JPS6231875Y2 - - Google Patents
Info
- Publication number
- JPS6231875Y2 JPS6231875Y2 JP1982038382U JP3838282U JPS6231875Y2 JP S6231875 Y2 JPS6231875 Y2 JP S6231875Y2 JP 1982038382 U JP1982038382 U JP 1982038382U JP 3838282 U JP3838282 U JP 3838282U JP S6231875 Y2 JPS6231875 Y2 JP S6231875Y2
- Authority
- JP
- Japan
- Prior art keywords
- pair
- falling weight
- rotatable
- chain
- sprocket
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000012360 testing method Methods 0.000 claims description 20
- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical compound C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 claims description 7
- 238000009863 impact test Methods 0.000 claims description 2
- 230000005540 biological transmission Effects 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000007665 sagging Methods 0.000 description 1
Landscapes
- Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
Description
【考案の詳細な説明】
本考案は落錘の落下高さを簡単に調整でき且つ
自動的に該落錘を繰り返し落下すべく成した衝撃
試験装置に関するものである。Detailed Description of the Invention The present invention relates to an impact testing device that allows the drop height of a weight to be easily adjusted and that automatically drops the weight repeatedly.
従来に於いては、落錘の落下高さを調整するに
際し、落錘の落下位置は一定にしておいて試験片
を載置する試料受台の位置を上下動して、その落
下距離を調整していた。 Conventionally, when adjusting the falling height of a falling weight, the falling position of the falling weight is kept constant and the position of the sample holder on which the test piece is placed is moved up and down to adjust the falling distance. Was.
従つて、落錘の落下衝撃力により試料受台の位
置がずれてしまうことがあり、精度の高い試験が
行い難いという欠点があつた。 Therefore, the position of the sample holder may shift due to the impact force of the falling weight, which has the drawback of making it difficult to perform highly accurate tests.
又試験を繰り返し行うに際しては落錘を持ち上
げてはクランプを外して落下せしめており能率的
な連続試験が行い難い等の欠点もあつた。 In addition, when testing is repeated, the falling weight is lifted, the clamp is removed, and the test is allowed to fall, making it difficult to carry out efficient continuous testing.
本考案はこれらの点に鑑みなされたもので、以
下に図示の実施例に基きその内容について説明す
る。 The present invention has been devised in view of these points, and its contents will be explained below based on the illustrated embodiments.
１は試験装置本体で落錘２の落下を案内する一
対の案内レール３を設けてある。この落錘２の重
量は試験試料に対応して選択するものである。３
Ａは落錘２の撃点で種々の形状の物に交換可能で
ある。４は落錘２の張出アームでアーム板４Ａと
４Ｂとの間に前記案内レール３を配置してあり、
落錘２の案内を司るものである。 Reference numeral 1 denotes a main body of the testing apparatus, which is provided with a pair of guide rails 3 for guiding the falling of a falling weight 2. The weight of this falling weight 2 is selected depending on the test sample. 3
A is the shooting point of the falling weight 2 and can be replaced with items of various shapes. 4 is an overhanging arm of a falling weight 2, and the guide rail 3 is arranged between arm plates 4A and 4B;
It is in charge of guiding Falling Weight 2.
５はアーム板４Ａと４Ｂとの間に回転可能に設
けたガイドローラーで前記案内レール３に当接せ
しめてあり、落錘２の落下を円滑に行わせる機能
を有している。 Reference numeral 5 denotes a guide roller rotatably provided between arm plates 4A and 4B, which is brought into contact with the guide rail 3 and has the function of allowing the falling weight 2 to fall smoothly.
６は落錘２を所定高さ位置まで持ち上げてはそ
の持ち上げを自動的に開放して落錘２を落下せし
めるためのチエーンで前記落錘２の張出アーム４
に於けるアーム板４Ａ，４Ｂ間を挿通せしめてあ
る。 Reference numeral 6 is a chain for lifting the falling weight 2 to a predetermined height position and automatically releasing the lifted weight to allow the falling weight 2 to fall; the arm 4 extending from the falling weight 2;
It is inserted between the arm plates 4A and 4B at the same time.
７は該チエーン６の一部に設けた一対の突出部
材で前記アーム板４Ａ，４Ｂを下側から持ち上げ
て、落錘２を矢標Ａ方向に移行せしめるものであ
る。８は案内シヤフト９に上下移動可能に設けた
高さ位置可変設定部材で、ワイヤー１０を介して
バランスウエイト１１によりその高さ位置を調節
すべくなしてある。 Numeral 7 is a pair of protruding members provided on a part of the chain 6, which lifts the arm plates 4A, 4B from below to move the falling weight 2 in the direction of arrow A. Reference numeral 8 denotes a variable height setting member provided on the guide shaft 9 so as to be movable up and down, and its height position is adjusted by a balance weight 11 via a wire 10.
尚、バランスウエイト１１の代りに回転ハンド
ル（図示せず）等によりワイヤー１０を捲き上げ
て高さ位置をモーター等により自動設定してもよ
い。 Note that instead of using the balance weight 11, the wire 10 may be rolled up using a rotary handle (not shown) or the like, and the height position may be automatically set using a motor or the like.
１２はクランプねじで高さ位置可変設定部材８
を位置調整した後に、クランプ固定するものであ
る。１３及び１４は高さ位置可変設定部材８に取
り付けた可回転スプロケツトで前記チエーン６を
引つ掛けてある。 12 is a height position variable setting member 8 with a clamp screw.
After adjusting the position, it is fixed with a clamp. Reference numerals 13 and 14 are rotatable sprockets attached to the variable height setting member 8, on which the chain 6 is hooked.
このチエーン６はエンドレスにしてあり、他の
スプロケツト１５，１６，１７に捲き付けてあ
る。 This chain 6 is made endless and is wound around other sprockets 15, 16, and 17.
即ち、駆動モーター１８によりスプロケツト１
５が矢標Ｂ方向に回転せしめられるとチエーン６
は矢標Ｃ方向に回転移行せしめられる。１９は駆
動モーター１８の回転をスプロケツト１５に伝達
するための伝達チエーンである。 That is, the drive motor 18 drives the sprocket 1.
When chain 5 is rotated in the direction of arrow B, chain 6
is rotated in the direction of arrow C. 19 is a transmission chain for transmitting the rotation of the drive motor 18 to the sprocket 15.
前記した可回転スプロケツト１３と可回転スプ
ロケツト１４とはその中心軸P1及びP2を上下及び
左右方向にずらせてあり、可回転スプロケツト１
３の中心軸P1を、可回転スプロケツト１４の中心
軸P2より内側であつて且つ下側に位置付けしてあ
る。 The rotatable sprocket 13 and the rotatable sprocket 14 described above have their central axes P 1 and P 2 shifted vertically and horizontally, and the rotatable sprocket 1
The central axis P1 of the rotatable sprocket 14 is located inside and below the central axis P2 of the rotatable sprocket 14.
従つて、チエーン６に取り付けた突出部材７は
この可回転スプロケツト１３の位置で落錘２から
外側へ逃がすようにして外れることとなる。 Therefore, the protruding member 7 attached to the chain 6 is removed from the falling weight 2 at the position of the rotatable sprocket 13 so as to escape outward.
換言すれば、チエーン６の矢標Ｃ方向の移行に
より突出部材７が落錘２を張出アーム４を介して
矢標Ａ方向に持ち上げ、該突出部材７が可回転ス
プロケツト１３に沿つて矢標Ｄ方向に移行し、張
出アーム４から外れると落錘２は自重により落下
せしめられることとなる。 In other words, as the chain 6 moves in the direction of arrow C, the protruding member 7 lifts the falling weight 2 in the direction of arrow A via the overhanging arm 4, and the protruding member 7 moves along the rotatable sprocket 13 in the direction of arrow A. When the falling weight 2 moves in the direction D and comes off the overhanging arm 4, it will fall due to its own weight.
張出アーム４から外れた突出部材７はチエーン
６の移行と共に同方に移行せしめられる。 The projecting member 7 that has come off the projecting arm 4 is moved in the same direction as the chain 6 is moved.
２０は高さ位置可変設定部材８の取手で、クラ
ンプねじ１２を緩るめて該高さ位置可変設定部材
８の高さを可変する際に手で把握する部分であ
る。 Reference numeral 20 denotes a handle of the variable height setting member 8, which is a part that is grasped by hand when loosening the clamp screw 12 to change the height of the variable height setting member 8.
２１はガイドローラーでワイヤー１０を係架し
てある。 21 is a guide roller on which the wire 10 is suspended.
２２は高さ目盛を布置した支柱で上端にスプロ
ケツト１５を軸着し、下端にスプロケツト１６を
軸着してある。２３は落錘２の落下端に位置せし
めた試験試料載置受台である。２４は指針、２５
はスイツチ操作パネル、２６は試験試料である。 Numeral 22 is a column having a height scale arranged thereon, and has a sprocket 15 pivotally attached to its upper end, and a sprocket 16 pivotally attached to its lower end. 23 is a test sample mounting pedestal located at the falling end of the falling weight 2. 24 is a guideline, 25
is a switch operation panel, and 26 is a test sample.
次に叙上の構成より成る本考案装置の作動態様
について説明する。 Next, the operating mode of the device of the present invention having the above configuration will be explained.
試験試料２６として例えばシート、フイルムを
試験試料載置受台２３上に載置し各種アダプター
（図示せず）により挾持する。 For example, a sheet or a film as the test sample 26 is placed on the test sample mounting pedestal 23 and held by various adapters (not shown).
然る後、電源スイツチ（図示せず）をONにし
て、駆動モーター１８を所定方向に回転せしめる
とスプロケツト１５が矢標Ｂ方向に回転し、チエ
ーン６を矢標Ｃ方向に回転移行せしめる。このチ
エーン６の矢標Ｃ方向への回転移行に伴つて突出
部材７も同方向に移行するので、落錘２も張出ア
ーム４と突出部材７との衝合により持ち上げられ
て矢標Ａ方向に上昇移行する。 Thereafter, when a power switch (not shown) is turned on and the drive motor 18 is rotated in a predetermined direction, the sprocket 15 rotates in the direction of arrow B, causing the chain 6 to rotate in the direction of arrow C. As the chain 6 rotates in the direction of arrow C, the protruding member 7 also moves in the same direction, so the falling weight 2 is also lifted up by the collision between the overhanging arm 4 and the protruding member 7, and moves in the direction of arrow A. to move upward.
一方、予め一定の高さ位置に可変設定されてい
る高さ位置可変設定部材８の可回転スプロケツト
１３の位置に、チエーン６に取り付けた突出部材
７が移行して来て、該突出部材７が可回転スプロ
ケツト１３に沿つて矢標Ｄ方向に移行し、張出ア
ーム４から外れると落錘２は自重により案内レー
ル３に案内されて落下せしめられ、試験試料２６
に落下衝撃力を与える。 On the other hand, the protruding member 7 attached to the chain 6 moves to the position of the rotatable sprocket 13 of the height variable setting member 8, which is variably set to a certain height position in advance, and the protruding member 7 When the falling weight 2 moves in the direction of arrow D along the rotatable sprocket 13 and comes off the overhanging arm 4, it is guided by the guide rail 3 by its own weight and falls, and the test sample 26
gives a falling impact force to.
連続してチエーン６が回転し、再び突出部材７
が廻つて来ると落錘２の張出アーム４と衝合し該
落錘２を持ち上げて矢標Ａ方向に上昇移行し、再
び所定高さから落下せしめる。 The chain 6 rotates continuously and the protruding member 7
When it rotates, it collides with the overhanging arm 4 of the falling weight 2, lifts up the falling weight 2, moves upward in the direction of arrow A, and causes it to fall again from a predetermined height.
以後、同様の落下試験が自動的に繰り返えされ
て行われる。 Thereafter, similar drop tests are automatically repeated.
而して、本考案は叙上に示す如き構成及び作用
を有するものであり、特に試験試料載置受台を固
定式とし、高さ位置可変設定部材を上下方向に移
動可能にして落錘２の落下高さを可変すべく成し
たので従来の如く受台が落下衝撃力によりずれ動
くことはなく、又受台の位置修正を行なう等の煩
雑な手間を必要とせずに精度の高い試験を行い得
ると共に、チエーンに取付けた突出部材が落錘よ
り外側へ逃げ出す如く外れて該落錘を落下せし
め、再び該突出部材が落錘を持ち上げるので落下
試験を自動的に繰り返して行うことが出来、更に
又、チエーンの突出部材を介しての落錘の持ち上
げ動作が、該突出部材のみでもつて単に案内レー
ル３に沿つて落錘を持ち上げるだけであり、案内
レール３と突出部材とは何等接触することがなく
チエーンの突出部材を介しての該チエーンの引掛
かり、たるみ等による損傷や突出部材自体の案内
レール３等による持ち上げ摩擦抵抗等に基く損傷
或いは負担を生じる惧れがなく落錘をスムースに
持ち上げることが出来る等の実益なること多大な
るものがある。 Therefore, the present invention has the structure and function as described above, and in particular, the test sample mounting pedestal is fixed, the height variable setting member is movable in the vertical direction, and the falling weight 2 is fixed. Because the height of the drop is variable, the pedestal does not shift due to the impact force of the fall, unlike conventional methods, and highly accurate tests can be performed without the need for troublesome efforts such as adjusting the position of the pedestal. In addition, the protruding member attached to the chain escapes outward from the falling weight, causing the falling weight to fall, and the protruding member lifts the falling weight again, so that the drop test can be repeated automatically. Furthermore, the lifting action of the falling weight via the protruding member of the chain merely lifts the falling weight along the guide rail 3 with the protruding member alone, and the guide rail 3 and the protruding member do not come into contact with each other in any way. The weight can be smoothly dropped without causing damage due to the chain being caught or sagging via the protruding member of the chain, or damage or burden due to lifting frictional resistance of the protruding member itself due to the guide rail 3, etc. There are many practical benefits such as being able to lift things up.
第１図は本考案装置全体の概略正面図、第２図
は第１図の要部の側面図、第３図は落錘の張出ア
ームとチエーンに取り付けた突出部材との関係を
示す要部の平面図、第４図は落錘が落下した状態
の要部の正面図である。
１……試験装置本体、２……落錘、４……張出
アーム、４Ａ，４Ｂ……アーム板、６……チエー
ン、７……突出部材、８……高さ位置可変設定部
材、１３，１４……可回転スプロケツト、２３…
…試験試料載置受け台、２５……試験試料。
Figure 1 is a schematic front view of the entire device of the present invention, Figure 2 is a side view of the main parts of Figure 1, and Figure 3 is a diagram showing the relationship between the overhanging arm of the falling weight and the protruding member attached to the chain. Fig. 4 is a front view of the main part in a state where the falling weight has fallen. DESCRIPTION OF SYMBOLS 1... Test device main body, 2... Falling weight, 4... Extended arm, 4A, 4B... Arm plate, 6... Chain, 7... Protruding member, 8... Height position variable setting member, 13 , 14... rotatable sprocket, 23...
...Test sample mounting pedestal, 25...Test sample.
Claims (1)
すると共に、一対の案内レール３を前記不動部よ
り垂直方向に直立せしめて、一対の張出アーム４
を有する落錘２を上昇及び落下可能に取付ける一
方、一対の案内シヤフト９を前記不動部より垂直
方向であつて且つ前記一対の案内レール３より外
側に直立せしめて、中心軸P1を内側下方向に位置
付けした一対の可回転スプロケツト１３と中心軸
P2を該可回転スプロケツト１３よりも外側上方向
にズレて位置付けした一対の可回転スプロケツト
１４とを有する高さ位置可変設定部材８を上下動
可能に取付ける他方、一対の突出部材７を有する
エンドレスのチエーン６を前記案内レール３の一
部乃至可回転スプロケツト１３、前記案内シヤフ
ト９の一部乃至可回転スプロケツト１４に沿つて
移動すべく配設し、更に前記一対の突出部材７が
所定の高さ位置にある前記内側に在る一対の可回
転スプロケツト１３の位置で前記落錘２の一対の
張出アーム４より、前記案内レール３に対して外
側方向へ外れるように成した繰り返し落下衝撃試
験装置。 The test sample mounting pedestal 23 is fixed to a lower stationary part, and a pair of guide rails 3 are made to stand vertically from the stationary part, and a pair of overhanging arms 4 are fixed.
A falling weight 2 having a vertical axis is attached so as to be able to rise and fall, while a pair of guide shafts 9 are made to stand upright perpendicularly to the stationary part and outwardly from the pair of guide rails 3 so that the center axis P1 is A pair of rotatable sprockets 13 positioned in the direction and the central shaft
A variable height setting member 8 having a pair of rotatable sprockets 14 in which P 2 is positioned outwardly and upwardly than the rotatable sprocket 13 is vertically movably mounted, and an endless member having a pair of protruding members 7 The chain 6 is arranged to move along a part of the guide rail 3 or along the rotatable sprocket 13, a part of the guide shaft 9 or the rotatable sprocket 14, and the pair of protruding members 7 are arranged to move along a part of the guide shaft 9 or along the rotatable sprocket 14. A repeated drop impact test in which the falling weight 2 was detached from the pair of overhanging arms 4 of the falling weight 2 toward the outside with respect to the guide rail 3 at the position of the pair of rotatable sprockets 13 located on the inside. Device.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3838282U JPS58140458U (en) | 1982-03-18 | 1982-03-18 | Repeated drop impact test equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3838282U JPS58140458U (en) | 1982-03-18 | 1982-03-18 | Repeated drop impact test equipment |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS58140458U JPS58140458U (en) | 1983-09-21 |
| JPS6231875Y2 true JPS6231875Y2 (en) | 1987-08-15 |
Family
ID=30049725
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP3838282U Granted JPS58140458U (en) | 1982-03-18 | 1982-03-18 | Repeated drop impact test equipment |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS58140458U (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5122511B2 (en) * | 2009-03-31 | 2013-01-16 | カヤバ システム マシナリー株式会社 | Drop test device |
| JP5336977B2 (en) * | 2009-08-26 | 2013-11-06 | カヤバ システム マシナリー株式会社 | Drop test device |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5557042U (en) * | 1978-10-16 | 1980-04-17 |
-
1982
- 1982-03-18 JP JP3838282U patent/JPS58140458U/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS58140458U (en) | 1983-09-21 |
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