JPS6221792A - Device for liquid-phase epitaxial growth - Google Patents

Device for liquid-phase epitaxial growth

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Publication number
JPS6221792A
JPS6221792A JP15892385A JP15892385A JPS6221792A JP S6221792 A JPS6221792 A JP S6221792A JP 15892385 A JP15892385 A JP 15892385A JP 15892385 A JP15892385 A JP 15892385A JP S6221792 A JPS6221792 A JP S6221792A
Authority
JP
Japan
Prior art keywords
solution
growth
substrate holder
piston
holder part
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP15892385A
Other languages
Japanese (ja)
Other versions
JPH0532359B2 (en
Inventor
Tsunehiro Unno
恒弘 海野
Mineo Wajima
峰生 和島
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Cable Ltd
Original Assignee
Hitachi Cable Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Cable Ltd filed Critical Hitachi Cable Ltd
Priority to JP15892385A priority Critical patent/JPS6221792A/en
Publication of JPS6221792A publication Critical patent/JPS6221792A/en
Publication of JPH0532359B2 publication Critical patent/JPH0532359B2/ja
Granted legal-status Critical Current

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  • Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)

Abstract

PURPOSE:To make it possible to grow epitaxial layer in a range from small thickness to large thickness in uniform thickness, by combining a substrate holder part, a solution storage part and a piston device to carry out a specific action and performing liquid-phase epitaxial growth. CONSTITUTION:The GaAs substrates 1 rate arranged in the substrate holder part 3 and Ga and GaAs polycrystal are put in the solution reservoir 4. When GaAs is dissolved in Ga until it is saturated, annealing is started. The piston 7 is pushed at the time t3 when temperature is dropped by 3 deg.C from the starting temperature of drop in temperature and the solution 2 for growing is raised to the substrate holder 3 and packed into it. Then, annealing is continued and, when 30sec is passed and time reaches the time t4, the piston 7 is retreated and the solution 2 for growing is restored from the substrate holder part 3 to the solution reservoir 4. In this operation, the solution 2 for growing can be separated from the substrates in 0.5sec. After the growth processes are carried out, the solution is cooled to room temperature, the substrate holder part 3 is changed and the following growth is performed.

Description

【発明の詳細な説明】 [発、明の背量と目的] 本発明は、液相エピタキシャル成長装置の改良に関する
ものである。
DETAILED DESCRIPTION OF THE INVENTION [Invention, Aspects and Objects of the Invention] The present invention relates to an improvement in a liquid phase epitaxial growth apparatus.

液相エピタキシャル成長に関しては、LDの成長などに
用いられるスライドボート法が広く用いられている。し
かし、スライドボート法では、基板を水平にして1枚1
枚成長させるため」1産化が難しい。一般的に、液相エ
ピタキシャル法は、■ビタキシャル法の中で量産化が難
しいと云われている方法である。
Regarding liquid phase epitaxial growth, the slide boat method used for LD growth etc. is widely used. However, in the slide boat method, the substrates are held horizontally and one
It is difficult to produce a single product because of the need to grow a single sheet. In general, the liquid phase epitaxial method is said to be difficult to mass-produce among the bitaxial methods.

従来、上記のスライドボート法以外に行なわれている方
法の装aを第4図により説明する。図において、1は基
板、2は成長用溶液、4は溶液溜。
A conventional method other than the slide boat method described above will be explained with reference to FIG. In the figure, 1 is a substrate, 2 is a growth solution, and 4 is a solution reservoir.

5は成長用溶液収容部、8はシャッターである。5 is a growth solution storage part, and 8 is a shutter.

そして、上下のシャッター8,8間に縦方向に複数の基
板1が間隙をおいて配列され、上部のシャッター8の上
面の溶液溜4内に成長用溶液2を収容しておぎ、上部の
シャッター8を開いて成長用溶液2を下部に流し込む。
A plurality of substrates 1 are arranged vertically with gaps between the upper and lower shutters 8, 8, and a growth solution 2 is stored in a solution reservoir 4 on the upper surface of the upper shutter 8. 8 and pour the growth solution 2 into the lower part.

成長終了後、下部のシャッター8を開いて成長用溶液2
を更に下部の溶液溜4に流下させる。しかし、この方法
では、多数枚を同時に成長させることはできるが、成長
終7後、再度成長用溶液2を使用するためには上部のシ
ャッター8上に移し変える作業が必要となり、さらに、
成長用溶液2の汚染の原因となる。また、重心が高いた
め著しく不安定である。
After the growth is completed, open the lower shutter 8 and release the growth solution 2.
further flows down into the solution reservoir 4 at the bottom. However, with this method, although it is possible to grow a large number of sheets at the same time, in order to use the growth solution 2 again after the completion of growth 7, it is necessary to transfer the growth solution 2 onto the upper shutter 8.
This causes contamination of the growth solution 2. It is also extremely unstable due to its high center of gravity.

この対策として第5図に示す構造が提案された。As a countermeasure to this problem, a structure shown in FIG. 5 was proposed.

第5図では液収容部5の内底部に溶液溜4を設け、内部
に縦方向に複数の基板1が配列された基板ホルダー部3
の側壁部に溶液注入口6を設け、基板ボルダ一部3の下
部に溶液溜4内の成長用溶液2を溶液注入口6から基板
ホルダー部3内に押し込むピストン7が設けられている
。そして、ピストン7を押し込むことにより、成長用溶
液2が溶液注入口9側に押し上げられ基板ホルダー部3
の側方向から溶液注入口6より流入し、成長終了後にピ
ストン7を引き戻すことにより成長用溶液2は溶液溜4
内に戻るようになっている。しかし、第5図の方法では
、温度プログラムとしてスーパークーリング法を用いた
場合には、薄くエピタキシャル層の成長は困難である。
In FIG. 5, a solution reservoir 4 is provided at the inner bottom of a liquid storage section 5, and a substrate holder section 3 in which a plurality of substrates 1 are arranged vertically.
A solution inlet 6 is provided in the side wall portion of the substrate boulder portion 3, and a piston 7 is provided at the bottom of the substrate boulder portion 3 for pushing the growth solution 2 in the solution reservoir 4 from the solution inlet 6 into the substrate holder portion 3. Then, by pushing the piston 7, the growth solution 2 is pushed up toward the solution injection port 9 side, and the substrate holder part 3
The growth solution 2 flows into the solution reservoir 4 from the side direction by pulling back the piston 7 after the growth is completed.
It's like going back inside. However, in the method shown in FIG. 5, it is difficult to grow a thin epitaxial layer when a supercooling method is used as the temperature program.

薄いエピタキシャル層を均一に成長させるためには、基
板1の収容部全体に成長用溶液の注入を急速に行なう必
要がある。しかし、成長用溶液を側方の溶液注入口6か
ら導入するために溶液注入口6のサイズにより制限され
、特に、基板1の枚数が多くなり基板収容部の大きさが
大きくなると、基板1の下側と上側とでは成長用溶液2
に接触する時間差は、10秒前後におよぶことになる。
In order to uniformly grow a thin epitaxial layer, it is necessary to rapidly inject the growth solution into the entire receptacle of the substrate 1. However, since the growth solution is introduced from the side solution inlet 6, it is limited by the size of the solution inlet 6. In particular, when the number of substrates 1 increases and the size of the substrate accommodating section increases, the growth solution is introduced from the side solution inlet 6. Growth solution 2 on the lower and upper sides
The time difference between the two contacts is approximately 10 seconds.

そして、液面が水平状に上t/することができない。Also, the liquid level cannot rise horizontally.

また、スーパークーリング法を用いた場合には溶液注入
口6に近い基板1aと遠い基板1bとでは厚さが異なっ
てしまう。このため、第5図の装置による方法では、成
長用溶液2を注入後、答、冷を開始して成長する平衡冷
却法が用いられている。
Further, when the super cooling method is used, the thickness of the substrate 1a close to the solution injection port 6 and the substrate 1b far away from the solution injection port 6 will be different. Therefore, in the method using the apparatus shown in FIG. 5, an equilibrium cooling method is used in which after the growth solution 2 is injected, cooling is started to grow.

しかし、平衡冷却法によるエピタキシャル層表面は、骨
、冷して過冷却度を付けてから成長させるスーパークー
リング法やステップクーリング法に比べて表面の平坦さ
が悪いのは文献などによっても周知の事実である。従っ
て、1μm程度の薄さで、鏡面のエピタキシャル層を成
長させるためには、成長用溶液と基板との接触及び分離
の時開を短くかくしなければならない。
However, it is well known in the literature that the epitaxial layer surface obtained by the equilibrium cooling method has poor surface flatness compared to the supercooling method or step cooling method, in which the epitaxial layer is grown after being cooled to a degree of supercooling. It is. Therefore, in order to grow a specular epitaxial layer with a thickness of about 1 μm, the contact and separation periods between the growth solution and the substrate must be kept short.

本発明は上記の状況に鑑みなされたものであり、薄いエ
ピタキシャル層から厚いエピタキシャル層まで均一厚さ
で成長を可能にする液相エピタキシャル成長装置を提供
することを目的としたものである。
The present invention was made in view of the above situation, and an object of the present invention is to provide a liquid phase epitaxial growth apparatus that enables growth of a thin epitaxial layer to a thick epitaxial layer with uniform thickness.

[発明の概要] 本発明の液相エピタキシャル成長装置は、複数の基板を
基板ホルダー部内に縦に配列し高温雰囲気内で上記基板
面に成長用溶液を接触させてエピタキシャル成長させる
ように形成されてなり、上記基板が内蔵されると共に下
端部から上部成長用溶液が出入り可能に形成された上記
基板ホルダー部と、該基板ホルダー部が上部側に配設さ
れ上記成長用溶液を収容する溶液溜がF部に設けられて
いる溶液収容部と、該溶液収容部内にピストンを押し込
むことにより上記溶液溜内の上記成長用溶液を上記基板
ホルダー部内に該基板ホルダー部下部から押し上げ所定
時間後上記ピストンを引き出すことにより該溶液溜内に
戻すように形成されたピストン5A胃とを設けたもので
ある。
[Summary of the Invention] The liquid phase epitaxial growth apparatus of the present invention is formed such that a plurality of substrates are vertically arranged in a substrate holder section and epitaxial growth is performed by bringing a growth solution into contact with the substrate surface in a high temperature atmosphere. The substrate holder part has the substrate built therein and is formed so that the upper growth solution can enter and exit from the lower end, and the F part has the substrate holder part disposed on the upper side and a solution reservoir for accommodating the growth solution. a solution storage part provided in the solution storage part; pushing a piston into the solution storage part to push up the growth solution in the solution reservoir from the lower part of the substrate holder part into the substrate holder part; and pulling out the piston after a predetermined period of time; A piston 5A is formed to return the solution into the reservoir.

[実施例] 以下、本発明の液相エピタキシャル成長装置の実施例を
従来と同部品は同符号で示し第1図により説明Jる。基
板ホルダー部3は下端面が大きく開放され下部より成長
用溶液2の出入りが溶液に可能に形成されている。基板
ホルダー部3の下部には溶液溜4を有する溶液収容部5
が形成されている。溶液収容部5内にはピストン装置の
ピストン7が、ピストン7を押し込むことにより溶液溜
4内の成長用溶液2をυ板ホルダー部3内に基板ホルダ
ー3の下部から押し上げ充填させ、引き戻°りことによ
り溶液溜4内に戻Jように取り付けられている。
[Example] Hereinafter, an example of the liquid phase epitaxial growth apparatus of the present invention will be described with reference to FIG. The substrate holder part 3 has a large open lower end surface so that the growth solution 2 can enter and exit from the lower part. A solution storage section 5 having a solution reservoir 4 is provided at the bottom of the substrate holder section 3.
is formed. A piston 7 of a piston device is inserted into the solution storage section 5, and by pushing the piston 7, the growth solution 2 in the solution reservoir 4 is pushed up and filled into the υ plate holder section 3 from the bottom of the substrate holder 3, and then pulled back. It is attached in such a way that it can be returned to the solution reservoir 4 by removing the liquid.

第1図の装置により、GaAsの1ビタキシヤル成長を
行った場合を以下に説明する。50MR×50m+サイ
ズのGaAs基板1を互いに向い合せた状態で30枚基
板ホルダー部3内に縦方向に配列する。溶液溜4内に、
ガリウムをi 5ooa。
A case in which one-bitaxial growth of GaAs is performed using the apparatus shown in FIG. 1 will be described below. Thirty GaAs substrates 1 having a size of 50 MR x 50 m+ are arranged vertically in a substrate holder part 3 with facing each other. In the solution reservoir 4,
Gallium i 5ooa.

GaAS多結晶を1200Åれる。このように準備した
エピタキシャル成長装置を反応管(図示せず)に入れ、
水素ガスを1時間流し反応管内部の空気を水素ガスと置
換する。その後、横軸に時間をとり縦軸に炉内温度とっ
て示した第5図の加熱冷却曲線図の曲線Aの如く800
℃(王りまで昇温してGa中にGaASを溶かす。
A GaAS polycrystalline film with a thickness of 1200 Å is formed. Place the epitaxial growth apparatus prepared in this way into a reaction tube (not shown),
Hydrogen gas was passed for 1 hour to replace the air inside the reaction tube with hydrogen gas. Thereafter, as shown in curve A of the heating/cooling curve diagram in FIG. 5, where the horizontal axis represents time and the vertical axis represents furnace temperature,
°C (raise the temperature to the brim to dissolve GaAS in Ga.

Ga内にGaAsが飽和するまで溶けたところで、時間
t2から冷却速度1℃/winで様冷を開始する。降温
開始温度より3℃下ったところの時間t3でピストン7
を押し成長用溶液2を基板ホルダー部3内にIJIさせ
充填する。ピストン7の移動距離は10cmで、上昇を
0.5秒で終了させることができた。尚、ピストン7は
ボートローダ−を用いて操作しているが、現状のボート
ローダ−では200 ttytr/ secの速度が限
界であるため、成長用溶液充填速度が制限されている。
When GaAs is dissolved in Ga until it is saturated, cooling is started from time t2 at a cooling rate of 1° C./win. Piston 7 at time t3 when the temperature has decreased by 3°C from the starting temperature.
Press to fill the growth solution 2 into the substrate holder part 3. The moving distance of the piston 7 was 10 cm, and the ascent could be completed in 0.5 seconds. Incidentally, the piston 7 is operated using a boat loader, but since the speed of the current boat loader is limited to 200 ttytr/sec, the filling speed of the growth solution is limited.

そして、そのまま埒、冷を続け、30秒経過して時間t
4になったところでピストン7を引き、成長用溶液2を
基板ボルダ一部3から溶液溜4へ戻す。このときも、0
.5秒で成長用溶液2を基板1から分離することができ
る。以上の成長工程を終了侵室温まで冷即し基板ホルダ
ー部3を交換した後次の成長行なう。
Then, continue cooling as it is, and after 30 seconds, time t
4, the piston 7 is pulled and the growth solution 2 is returned from the substrate boulder part 3 to the solution reservoir 4. At this time as well, 0
.. The growth solution 2 can be separated from the substrate 1 in 5 seconds. After the above growth process is completed, the substrate is cooled down to the invasive temperature, and the substrate holder part 3 is replaced, after which the next growth is performed.

上記の方法で成長させたエピタキシャル層の厚さの平均
値は、1.1μmであり面内ばらつきは±10%以内に
入っていた。上記のように1μm台の薄いエピタキシャ
ルウェハが面内均−性よく成長可能である。そして、通
常液相エピタキシャルウェハ表面に現われるメニスカス
ラインも小さく、きわめてきれいな表面状態である。こ
れは、成長用溶液2を上昇、下降させる速度が速いため
で あり、ピストン7の操作速度を遅クシた場合には肉
眼でもはっきり見える程度のメニスカスラインが表われ
てきた。
The average thickness of the epitaxial layer grown by the above method was 1.1 μm, and the in-plane variation was within ±10%. As described above, epitaxial wafers as thin as 1 μm can be grown with good in-plane uniformity. The meniscus lines that normally appear on the surface of a liquid phase epitaxial wafer are also small and the surface is extremely clean. This is because the speed at which the growth solution 2 is raised and lowered is fast, and when the operating speed of the piston 7 is slowed down, a meniscus line appears that is clearly visible to the naked eye.

このように本実施例の液相エピタキシ1!ル成長装置に
よれば、基板が縦方向に複数枚配列された基板ホルダー
部内に下方から成長用溶液を充填。
In this way, liquid phase epitaxy 1 of this example! According to this growth device, a growth solution is filled from below into a substrate holder part in which a plurality of substrates are arranged vertically.

排出できるようにしたので、基板ホルダー部への流入口
を大きくして液面が水平状態で充填、排出を急速に行な
うことができ、薄いエピタキシャル層から厚いエピタキ
シャル層まで均一厚さに成長させることができる。
By making it possible to drain the liquid, the inlet to the substrate holder is enlarged, allowing rapid filling and draining while keeping the liquid level horizontal, allowing growth of a uniform thickness from thin epitaxial layers to thick epitaxial layers. I can do it.

第4図は他の実施例を示す。1μm以下の厚さのエピタ
キシせル層を多数枚成長させるためには、成長用溶液を
上昇及び下降させる時間をさらに短縮させる必要がある
。このため本実施例においては、溶液溜4を2個設け、
基板ホルダー部3内のそれぞれの溶液溜4の成長用溶液
2をそれぞれピストン7が第1図の場合に比較し半分の
可動距離で流入充填、排出ができるようにしたものであ
る。
FIG. 4 shows another embodiment. In order to grow a large number of epitaxial shell layers with a thickness of 1 μm or less, it is necessary to further shorten the time for raising and lowering the growth solution. Therefore, in this embodiment, two solution reservoirs 4 are provided,
The growth solution 2 in each solution reservoir 4 in the substrate holder part 3 can be inflowed, filled, and discharged with half the movable distance of the piston 7 compared to the case shown in FIG.

従って、0.5μm厚さでも多数枚を均一厚さに成長さ
せることができ、また、溶融溜4を増加しただけ成長用
溶液の上昇、下降時間を短縮できる。
Therefore, even with a thickness of 0.5 μm, many sheets can be grown to a uniform thickness, and the rise and fall times of the growth solution can be shortened by increasing the number of melt reservoirs 4.

そして、両実施例の装置は、GaASを含む■−V族化
合物半導体及びGaAllAsなどの混晶化合物半導体
、さらに、II−Vl族化合物半導体とその混晶などの
液相エピタキシャル成長に適用できる。
The apparatuses of both embodiments can be applied to liquid phase epitaxial growth of -V group compound semiconductors including GaAS, mixed crystal compound semiconductors such as GaAllAs, and II-Vl group compound semiconductors and their mixed crystals.

[発明の効果] 以上記述したように本発明の液相エピタキシャル成長装
置は、薄いエピタキシャル層から厚いエピタキシャル層
まで均一厚さで成長させることができる効果を有するも
のである。
[Effects of the Invention] As described above, the liquid phase epitaxial growth apparatus of the present invention has the effect of being able to grow a thin epitaxial layer to a thick epitaxial layer with a uniform thickness.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の液相エピタキシャル成長装置の実施例
の縦断面図、第2図は第1図の装置による成長時の加熱
冷却曲線図、第3図は本発明の液相エピタキシャル成長
装置の他の実施例の縦断面図、第4図、第5図はそれぞ
れ従来の液相エピタキシャル成長装置の縦断面図である
。 1・・・基   板。 2・・・成長用溶液。 3・・・基板ホルダー。 4・・・溶 液 溜。 5・・・溶液収容部。 7・・・ピストン。 代理人 弁理士 佐 藤 不二雄 、  回置の1?信(内容に変更なし)第 112] 一鳳 箪 2 図 第 3 目 第 4 図 フ 本 晃 5 図 昭和   年   月   日
FIG. 1 is a vertical cross-sectional view of an embodiment of the liquid phase epitaxial growth apparatus of the present invention, FIG. 2 is a heating/cooling curve diagram during growth using the apparatus of FIG. 1, and FIG. FIGS. 4 and 5 are longitudinal sectional views of the conventional liquid phase epitaxial growth apparatus, respectively. 1... Board. 2... Growth solution. 3... Board holder. 4...Solution reservoir. 5...Solution storage section. 7... Piston. Agent Patent Attorney Fujio Sato, 1? Letter (no change in content) No. 112] Ichihokan 2 Figure 3 Item 4 Figure F Honko 5 Figure Showa Year Month Day

Claims (1)

【特許請求の範囲】[Claims] (1)複数の基板を基板ホルダー部内に縦に配列し高温
雰囲気内で上記基板面に成長用溶液を接触させてエピタ
キシャル成長させるものにおいて、上記基板が内蔵され
ると共に下端部から上記成長用溶液が出入り可能に形成
された上記基板ホルダー部と、該基板ホルダー部が上部
側に配設され上記成長用溶液を収容する溶液溜が下部に
設けられている溶液収容部と、該溶液収容部内にピスト
ンを押し込むことにより上記溶液溜内の上記成長用溶液
を上記基板ホルダー部内に該基板ホルダー部下部から押
し上げ所定時間後上記ピストンを引き出すことにより該
溶液溜内に戻すように形成されたピストン装置とを設け
たことを特徴とする液相エピタキシヤル成長装置。
(1) In a device in which a plurality of substrates are vertically arranged in a substrate holder part and a growth solution is brought into contact with the substrate surface in a high temperature atmosphere for epitaxial growth, the substrates are built in and the growth solution is supplied from the lower end. The substrate holder part is formed to be removable, the solution storage part has the substrate holder part disposed on the upper side and a solution reservoir for storing the growth solution is provided in the lower part, and a piston is disposed in the solution storage part. a piston device configured to push the growth solution in the solution reservoir into the substrate holder part from the lower part of the substrate holder part by pushing the piston back into the solution reservoir by pulling out the piston after a predetermined period of time; A liquid phase epitaxial growth apparatus characterized in that:
JP15892385A 1985-07-18 1985-07-18 Device for liquid-phase epitaxial growth Granted JPS6221792A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15892385A JPS6221792A (en) 1985-07-18 1985-07-18 Device for liquid-phase epitaxial growth

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15892385A JPS6221792A (en) 1985-07-18 1985-07-18 Device for liquid-phase epitaxial growth

Publications (2)

Publication Number Publication Date
JPS6221792A true JPS6221792A (en) 1987-01-30
JPH0532359B2 JPH0532359B2 (en) 1993-05-14

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JP15892385A Granted JPS6221792A (en) 1985-07-18 1985-07-18 Device for liquid-phase epitaxial growth

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JP (1) JPS6221792A (en)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS627696A (en) * 1985-07-04 1987-01-14 Hitachi Cable Ltd Method and apparatus for liquid-phase epitaxial growth

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS627696A (en) * 1985-07-04 1987-01-14 Hitachi Cable Ltd Method and apparatus for liquid-phase epitaxial growth

Also Published As

Publication number Publication date
JPH0532359B2 (en) 1993-05-14

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