JPS62190776A - Photoelectric conversion device - Google Patents

Photoelectric conversion device

Info

Publication number
JPS62190776A
JPS62190776A JP61033585A JP3358586A JPS62190776A JP S62190776 A JPS62190776 A JP S62190776A JP 61033585 A JP61033585 A JP 61033585A JP 3358586 A JP3358586 A JP 3358586A JP S62190776 A JPS62190776 A JP S62190776A
Authority
JP
Japan
Prior art keywords
photoelectric conversion
conversion element
transparent substrate
light
transparent
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP61033585A
Other languages
Japanese (ja)
Other versions
JPH06105791B2 (en
Inventor
Hiroshi Konakano
浩志 向中野
Kojin Kawahara
河原 行人
Satoshi Machida
聡 町田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Instruments Inc
Original Assignee
Seiko Instruments Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Instruments Inc filed Critical Seiko Instruments Inc
Priority to JP61033585A priority Critical patent/JPH06105791B2/en
Publication of JPS62190776A publication Critical patent/JPS62190776A/en
Publication of JPH06105791B2 publication Critical patent/JPH06105791B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/02Details
    • H01L31/0203Containers; Encapsulations, e.g. encapsulation of photodiodes
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/10Bump connectors; Manufacturing methods related thereto
    • H01L2224/15Structure, shape, material or disposition of the bump connectors after the connecting process
    • H01L2224/16Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
    • H01L2224/161Disposition
    • H01L2224/16151Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/16221Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/16225Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/26Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
    • H01L2224/31Structure, shape, material or disposition of the layer connectors after the connecting process
    • H01L2224/32Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
    • H01L2224/321Disposition
    • H01L2224/32151Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/32221Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/32225Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481Disposition
    • H01L2224/48151Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48225Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • H01L2224/48227Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation connecting the wire to a bond pad of the item
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/484Connecting portions
    • H01L2224/48463Connecting portions the connecting portion on the bonding area of the semiconductor or solid-state body being a ball bond
    • H01L2224/48465Connecting portions the connecting portion on the bonding area of the semiconductor or solid-state body being a ball bond the other connecting portion not on the bonding area being a wedge bond, i.e. ball-to-wedge, regular stitch
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/73Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
    • H01L2224/732Location after the connecting process
    • H01L2224/73201Location after the connecting process on the same surface
    • H01L2224/73203Bump and layer connectors
    • H01L2224/73204Bump and layer connectors the bump connector being embedded into the layer connector

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Power Engineering (AREA)
  • Photovoltaic Devices (AREA)
  • Light Receiving Elements (AREA)
  • Solid State Image Pick-Up Elements (AREA)

Abstract

PURPOSE:To form a photoelectric conversion device, an optical distance thereof the surface of a light-receiving element is equalized and which has excellent dampproofness and is manufactured simply, by connecting a photoelectric conversion element so that a light-receiving section for the photoelectric conversion element is faced to a transparent substrate, to which a wiring, etc. are executed, and injecting a transparent resin between the photoelectric conversion element and the transparent substrate. CONSTITUTION:A light-receiving surface for a photoelectric conversion element 2 is faced to a transparent substrate 1, and an optical signal is projected from the side A. A section between the photoelectric conversion element 2 and the transparent substrate 1 is filled with a transparent resin 4, and interrupted from the outside air. The light-receiving surface of the photoelectric conversion element 2 is faced to the transparent substrate, and the transparent resin is hardly brought into contact with the outside air. The transparent resin 4 has no effect on the function of a semiconductor device even when it creeps onto the back of the light-receiving element 2 because a distance between the light-receiving element 2 and the transparent substrate 1 is fixed. Since beams C reflected from a draft surface pass through the transparent substrate 1 and the transparent resin 4 and are projected to the light-receiving surface for the photoelectric conversion element 2, the transparent substrate 2 functions as the plane of incidence, thus eliminating the need for working such as optical polishing. No bonding wire is used, thus also executing a process, in which the transparent resin 4 is filled, easily.

Description

【発明の詳細な説明】 (産業上の利用分野) 本発明は、光電変換S!ii置の構造に関するものであ
る。
[Detailed Description of the Invention] (Industrial Application Field) The present invention provides photoelectric conversion S! This relates to the structure of position ii.

(発明の概要) 本発明は、光・電気変換を行なう光電変換素子を塔載し
た光電変換装置において、配線等を施した透明基板に前
記光電変換素子の受光部が面する様に半導体装置製造工
程で用いられる半田バンプ法等を用いて前記光電変換素
子を接続し透明樹脂を前記光電変換素子と前記透明基板
の間に注入することにより、受光素子面への光学距離が
均一であり、防湿性に優れ製造工程も簡易である光電変
換装置を実現するものである。
(Summary of the Invention) The present invention provides a photoelectric conversion device mounted with a photoelectric conversion element that performs light-to-electrical conversion, in which the semiconductor device is manufactured so that the light-receiving part of the photoelectric conversion element faces a transparent substrate provided with wiring, etc. By connecting the photoelectric conversion element using the solder bump method used in the process and injecting transparent resin between the photoelectric conversion element and the transparent substrate, the optical distance to the light receiving element surface is uniform and moisture-proof. The objective is to realize a photoelectric conversion device that has excellent performance and a simple manufacturing process.

(従来の技術) 従来より、光電変換素子は受光部に光信号を入射する必
要性があり、かつ前記光電変換素子を外気から遮断する
ためにはエポキシあるいはアクリル等の透明樹脂が使用
されている。さらに前記光電変換素子は、湿度に対して
、敏感な特性を示し、安定性・信頼性を保つために気密
性の良い封止が必要となる。また光電変換素子の各受光
部と光信号の入射面との距離を均一にして、各受光部に
照射される光信号の光学的距離を一定にする必要もある
。光電変換装置の例として、特に最近は原稿と一対一に
対応させた受光部をもち、画像信号を得る密着読み取り
可能なイメージセンサがあり、その開発が盛んである。
(Prior Art) Conventionally, a photoelectric conversion element needs to input an optical signal into a light receiving part, and a transparent resin such as epoxy or acrylic has been used to shield the photoelectric conversion element from the outside air. . Furthermore, the photoelectric conversion element exhibits characteristics that are sensitive to humidity, and requires sealing with good airtightness in order to maintain stability and reliability. It is also necessary to equalize the distance between each light-receiving section of the photoelectric conversion element and the plane of incidence of the optical signal, so that the optical distance of the optical signal irradiated to each light-receiving section is constant. As an example of a photoelectric conversion device, there is an image sensor that has a light-receiving portion in one-to-one correspondence with a document and is capable of close-contact reading to obtain an image signal, which has been actively developed recently.

前記イメージセンサは、原稿幅と同寸法の読み取り幅が
必要なために光市変換素子も大きくなり、前述したよう
な光学距離の均一性、防湿性等の問題が生じている。
Since the image sensor requires a reading width of the same size as the document width, the optical field conversion element is also large, which causes problems such as optical distance uniformity and moisture resistance as described above.

従来、第2図(a’)に示した様に光電変換索子2を凹
形に加工した基板7に実装し、透明ガラス板8を低融点
ガラスあるいはエポキシ等の樹脂により装着することで
光電変換素子2の封止をする□構造となっている。しか
し、この構造の光電変換装置では、基板8を凹形に加′
rする必要があり、複数個の光電変換素子を基板8上に
高精麿に実装することは困難である。次に、他の実施例
として第2図(b)を示す。この光電変換装置は、平坦
な基板6に光電変換素子2を実装した後、エポキシある
いはアクリル等の透明樹脂4で前記光電変換素子2を覆
うことにより、封止を行なう構造となっている。この構
造では、光電変換素子2の各受光部と光信号の入射面と
の光学的距離を一定にするために、透明樹脂の面精度が
要求される。さらに透明樹脂が全て外気に接しており、
充分な封止効果が得られない。三番目の従来例として、
第2図(C)を示づ。この構造は、基板6上に設けた光
電変換素子2に透明ガラス板8を設置し、基板6および
光電変換素子2と透明ガラス板8との間に透明樹脂4を
充填し、この透明樹脂4で光電変換索子2のまわりを覆
い、封止効果を高め、入射面に凹凸の少なくした構造で
ある。しかし、この構造では、ボンディングワイヤ9に
ガラス板8が触れぬ様に設置せねばならず、透明樹脂を
充填する工程は容易ではない。またガラス板8と光電変
換素子2の受光面の光学距離を一定に保つためには、ス
ペーサ等の冶具が必要となる。
Conventionally, as shown in FIG. 2(a'), a photoelectric converter 2 is mounted on a substrate 7 processed into a concave shape, and a transparent glass plate 8 is attached using low melting point glass or resin such as epoxy. It has a square structure that seals the conversion element 2. However, in the photoelectric conversion device with this structure, the substrate 8 is formed into a concave shape.
Therefore, it is difficult to mount a plurality of photoelectric conversion elements on the substrate 8 with high precision. Next, FIG. 2(b) is shown as another example. This photoelectric conversion device has a structure in which a photoelectric conversion element 2 is mounted on a flat substrate 6 and then sealed by covering the photoelectric conversion element 2 with a transparent resin 4 such as epoxy or acrylic. In this structure, surface precision of the transparent resin is required in order to keep the optical distance between each light receiving part of the photoelectric conversion element 2 and the incident surface of the optical signal constant. Furthermore, all the transparent resin is in contact with the outside air,
A sufficient sealing effect cannot be obtained. As a third conventional example,
Figure 2 (C) is shown. In this structure, a transparent glass plate 8 is installed on a photoelectric conversion element 2 provided on a substrate 6, and a transparent resin 4 is filled between the substrate 6 and the photoelectric conversion element 2 and the transparent glass plate 8. This structure has a structure in which the photoelectric conversion cord 2 is covered with a material to enhance the sealing effect and to reduce irregularities on the incident surface. However, in this structure, the glass plate 8 must be installed so that it does not touch the bonding wire 9, and the process of filling the transparent resin is not easy. Further, in order to keep the optical distance between the glass plate 8 and the light receiving surface of the photoelectric conversion element 2 constant, a jig such as a spacer is required.

(問題点を解決するための手段) 上記問題点を解決するために本発明は、透明基板に光電
変換素子を半田バンプ法等を用いて実装する。この際、
光電変換素子の受光部はガラス基板に面している。基板
と光電変換素子の間に透明樹脂を充填し気密性を高める
。この構造により、入射面の加工が必要なく、製作工程
の簡単な構造としたものである。
(Means for Solving the Problems) In order to solve the above problems, the present invention mounts a photoelectric conversion element on a transparent substrate using a solder bump method or the like. On this occasion,
The light receiving part of the photoelectric conversion element faces the glass substrate. Transparent resin is filled between the substrate and the photoelectric conversion element to improve airtightness. This structure eliminates the need for machining the entrance surface, resulting in a simple manufacturing process.

(実施例) 以下にこの発明の実施例を図面にもとづいて詳細に説明
する。第1図(a)は本発明の光電変換装置の一実施例
の断面図である。光電変換素子2がガラス板等に金属電
極3等を施した透明基板1に実装されている。その電気
的接続は透明基板1に通常の半導体装技術で用いられる
半田バンプ法を使用することにより可能である。またこ
の際、光電変換素子2の受光面は、透明基板1と面して
おり、光信号は図面上A側から入射される。また透明基
板1は平坦であるので複数個の光電変換素子を実装する
にも困難が生じることはない。光電変換素子2と透明基
板1の間には、透明樹脂4を充填し外気との遮断を行な
う。第1図(a)から明らかなように光電変換素子2の
受光面は透明基板と向きあっており、従来と比較し透明
樹脂の外気に触れる部分は少ない。さらに透明樹脂4は
、前記受光素子2と前記透明基板1の距離が固定されて
いるので前記受光素子2の裏面へまわり込んでも半導体
装置の機能へは何ら影響を与えるものではない。封止効
果を高めるために、受光素子離面へ透明樹脂4よりも気
密性の優れた不透明樹脂5で覆う様にしてもよい。
(Example) Examples of the present invention will be described in detail below based on the drawings. FIG. 1(a) is a sectional view of one embodiment of the photoelectric conversion device of the present invention. A photoelectric conversion element 2 is mounted on a transparent substrate 1 made of a glass plate or the like provided with metal electrodes 3 and the like. The electrical connection can be made on the transparent substrate 1 by using a solder bump method used in ordinary semiconductor packaging technology. Further, at this time, the light-receiving surface of the photoelectric conversion element 2 faces the transparent substrate 1, and the optical signal is input from the side A in the drawing. Further, since the transparent substrate 1 is flat, there is no difficulty in mounting a plurality of photoelectric conversion elements. A transparent resin 4 is filled between the photoelectric conversion element 2 and the transparent substrate 1 to isolate it from the outside air. As is clear from FIG. 1(a), the light-receiving surface of the photoelectric conversion element 2 faces the transparent substrate, and the portion of the transparent resin that comes into contact with the outside air is smaller than in the past. Further, since the distance between the light receiving element 2 and the transparent substrate 1 is fixed, the transparent resin 4 does not affect the function of the semiconductor device even if it wraps around to the back surface of the light receiving element 2. In order to enhance the sealing effect, the outer surface of the light-receiving element may be covered with an opaque resin 5 which has better airtightness than the transparent resin 4.

原稿面から反射された光Cは、透明基板1および透明樹
脂4を通過して光電変換素子2の受光面に照射されるの
で、入射面は透明基板2となり、光学研磨等の加工は不
要である。またボンディングワイヤを使用しないために
、透明樹脂4を充填する工程も容易に行なえる。
The light C reflected from the document surface passes through the transparent substrate 1 and the transparent resin 4 and is irradiated onto the light-receiving surface of the photoelectric conversion element 2, so the incident surface becomes the transparent substrate 2, and processing such as optical polishing is not required. be. Furthermore, since no bonding wire is used, the step of filling the transparent resin 4 can be easily performed.

第1図(a)で示した実施例で、その使用法においては
図中B側を平面に設置する必要が生じる場合もあるが、
第1図(b)に示したように不透明樹脂5で受光素子2
の裏面を覆う際に、平面基板6を設置することにより解
決できる。この時、平面基板6を透明基板2よりも幅を
短くすることにより、前記透明基板2上に施された配線
3から外部へ電気的接続を行なうことが可能である。
In the embodiment shown in FIG. 1(a), there may be cases where it is necessary to install the B side in the figure on a flat surface depending on its usage.
As shown in FIG. 1(b), the light receiving element 2 is made of opaque resin 5.
This can be solved by installing a flat substrate 6 when covering the back side of the . At this time, by making the flat substrate 6 shorter in width than the transparent substrate 2, it is possible to electrically connect the wiring 3 provided on the transparent substrate 2 to the outside.

(発明の効果) 本発明は以上説明したように、平坦な透明基板に半田バ
ンプ法等を用いて光電変換素子を実装しこの光電変換素
子と前記透明基板の間に透明樹脂を充填するという簡単
な工程を用いて光電変換装置が製作される。このため従
来のように基板を加工する必要もなく、入射面の加りち
必要なく、ざらに透明樹脂の充填も容易に行なうことが
できる。
(Effects of the Invention) As explained above, the present invention is a simple method in which a photoelectric conversion element is mounted on a flat transparent substrate using a solder bump method or the like, and a transparent resin is filled between the photoelectric conversion element and the transparent substrate. A photoelectric conversion device is manufactured using a process. Therefore, it is not necessary to process the substrate as in the conventional case, and there is no need to adjust the entrance surface, and it is possible to easily fill the transparent resin in a rough manner.

また本発明の光電変換装置は、光電変換素子の受光面が
透明基板に面しているために従来の構造よりも気密性が
高く、透明基板が平坦なために高精度に実装可能である
。この様に本発明を用いれば信頼性が高く、安定性に優
れかつ安価な装置を提供する効果がある。
Furthermore, the photoelectric conversion device of the present invention has higher airtightness than conventional structures because the light-receiving surface of the photoelectric conversion element faces the transparent substrate, and can be mounted with high precision because the transparent substrate is flat. As described above, the present invention has the effect of providing a highly reliable, highly stable, and inexpensive device.

【図面の簡単な説明】[Brief explanation of drawings]

第1図(a)と第1図(b)は、それぞれ本発明の光電
変換装置の断面図、第2図(a)、第2図(b)及び第
2図(C)はそれぞれ従来の光電変換装置の断面図であ
る。 1・・・透明基板 2・・・光電変換素子 3・・・金属配線 4・・・透明樹脂 5・・・不透明樹脂 6・・・平面基板 7・・・凹形基板 8・・・透明ガラス板 9・・・ボンディングワイヤ
1(a) and 1(b) are sectional views of the photoelectric conversion device of the present invention, and FIG. 2(a), 2(b), and 2(C) are sectional views of the conventional photoelectric conversion device, respectively. FIG. 2 is a cross-sectional view of a photoelectric conversion device. 1... Transparent substrate 2... Photoelectric conversion element 3... Metal wiring 4... Transparent resin 5... Opaque resin 6... Flat substrate 7... Concave substrate 8... Transparent glass Plate 9...bonding wire

Claims (1)

【特許請求の範囲】[Claims] 光信号を電気信号に変換する光電変換装置において、金
属配線等が施された透明基板と、この透明基板に設置さ
れた光電変換素子と、前記透明基板と前記光電変換素子
の間に充填された透明樹脂を具備しており、前記光電変
換素子の受光部は前記透明基板に面していることを特徴
とする光電変換装置。
A photoelectric conversion device that converts an optical signal into an electrical signal includes a transparent substrate provided with metal wiring, etc., a photoelectric conversion element installed on this transparent substrate, and a photoelectric conversion element filled between the transparent substrate and the photoelectric conversion element. A photoelectric conversion device comprising a transparent resin, wherein a light receiving portion of the photoelectric conversion element faces the transparent substrate.
JP61033585A 1986-02-18 1986-02-18 Photoelectric conversion device Expired - Lifetime JPH06105791B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP61033585A JPH06105791B2 (en) 1986-02-18 1986-02-18 Photoelectric conversion device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP61033585A JPH06105791B2 (en) 1986-02-18 1986-02-18 Photoelectric conversion device

Publications (2)

Publication Number Publication Date
JPS62190776A true JPS62190776A (en) 1987-08-20
JPH06105791B2 JPH06105791B2 (en) 1994-12-21

Family

ID=12390594

Family Applications (1)

Application Number Title Priority Date Filing Date
JP61033585A Expired - Lifetime JPH06105791B2 (en) 1986-02-18 1986-02-18 Photoelectric conversion device

Country Status (1)

Country Link
JP (1) JPH06105791B2 (en)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5770889A (en) * 1995-12-29 1998-06-23 Lsi Logic Corporation Systems having advanced pre-formed planar structures
US5834799A (en) * 1989-08-28 1998-11-10 Lsi Logic Optically transmissive preformed planar structures
FR2819104A1 (en) * 2000-12-29 2002-07-05 St Microelectronics Sa OPTICAL SEMICONDUCTOR PACKAGE WITH TRANSPARENT SUPPORT
JP2004023058A (en) * 2002-06-20 2004-01-22 Seiko Epson Corp Semiconductor device, manufacturing method therefor, electro-optical device and electronic apparatus
JP2006504279A (en) * 2002-10-25 2006-02-02 フリースケール セミコンダクター インコーポレイテッド Image sensor device
JP2006041084A (en) * 2004-07-26 2006-02-09 Sharp Corp Optical semiconductor device, optical connector, and electronic equipment
JP2007311416A (en) * 2006-05-16 2007-11-29 Fujifilm Corp Solid-state imaging device

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Publication number Priority date Publication date Assignee Title
JPS4893284A (en) * 1972-03-09 1973-12-03
JPS5562776A (en) * 1978-11-01 1980-05-12 Mitsubishi Electric Corp Shutter controller for camera
JPS59198770A (en) * 1983-04-26 1984-11-10 Fuji Electric Co Ltd Photo receiving electronic device

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4893284A (en) * 1972-03-09 1973-12-03
JPS5562776A (en) * 1978-11-01 1980-05-12 Mitsubishi Electric Corp Shutter controller for camera
JPS59198770A (en) * 1983-04-26 1984-11-10 Fuji Electric Co Ltd Photo receiving electronic device

Cited By (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5834799A (en) * 1989-08-28 1998-11-10 Lsi Logic Optically transmissive preformed planar structures
US5770889A (en) * 1995-12-29 1998-06-23 Lsi Logic Corporation Systems having advanced pre-formed planar structures
FR2819104A1 (en) * 2000-12-29 2002-07-05 St Microelectronics Sa OPTICAL SEMICONDUCTOR PACKAGE WITH TRANSPARENT SUPPORT
WO2002054498A1 (en) * 2000-12-29 2002-07-11 Stmicroelectronics Sa Optical semiconductor device with transparent support
JP2004023058A (en) * 2002-06-20 2004-01-22 Seiko Epson Corp Semiconductor device, manufacturing method therefor, electro-optical device and electronic apparatus
US7435998B2 (en) 2002-06-20 2008-10-14 Seiko Epson Corporation Semiconductor device, method of manufacturing the same, electro-optic device and electronic apparatus with a protective film
US7709283B2 (en) 2002-06-20 2010-05-04 Seiko Epson Corporation Method of manufacturing a semiconductor device having an insulating protective film covering at least a portion of a tile-shaped element
JP2006504279A (en) * 2002-10-25 2006-02-02 フリースケール セミコンダクター インコーポレイテッド Image sensor device
JP4895506B2 (en) * 2002-10-25 2012-03-14 インテレクチュアル ベンチャーズ セカンド エルエルシー Image sensor device
JP2006041084A (en) * 2004-07-26 2006-02-09 Sharp Corp Optical semiconductor device, optical connector, and electronic equipment
JP2007311416A (en) * 2006-05-16 2007-11-29 Fujifilm Corp Solid-state imaging device

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