JPS6262254A - Printed circuit board inspector - Google Patents
Printed circuit board inspectorInfo
- Publication number
- JPS6262254A JPS6262254A JP60202022A JP20202285A JPS6262254A JP S6262254 A JPS6262254 A JP S6262254A JP 60202022 A JP60202022 A JP 60202022A JP 20202285 A JP20202285 A JP 20202285A JP S6262254 A JPS6262254 A JP S6262254A
- Authority
- JP
- Japan
- Prior art keywords
- hole
- circuit board
- probe
- light
- defect
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Abstract
Description
【発明の詳細な説明】
〔概要〕
透光性回路基板に導体パターン、および所定の導体パタ
ーンに接続するスルーホールが形成されたプリント板の
検査装置において、
該導体パターンの導通試験と、該スルーホールの内壁に
発生することのある欠陥の検査とを、同一工程で実施可
能とすることにより、
該回路基板の検査に要する時間を短縮するものである。[Detailed Description of the Invention] [Summary] In an inspection device for a printed board in which a conductive pattern and a through hole connected to a predetermined conductive pattern are formed on a transparent circuit board, a continuity test of the conductive pattern and a through hole are performed. By making it possible to inspect defects that may occur on the inner walls of holes in the same process, the time required to inspect the circuit board is shortened.
本発明は透光性を有する回路基板に形成した導体パター
ンの電気導通検査、およびスルーホールの内壁欠陥を検
査する装置に関する。The present invention relates to an apparatus for inspecting electrical continuity of a conductor pattern formed on a light-transmitting circuit board, and for inspecting inner wall defects of through holes.
両面印刷配線板や多層印刷配線板の導体パターン、およ
び該導体パターンを眉間接続するスルーホールの形成さ
れた回路基板において、導体パターンは途中で切断され
たり、電気的に絶縁されるべき他の導体パターンに接続
される等の欠陥の生じることがある。と共に、スルーホ
ールはめっき形成した内壁に切れ目やピンホール等の欠
陥の生じることがある。In conductor patterns of double-sided printed wiring boards and multilayer printed wiring boards, and circuit boards with through holes that connect the conductor patterns between the eyebrows, the conductor patterns may be cut in the middle or other conductors that should be electrically insulated. Defects such as connection to patterns may occur. In addition, defects such as cuts and pinholes may occur in the plated inner wall of the through hole.
そして、かかる欠陥は回路基板の機能が損なわれたり、
信頼性を低下させるため、回路基板に回路素子を搭載す
る前に検査する必要がある。Such defects may impair the functionality of the circuit board, or
To reduce reliability, it is necessary to inspect circuit elements before mounting them on a circuit board.
従来、一般に前記導体パターンの導通試験は、一連の導
体パターンの両端部にプローブを当接し、該プローブ間
の導通の有無で検査している。Conventionally, the continuity test of the conductor pattern is generally carried out by bringing probes into contact with both ends of a series of conductor patterns, and checking whether there is continuity between the probes.
他方、前記スルーホールの欠陥検査には回路基板に透光
性のある絶縁材料を使用しその透光性を利用した方法、
即ち基板内に投光しスルーホールに欠陥があれば、該欠
陥部から前記投光の漏れることを利用した方法があり、
このスルーホール検査方法は検査に高速性が付与され、
自動化を可能ならしめた等の優れた利点がある。On the other hand, for defect inspection of the through-holes, a method using a translucent insulating material for the circuit board and utilizing its translucency;
That is, there is a method that utilizes the fact that when light is emitted into the board and there is a defect in the through hole, the emitted light leaks from the defective part.
This through-hole inspection method provides high-speed inspection,
It has excellent advantages such as making automation possible.
しかし、前記導通試験とスルーホールの欠陥検査は、そ
れぞれのために設計された装置を使用していた。従って
、検査すべき回路基板を検査装置に搭載して位置決めす
る作業は、それぞれの装置について必要であり、かつ導
通試験とスルーホールの欠陥検査に要する時間は、それ
ぞれの所要時間の加算値となる。However, the continuity test and through-hole defect inspection used devices designed for each. Therefore, the work of mounting and positioning the circuit board to be inspected on the inspection device is necessary for each device, and the time required for continuity testing and through-hole defect inspection is the sum of the time required for each. .
そこで、回路基板の生産性を高めるための一環として、
該試験作業の改善が強く望まれるようになった。Therefore, as part of improving the productivity of circuit boards,
There is a strong desire to improve this test work.
第１図は本発明の一実施例になるプリント板検査装置の
要部を模式的に示す斜視図であり、１は所望の導体パタ
ーン２およびスルーホール３が形成された透光性回路基
板、４は各スルーホール３の上部開口を遮蔽しスルーホ
ール３と電気的に接続する先端部５を有する導通試験用
プローブ、８は回路基板１の下方に設けたＸ−Ｙステー
ジ９に搭載された光検出器、１０は導光管７の外方端に
対向する光源である。FIG. 1 is a perspective view schematically showing the main parts of a printed board inspection apparatus according to an embodiment of the present invention, in which 1 is a translucent circuit board on which a desired conductor pattern 2 and through holes 3 are formed; 4 is a continuity test probe having a tip 5 that shields the upper opening of each through hole 3 and is electrically connected to the through hole 3; 8 is mounted on an X-Y stage 9 provided below the circuit board 1; A photodetector 10 is a light source facing the outer end of the light guide tube 7.
上記問題点は第１図に示すように、
透光性回路基板１に形成した導体パターン２の電気導通
検査、および回路基板１に形成したスルーホール３の内
壁欠陥を検査する装置であり、回路基板１に透過光を照
射する光源１０と、スルーホール３の一方の開口部と導
電性を有する先端５が接触し該開口部を遮蔽する電気導
通検査用のプローブ４と、
スルーホール３の該一方または他方の開口部からスルー
ホール３内の漏洩光を検出する検出器８とを具えてなる
ことを特徴とし、
さらには、光検出器８が回路基板１を挟みプローブ４と
対向し配設してなること、
光検出器８がプローブの中心部を貫通しプローブ先端に
一端が開口する導光路を介し、光学的にスルーホール３
と対向するようにしてなること、を特徴とするプリント
板検査装置により解決される。As shown in FIG. 1, the above-mentioned problem is that the device tests the electrical continuity of the conductor pattern 2 formed on the transparent circuit board 1 and inspects the inner wall defects of the through hole 3 formed on the circuit board 1. A light source 10 that irradiates the substrate 1 with transmitted light; a probe 4 for electrical continuity testing whose conductive tip 5 contacts one opening of the through hole 3 to shield the opening; It is characterized by comprising a detector 8 that detects leakage light in the through hole 3 from one or the other opening, and furthermore, the photodetector 8 is disposed facing the probe 4 with the circuit board 1 in between. The photodetector 8 is optically connected to the through hole 3 through a light guide path that passes through the center of the probe and has one end open at the tip of the probe.
This problem is solved by a printed board inspection device characterized in that:
上記手段によれば、プローブ４をスルーホール３の上部
開口に当接し導体パターン２の電気導通検査を行うト共
に、所定のスルーホール３の下方に光検出器８を位置さ
せれば、該スルーホール３の内壁の欠陥検査が実施でき
るようになる。従って、回路基板１は１回のセットで、
導体パターン２の導通検査と、スルーホール３の欠陥検
査とが可能となり、しかも該導通検査と欠陥検査とは並
行に実施できるため、回路基板１の試験時間は従来より
も短縮される。According to the above means, in addition to testing the electrical continuity of the conductive pattern 2 by bringing the probe 4 into contact with the upper opening of the through hole 3, if the photodetector 8 is positioned below a predetermined through hole 3, the through hole It becomes possible to inspect the inner wall of the hole 3 for defects. Therefore, the circuit board 1 is set once,
Since the continuity test of the conductor pattern 2 and the defect test of the through hole 3 can be performed in parallel, and the continuity test and the defect test can be performed in parallel, the test time for the circuit board 1 can be shortened compared to the conventional method.
以下に、図面を用いて本発明の実施例になるプリント板
検査装置を説明する。DESCRIPTION OF THE PREFERRED EMBODIMENTS A printed board inspection apparatus according to an embodiment of the present invention will be described below with reference to the drawings.
第１図において、複数本のプローブ４を上下動可能に支
持し導光管７を支持する絶縁板６は、予め位置決めし固
定された回路基板１の上方で上下動可能であり、回路基
板１の下方に配設された光検出器８は、回路基板１と平
行平面内を移動するようになっている。In FIG. 1, an insulating plate 6 that supports a plurality of probes 4 in a vertically movable manner and supports a light guide tube 7 is vertically movable above a circuit board 1 that has been positioned and fixed in advance. A photodetector 8 disposed below is configured to move within a plane parallel to the circuit board 1.
そこで、回路基板１の導体パターン２の導通検査、およ
びスルーホール３の配役位置に対応し設は金属にてなル
複数本のプローブ４は、導電性ゴムにてなりスルーホー
ル３の開口を覆う大きさの先端部５を下端フランジの下
面に取着し、上端に係止用のフランジを具え、該下端フ
ランジと絶縁板６との間に圧縮コイルばね１４が嵌挿さ
れており、直流電源１２にて駆動する切替回路１１に接
続されている。一方、光検出器８はスルーホール３内に
漏洩光の有無（欠陥判定）を行うプロセッサ１３に接続
しである。Therefore, a plurality of probes 4 are made of metal and are made of conductive rubber to cover the openings of the through holes 3 in order to test the continuity of the conductor pattern 2 on the circuit board 1 and to correspond to the positions of the through holes 3. A tip portion 5 of the same size is attached to the lower surface of the lower end flange, a locking flange is provided at the upper end, and a compression coil spring 14 is inserted between the lower end flange and the insulating plate 6. It is connected to a switching circuit 11 driven by 12. On the other hand, the photodetector 8 is connected to a processor 13 that determines whether there is leakage light in the through hole 3 (defect determination).
このように構成したプリント板検査装置は、回路基板１
を固着したのち、絶縁板６を降下動させると各プローブ
４の先端部５は、圧縮コイルばね１４の少し圧縮された
状態で、スルーホール３の上端面および導体パターン２
の所定部と接触し、各スルーホール３の上部開口が遮蔽
される。The printed board inspection device configured in this way has a circuit board 1
After fixing, when the insulating plate 6 is moved down, the tip 5 of each probe 4 is in a slightly compressed state of the compression coil spring 14, and the upper end surface of the through hole 3 and the conductor pattern 2
The upper opening of each through hole 3 is blocked.
そこで、光源ｌＯを点灯するとその出射光１５は、導光
管７を透過して回路基板１の上面を照射し、回路基板１
内で散乱した散乱光１６は、スルーホール３に欠陥１７
があるとそこから漏洩し、スルーホール３内を明るくす
る。そのため、Ｘ−Ｙステージ９を駆動し、各スルーホ
ール３の下方に光検出器８を順次位置させると、欠陥１
７により内部が明るくなったスルーホール３は、光検出
器８に接続したプロセッサ１３で検出される。Therefore, when the light source IO is turned on, the emitted light 15 passes through the light guide tube 7 and illuminates the upper surface of the circuit board 1.
The scattered light 16 scattered within the through hole 3 causes a defect 17 in the through hole 3.
If there is, it will leak from there and brighten the inside of the through hole 3. Therefore, when the X-Y stage 9 is driven and the photodetector 8 is sequentially positioned below each through hole 3, the defect 1
The through hole 3 whose inside is brightened by the light source 7 is detected by a processor 13 connected to a photodetector 8.
他方、回路基板１の電気導通検査、例えば導体パターン
２で接続されたスルーホール３間等の電気導通検査は、
予め設定したプログラムによって切替回路１１がプロー
ブ４を選択し、前記スルーホール３の欠陥検査と同時に
実施する。On the other hand, the electrical continuity test of the circuit board 1, for example, the electrical continuity test between the through holes 3 connected by the conductor pattern 2,
The switching circuit 11 selects the probe 4 according to a preset program, and performs the defect inspection of the through hole 3 at the same time.
第２図は本発明の他の実施例に係わるプローブを示す断
面図であり、該プローブはスルーホールの内部に漏洩し
た光を光検出器に導く導光管を具えている。FIG. 2 is a sectional view showing a probe according to another embodiment of the present invention, and the probe includes a light guide tube that guides light leaked into the through hole to a photodetector.
第１図と同一部分に同一符号を使用した第２図において
、プローブ４と同様に装着し使用されるプローブ２１は
、下部フランジの下面に導電性ゴムにてなりドーナツ形
をした下端部２２を設け、下端部２２の中心部に一端が
開口しプローブ２１の上部から導出した導光管２３を具
えてなる。In FIG. 2, in which the same parts as in FIG. A light guide tube 23 is provided, one end of which is open at the center of the lower end portion 22 and led out from the top of the probe 21.
従って第２図に示す如く、スルーホール３の内壁に欠陥
１７があると、第１図のそれと同様に照明し回路基板１
の内部で散乱した散乱光１６は、欠陥１７から漏洩し、
該漏洩光は導光管２３の他端に対向させた光検出器８で
検出される。そのため、プローブ２１を使用したプリン
ト板検査装置は、スルーホール３に対応し光検出器８を
移動させる必要がなく、所望の方向および位置に配設し
た導光管２３の他端と対向するように設けることが可能
となり、装置構成が小型化できる。Therefore, if there is a defect 17 on the inner wall of the through hole 3 as shown in FIG.
The scattered light 16 scattered inside leaks from the defect 17,
The leaked light is detected by a photodetector 8 facing the other end of the light guide tube 23. Therefore, the printed board inspection apparatus using the probe 21 does not need to move the photodetector 8 to correspond to the through hole 3, and can be moved so that the photodetector 8 faces the other end of the light guide tube 23 arranged in a desired direction and position. The device configuration can be made smaller.
以上説明したように本発明−によれば、透光性回路基板
の電気導通検査と、そこに形成したスルーホールの欠陥
検査とが、同一工程に同時に実施可能となり、該回路基
板の検査に要する時間が短縮されると共に、検査装置の
所要スペースが従来より狭くてできる効果を有する。As explained above, according to the present invention, the electrical continuity test of a translucent circuit board and the defect test of through-holes formed therein can be performed simultaneously in the same process, and the inspection of the circuit board requires This has the advantage that not only the time is shortened, but also the space required for the inspection device is smaller than that of the conventional method.
第１図は本発明の一実施例になるプリント板検査装置の
要部を模式的に示す斜視図、
第２図は本発明の他の実施例に係わるプローブを示す断
面図、
である。
図中において、
１は透光性回路基板、
２は導体パターン、
３はスルーホール、
４．２１はプローブ、
５．２２はプローブ先端、
８は光検出器、
１０は光源、
１７はスルーホール欠陥、
２３は導光路、
を示す。
革１図FIG. 1 is a perspective view schematically showing the main parts of a printed board inspection apparatus according to an embodiment of the present invention, and FIG. 2 is a sectional view showing a probe according to another embodiment of the present invention. In the figure, 1 is a translucent circuit board, 2 is a conductor pattern, 3 is a through hole, 4.21 is a probe, 5.22 is a probe tip, 8 is a photodetector, 10 is a light source, 17 is a through hole defect , 23 indicates a light guide path. Leather 1 diagram
Claims (3)
２）の電気導通検査、および該基板（１）に形成したス
ルーホール（３）の内壁欠陥を検査する装置であり、 該回路基板（１）に透過光を照射する光源（１０）と、
該スルーホール（３）の一方の開口部と導電性を有する
先端（５、２２）が接触し該開口部を遮蔽する電気導通
検査用のプローブ（４、２１）と、 該スルーホール（３）の該一方または他方の開口部から
該スルーホール（３）内の漏洩光を検出する検出器（８
）とを具えてなることを特徴とするプリント板検査装置
。(1) Conductor pattern (
2), and an apparatus for inspecting the inner wall defects of the through hole (3) formed in the circuit board (1), and a light source (10) that irradiates the circuit board (1) with transmitted light;
an electrical continuity test probe (4, 21) whose conductive tip (5, 22) comes into contact with one opening of the through-hole (3) to shield the opening; and the through-hole (3). a detector (8) for detecting leakage light in the through hole (3) from one or the other opening of the
) A printed board inspection device comprising:
前記プローブ（４）と対向し、配設してなることを特徴
とする前記特許請求の範囲第１項記載のプリント板検査
装置。(2) The printed board according to claim 1, characterized in that the photodetector (8) is arranged opposite to the probe (4) with the circuit board (1) in between. Inspection equipment.
心部を貫通し前記プローブ先端（２２）に一端が開口す
る導光路（２３）を介し、光学的に前記スルーホール（
３）と対向するようにしてなることを特徴とする前記特
許請求の範囲第１項記載のプリント板検査装置。(3) The photodetector (8) is optically connected to the through hole (
3) The printed board inspection device according to claim 1, wherein the printed board inspection device is arranged so as to face the printed board inspection device 3).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP60202022A JPS6262254A (en) | 1985-09-12 | 1985-09-12 | Printed circuit board inspector |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP60202022A JPS6262254A (en) | 1985-09-12 | 1985-09-12 | Printed circuit board inspector |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS6262254A true JPS6262254A (en) | 1987-03-18 |
Family
ID=16450624
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP60202022A Pending JPS6262254A (en) | 1985-09-12 | 1985-09-12 | Printed circuit board inspector |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6262254A (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS57192723A (en) * | 1981-05-20 | 1982-11-26 | Matsushita Electric Ind Co Ltd | Automatic temperature control combustor |
| JP2006177847A (en) * | 2004-12-24 | 2006-07-06 | Matsushita Electric Ind Co Ltd | Visual inspection device and visual inspection method of substrate |
| CN103674960A (en) * | 2012-09-07 | 2014-03-26 | 威光自动化科技股份有限公司 | Detection device |
-
1985
- 1985-09-12 JP JP60202022A patent/JPS6262254A/en active Pending
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS57192723A (en) * | 1981-05-20 | 1982-11-26 | Matsushita Electric Ind Co Ltd | Automatic temperature control combustor |
| JP2006177847A (en) * | 2004-12-24 | 2006-07-06 | Matsushita Electric Ind Co Ltd | Visual inspection device and visual inspection method of substrate |
| CN103674960A (en) * | 2012-09-07 | 2014-03-26 | 威光自动化科技股份有限公司 | Detection device |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| KR19980064499A (en) | Adapter device for electrically inspecting printed circuit boards | |
| RU2212775C2 (en) | Installation for electrical inspection of printed circuits with adjustable-position probing needles | |
| JPS6262254A (en) | Printed circuit board inspector | |
| JP4247076B2 (en) | Substrate inspection system and substrate inspection method | |
| JPH0447782B2 (en) | ||
| US4734980A (en) | Printed circuit board wiring method | |
| KR100765490B1 (en) | PCB electrode plate | |
| KR20050067759A (en) | A semiconductor test device | |
| JPH0815361A (en) | Inspection method for printed wiring board | |
| JPH0359448A (en) | Through hole mask device for light leak inspecting method | |
| JPH04315068A (en) | Apparatus for inspecting printed circuit board | |
| JP2004361249A (en) | Substrate inspection device | |
| KR200417528Y1 (en) | PCB electrode plate | |
| KR20050067760A (en) | A semiconductor test device | |
| SU1580597A1 (en) | Device for checking multilayer printed circuit boards | |
| KR0176519B1 (en) | QEP, IC inspection device and inspection method | |
| JP2007165391A (en) | Printed board inspection apparatus and grid conversion board therefor | |
| JPH0421104Y2 (en) | ||
| KR19980035266A (en) | Inspection device of printed circuit board | |
| JPH05164822A (en) | Testing method for packaged circuit device | |
| KR20240073639A (en) | 4-wire probe type test apparatus | |
| JPS60242379A (en) | Probe card | |
| KR890004759Y1 (en) | Monoblock detect system | |
| KR20030094489A (en) | Probing system having pogo block leveling inspection apparatus | |
| JPH04236365A (en) | Board inspecting apparatus |