JPS63171366A - Electric contact apparatus - Google Patents
Electric contact apparatusInfo
- Publication number
- JPS63171366A JPS63171366A JP305087A JP305087A JPS63171366A JP S63171366 A JPS63171366 A JP S63171366A JP 305087 A JP305087 A JP 305087A JP 305087 A JP305087 A JP 305087A JP S63171366 A JPS63171366 A JP S63171366A
- Authority
- JP
- Japan
- Prior art keywords
- electrodes
- contact
- measuring
- insulators
- measuring electrodes
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000004020 conductor Substances 0.000 claims abstract description 8
- 238000005259 measurement Methods 0.000 abstract description 15
- 239000012212 insulator Substances 0.000 abstract description 5
- 238000000034 method Methods 0.000 description 5
- 230000000694 effects Effects 0.000 description 4
- 239000011248 coating agent Substances 0.000 description 3
- 238000000576 coating method Methods 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- 238000004140 cleaning Methods 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 230000005284 excitation Effects 0.000 description 1
- WABPQHHGFIMREM-UHFFFAOYSA-N lead(0) Chemical compound [Pb] WABPQHHGFIMREM-UHFFFAOYSA-N 0.000 description 1
Landscapes
- Measuring Leads Or Probes (AREA)
Abstract
Description
【発明の詳細な説明】
〈発明の技術分野〉
本発明は、接点を構成する導体を振動させ、安定な低接
触抵抗を得るよ５Ｋした電気接点装置に関する。DETAILED DESCRIPTION OF THE INVENTION Technical Field of the Invention The present invention relates to a 5K electric contact device that vibrates a conductor constituting a contact and obtains a stable low contact resistance.
〈従来技術とその問題点〉
電気素子測定装置等において、安定な低接触抵抗を有す
る接点装置は必須の構成要素である。特に高精度測定に
おいては、抵抗値のバラツキが補正を困難にするランダ
ム誤差を増加させるので、接触抵抗の安定性が特に求め
られる。<Prior art and its problems> A contact device having stable and low contact resistance is an essential component in an electric device measuring device or the like. Particularly in high-precision measurements, stability of contact resistance is particularly required since variations in resistance value increase random errors that are difficult to correct.
前述の要求を満たすための１つの方法に、接点の接触圧
力を高くする方法がある。One method for meeting the above requirements is to increase the contact pressure of the contacts.
この方法では、被測定素子の挿抜が困難となつたり、被
測定素子の変形や、それに起因する電気的定数の変化な
どが起りやすいという欠点がある。This method has disadvantages in that it is difficult to insert and remove the device to be measured, and the device to be measured is likely to be deformed and electrical constants may change due to deformation.
さらに、比較的強靭な高抵抗皮膜が平坦な接点に形成さ
れるときは、圧力のみ高めても皮膜が破壊されず、低い
安定な接触抵抗を得ることはできない。Furthermore, when a relatively tough, high-resistance coating is formed on a flat contact, the coating will not be destroyed even if only the pressure is increased, making it impossible to obtain a low and stable contact resistance.
さらに有効な従来技術は、４端子法によって電流端子と
電圧端子をＭｋ／Ｃ設けて、接点における接触抵抗の影
響を実質的に排除するものである。A more effective conventional technique is to provide current terminals and voltage terminals with Mk/C using a four-terminal method, thereby substantially eliminating the influence of contact resistance at the contacts.
しかし、Ｉ Ｍ Ｈｚを超える高周波では、接続ケーブ
ルを含む、電圧および電流検出回路の入力インピーダン
スが低下し、もともと高インピーダンスを前提にしてい
る４端子法の効果が低減し、接触抵抗の影響はやはり無
視できなくなる。However, at high frequencies exceeding I MHz, the input impedance of the voltage and current detection circuit, including the connection cable, decreases, and the effect of the four-terminal method, which originally assumes high impedance, is reduced, and the effect of contact resistance is still It becomes impossible to ignore.
一方、接点の研麿によって接触抵抗を低減したり、接点
を交換する方法は最も基本的なものであるが、作業工数
がかかるとともに１十分な頻度が得られないため、信頼
性のある接触抵抗の低減はできない。・
〈発明の目的〉
従って本発明の目的は、自動的に接点の清浄化を行うよ
うに接点を構成する導体を振動させ、上記の欠点を解消
することである。On the other hand, the most basic method is to reduce the contact resistance by grinding the contacts or replacing the contacts, but it takes a lot of work and cannot be done frequently enough. cannot be reduced. - <Object of the Invention> Therefore, the object of the present invention is to eliminate the above-mentioned drawbacks by vibrating the conductor constituting the contact so as to automatically clean the contact.
〈発明の概要〉
本発明の１実施例では、接点を構成する導体のいくつか
が超音波振動体に連結されている。超音波振動体の振動
により導体間の新暦作用を行わせ、接点を清浄化してい
る。SUMMARY OF THE INVENTION In one embodiment of the invention, some of the conductors that make up the contacts are coupled to an ultrasonic vibrator. The vibrations of the ultrasonic vibrator cause a new calendar effect between the conductors to clean the contacts.
〈発明の実施例〉
第１図は本発明の１実施例の電気接点装置を示す。被測
定素子３の電極４．４′は、測定電極２，２′に接触し
ており、該測定電極２，２′には測定器からのリード線
ｌ、１′の芯線がそれぞれ接続されている。<Embodiment of the Invention> FIG. 1 shows an electrical contact device according to an embodiment of the invention. The electrodes 4.4' of the device to be measured 3 are in contact with the measuring electrodes 2, 2', to which the core wires of the lead wires l and 1' from the measuring instrument are connected, respectively. There is.
また測定電極２，２′は、静止板５．５′に固定された
絶縁体６．６’に固着されている。The measuring electrodes 2, 2' are also fixed to an insulator 6.6' which is fixed to the stationary plate 5.5'.
絶縁体６．６′は、ランジュバン型振動子、７，７′で
駆動される。その結果、測定電極２．２′は、電・極４
，４′に対して相対的に運動し、電極２．２’。The insulator 6,6' is driven by a Langevin type oscillator, 7,7'. As a result, the measuring electrode 2.2'
, 4' and moving relative to the electrode 2.2'.
４．４′上の被膜を破壊し低い接触抵抗を与えるよ５に
電極４．４′の導体部に密着する。The electrode 4.4' is closely attached to the conductor portion of the electrode 4.4' so as to break the coating on the electrode 4.4' and provide a low contact resistance.
またランジュバン型振動子のかわりに、音片型の振動子
を使用する構成とすることも容易に考えられる。It is also easily possible to use a vibrator-type vibrator instead of the Langevin-type vibrator.
第２図は本発明の装置を応用した測定システムを示して
いる。測定器２０はＨＰ４２７８Ａなどのインピーダン
スを測定する装置である。測定器２０から測定用リード
２１．２１’が測定電極２２．２２′に接続され、被測
定電気素子３の電極４．４′のそれぞれと測定信号の授
受をおこなう。FIG. 2 shows a measurement system to which the device of the present invention is applied. The measuring device 20 is an impedance measuring device such as HP4278A. Measurement leads 21.21' from the measuring device 20 are connected to measurement electrodes 22.22', and exchange measurement signals with each of the electrodes 4.4' of the electrical element 3 to be measured.
測定電極２２．２２’は上述のように、超音波振動子７
，７′でそれぞれ励振される。超音波振動子７゜７′の
駆動は発振器２４からスイッチ２３を介しておこなう。The measuring electrodes 22, 22' are connected to the ultrasonic transducer 7, as described above.
, 7', respectively. The ultrasonic transducer 7° 7' is driven by an oscillator 24 via a switch 23.
図は超音波振動子７．７′を並列駆動しているが、かな
らずしもこのようｋする必要はない。In the figure, the ultrasonic transducers 7 and 7' are driven in parallel, but it is not always necessary to do so.
スイッチ７の開閉は、測定器２０から信号ライン２５に
出力される制御信号によって制御されるスイッチ駆動回
路２６によって行われる。The switch 7 is opened and closed by a switch drive circuit 26 controlled by a control signal output from the measuring device 20 to the signal line 25.
測定の顆序はつぎのようＫなる。まず被測定素子３が測
定電極２２．２２’に装着されると、一定時間（例えば
２５ｍ５の間）超音波振動子７，７′は一定周波数（例
えば３５ＫＨｚ）で振動する。その後測定がおこなわれ
る。The condylar order of measurement is K as follows. First, when the device to be measured 3 is attached to the measurement electrodes 22, 22', the ultrasonic vibrators 7, 7' vibrate at a constant frequency (eg, 35 KHz) for a certain period of time (eg, 25 m5). Measurements are then taken.
波振動子を用いるときは２ｍΩのバラツキとな咲その中
心値も約１５ｍΩ減少した。When using a wave oscillator, the center value decreased by about 15 mΩ with a variation of 2 mΩ.
なお、上述の実施例では、振動子７，７′が各測定電極
をそれぞれ振動させているが、１つの振動子で振動させ
るようにすることは容易である。また、励振力やその周
波数も、被測定電気素子３や、測定電極に応じて広い範
囲から選択できることは周知である。電極２，２′と電
極４，４′の振動子による相対的運動は、電極同志が作
る接触面の方向に対し種々の角度をもたせることができ
る。In the above-mentioned embodiment, the vibrators 7 and 7' vibrate each measurement electrode, but it is easy to vibrate it with one vibrator. Furthermore, it is well known that the excitation force and its frequency can be selected from a wide range depending on the electrical element 3 to be measured and the measurement electrode. The relative movement of the electrodes 2, 2' and the electrodes 4, 4' by the vibrator can be made at various angles with respect to the direction of the contact surfaces formed by the electrodes.
〈発明の効果〉
以上本発明の１実施例から明らかなように、本発明の実
施により、常に清浄化された接点による測定が可能とな
る。さらＫ、その清浄化が自動的に行われるから本発明
は実用に供して有用である。<Effects of the Invention> As is clear from the above-described embodiment of the present invention, by carrying out the present invention, measurements can be made using constantly cleaned contacts. Furthermore, since the cleaning is automatically performed, the present invention is useful in practical use.
第１図は本発明の１実施例の電気接点装置を示す図。
第２図は本発明の１実施例の電気接点装置を用いた測定
システムの構成図。
１＠１’：リード線； ２．２／ ：測定電極；３：
被測定電気素子； ４，４１＝素子電極；５．５′：
静止板； ６，６１：絶縁体； ７，７／：振動子
； ２０：測定器； ２１，２１’：測定用り−ド；
２２，２２’：測定電極； ２３：スイッチ；２４
：発振器； ２５：信号ライン； ２６：スイッチ駆動
回路。FIG. 1 is a diagram showing an electrical contact device according to one embodiment of the present invention. FIG. 2 is a configuration diagram of a measurement system using an electrical contact device according to an embodiment of the present invention. 1@1': Lead wire; 2.2/: Measurement electrode; 3:
Electrical element to be measured; 4,41 = element electrode; 5.5':
Stationary plate; 6, 61: Insulator; 7, 7/: Vibrator; 20: Measuring device; 21, 21': Measurement board;
22, 22': Measuring electrode; 23: Switch; 24
: Oscillator; 25: Signal line; 26: Switch drive circuit.
Claims (1)
装備した電気接点装置。An electrical contact device equipped with a drive device to create relative movement between contacting conductors.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP305087A JPS63171366A (en) | 1987-01-09 | 1987-01-09 | Electric contact apparatus |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP305087A JPS63171366A (en) | 1987-01-09 | 1987-01-09 | Electric contact apparatus |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS63171366A true JPS63171366A (en) | 1988-07-15 |
Family
ID=11546491
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP305087A Pending JPS63171366A (en) | 1987-01-09 | 1987-01-09 | Electric contact apparatus |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS63171366A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2006273378A (en) * | 2005-03-29 | 2006-10-12 | Sekisui Plastics Co Ltd | Packaging paper with bag food packaging method using it, and packaged food |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5569058A (en) * | 1978-11-20 | 1980-05-24 | Fujitsu Ltd | Contact method for probe |
| JPS5899760A (en) * | 1981-12-09 | 1983-06-14 | Toshiba Corp | Probe device |
-
1987
- 1987-01-09 JP JP305087A patent/JPS63171366A/en active Pending
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5569058A (en) * | 1978-11-20 | 1980-05-24 | Fujitsu Ltd | Contact method for probe |
| JPS5899760A (en) * | 1981-12-09 | 1983-06-14 | Toshiba Corp | Probe device |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2006273378A (en) * | 2005-03-29 | 2006-10-12 | Sekisui Plastics Co Ltd | Packaging paper with bag food packaging method using it, and packaged food |
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