JPS6310778B2 - - Google Patents

Info

Publication number
JPS6310778B2
JPS6310778B2 JP55010683A JP1068380A JPS6310778B2 JP S6310778 B2 JPS6310778 B2 JP S6310778B2 JP 55010683 A JP55010683 A JP 55010683A JP 1068380 A JP1068380 A JP 1068380A JP S6310778 B2 JPS6310778 B2 JP S6310778B2
Authority
JP
Japan
Prior art keywords
light
inspected
scattered
transmitted light
laser beam
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP55010683A
Other languages
English (en)
Japanese (ja)
Other versions
JPS56107150A (en
Inventor
Toshuki Yamada
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Anritsu Corp
Original Assignee
Anritsu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Anritsu Corp filed Critical Anritsu Corp
Priority to JP1068380A priority Critical patent/JPS56107150A/ja
Publication of JPS56107150A publication Critical patent/JPS56107150A/ja
Publication of JPS6310778B2 publication Critical patent/JPS6310778B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/952—Inspecting the exterior surface of cylindrical bodies or wires

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP1068380A 1980-01-31 1980-01-31 Defect detection device Granted JPS56107150A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1068380A JPS56107150A (en) 1980-01-31 1980-01-31 Defect detection device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1068380A JPS56107150A (en) 1980-01-31 1980-01-31 Defect detection device

Publications (2)

Publication Number Publication Date
JPS56107150A JPS56107150A (en) 1981-08-25
JPS6310778B2 true JPS6310778B2 (es) 1988-03-09

Family

ID=11757053

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1068380A Granted JPS56107150A (en) 1980-01-31 1980-01-31 Defect detection device

Country Status (1)

Country Link
JP (1) JPS56107150A (es)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009186281A (ja) * 2008-02-05 2009-08-20 Nippon Electric Glass Co Ltd ガラス物品の欠陥検査方法及び欠陥検査装置

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3309629A1 (de) * 1983-03-17 1984-09-20 Siemens AG, 1000 Berlin und 8000 München Optische pruefvorrichtung zur fehlerortung in kabel- und leitungsoberflaechen
KR20030046616A (ko) * 2001-12-06 2003-06-18 삼성전자주식회사 레이져 광 산란을 이용한 고순도 글래스 튜브의 미세 기포분석 장치

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5149232A (es) * 1974-07-27 1976-04-28 Beecham Group Ltd

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5149232A (es) * 1974-07-27 1976-04-28 Beecham Group Ltd

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009186281A (ja) * 2008-02-05 2009-08-20 Nippon Electric Glass Co Ltd ガラス物品の欠陥検査方法及び欠陥検査装置

Also Published As

Publication number Publication date
JPS56107150A (en) 1981-08-25

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