JPS6310778B2 - - Google Patents
Info
- Publication number
- JPS6310778B2 JPS6310778B2 JP55010683A JP1068380A JPS6310778B2 JP S6310778 B2 JPS6310778 B2 JP S6310778B2 JP 55010683 A JP55010683 A JP 55010683A JP 1068380 A JP1068380 A JP 1068380A JP S6310778 B2 JPS6310778 B2 JP S6310778B2
- Authority
- JP
- Japan
- Prior art keywords
- light
- inspected
- scattered
- transmitted light
- laser beam
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 230000007547 defect Effects 0.000 claims description 33
- 238000001514 detection method Methods 0.000 claims description 12
- 230000007423 decrease Effects 0.000 claims description 6
- 230000001678 irradiating effect Effects 0.000 claims description 2
- 239000011521 glass Substances 0.000 description 14
- 238000010586 diagram Methods 0.000 description 8
- 230000001788 irregular Effects 0.000 description 4
- 230000002950 deficient Effects 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 230000035945 sensitivity Effects 0.000 description 2
- 230000005540 biological transmission Effects 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 230000000994 depressogenic effect Effects 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 238000003908 quality control method Methods 0.000 description 1
- 238000011179 visual inspection Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/952—Inspecting the exterior surface of cylindrical bodies or wires
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1068380A JPS56107150A (en) | 1980-01-31 | 1980-01-31 | Defect detection device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1068380A JPS56107150A (en) | 1980-01-31 | 1980-01-31 | Defect detection device |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS56107150A JPS56107150A (en) | 1981-08-25 |
JPS6310778B2 true JPS6310778B2 (es) | 1988-03-09 |
Family
ID=11757053
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1068380A Granted JPS56107150A (en) | 1980-01-31 | 1980-01-31 | Defect detection device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS56107150A (es) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2009186281A (ja) * | 2008-02-05 | 2009-08-20 | Nippon Electric Glass Co Ltd | ガラス物品の欠陥検査方法及び欠陥検査装置 |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE3309629A1 (de) * | 1983-03-17 | 1984-09-20 | Siemens AG, 1000 Berlin und 8000 München | Optische pruefvorrichtung zur fehlerortung in kabel- und leitungsoberflaechen |
KR20030046616A (ko) * | 2001-12-06 | 2003-06-18 | 삼성전자주식회사 | 레이져 광 산란을 이용한 고순도 글래스 튜브의 미세 기포분석 장치 |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5149232A (es) * | 1974-07-27 | 1976-04-28 | Beecham Group Ltd |
-
1980
- 1980-01-31 JP JP1068380A patent/JPS56107150A/ja active Granted
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5149232A (es) * | 1974-07-27 | 1976-04-28 | Beecham Group Ltd |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2009186281A (ja) * | 2008-02-05 | 2009-08-20 | Nippon Electric Glass Co Ltd | ガラス物品の欠陥検査方法及び欠陥検査装置 |
Also Published As
Publication number | Publication date |
---|---|
JPS56107150A (en) | 1981-08-25 |
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