出力セレクタ回路２
−１〜２−Ｎはパッケージ機能部１０の出力を出力端子
１２−１〜１２−Ｎに送出するようにセレクタしている
。Normally, the input selector circuits 1-1 to 1-N are connected to the input terminal 11.
-1 to 11-N are selected and supplied to the package function section 10. In addition, the output selector circuit 2
-1 to 2-N are selectors so that the output of the package function section 10 is sent to output terminals 12-1 to 12-N.
いま、診断試験指示端子１１に診断試験指示が入力され
ると、これを受けた制御部５の制御のもとにセレクタ切
替制御信号５１．５２がそれぞれ入力セレクタ回路１−
１〜１−Ｎおよび出力セレクタ回路２−１〜２−Ｎに供
給され、これら制御信号により入力セレクタ回路１−１
〜１−Ｎは入カバターンメモリ３の出力する診断用入力
データをセレクトしてパッケージ機能部１０に供給、ま
た出力セレクタ回路２−１〜２−Ｎはパッケージ機能部
１０の出力信号を照合回路６に供給するように切替えら
れる。Now, when a diagnostic test instruction is input to the diagnostic test instruction terminal 11, the selector switching control signals 51 and 52 are sent to the input selector circuits 1-1 and 52 under the control of the control section 5 that receives the instruction.
1 to 1-N and output selector circuits 2-1 to 2-N.
~1-N selects the diagnostic input data output from the input cover turn memory 3 and supplies it to the package function section 10, and output selector circuits 2-1 to 2-N check the output signal of the package function section 10. 6.
入カバターンメモリ３は制御部５の制御のもとに診断用
入力データを特定のタイミングで入力セレクタ回路１−
１〜１−Ｎを介してパッケージ機能部１０に供給する。The input cover turn memory 3 inputs diagnostic input data to the input selector circuit 1- at a specific timing under the control of the control unit 5.
1 to 1-N to the package function section 10.
この入力によるパッケージ機能部１０の出力信号２１は
出力セレクタ回路２−１〜２−Ｎを介して照合回路６に
供給される。The output signal 21 of the package function section 10 based on this input is supplied to the verification circuit 6 via the output selector circuits 2-1 to 2-N.
照合回路６には制御部５の制御のもとに出力パターンメ
モリ４から診断用出力データが供給され、照合回路６は
こうして入力する出力信号２１と診断用出力データとを
照合し、両者が不一致の場合にはパッケージ機能部１０
に障害ありとして障害発生表示端子１３に所定の信号が
出力される。The verification circuit 6 is supplied with diagnostic output data from the output pattern memory 4 under the control of the control unit 5, and the verification circuit 6 collates the input output signal 21 with the diagnostic output data to determine if the two do not match. In the case of package function part 10
A predetermined signal is output to the failure occurrence display terminal 13 indicating that there is a failure.
〔発明の効果〕
以上説明したように本発明は、電子回路パッケージの入
力と出力間で診断試験を行う手段を備えること、により
、すべての機能の診断が可能であるとともに、電子回路
パッケージ単位で障害判定ができるという効果がある。[Effects of the Invention] As explained above, the present invention is capable of diagnosing all functions by providing a means for performing a diagnostic test between the input and output of an electronic circuit package, and also enables diagnosis of each electronic circuit package. This has the effect of being able to determine faults.
第１図は本発明の一実施例を示すブロック図でる。
１−１〜１−Ｎ・・・入力セレクタ回路、２−１〜２−
Ｎ・・・出力セレクタ回路、３・・・入カバターンメモ
リ、４・・・出力パターンメモリ、５・・・制御部、６
・・・照合回路、１０・・・パッケージ機能部、１１−
１〜１１−Ｎ・・・入力端子、１２−１〜１２−Ｎ・・
・出力端子、１３・・・障害発生表示端子、１４・・・
診断試験指示端子。FIG. 1 is a block diagram showing one embodiment of the present invention. 1-1 to 1-N...input selector circuit, 2-1 to 2-
N...Output selector circuit, 3...Input pattern memory, 4...Output pattern memory, 5...Control unit, 6
...Verification circuit, 10...Package function section, 11-
1~11-N...input terminal, 12-1~12-N...
・Output terminal, 13...Fault occurrence display terminal, 14...
Diagnostic test indication terminal.
Claims (1)
パッケージ入力信号と診断用入力データとの入力切替な
らびにこの入力切替に対応する電子回路パッケージの出
力切替を行なう入力ならびに出力セレクタ回路と、前記
診断用入力データとしての特定データパターンを格納す
る入力パタンメモリと、前記診断用入力データを入力し
た場合に前記電子回路パッケージから出力されるべき標
準の出力データパターンを診断用出力データとしてあら
かじめ格納する出力パターンメモリと、電子回路パッケ
ージの入出力の制御を行なう制御部と、電子回路パッケ
ージの前記診断用入力データによる出力と前記診断用出
力データとの比較照合を行なう照合回路とを備えて電子
回路パッケージ単体での自己診断試験を行なうことを特
徴とする電子回路パッケージ自己診断装置。In an electronic circuit package self-diagnosis device, an input and output selector circuit that performs input switching between an electronic circuit package input signal and diagnostic input data, and output switching of an electronic circuit package corresponding to this input switching, and as the diagnostic input data. an input pattern memory that stores a specific data pattern of the above, and an output pattern memory that stores in advance a standard output data pattern to be output from the electronic circuit package when the diagnostic input data is input as the diagnostic output data; The electronic circuit package itself is equipped with a control section that controls input and output of the electronic circuit package, and a verification circuit that compares and verifies the output based on the diagnostic input data of the electronic circuit package and the diagnostic output data. An electronic circuit package self-diagnosis device characterized by performing a diagnostic test.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62132116A JPS63295979A (en) | 1987-05-27 | 1987-05-27 | Self-diagnostic apparatus for electronic circuit package |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62132116A JPS63295979A (en) | 1987-05-27 | 1987-05-27 | Self-diagnostic apparatus for electronic circuit package |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS63295979A true JPS63295979A (en) | 1988-12-02 |
Family
ID=15073794
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP62132116A Pending JPS63295979A (en) | 1987-05-27 | 1987-05-27 | Self-diagnostic apparatus for electronic circuit package |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS63295979A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6052806A (en) * | 1994-08-26 | 2000-04-18 | Stmicroelectronics Limited | Method and apparatus for testing an integrated circuit device |
| JP2010060498A (en) * | 2008-09-05 | 2010-03-18 | Denso Corp | Self-diagnostic circuit |
-
1987
- 1987-05-27 JP JP62132116A patent/JPS63295979A/en active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6052806A (en) * | 1994-08-26 | 2000-04-18 | Stmicroelectronics Limited | Method and apparatus for testing an integrated circuit device |
| JP2010060498A (en) * | 2008-09-05 | 2010-03-18 | Denso Corp | Self-diagnostic circuit |
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