JPS62176433A - Subtraction system for removing scattering x-rays - Google Patents

Subtraction system for removing scattering x-rays

Info

Publication number
JPS62176433A
JPS62176433A JP61016623A JP1662386A JPS62176433A JP S62176433 A JPS62176433 A JP S62176433A JP 61016623 A JP61016623 A JP 61016623A JP 1662386 A JP1662386 A JP 1662386A JP S62176433 A JPS62176433 A JP S62176433A
Authority
JP
Japan
Prior art keywords
rays
scattered
ray
grid
primary
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP61016623A
Other languages
Japanese (ja)
Inventor
木村 雄太郎
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP61016623A priority Critical patent/JPS62176433A/en
Publication of JPS62176433A publication Critical patent/JPS62176433A/en
Pending legal-status Critical Current

Links

Classifications

    • AHUMAN NECESSITIES
    • A61MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61BDIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/52Devices using data or image processing specially adapted for radiation diagnosis
    • A61B6/5258Devices using data or image processing specially adapted for radiation diagnosis involving detection or reduction of artifacts or noise
    • A61B6/5282Devices using data or image processing specially adapted for radiation diagnosis involving detection or reduction of artifacts or noise due to scatter

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  • Life Sciences & Earth Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Health & Medical Sciences (AREA)
  • Medical Informatics (AREA)
  • Pathology (AREA)
  • Heart & Thoracic Surgery (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Physics & Mathematics (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Optics & Photonics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Radiology & Medical Imaging (AREA)
  • Biomedical Technology (AREA)
  • Biophysics (AREA)
  • Molecular Biology (AREA)
  • Surgery (AREA)
  • Animal Behavior & Ethology (AREA)
  • General Health & Medical Sciences (AREA)
  • Public Health (AREA)
  • Veterinary Medicine (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【発明の詳細な説明】 (イ)産業上の利用分野 本発明は、X線測定の分野で利用される。[Detailed description of the invention] (b) Industrial application field INDUSTRIAL APPLICATION This invention is utilized in the field of X-ray measurement.

本発明は、X線撮影におけるχfrj1.画像の画質を
ピコ 1−レ↓ト 2 子、1人ハせり壬I V丘臼g
仝土、l−η”  k  二 h4′ノ 2  ’/シ
ステムに関する。
The present invention provides χfrj1. Pico the image quality
Regarding the earth, l−η”k2h4′ノ2′/system.

(ロ)従来技術 X線撮影において、被検体から出る散乱X線は被写体コ
ントラストを下げる。 このことは第3図右側に示すよ
うに、X線強度のうち散乱線が占める割合がパックグラ
ウンドとして大きく、−次X線の占める割合が小さくな
るからである。
(b) Prior art In X-ray photography, scattered X-rays emitted from the subject reduce the contrast of the subject. This is because, as shown on the right side of FIG. 3, the proportion of scattered rays in the X-ray intensity is large as back ground, and the proportion of -order X-rays is small.

この散乱線による画質低下を防ぐために、従来より散乱
線を除去する努力がなされている。
In order to prevent the image quality from deteriorating due to the scattered radiation, efforts have been made to remove the scattered radiation.

散乱線除去グリッドの介挿は、一般的に知られている。The insertion of anti-scatter grids is generally known.

(ハ)発明が角9決しようとする問題点しかしながら、
そのようなグリッド方式や、スリットレジオロジーと称
されるラインセンサーによる散乱線除去方式は、散乱線
の嵐少の分、X線の出力を増大させ、<iってx線管へ
の負荷増大、また愚者への被は(線量増大につながり、
画質とそれらとの兼合いで限度がある。
(c) Problems that the invention attempts to resolve, however,
Such a grid method and a scattered radiation removal method using a line sensor called slit resiology increase the output of X-rays by the amount of scattered radiation, increasing the load on the x-ray tube. , and the exposure to fools (leading to increased dose,
There is a limit depending on the image quality and the balance between them.

本発明の目的は、上記のような事情において散コツN?
461mL+Pi声;ル〆レ−/l−?11w−――・
=1−ja)’、1−−h−9嘲l啼コツM4C+白し
A市カレーよ 0■」貝力]LτCX肯ロJ月ff、に
−9つ円叉白し人麻除去サブトラクションシステムを提
供することである。
The purpose of the present invention is to solve the above-mentioned circumstances.
461 mL + Pi voice; Lure-/l-? 11w---・
= 1-ja)', 1--h-9 mocking tips M4C + white A city curry 0■'' shell power] LτCX affirmation J month ff, ni-9 yen white human hemp removal subtraction system The goal is to provide the following.

(ニ)問題点を解決するための手段 前記した目的は、被検体の直後にグリッドを挿入した場
合のX線lF2  (F2 =aTt +bS1、ただ
しT1は一次X線、Slは散乱X線、aは一次X線透過
率、bは散乱X線透過率)のメモリM2と、グリッドを
除去した場合のX線量Fi(Fi =T1+S1 )の
メモリと、グリッドによって決まる既知の一次線透過率
aと散乱X線透過率)/(b−a)を算出する演算器と
を具有することにより、達成できる。
(d) Means for solving the problem The above purpose is to calculate the X-rays when a grid is inserted immediately after the subject. is the primary X-ray transmittance; This can be achieved by having an arithmetic unit that calculates X-ray transmittance)/(ba).

(ホ)作用 t%来のように、散乱線による画質低下を防ぐのに、散
乱線を直接除去する器具を使うのではな(、散乱線を含
む像が記録される媒体ないしメモリを2つ用意し、両者
間の演算により一次X線を摘出する。 つ談り、散乱線
そのものを取除くのではなく、散乱線による像を利用し
て散乱線による画質劣化を改善する。
(e) Effect t% To prevent image quality deterioration due to scattered rays, do not use a device that directly removes scattered rays (i.e., use two media or memories in which images containing scattered rays are recorded). The primary X-rays are extracted by calculation between the two. Rather than removing the scattered rays themselves, the image of the scattered rays is used to improve the image quality deterioration caused by the scattered rays.

(へ)実施例 本発明の好)商な実権例は、図面の第1図と第2図につ
いて説明される。
DESCRIPTION OF THE PREFERRED EMBODIMENTS A practical example of the present invention will be described with reference to FIGS. 1 and 2 of the drawings.

理解の便宜上、従来のグリッドよる散乱線除去例を第4
図により示している。
For convenience of understanding, an example of scattering radiation removal using a conventional grid is shown in the fourth example.
Illustrated in the figure.

14がグリッドであり、入射側の散乱X線S1が一次X
線T1に比べ進む角度が大きくずれていることを利用し
、−次線の進む方向に並べた鉛などのX線じゃΔ〜い物
によるついたて14により、角度の異なるX線(つまり
散乱線)Slを除去している。
14 is a grid, and the scattered X-rays S1 on the incident side are the primary
Taking advantage of the fact that the advancing angle is greatly different from that of the line T1, X-rays at different angles (that is, scattered rays) are Sl is removed.

グリッド14に入射するX線は、−次線T1と散乱線S
1の和であり、さらにグリッドを通過した各々をT2、
S2とおくと、’I’2 = aT1、S2 =bSx
でa、b (1、さらにa)bとなって、散乱線の含有
率が罵って画質が改善される。
The X-rays incident on the grid 14 consist of a −th order ray T1 and a scattered ray S.
1, and each passing through the grid is T2,
If we set S2, 'I'2 = aT1, S2 = bSx
Then, a, b (1, and further a) b, the content of scattered radiation is reduced and the image quality is improved.

a、bはグリッド14によって決まる係数で、bはさら
に散乱線の度合にも依存する。
a and b are coefficients determined by the grid 14, and b further depends on the degree of scattered radiation.

そこで、本発明の原理作用例が第2図により示されてい
る。 グリッド14をはさみ、X線入射側とその反対側
にそれぞれX線記録物(例えばフィルム、増感紙、FC
,R)をおき、撮影を行なう。
Therefore, an example of the principle operation of the present invention is shown in FIG. Grid 14 is sandwiched between X-ray recording materials (for example, film, intensifying screen, FC
, R) and take pictures.

入射側のフィルムF1には、F1=T1+81、反対側
にはF2 =T2 +S2 =aTi +bSiが記録
される。 もし、b IJ(既知であればFlを重み係
数すをかけ、F2を引算して一次線のみの像T1を求め
ることができる。
F1=T1+81 is recorded on the film F1 on the incident side, and F2=T2+S2=aTi+bSi is recorded on the opposite side. If b IJ (if known), the image T1 of only the primary line can be obtained by multiplying Fl by the weighting coefficient and subtracting F2.

つまり、p1=’pi+5I F2 =aT1+bS1  (ただし、aは一次線透過
率、bは散乱線透過率としてそれぞれ既知である。)が
成立しているので、 bFl −F2 = (b−a)  ・Tiが得られ、
T1= (bFl−F2)/ (b−a)として、−次
X線T1のみの像、つまり散乱線のとれた像を得ること
ができる。
In other words, p1='pi+5I F2 =aT1+bS1 (However, a is known as the primary ray transmittance and b is the scattered ray transmittance.), so bFl - F2 = (b-a) ・Ti is obtained,
As T1=(bFl-F2)/(ba-a), an image of only -order X-rays T1, that is, an image without scattered rays can be obtained.

第1図は本発明の1実施例として上記の原理を実行した
処理ブロック図である。 ここで、10はX線管、12
は被亭$体、14はグリッド、1日はイメージ・インテ
ンシファイア、18はTVカメラ、20はメモリ、22
は演算器、24は係数a、bの設定器、26は表示器で
ある。
FIG. 1 is a processing block diagram in which the above principle is implemented as an embodiment of the present invention. Here, 10 is an X-ray tube, 12
is the object, 14 is the grid, 1st is the image intensifier, 18 is the TV camera, 20 is the memory, 22
24 is a calculator, 24 is a setter for coefficients a and b, and 26 is a display.

メモリ20の一方は、グリッド14を挿入して得たX線
像を、他方はグリッド14を除去して得たX線像をそれ
ぞれ格納している。 演算器22は前記した演算を行な
う。
One of the memories 20 stores an X-ray image obtained by inserting the grid 14, and the other stores an X-ray image obtained by removing the grid 14. The arithmetic unit 22 performs the above-mentioned arithmetic operations.

(ト)効果 従来例に比べて、散乱線をも有効利用するため退者の被
ば(線思が少な(て足り、従ってX線管の負荷も軽厘で
き、両者の寿命を延ばすことができるという効果が奏さ
れる。
(G) Effects Compared to the conventional example, since scattered radiation is also used effectively, there is less radiation exposure for the retiree, and the load on the X-ray tube can therefore be reduced, extending the lifespan of both. The effect of being able to do this is achieved.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の1実施例を示した処理ブロック図、第
2図は本発明による原理作用例示図、第3図は散乱線の
発生態様とその作用例示図、菓4図は従来例の作用説明
図である。 14はグリッド、20はメモリ、22は演算器、24は
設定器である。 第1図 第2図 第3図 第4図
Fig. 1 is a processing block diagram showing one embodiment of the present invention, Fig. 2 is a diagram illustrating the principle operation according to the present invention, Fig. 3 is a diagram illustrating the generation mode of scattered rays and its operation, and Fig. 4 is a conventional example. FIG. 14 is a grid, 20 is a memory, 22 is an arithmetic unit, and 24 is a setting device. Figure 1 Figure 2 Figure 3 Figure 4

Claims (1)

【特許請求の範囲】[Claims] 被検体の直後にグリッドを挿入した場合のX線量F2(
F2=aT1+bS1、ただしT1は一次X線、S1は
散乱X線、aは一次X線透過率、bは散乱X線透過率)
のメモリM2と、グリッドを除去した場合のX線量F1
(F1=T1+S1)のメモリと、グリッドによつて決
まる既知の一次X線透過率aと散乱X線透過率bの設定
器と、メモリM1、M2の各読出しデータと設定データ
とにより式T1=(bF1−F2)/(b−a)を算出
する演算器とを具有することを特徴とする散乱X線除去
サブトラクションシステム。
X-ray dose F2 (when the grid is inserted immediately after the subject)
F2=aT1+bS1, where T1 is primary X-ray, S1 is scattered X-ray, a is primary X-ray transmittance, b is scattered X-ray transmittance)
memory M2 and the X-ray dose F1 when the grid is removed
The formula T1= 1. A subtraction system for removing scattered X-rays, comprising: a computing unit that calculates (bF1-F2)/(ba).
JP61016623A 1986-01-28 1986-01-28 Subtraction system for removing scattering x-rays Pending JPS62176433A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP61016623A JPS62176433A (en) 1986-01-28 1986-01-28 Subtraction system for removing scattering x-rays

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP61016623A JPS62176433A (en) 1986-01-28 1986-01-28 Subtraction system for removing scattering x-rays

Publications (1)

Publication Number Publication Date
JPS62176433A true JPS62176433A (en) 1987-08-03

Family

ID=11921470

Family Applications (1)

Application Number Title Priority Date Filing Date
JP61016623A Pending JPS62176433A (en) 1986-01-28 1986-01-28 Subtraction system for removing scattering x-rays

Country Status (1)

Country Link
JP (1) JPS62176433A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02237277A (en) * 1989-03-09 1990-09-19 Toshiba Corp X-ray diagnostic device
JP2001134748A (en) * 1999-08-31 2001-05-18 General Electric Co <Ge> Method and device for correcting digital x-ray imaging
JP2017227541A (en) * 2016-06-23 2017-12-28 株式会社日立製作所 Radiation imaging apparatus and radiation imaging method

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02237277A (en) * 1989-03-09 1990-09-19 Toshiba Corp X-ray diagnostic device
JPH0582111B2 (en) * 1989-03-09 1993-11-17 Tokyo Shibaura Electric Co
JP2001134748A (en) * 1999-08-31 2001-05-18 General Electric Co <Ge> Method and device for correcting digital x-ray imaging
JP2017227541A (en) * 2016-06-23 2017-12-28 株式会社日立製作所 Radiation imaging apparatus and radiation imaging method

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