JPS62269043A - Particle analyser - Google Patents

Particle analyser

Info

Publication number
JPS62269043A
JPS62269043A JP61112987A JP11298786A JPS62269043A JP S62269043 A JPS62269043 A JP S62269043A JP 61112987 A JP61112987 A JP 61112987A JP 11298786 A JP11298786 A JP 11298786A JP S62269043 A JPS62269043 A JP S62269043A
Authority
JP
Japan
Prior art keywords
optical system
beam splitter
splitter
objective lens
imaging lens
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP61112987A
Other languages
Japanese (ja)
Inventor
Yuji Ito
勇二 伊藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Inc
Original Assignee
Canon Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Inc filed Critical Canon Inc
Priority to JP61112987A priority Critical patent/JPS62269043A/en
Priority to US07/049,522 priority patent/US4839528A/en
Publication of JPS62269043A publication Critical patent/JPS62269043A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/10—Investigating individual particles
    • G01N15/14—Optical investigation techniques, e.g. flow cytometry
    • G01N15/1434—Optical arrangements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/10—Investigating individual particles
    • G01N15/14—Optical investigation techniques, e.g. flow cytometry
    • G01N15/1456—Optical investigation techniques, e.g. flow cytometry without spatial resolution of the texture or inner structure of the particle, e.g. processing of pulse signals
    • G01N15/1459—Optical investigation techniques, e.g. flow cytometry without spatial resolution of the texture or inner structure of the particle, e.g. processing of pulse signals the analysis being performed on a sample stream
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/10—Investigating individual particles
    • G01N15/14—Optical investigation techniques, e.g. flow cytometry
    • G01N15/1434—Optical arrangements
    • G01N2015/144—Imaging characterised by its optical setup
    • G01N2015/1443—Auxiliary imaging
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N2021/4704—Angular selective
    • G01N2021/4707—Forward scatter; Low angle scatter

Landscapes

  • Chemical & Material Sciences (AREA)
  • Dispersion Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

PURPOSE:To split beam without generating an aberrational problem and receiving the effect of laser beam, by providing a beam splitter in the afocal optical system behind an objective lens. CONSTITUTION:The laser beam from a beam source 10 is condensed in the vicinity of the center of the flow passage of a flow cell 12 by an image forming lens 11. Forward scattering beam due to specimen particles is incident on a beam detector 18 through a beam splitter 14, an image forming lens 16 and an aperture 17. In the beam path bent in a 90 deg.-direction by the splitter 14, an image is formed on an image sensor 20 in order to monitor the shape of irradiation beam in the cell 12. Because an afocal optical system is formed between an objective lens 13 and an image forming lens 16, no aberrational problem is generated and a stopper 15 is provided behind the splitter 14 to directly cut the laser beam to the detector 18. By this method, the splitting of beam can be performed with good accuracy.

Description

【発明の詳細な説明】 ［産業上の利用分野］ 本発明は、照射ビームの観察光学系と前方散乱測光光学
系の光分割を行う粒子解析装置に関するものである。DETAILED DESCRIPTION OF THE INVENTION [Industrial Application Field] The present invention relates to a particle analysis device that performs light splitting between an observation optical system and a forward scattering photometry optical system of an irradiation beam.

［従来の技術Ｊ フローサイトメータ等に用いられる従来の粒子解析装置
では、フローセルの中央部の例えば２００ｇｍＸ２００
ｐｍの微少な断面を有する流通部内を、シース液に包ま
れて通過する検体粒子に照射光を照射し、その結果生ず
る前方及び側方散乱光により、検体粒子の形状・大きさ
・屈折率等の粒子的性質を得ることが可能である。[Prior art J] In conventional particle analysis devices used in flow cytometers, for example, 200 gm
Irradiation light is irradiated onto specimen particles passing through a flow section with a minute cross section of pm, wrapped in sheath liquid, and the resulting forward and side scattered light is used to determine the shape, size, refractive index, etc. of the specimen particles. It is possible to obtain the particle-like properties of

第３図に示す従来例の場合に、フローセル１を流れる検
体粒子のレーザー光による前方散乱光は、貼り合わせ面
を有するビームスプリ７タ２゜対物レンズ３、アパーチ
ャ４を経て光検出器５に入射する。そして、対物レンズ
３の前面に配置されたストッパ６は光検出器５に直接入
射するレーザー光をカットする役割を果している。ビー
ムスプリッタ２で９０°方向に曲げられたビーム観察光
学系では、結像レンズ７を介しイメージセンサ８上に照
射レーサー光の形状、フローセル１の内部の汚れ等を検
出するための像が結像される。In the case of the conventional example shown in FIG. 3, the forward scattered light caused by the laser beam of the sample particles flowing through the flow cell 1 passes through a beam splitter 7 having a bonded surface, a 2° objective lens 3, and an aperture 4, and then reaches the photodetector 5. incident. A stopper 6 placed in front of the objective lens 3 serves to cut off laser light that is directly incident on the photodetector 5. In the beam observation optical system bent in a 90° direction by the beam splitter 2, an image for detecting the shape of the irradiated laser light, dirt inside the flow cell 1, etc. is formed on the image sensor 8 via the imaging lens 7. be done.

この場合に、レーザー光の形状を検知するためには、ス
トッパ６はビームスプリッタ２の後方に配置する必要が
生ずる。そのため、ビームスプリッタ２の貼り合わせ面
に直接のレーザー光が入射することによって、貼り合わ
せ部分の接着剤に光学的な変化が生ずる。また、平面板
状のビームスプリッタ２を対物レンズ３の前方に配置す
ることは収差的に好ましくない。In this case, in order to detect the shape of the laser beam, it becomes necessary to arrange the stopper 6 behind the beam splitter 2. Therefore, when the laser beam is directly incident on the bonded surface of the beam splitter 2, an optical change occurs in the adhesive at the bonded portion. Further, it is not preferable to arrange the beam splitter 2 in the form of a flat plate in front of the objective lens 3 in terms of aberrations.

［発明の目的］ 本発明の目的は、上述の従来例の欠点を除去し、ビーム
スプリフタの光学的な影響を受けずに、精度の良い粒子
解析装置を提供することにある。[Object of the Invention] An object of the present invention is to eliminate the drawbacks of the above-mentioned conventional examples and to provide a particle analysis device with high precision without being affected by the optical influence of a beam splitter.

［発明の概要］ 上述の目的を達成するための本発明の要旨は。[Summary of the invention] The gist of the present invention is to achieve the above objects.

フローセルを通過する液体中に浮遊する検体粒子に光を
照射し、検体粒子から得られる散乱光を検出する装置に
おいて、前記フローセル側から散乱光を集光する対物レ
ンズ、ビームスプリフタ、結像レンズ、光検出器を順次
に配列し、前記対物レンズと結像レンズ間をアフォーカ
ル光学系とし。In a device that irradiates light onto sample particles floating in a liquid passing through a flow cell and detects scattered light obtained from the sample particles, an objective lens, a beam splitter, and an imaging lens converge the scattered light from the flow cell side. , photodetectors are arranged in sequence, and an afocal optical system is formed between the objective lens and the imaging lens.

前記ビームスプリッタは前記ビーを直進する第１の光学
系と前記ビームスプリッタビームから側方に進む第２の
光学系とに光路を分割する機能を有することを特徴とす
る粒子解析装置である。The beam splitter is a particle analysis apparatus characterized in that it has a function of dividing an optical path into a first optical system that travels straight through the beam and a second optical system that travels laterally from the beam splitter beam.

［発明の実施例］ 本発明を第１図、第２図に図示の実施例に基づいて詳細
に説明する。[Embodiments of the Invention] The present invention will be explained in detail based on the embodiments shown in FIGS. 1 and 2.

第１図において、１０はレーザー光源であり、その光軸
に沿って順次に結像レンズ１１、フローセル１１．対物
レンズ１３、ビームスプリッタ１４、ストッパ１５、結
像レンズ１６、アパーチャ１７、光検出器１８が配列さ
れている。また、ビームスプリッタ１４の反射側には結
像レンズ１９、イメージセンサ２０が配置されている。In FIG. 1, 10 is a laser light source, and along its optical axis, an imaging lens 11, a flow cell 11, . An objective lens 13, a beam splitter 14, a stopper 15, an imaging lens 16, an aperture 17, and a photodetector 18 are arranged. Furthermore, an imaging lens 19 and an image sensor 20 are arranged on the reflection side of the beam splitter 14.

そして、対物レンズ１３と結像レンズ１６の間はアフォ
ーカル光学系とされている。An afocal optical system is provided between the objective lens 13 and the imaging lens 16.

レーザー光源１０からのレーザー光は、結像レンズ１１
でフローセル１１の流路の中央近くに集光される。ここ
で、検体粒子による前方散乱光はビームスプリッタ１４
、結像レンズ１６、アパーチャ１７を経て光検出器１８
に入射する。ハーフミラ−等から成るビームスプリッタ
１４で９０゜方向に曲げられた光路では、照射ビームの
フローセル１１内での形状をモニタするために、像を結
像レンズ１９によりイメージセンサ２０上に結像する。The laser light from the laser light source 10 passes through the imaging lens 11
The light is focused near the center of the flow path of the flow cell 11. Here, the forward scattered light by the sample particles is transmitted to the beam splitter 14.
, an imaging lens 16, an aperture 17, and a photodetector 18.
incident on . In the optical path bent in a 90° direction by a beam splitter 14 such as a half mirror, an image is formed on an image sensor 20 by an imaging lens 19 in order to monitor the shape of the irradiation beam within the flow cell 11.

対物レンズ１３と結像レンズ１６の間はアフォーカル光
学系になっているので、ビームスプリッタ１４の前面と
後面で反射され、結像レンズ１９で結像される像は二重
像となることはない。Since there is an afocal optical system between the objective lens 13 and the imaging lens 16, the image reflected by the front and rear surfaces of the beam splitter 14 and formed by the imaging lens 19 will not become a double image. do not have.

これは前方散乱光測光光学系にも同様なことが云え、収
差的にも問題はない。The same can be said of the forward scattered light photometry optical system, and there is no problem in terms of aberrations.

また、ビームスプリッタ１４の後方にストッパ１５を配
置することにより、光検出器１８へのレーザー光からの
直接光をカットすることができる。Further, by arranging the stopper 15 behind the beam splitter 14, direct light from the laser beam to the photodetector 18 can be cut off.

第２図は第１図のビームスプリッタ１４の代りに挿入す
るビームスプリッタ１４゛であり、反射鏡２１に相当す
る部分が前方散乱測光光学系に対するストッパの働きを
すると共に、かつレーザー光をイメージセンサ２０に導
くという利点がある。FIG. 2 shows a beam splitter 14' inserted in place of the beam splitter 14 in FIG. It has the advantage of leading to 20.

［発明の効果］ 以上説明したように本発明に係る粒子解析装置によれば
、対物レンズの後方のアフォーカル光学系内にビームス
プリフタを設けることにより、収差的に問題なく、また
レーザー光による影響を受けずに光分割を行うことが可
能となる。[Effects of the Invention] As explained above, according to the particle analyzer according to the present invention, by providing a beam splitter in the afocal optical system behind the objective lens, there is no problem with aberrations, and the particle analysis device according to the present invention can be used without any aberration problems. It becomes possible to perform light division without being affected.

【図面の簡単な説明】[Brief explanation of the drawing]

図面第１図、第２図は本発明に係る粒子解析装置の一実
施例を示し、第１図はその構成図、第２図はビームスプ
リッタの変形例の断面図であり。 第３図は従来例の構成図である。 符号１０はレーザー光源、１１．１６．１９は結像レン
ズ、１２はフローセル、１３は対物レンズ、１４．１４
’　はビームスプリッタ、１５はストッパ、１７はアパ
ーチャ、１８は光検出器。 ２０はイメージセンサ、２１は反射鏡である。1 and 2 show an embodiment of a particle analysis apparatus according to the present invention, with FIG. 1 being a configuration diagram thereof, and FIG. 2 being a sectional view of a modified example of a beam splitter. FIG. 3 is a configuration diagram of a conventional example. 10 is a laser light source, 11.16.19 is an imaging lens, 12 is a flow cell, 13 is an objective lens, 14.14
' is a beam splitter, 15 is a stopper, 17 is an aperture, and 18 is a photodetector. 20 is an image sensor, and 21 is a reflecting mirror.

Claims (1)

【特許請求の範囲】 １、フローセルを通過する液体中に浮遊する検体粒子に
光を照射し、検体粒子から得られる散乱光を検出する装
置において、前記フローセル側から散乱光を集光する対
物レンズ、ビームスプリッタ、結像レンズ、光検出器を
順次に配列し、前記対物レンズと結像レンズ間をアフォ
ーカル光学系とし、前記ビームスプリッタは前記ビーを
直進する第１の光学系と前記ビームスプリッタビームか
ら側方に進む第２の光学系とに光路を分割する機能を有
することを特徴とする粒子解析装置。 ２、前記第１の光学系は前方散乱光測光光学系とし、前
記第２の光学系はビーム観察光学系とした特許請求の範
囲第１項に記載の粒子解析装置。 ３、前記ビームスプリッタはストッパを兼用し、その表
面或いは裏面に、前記第１の光学系に対するストッパの
役割を果すと共に、前記第２の光学系への反射面を設け
た特許請求の範囲第１項に記載の粒子解析装置。[Claims] 1. In a device that irradiates light onto sample particles floating in a liquid passing through a flow cell and detects scattered light obtained from the sample particles, an objective lens that focuses the scattered light from the flow cell side. , a beam splitter, an imaging lens, and a photodetector are arranged in sequence, and an afocal optical system is formed between the objective lens and the imaging lens, and the beam splitter includes a first optical system that moves straight through the beam and the beam splitter. A particle analysis device characterized by having a function of dividing an optical path from a beam into a second optical system that proceeds laterally. 2. The particle analysis apparatus according to claim 1, wherein the first optical system is a forward scattered light photometry optical system, and the second optical system is a beam observation optical system. 3. The beam splitter also serves as a stopper, and the front or back surface of the beam splitter is provided with a reflective surface for the first optical system and a reflection surface for the second optical system. Particle analysis device described in section.
JP61112987A 1986-05-17 1986-05-17 Particle analyser Pending JPS62269043A (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP61112987A JPS62269043A (en) 1986-05-17 1986-05-17 Particle analyser
US07/049,522 US4839528A (en) 1986-05-17 1987-05-14 Particle analyzing apparatus using an afocal light beam

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP61112987A JPS62269043A (en) 1986-05-17 1986-05-17 Particle analyser

Publications (1)

Publication Number Publication Date
JPS62269043A true JPS62269043A (en) 1987-11-21

Family

ID=14600577

Family Applications (1)

Application Number Title Priority Date Filing Date
JP61112987A Pending JPS62269043A (en) 1986-05-17 1986-05-17 Particle analyser

Country Status (1)

Country Link
JP (1) JPS62269043A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2013175661A1 (en) * 2012-05-25 2013-11-28 Kowa Company, Ltd. Apparatus and method for measuring physiologically active substance of biological origin
WO2019116802A1 (en) * 2017-12-15 2019-06-20 株式会社堀場製作所 Particle analyzing device

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2013175661A1 (en) * 2012-05-25 2013-11-28 Kowa Company, Ltd. Apparatus and method for measuring physiologically active substance of biological origin
WO2019116802A1 (en) * 2017-12-15 2019-06-20 株式会社堀場製作所 Particle analyzing device
JPWO2019116802A1 (en) * 2017-12-15 2020-12-24 株式会社堀場製作所 Particle analyzer

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