JPS63128199A - Method for controlling thickness of treated film on surface-treated material - Google Patents
Method for controlling thickness of treated film on surface-treated materialInfo
- Publication number
- JPS63128199A JPS63128199A JP27295286A JP27295286A JPS63128199A JP S63128199 A JPS63128199 A JP S63128199A JP 27295286 A JP27295286 A JP 27295286A JP 27295286 A JP27295286 A JP 27295286A JP S63128199 A JPS63128199 A JP S63128199A
- Authority
- JP
- Japan
- Prior art keywords
- treated
- thickness
- line
- film
- color tone
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000463 material Substances 0.000 title claims abstract description 42
- 238000000034 method Methods 0.000 title claims description 24
- 238000004381 surface treatment Methods 0.000 claims description 26
- 238000012545 processing Methods 0.000 abstract description 25
- 230000001105 regulatory effect Effects 0.000 abstract description 2
- 239000007788 liquid Substances 0.000 description 38
- 238000011282 treatment Methods 0.000 description 23
- 238000007747 plating Methods 0.000 description 14
- 238000000576 coating method Methods 0.000 description 12
- 239000011248 coating agent Substances 0.000 description 9
- 230000001276 controlling effect Effects 0.000 description 7
- 238000005259 measurement Methods 0.000 description 7
- 238000010586 diagram Methods 0.000 description 6
- 238000002347 injection Methods 0.000 description 6
- 239000007924 injection Substances 0.000 description 6
- ZCDOYSPFYFSLEW-UHFFFAOYSA-N chromate(2-) Chemical compound [O-][Cr]([O-])(=O)=O ZCDOYSPFYFSLEW-UHFFFAOYSA-N 0.000 description 5
- VYZAMTAEIAYCRO-UHFFFAOYSA-N Chromium Chemical compound [Cr] VYZAMTAEIAYCRO-UHFFFAOYSA-N 0.000 description 3
- 238000002441 X-ray diffraction Methods 0.000 description 3
- 230000009467 reduction Effects 0.000 description 3
- 239000003795 chemical substances by application Substances 0.000 description 2
- 229910052804 chromium Inorganic materials 0.000 description 2
- 239000011651 chromium Substances 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 229910000831 Steel Inorganic materials 0.000 description 1
- 230000002238 attenuated effect Effects 0.000 description 1
- 238000012937 correction Methods 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000009713 electroplating Methods 0.000 description 1
- 238000005246 galvanizing Methods 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 238000000691 measurement method Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- 239000010959 steel Substances 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 238000011144 upstream manufacturing Methods 0.000 description 1
Landscapes
- Coating With Molten Metal (AREA)
- Chemical Treatment Of Metals (AREA)
Abstract
Description
【発明の詳細な説明】
（産業上の利用分野）
本発明は、例えば連続溶融メツキライン等に適用して好
適な表面処理材の処理皮膜々厚制御法に係わり、特に表
面処理材の種類に影響されずに処理皮膜々厚を正確に測
定して適切な制御を行う表面処理材の処理皮幌々厚制卯
法の改良に関する。Detailed Description of the Invention (Industrial Field of Application) The present invention relates to a method for controlling the thickness of a treated coating on a surface-treated material, which is suitable for application to, for example, a continuous melt plating line, etc. This invention relates to an improvement in a method for controlling the thickness of a treated coating for surface-treated materials, which accurately measures and appropriately controls the thickness of the treated coating without being overly heated.
（従来の技術）
通常、電気メッキまたは溶融亜鉛メツキラインでは、オ
ンラインにてメッキ処理後の表面処理板の処理皮膜々厚
を測定し、この測定値に基づいて処理液の吐出ｍやライ
ン速度などを制御している。(Prior art) Normally, in an electroplating or hot-dip galvanizing line, the thickness of the treated film on the surface-treated plate after plating is measured online, and the discharge m of the treatment liquid, line speed, etc. are determined based on this measurement value. It's in control.
例えば連続溶融メッキ処理ラインでは、第４図に示すよ
うに溶融亜鉛メッキ処理を行う表面処理部１から処理さ
れて出てくる表面処理材２に対してＸ線を照射してその
表面処理材２から出てくる蛍光Ｘ線を検出するメッキ厚
み計３を用いて表面処理材２のメッキ厚みを測定する。For example, in a continuous hot-dip plating process line, as shown in FIG. The plating thickness of the surface-treated material 2 is measured using a plating thickness meter 3 that detects fluorescent X-rays emitted from the surface.
しかる後、この測定値を受けてコントローラ４は測定値
と目探値との（Ｑ差を零とするための操作出力を得ると
ともに、この操作出力を制御アクチュエータ５例えば処
理液噴射ノズルに与えることにより、処理液噴射ノズル
の圧力または溶融メッキ洛面からの処理液噴射ノズルの
高さを調整し表面処理材２のメッキ厚みを制御するよう
にしている。Thereafter, in response to this measured value, the controller 4 obtains an operational output for making the Q difference between the measured value and the target value zero, and provides this operational output to the control actuator 5, for example, a processing liquid injection nozzle. Accordingly, the plating thickness of the surface treatment material 2 is controlled by adjusting the pressure of the treatment liquid injection nozzle or the height of the treatment liquid injection nozzle from the hot-dip plating surface.
しかし、この表面処理材の処理皮躾々厚制罪法において
は、蛍光Ｘ線分析法によるメッキ厚み計３を使用してい
るので、表面処理材２中に処理部ｆｉｌ ２ ａと同じ
元素の物質が含まれている場合、つまり第５図に示すよ
うに処理皮膜２ａの成分がクロムＯｒであり、かつ、表
面処理材２がクロムＯｒを含んでいる場合には該表面処
理材２中からち外乱としての蛍光ＸＩ！ｉｌが出てくる
ために測定結果に大きな誤差が生じる。However, in this law for regulating the thickness of treated skin of surface-treated materials, a plating thickness meter 3 based on fluorescent X-ray analysis is used, so the surface-treated material 2 contains the same element as the treated part fil 2 If a substance is contained in the surface treated material 2, that is, if the treated film 2a contains chromium Or as shown in FIG. Fluorescence XI as a disturbance! Since il appears, a large error occurs in the measurement results.
そこで、従来、上記制御法の欠点を解決するものとして
第６図に示すように、表面処理部１の入り側と出側にそ
れぞれ蛍光Ｘ１ｓ分析装置３Ａ。Therefore, in order to solve the drawbacks of the conventional control method, as shown in FIG. 6, fluorescence X1s analyzers 3A are installed on the entrance and exit sides of the surface treatment section 1, respectively.
３Ｂを配置し、両分折装置３Ａ、３Ｂの測定値差から処
理皮膜２ａの厚みを求めるものがある。６はバイオフリ
ール、７はテンションリールである。3B, and the thickness of the treated film 2a is determined from the difference in measured values between the two spectrometers 3A and 3B. 6 is a biofree reel, and 7 is a tension reel.
（発明が解決しようとする問題点）
しかし、この処理皮膜々厚１ｉ１１０１１法は、表面処
理部１の入り側と出側にそれぞれ蛍光Ｘ線分析装置３Ａ
、３Ｂを設けるものであるため、それらの装置３Ａ、３
Ｂを設置するためのスペースおよび比較的に長いライン
を確保する必要があるばかりでなく、コスト的にも高く
なる問題がある。また、この制御法では重元素をオンラ
インの測定対象としている。つまり、Ｓｉ、Ｐ等の軽元
素からの蛍光Ｘ線は大気中で大きく減衰してしまうので
測定することができない。このため、従来、軽元素の処
理皮膜の場合にはオフラインのみの測定であり、かつ、
真空状態にして測定しなければならなかった。(Problems to be Solved by the Invention) However, in this treatment film thickness 11011 method, a fluorescent
, 3B, those devices 3A, 3
Not only is it necessary to secure a space and a relatively long line for installing B, but there is also the problem of high costs. In addition, this control method targets heavy elements for online measurement. That is, fluorescent X-rays from light elements such as Si and P are greatly attenuated in the atmosphere and cannot be measured. For this reason, conventionally, in the case of light element treated films, measurements were only performed off-line, and
Measurements had to be made in a vacuum.
本発明は上記実情に鑑みてなされたもので、表面処理材
中に含む元素が皮膜の元素と同一であり、かつ、それが
軽元素であっても処理皮膜の厚みを正確に測定し得、し
かもオンラインにて測定できる表面処理材の処理皮膜々
厚制御法を提供することを目的とする。The present invention was made in view of the above circumstances, and it is possible to accurately measure the thickness of a treated film even if the elements contained in the surface treatment material are the same as the elements of the coating and are light elements. Moreover, it is an object of the present invention to provide a method for controlling the thickness of treated coatings on surface-treated materials that can be measured online.
（問題点を解決するための手段および作用）本発明によ
る表面処理材の処理皮膜々厚制御法は、表面処理ライン
の出側に色調演算計を設置して表面処理材の表面色調と
表面処理皮膜々厚との相関関係を利用して処理皮膜々原
信号を得るとともに、この処理皮膜々原信号に基づいて
制御アクチュエータを調整して所望とする前記処理皮膜
々厚を形成することにより、表面処理材中の元素に影響
されずに処理皮膜の色調から処理皮膜の厚みを３１＋１
定することが可能となり、かつ、軽・重元素に左右され
ずに測定することができる。(Means and effects for solving the problem) The method for controlling the thickness of the treated film on a surface-treated material according to the present invention is to install a color tone arithmetic meter on the outlet side of a surface treatment line to determine the surface color tone and surface treatment of the surface-treated material. By obtaining the treated film original signal using the correlation with the film thickness, and adjusting the control actuator based on this treated film original signal to form the desired treated film thickness, the surface The thickness of the treated film can be determined by 31+1 based on the color tone of the treated film without being affected by the elements in the treated material.
This makes it possible to determine the amount of light and heavy elements, and to make measurements independent of light and heavy elements.
（実施例） 以下、本発明の一実施例を説明するに先立ち。(Example) Below, before explaining one embodiment of the present invention.
第１図および第２図を参照して本発明制御法を適用した
装置の基本的な構成について説明する。第１図において
１１は表面処理材であって、これは例えばメッキ処理部
等の表面処理部１２に送られ、ここで所望とする表面処
理が施された後、ライン出側１３へ送り出される。この
ライン出側１３には表面処理材１１の処理皮膜々厚を測
定するための色調Ｘ韓計１４がＸＱ置されている。この
色調演算計１４は次に述べる様な理由からライン出側１
３に設けたものである。即ち、クロムメッキラインにお
いて表面処理材１１のクロム付Ｗｆｆｉつまり処理皮膜
厚みと色調演算計１４の色調出力値とは実験結果から第
２図に示すような相関関係をもっている。この相関関係
は他の処理液の付着量との関係でもほぼ同様な結果が得
られる。そこで、第２図から例えばクロム付着量と色調
演算出力値との間にある管理範囲を設け、この管理範囲
内で色調演算出力値を用いて表面処理材１１の処理皮膜
厚みを得ることが可能である。また、予め非直線的な部
分あるいは処理液の種類その他の要素に応じて補正パラ
メータを用意しておけば、色調演算出力値と表面処理材
１１の処理被膜厚みとを比例関係を持たせて取り出すこ
とができる。The basic configuration of an apparatus to which the control method of the present invention is applied will be explained with reference to FIGS. 1 and 2. In FIG. 1, reference numeral 11 denotes a surface treatment material, which is sent to a surface treatment section 12 such as a plating section, where it is subjected to a desired surface treatment, and then sent to a line outlet side 13. On the line outlet side 13, a color tone X-K meter 14 for measuring the thickness of each treated film on the surface-treated material 11 is placed XQ. This color tone calculation meter 14 is connected to the line output side 1 for the following reasons.
3. That is, in the chrome plating line, the chromium-attached Wffi of the surface treated material 11, that is, the treated film thickness, and the color tone output value of the color tone calculation meter 14 have a correlation as shown in FIG. 2 from experimental results. Almost the same results can be obtained from this correlation with the adhesion amounts of other processing liquids. Therefore, from FIG. 2, for example, it is possible to set a control range between the chromium adhesion amount and the color tone calculation output value, and obtain the treated film thickness of the surface treatment material 11 using the color tone calculation output value within this control range. It is. In addition, if correction parameters are prepared in advance according to non-linear parts, the type of treatment liquid, and other factors, the color tone calculation output value and the treatment film thickness of the surface treatment material 11 can be extracted with a proportional relationship. be able to.
そして、この色調演算計１４の出力は調節手段１５に送
られる。この調節手段１５は、一般のコントローラと同
様に目標値信号と色調演算計出力値との偏差を零とすべ
く調節演算を行って操作出力を得、この信号を用いて制
御アクチュエータ１６例えば処理液吐出量、コーティン
グロール圧下刃、コーティングロール回転数、ライン速
度等の何れかをｉｄＪ御する操作端に与えることにより
、表面処理材１１の処理皮膜を所望の厚みとするもので
ある。The output of this color tone calculation meter 14 is sent to the adjustment means 15. This adjustment means 15, like a general controller, performs adjustment calculation to zero the deviation between the target value signal and the color tone calculation meter output value, obtains an operation output, and uses this signal to control the control actuator 16, for example, the processing liquid. By applying any of the discharge amount, coating roll reduction blade, coating roll rotation speed, line speed, etc. to the operating end that controls idJ, the treated film of the surface treatment material 11 is made to have a desired thickness.
次に、以上のような基本的な構成に基づいて具体化した
装置の一実施例について第３図を参照して説明する。同
図はクロメート処理被膜々厚制御法を説明するための装
置の構成図であって、表面処理材２１が図示矢印方向へ
搬送されて処理液（ａ２２内に送られる。この処理液槽
２２の内部には所定の間隔を有して例えば表面処理材２
１を上下で挟持して矢印方向に搬送する複数対の搬送ロ
ール２３．・・・が配置され、かつ、これら対の搬送ロ
ール２３−２３の間に同様に表面処理材２１の上下部に
位置させて搬送方向と直交する方向に複数の噴射口を持
つ処理液吐出ノズル２４ａ、・・・。Next, an embodiment of the device based on the above basic configuration will be described with reference to FIG. 3. This figure is a configuration diagram of an apparatus for explaining the chromate treatment film thickness control method, in which the surface treatment material 21 is conveyed in the direction of the arrow shown in the figure and sent into the treatment liquid (a22). For example, a surface treatment material 2 is placed inside at a predetermined interval.
A plurality of pairs of conveyance rolls 23. which sandwich the .1 at the top and bottom and convey it in the arrow direction. ... are disposed, and treatment liquid discharge nozzles having a plurality of injection ports in the direction orthogonal to the conveyance direction are similarly located at the upper and lower parts of the surface treatment material 21 between these pairs of conveyance rolls 23-23. 24a...
２４ｂ、・・・が多数配置されている。モして１上流側
に位置する上下部の複数本の処理液吐出ノズル２４ａ、
・・・と下流側に位置する複数本の処理液吐出ノズル２
４ｂ、・・・とに別けて処理液流入管２５ａ、２５ｂが
それぞれ接続され、これら処理液流入管２５ａ、２５ｂ
の他端側よりクロメート処理液が供給される様になって
いる。また、これらの処理液流入管２５ａ、２５ｂには
処理液の流量を調節する流ｆ！ｋｙ４節弁２６節介２６
ｂが設けられている。A large number of 24b, . . . are arranged. A plurality of upper and lower processing liquid discharge nozzles 24a located on the one upstream side;
... and multiple processing liquid discharge nozzles 2 located on the downstream side.
Processing liquid inflow pipes 25a, 25b are connected to these processing liquid inflow pipes 25a, 25b separately.
The chromate treatment liquid is supplied from the other end. Further, these processing liquid inflow pipes 25a and 25b have a flow f! for adjusting the flow rate of the processing liquid. ky4 section valve 26 section 26
b is provided.
一方、前記処理液槽２２から表面皮膜が施されて出力さ
れた表面処理材２１はライン出側へ送り出されるが、こ
こで例えば所定間隔で配置された複数のパックテンショ
ンロール２７．２８を介して表面処理材２１を送り出す
。このライン出側において表面処理材２１の処理皮膜の
色調から処理皮膜厚みを得る色調演算計２９が設置され
、この色調演算計２９で得られた色調演算出力値つまり
処理皮ｊ！厚み信号がコントローラ３０に送られる。On the other hand, the surface-treated material 21 output from the treatment liquid tank 22 with a surface coating applied thereto is sent to the line exit side, where it is passed through, for example, a plurality of pack tension rolls 27 and 28 arranged at predetermined intervals. The surface treatment material 21 is sent out. At the output side of this line, a color tone calculation meter 29 is installed which obtains the thickness of the treated film from the color tone of the treated film of the surface treated material 21, and the color tone calculation output value obtained by this color tone calculation meter 29, that is, the treated skin j! A thickness signal is sent to controller 30.
このコントローラ３０には色調演算計２９からの処理皮
膜厚み信号の池、例えばパックテンションローラ２７の
回転数に応じてパルスを発生するパルス発生器３１から
ライン速度に係わる信号が入力されている。ざらに、こ
のコントローラ３０には表面処理材２１の処理皮膜を所
望とする厚みとするための処理液流ｍ目標値信号が入力
されている。従って、このコントローラ３０は、色調演
算計２９から得られた処理皮膜々原信号を処理液流量に
変換し、この処理液流量と処理液流ｍ目標値信号との偏
差が零とすべく調整演算を行って操作出力を１ｑ、この
操作出力を用いて処理液流量調節弁２６ａ、２６ｂの開
度を調節し、処理液吐出ノズル２４ａ、・・・、２４ｂ
、・・・からの処理液の噴射分を調整する。すなわち、
色調演算計２９の出力から表面処理材２１のクロメート
皮膜が大きい場合には処理液流量調節弁２６ａ、２６ｂ
の開度を下げて処理液吐出量を少な（し、逆にクロメー
ト被摸が小さい場合には処理液流ｆｆｉ調節弁２６ａ。The controller 30 receives a processed film thickness signal from the color tone arithmetic meter 29 and, for example, a signal related to the line speed from a pulse generator 31 that generates pulses in accordance with the number of rotations of the pack tension roller 27. Roughly speaking, a treatment liquid flow m target value signal for making the treatment film of the surface treatment material 21 a desired thickness is input to the controller 30. Therefore, this controller 30 converts the treated film original signal obtained from the color tone calculation meter 29 into a treatment liquid flow rate, and performs an adjustment calculation to make the deviation between the treatment liquid flow rate and the treatment liquid flow m target value signal zero. The operation output is set to 1q, and this operation output is used to adjust the opening degree of the processing liquid flow rate control valves 26a, 26b, and the processing liquid discharge nozzles 24a, . . . , 24b are
Adjust the amount of processing liquid sprayed from , . That is,
If the chromate film on the surface treatment material 21 is large based on the output of the color tone calculation meter 29, the treatment liquid flow rate control valves 26a and 26b
Reduce the amount of processing liquid discharged by lowering the opening of the processing liquid flow ffi control valve 26a.
２６ｂの開度を上げて処理液吐出口を大きくする。26b is increased to enlarge the processing liquid discharge port.
なお、コントローラ３０は、ライン速度を考慮して操作
出力を得るようにすれば、より正確に表面処理材２１の
皮膜々厚をＸｌｌ整することができる。Note that if the controller 30 obtains the operation output in consideration of the line speed, it is possible to adjust the thickness of each film of the surface treatment material 21 more accurately.
従って、以上のような実施例の構成によれば、従来のよ
うにラインの入り側と出側に皮膜々厚検出手段を設置す
る必要がなくなり、その分だけ処理ラインの長さを短く
できるとともに、コストの低減化に寄与する。また、表
面処理材２１の処理反映色調と皮膜々厚の相関関係から
処理皮膜の厚みを得るようにしたので、処理皮膜の元素
と表面処理材２１の混合元素との関係が問題にならなく
なる。つまり、表面処理材中に含まれる元素が処理皮膜
の元素と同一であっても測定誤差が生じることがなく、
正確に所要とする処理皮膜の厚みを測定できる。また、
従来、オンラインで処理皮膜の膜厚を測定する場合には
蛍光Ｘ線分析法を用いて専ら重元素だけを測定するもの
であるが、この制御法を用いればオンラインで重元素だ
けでなく、軽元素でも処理皮膜の厚みを測定できる。Therefore, according to the configuration of the embodiment as described above, there is no need to install film thickness detection means on the entry and exit sides of the line as in the past, and the length of the processing line can be shortened accordingly. , contributing to cost reduction. Further, since the thickness of the treated film is obtained from the correlation between the color tone reflected by the treatment of the surface treatment material 21 and the thickness of each film, the relationship between the elements of the treated film and the mixed elements of the surface treatment material 21 does not matter. In other words, even if the elements contained in the surface-treated material are the same as those in the treated film, measurement errors will not occur.
It is possible to accurately measure the required thickness of the treated film. Also,
Conventionally, when measuring the film thickness of treated films online, only heavy elements are measured using fluorescent X-ray analysis, but with this control method, it is possible to measure not only heavy elements but also light elements online. The thickness of treated films can also be measured using elements.
なお、上記実施例はクロメート処理について述べたが、
処理皮膜々厚と色調演算値との間に相対関係が持つもの
であれば、何れの測定対象でも適用できるものである。In addition, although the above example described chromate treatment,
This method can be applied to any object to be measured as long as there is a relative relationship between the thickness of the treated film and the color tone calculation value.
また、メッキ処理以外の表面処理にも同様に適用できる
ものである。また、コントローラ３０を用いて処理液流
量ひいては処理液吐出口を調節するようにしたが、例え
ばコーティングロール圧下刃、コーティングロール回転
数、ライン速度等の何れかを調整するようにしてもよい
。その他、本発明は上記実施例に限らずその要旨を逸脱
しない範囲で種々変形して実施できる。Furthermore, it can be similarly applied to surface treatments other than plating. Further, although the controller 30 is used to adjust the processing liquid flow rate and the processing liquid discharge port, for example, any one of the coating roll reduction blade, coating roll rotation speed, line speed, etc. may be adjusted. In addition, the present invention is not limited to the above embodiments, and can be implemented with various modifications without departing from the gist thereof.
（発明の効果）
以上詳記したように本発明によれば、表面処理板中に含
む元素が処理皮膜の元素と同一であり、かつ、それが軽
元素であっても処理皮膜々厚を正確に測定することがで
き、しかもオンラインにて測定できる表面処理材の処理
皮膜々厚制御法を提供できる。(Effects of the Invention) As detailed above, according to the present invention, even if the elements contained in the surface-treated plate are the same as the elements of the treated film, and even if they are light elements, the thickness of the treated film can be accurately determined. It is possible to provide a method for controlling the thickness of a treated film on a surface-treated material, which can be measured on-line.
第１図ないし第３図は本発明に係わる表面処理材の処理
皮膜々厚制御法を説明するために示したもので、第１図
は本発明制御法を適用するための基本的な構成図、第２
図は処理皮膜々厚と色調演締出力値の関係を示す図、第
３図は本発明制御法の一実施例としてのクロメート処理
皮ｆｉ！Ｊ装置の構成図、第４図および第５図は従来の
処理皮膜々厚制御法を説明するための装置の構成図およ
び蛍光Ｘ線分析法の説明図、第６図は従来のもう１つの
装置を説明するための構成図である。
１１．２１・・・表面処理材、１２・・・表面処理部、
１４．２９・・・色調′ａ算計、１５・・・調節手段、
１６・・・副葬アクチュエータ、２２・・・処理液槽、
２４ａ。
２４ｂ・・・処理液吐出ノズル、２’６ａ、２６ｂ・・
・処理液流ｆｆｉ調節弁、３０・・・コントローラ。
出願人代理人 弁理士 鈴 江 武 彦治１図
２０１−イ“１；１シｉ＜ｒｎＶｒｒ？＞第２２
第４図
第５図
第６ 図
手続補正書
昭和 ＄２・角・１５日
特許庁長官 黒 １）明 雄 殿
１、事件の表示
特願昭６１−２７２９５２号
２、発明の名称
表面処理材の処理皮膜々厚制御法
３、補正をする者
事件との関係 特許出願人
（４１２） 日本鋼管株式会社
４、代理人
東京都千代田区霞が関３丁目７番２号 ＵＢＥビル明細
書、図面
７、補正の内容
（１）図面第３図を別紙の通り訂正する。
（２）明細書第１頁第１４行目の「連続溶融メッキ」と
あるを「連続メッキ」と訂正する。
（３）明細書第２頁第３行目の「処理液の吐出量や」な
る記載を削除する。
（４）明細書′！Ｊ２頁第１３行目ないし同頁第５行目
の「処理液噴射ノズルに与える・・・処理液噴射ノズル
の高さ」とあるを「絞りノズルに与えることにより、絞
りノズルの圧力または溶融メッキ洛面からの絞りノズル
の高さ」と訂正する。
（５）明細書第３頁第１６行目ないし同頁第５行目の「
スペースおよび比較的に長いラインを確保」とあるを「
スペースを確保」と訂正する。
（６）明細書第３頁第１９行目の「制御法」とあるを「
測定法」と訂正する。
（７）明細書第４頁第３行目ないし同頁第５行目の「石
合にはオフライン・・・ならなかった。」とあるを［場
合には真空状態にして測定しなければならないため、オ
フライン４ｐ１定にならざるを得なかった。」と訂正す
る。
（８）明細書第４頁第１９行目ないし同頁第２０行目に
記載する「表面処理材中の元素に影響されずに」なる文
章を削除する。
（９）明細書第５頁第１８行目ないし同頁第１９行目に
記載する「この相関関係は他の処理液の付性量との関係
でもほぼ同様な結果が得られる。」なる文章を削除する
。
（１０）明細書第６頁第４行目の「処理液」とあるを「
処理皮膜」と訂正する。
（１１）明細書第８頁第３行目および同頁第１０行目に
記載する「パックテンション」なる文章を削除する。
（１２）明細書第８頁第１１行目の「ローラ２７」とあ
るを「ロール２７」と訂正する。
（１３）明細書第９頁第１４行目ないし同頁第１５行目
に記載する「その分だけ処理ラインの長さを短くできる
とともに、」なる文章を削除する。
（１４）明細書第１０頁第６行目の「制御法」とあるを
「測定法」と訂正する。
（１５）明細書第１０頁第１０行目の「関係が持つ」と
あるを「関係を持つ」と訂正する。Figures 1 to 3 are shown to explain the method for controlling the thickness of treated coatings on surface-treated materials according to the present invention, and Figure 1 is a basic configuration diagram for applying the control method of the present invention. , second
The figure shows the relationship between the thickness of treated films and the color tone enhancement output value, and Figure 3 shows the chromate-treated skin fi! as an embodiment of the control method of the present invention. The configuration diagram of the J apparatus, Figures 4 and 5 are the configuration diagram of the apparatus for explaining the conventional treatment film thickness control method and the explanatory diagram of the fluorescent X-ray analysis method, and Figure 6 is another conventional FIG. 2 is a configuration diagram for explaining the device. 11.21...Surface treatment material, 12...Surface treatment part,
14.29...Tone 'a calculator, 15...Adjustment means,
16... Grave actuator, 22... Processing liquid tank,
24a. 24b...processing liquid discharge nozzle, 2'6a, 26b...
- Processing liquid flow ffi control valve, 30...controller. Applicant's agent Patent attorney Hikoji Suzue Takehikoji 1 Figure 201-a "1; 1 si <rnVrr?> 22 Figure 4 Figure 5 Figure 6 Figure 6 Procedural amendments Showa $2, corner, 15th Director of the Patent Office Black 1) Mr. Akio 1, Indication of the case Japanese Patent Application No. 61-272952 2, Name of the invention Method for controlling the thickness of treated coatings for surface treated materials 3, Person making the amendment Relationship with the case Patent applicant (412) Japan Steel Tube Co., Ltd. 4, Agent 3-7-2 Kasumigaseki, Chiyoda-ku, Tokyo UBE Building Specification, Drawing 7, Contents of amendments (1) Figure 3 of the drawing is corrected as shown in the attached sheet. (2) Specification No. 1 In the 14th line of the page, "continuous hot-dip plating" should be corrected to "continuous plating." (3) Delete the statement "discharge amount of processing liquid" in the third line of page 2 of the specification. (4) Specification'! From line 13 of page J2 to line 5 of the same page, the phrase ``Applying to the treatment liquid injection nozzle... the height of the treatment liquid injection nozzle'' has been changed to ``By applying it to the aperture nozzle, the pressure of the aperture nozzle or the molten plating The height of the aperture nozzle from the surface of the plane is corrected. (5) From line 16 on page 3 of the specification to line 5 on the same page, “
``Secure space and relatively long lines''
Make sure you have some space.'' (6) The phrase “control method” on page 3, line 19 of the specification has been replaced with “
``Measurement method''. (7) In the specification, page 4, line 3 to line 5 of the same page, the statement ``Ishiai was not offline...'' has been changed. Therefore, I had no choice but to use offline 4p1. ” he corrected. (8) Delete the sentence "not affected by the elements in the surface-treated material" written on page 4, line 19 to line 20 of the same page of the specification. (9) The sentence "Almost similar results can be obtained with this correlation with the adhesion amount of other treatment liquids" written in page 5, line 18 to line 19 of the same page of the specification. Delete. (10) The term “processing liquid” on page 6, line 4 of the specification has been replaced with “
Corrected to ``treated film.'' (11) The text "Pack tension" written on page 8, line 3 and line 10 of the same page of the specification will be deleted. (12) "Roller 27" on page 8, line 11 of the specification is corrected to "roll 27." (13) Delete the sentence ``The length of the processing line can be shortened by that much,'' written in the 14th line to the 15th line of page 9 of the specification. (14) "Control method" on page 10, line 6 of the specification is corrected to "measurement method." (15) On page 10, line 10 of the specification, the phrase "having a relationship" is corrected to "having a relationship."
Claims (1)
材の表面色調と表面処理皮膜々厚との相関関係を利用し
て処理皮膜々厚信号を得るとともに、この色調演算計の
出力に基づいて制御アクチュエータを調整して所望とす
る前記処理皮膜々厚を形成するようにしたことを特徴と
する表面処理材の処理皮膜々厚制御法。A color tone calculation meter is installed on the output side of the surface treatment line to obtain a treated film thickness signal using the correlation between the surface color tone of the surface treatment material and the surface treatment film thickness, and the output of this color tone calculation meter is 1. A method for controlling the thickness of a treated film on a surface-treated material, characterized in that a control actuator is adjusted based on the desired thickness of the treated film.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP27295286A JPS63128199A (en) | 1986-11-18 | 1986-11-18 | Method for controlling thickness of treated film on surface-treated material |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP27295286A JPS63128199A (en) | 1986-11-18 | 1986-11-18 | Method for controlling thickness of treated film on surface-treated material |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS63128199A true JPS63128199A (en) | 1988-05-31 |
Family
ID=17521066
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP27295286A Pending JPS63128199A (en) | 1986-11-18 | 1986-11-18 | Method for controlling thickness of treated film on surface-treated material |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS63128199A (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0253966U (en) * | 1988-10-14 | 1990-04-18 | ||
| JPH02107785A (en) * | 1988-10-14 | 1990-04-19 | Nippon Steel Corp | Surface treatment of metallic pipe and equipment |
| WO2003027346A1 (en) * | 2001-09-20 | 2003-04-03 | Sms Demag Aktiengesellschaft | Method and device for coating the surface of elongated metal products |
| KR100807421B1 (en) * | 2006-12-12 | 2008-02-25 | 대우조선해양 주식회사 | A chimney structure of vessel |
-
1986
- 1986-11-18 JP JP27295286A patent/JPS63128199A/en active Pending
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0253966U (en) * | 1988-10-14 | 1990-04-18 | ||
| JPH02107785A (en) * | 1988-10-14 | 1990-04-19 | Nippon Steel Corp | Surface treatment of metallic pipe and equipment |
| JPH0826463B2 (en) * | 1988-10-14 | 1996-03-13 | 新日本製鐵株式会社 | Metal tube surface treatment method and apparatus |
| WO2003027346A1 (en) * | 2001-09-20 | 2003-04-03 | Sms Demag Aktiengesellschaft | Method and device for coating the surface of elongated metal products |
| KR100807421B1 (en) * | 2006-12-12 | 2008-02-25 | 대우조선해양 주식회사 | A chimney structure of vessel |
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