JPS62154813A - Waveform shaping circuit - Google Patents

Waveform shaping circuit

Info

Publication number
JPS62154813A
JPS62154813A JP60295007A JP29500785A JPS62154813A JP S62154813 A JPS62154813 A JP S62154813A JP 60295007 A JP60295007 A JP 60295007A JP 29500785 A JP29500785 A JP 29500785A JP S62154813 A JPS62154813 A JP S62154813A
Authority
JP
Japan
Prior art keywords
signal
level
input signal
circuit
comparator
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP60295007A
Other languages
Japanese (ja)
Other versions
JP2542575B2 (en
Inventor
Kenji Ito
健司 伊藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP60295007A priority Critical patent/JP2542575B2/en
Publication of JPS62154813A publication Critical patent/JPS62154813A/en
Application granted granted Critical
Publication of JP2542575B2 publication Critical patent/JP2542575B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Manipulation Of Pulses (AREA)
  • Control Of Electric Motors In General (AREA)

Abstract

PURPOSE:To obtain an accurate waveform shaping signal without the influence of AM variation of a rotation detecting signal by detecting both the zero crossing points of the leading and trailing edges of an input signal. CONSTITUTION:A comparator 34 compares an input signal DES with a level SDC, and when the input signal DES is smaller than the level SDC, outputs the 2nd signal A2 to be a high level. The 1st signal A1 and the 2nd signal A2 are supplied to the set and reset terminals of a flip flop (FF) 37 constituted of NAND circuits 35, 36. The FF 37 is triggered at the leading edge of the input signal and a waveform-shaped output signal A3 can be obtained from an output terminal 38. In addition, the circuit is also proper as a both-edge detecting constitution for detecting both the zero crossing points of the leading and trailing edges of the input signal accurately.

Description

【発明の詳細な説明】 [発明の技術分野] この発明は、例えばビデオテープレコーダ(以下VT’
Rと称する)のモータなどの回転を検出する回転検出装
置からの出力を波形整形する波形整形回路に関する。
[Detailed Description of the Invention] [Technical Field of the Invention] The present invention relates to a video tape recorder (hereinafter referred to as VT'), for example.
The present invention relates to a waveform shaping circuit that shapes the waveform of an output from a rotation detection device that detects the rotation of a motor (referred to as R).

[発明の技術的背景とその問題点] VTRのキャプスタンモータ、ヘッドモータの回転検出
装置には、第5図に示すような種々のものがある。同図
(A)のものはマグネット11、固定磁性体13、回転
磁性体14で磁路を形成し、この磁路を通る磁気に対し
て回転側と固定側の歯車構造により変化を与え、この変
化をコイル12で感知して回転検出出力を得るものであ
る。同図(B)は、回転体をマグネット15とし、固定
体17に導電パターン1Bを形成しておき、このパター
ンの端子からの出力を回転検出出力とするものである。
[Technical Background of the Invention and Problems Therein] There are various types of rotation detection devices for the capstan motor and head motor of a VTR, as shown in FIG. In the case shown in (A), a magnetic path is formed by a magnet 11, a fixed magnetic body 13, and a rotating magnetic body 14, and the magnetism passing through this magnetic path is changed by the gear structure on the rotating side and the fixed side. The change is sensed by the coil 12 to obtain a rotation detection output. In FIG. 3B, the rotating body is a magnet 15, a conductive pattern 1B is formed on the fixed body 17, and the output from the terminal of this pattern is used as the rotation detection output.

同図(C)は、回転体18の外周にマグネットを着磁形
成し、このマグネットに近接して磁気ヘッド19を配設
し、この磁気ヘッドの出力を回転検出出力とするもので
ある。
In FIG. 2C, a magnet is formed on the outer periphery of the rotating body 18, a magnetic head 19 is disposed close to the magnet, and the output of the magnetic head is used as the rotation detection output.

さて上記の回転検出装置の出力は、回転系の正確な位相
を検出するために波形整形回路で整形されて位相比較回
路に入力される。しかし、回転検出部には、着磁むら、
回転軸の偏心などがあるために前記検出出力は、AM変
調を受けることが多い。
Now, the output of the rotation detection device described above is shaped by a waveform shaping circuit and input to a phase comparison circuit in order to detect the accurate phase of the rotation system. However, the rotation detection unit has uneven magnetization,
The detection output is often subjected to AM modulation due to eccentricity of the rotating shaft.

AM変調を受けた回転検出出力を波形整形すると、その
回転周波数、位相情報は不正確となるので、シュミット
動作を得る波形整形を行なっている。
If the rotation detection output subjected to AM modulation is waveform-shaped, its rotation frequency and phase information will become inaccurate, so waveform shaping is performed to obtain Schmitt operation.

第6図は従来の波形整形回路であり、入力端子21に回
転検出信号が供給される。その信号は抵抗R1とコンデ
ンサC1からなる積分回路に供給され平均直流レベルの
電圧に変換され、比較器22の負入力端子に供給される
。また入力信号は抵抗R2を介して比較器22の正入力
端子に供給される。抵抗R3は正帰還用の抵抗である。
FIG. 6 shows a conventional waveform shaping circuit, and a rotation detection signal is supplied to an input terminal 21. In FIG. The signal is supplied to an integrating circuit consisting of a resistor R1 and a capacitor C1, converted to an average DC level voltage, and supplied to the negative input terminal of the comparator 22. The input signal is also supplied to the positive input terminal of the comparator 22 via the resistor R2. Resistor R3 is a positive feedback resistor.

この回路の動作波形は第7図のようになり、出力端子2
3の出力は、立上がりがシュミットレベルa1で整形さ
れ、立ち下がりがシュミットレベルb1で整形される。
The operating waveform of this circuit is as shown in Figure 7, and the output terminal 2
The rising edge of the output of No. 3 is shaped to Schmitt level a1, and the falling edge is shaped to Schmitt level b1.

しかしこの回路においても、AM成分の影響を完全に除
去することはできず、この点の改善が望まれている。A
M成分の影響を受けることは出力側にPM酸成分発生す
ることになる。
However, even in this circuit, the influence of the AM component cannot be completely removed, and improvement in this point is desired. A
Being affected by the M component means that a PM acid component will be generated on the output side.

[発明の目的] この発明は上記の事情に鑑みてなされたもので、回転検
出信号のAM変動の影響を受けることがなく、正確な波
形整形信号を得る波形整形回路を提供することを目的と
する。
[Objective of the Invention] The present invention has been made in view of the above circumstances, and an object thereof is to provide a waveform shaping circuit that is not affected by AM fluctuations of a rotation detection signal and obtains an accurate waveform shaping signal. do.

[発明の概要] この発明は、第1図に示すように、入力信号の第1の直
流レベルを抽出する手段と、前記入力信号と第1の直流
レベルとを比較し双方の大小期間を示す第1の信号を得
る第1の比較器と、前記入力信号と前記直流レベルをシ
フトした第2の直流レベルとを、前記第1の比較器が比
較した極性とは逆の極性で比較し、前記入力信号と第2
の直流レベルとの大小期間を示す第2の信号を得る第2
の比較器手段と、前記第1の信号と第2の信号が第1、
第2の入力端子にトリガとして供給されるフリップフロ
ップ手段とを具備することにより上記の目的を達成する
ものである。
[Summary of the Invention] As shown in FIG. 1, the present invention includes a means for extracting a first DC level of an input signal, and a means for comparing the input signal and the first DC level to indicate the magnitude period of both. A first comparator that obtains a first signal compares the input signal and a second DC level obtained by shifting the DC level with a polarity opposite to that compared by the first comparator, the input signal and the second
A second signal is obtained which indicates the magnitude period with respect to the DC level of the second signal.
comparator means for said first signal and said second signal being a first signal;
The above object is achieved by comprising a flip-flop means supplied as a trigger to the second input terminal.

[発明の実施例] 以下この発明の実施例を図面を参照して説明する。[Embodiments of the invention] Embodiments of the present invention will be described below with reference to the drawings.

第1図において、入力端子31には回転検出装置からの
回転検出信号が供給される。この入力信号DBSは抵抗
R1とコンデンサCtからなる積分器に供給される。よ
って積分器からは、入力信号DBSの平均直流レベルA
DCの電圧か得られる。この平均直流レベルADCは、
比較器32の負入力端子に供給され、入力信号DBSと
比較される。比較器32はレベルADCよりも入力信号
DBSが大きい場合にハイレベルと成る第1の信号A1
を出力する。
In FIG. 1, an input terminal 31 is supplied with a rotation detection signal from a rotation detection device. This input signal DBS is supplied to an integrator consisting of a resistor R1 and a capacitor Ct. Therefore, from the integrator, the average DC level A of the input signal DBS
DC voltage can be obtained. This average DC level ADC is
It is supplied to the negative input terminal of comparator 32 and compared with input signal DBS. The comparator 32 outputs a first signal A1 which becomes high level when the input signal DBS is larger than the level ADC.
Output.

更に前記平均直流レベルADCは、レベルシフト回路3
3でレベルシフトされたレベルSDCとなり、比較器3
4の正入力端子に供給される。比較器34は人力信号D
BSとレベルSDCとを比較し、レベルSDCよりも入
力信号DBSが小さい場合にハイレベルとなる第2の信
号A2を出力する。前記第1の信号Δ1とこの第2の信
号とは、ナンド回路35.36で構成されるフリップフ
ロップ37のセット、リセット端子に供給される。この
フィリップフロップ37は、入力信号の立上がりでトリ
ガされ、出力端子38には第2図に示すような波形整形
された出力信号A3を得ることができる。第2図は第1
図の回路のタイミングチャートである。出力信号A3の
立上がりは、入力信号DBSの零クロスレベルであり、
入力信号DBSにAM変動かあったとしても、これによ
る出力側のPM酸成分全く発生しない。
Furthermore, the average DC level ADC is controlled by a level shift circuit 3.
3 becomes level shifted level SDC, comparator 3
It is supplied to the positive input terminal of No. 4. Comparator 34 receives human power signal D
BS and level SDC are compared, and when input signal DBS is smaller than level SDC, a second signal A2 that becomes high level is output. The first signal Δ1 and this second signal are supplied to set and reset terminals of a flip-flop 37 constituted by NAND circuits 35 and 36. This flip-flop 37 is triggered by the rising edge of the input signal, and an output signal A3 whose waveform is shaped as shown in FIG. 2 can be obtained at the output terminal 38. Figure 2 is the first
3 is a timing chart of the circuit shown in the figure. The rising edge of the output signal A3 is the zero cross level of the input signal DBS,
Even if there is an AM fluctuation in the input signal DBS, no PM acid component is generated on the output side due to this.

またシフトされたレベルSDCと入力信号DBSを比較
してタイミングを得るために、シフト幅670間てンユ
ミット動作が得られ、ノイズなどによる誤動作も避ける
ことができる。そしてシフト幅Δ■は、AM変動による
影響に左右されないために、システムに生じるノイズに
応じた幅に適宜選択することができる。また本回路を集
積化した場合には、コンデンサCIを外付するピンのみ
を要するだけである。
Further, since the shifted level SDC and the input signal DBS are compared to obtain timing, a unitary operation is obtained within a shift width of 670, and malfunctions due to noise or the like can be avoided. Since the shift width Δ■ is not affected by AM fluctuations, it can be appropriately selected in accordance with the noise generated in the system. Furthermore, when this circuit is integrated, only a pin for externally connecting the capacitor CI is required.

この発明は、上記の実施例に限定されるものではなく、
第3図に示すように、人力信号の立上がり、立ち下がり
の両方の零クロス点を正確に検出する両エツジ検出構成
としても良い。
This invention is not limited to the above embodiments,
As shown in FIG. 3, a double edge detection configuration may be used to accurately detect both the rising and falling zero cross points of the human input signal.

第1図と同じ部分には同じ符号を付して説明する。この
実施例の場合、平均直流レベルADCは、レベルシフト
回路41でシフトされBDCのレベルとなり、比較器4
2の正入力端子に供給される。この比較器42は、入力
信号DESとレベルBDCとを比較し、人力DESが大
きい場合にノ\イレベルとなる出力信号A4を得る。こ
の出力信号A4は、ナンド回路43.44から成るフリ
ップフロップにトリガとして供給される。またこのフリ
ップフロップには前記比較器32の出力がインバータ4
5を介して供給される。従ってこのフリップフロップか
らは第4図に示す信号A5が得られる。この信号A5と
フリップフロップ37からの信号A3は、アンド回路4
6に供給され、この回路から最終出力信号ΔGが得られ
る。第4図は、上記の回路のタイミングチャートであり
、この図かられかるように上記の回路は人力信号の零ク
ロス点に一致した検出パルスを得ることができる。
The same parts as in FIG. 1 will be described with the same reference numerals. In this embodiment, the average DC level ADC is shifted by the level shift circuit 41 to become the level of BDC, and the comparator 4
2 positive input terminal. This comparator 42 compares the input signal DES and the level BDC, and obtains an output signal A4 which becomes a noise level when the human power DES is large. This output signal A4 is supplied as a trigger to a flip-flop consisting of NAND circuits 43 and 44. Further, the output of the comparator 32 is connected to the inverter 4 in this flip-flop.
5. Therefore, the signal A5 shown in FIG. 4 is obtained from this flip-flop. This signal A5 and the signal A3 from the flip-flop 37 are connected to the AND circuit 4.
6, from which the final output signal ΔG is obtained. FIG. 4 is a timing chart of the above circuit, and as can be seen from this figure, the above circuit can obtain a detection pulse that coincides with the zero crossing point of the human input signal.

このように本回路は、入力信号の立上がり、立ち下がり
の両方の零クロス点を入力信号のAM変動にかかわらず
正確に検出するので、出力のパルス周期は一定となり、
両エツジをいずれも使用して回転位相および周波数を検
出することができ、利用しやすい。また、入力信号の2
倍の周波数の信号であるから2逓倍回路を兼ねることも
できる。
In this way, this circuit accurately detects both the rising and falling zero crossing points of the input signal regardless of the AM fluctuation of the input signal, so the output pulse period is constant.
Both edges can be used to detect rotational phase and frequency and are easy to use. Also, 2 of the input signal
Since it is a signal with twice the frequency, it can also serve as a double multiplier circuit.

[発明の効果] 以上説明したようにこの発明は、回転検出信号のAM変
動の影響を受けることがなく、正確な波形整形信号を得
る波形整形回路を提供することができる。
[Effects of the Invention] As described above, the present invention can provide a waveform shaping circuit that is not affected by AM fluctuations in the rotation detection signal and can obtain accurate waveform shaping signals.

【図面の簡単な説明】[Brief explanation of drawings]

第1図はこの発明の一実施例を示す回路図、第2図は第
1図のタイムチャート、第3図はこの発明の他の実施例
を示す回路図、第4図は第3図のタイムチャート、第5
図はビデオテープレコーダの回転検出装置の例を示す図
、第6図は従来の波形整形回路を示す図、第7図は第6
図のタイミングチャートである。 32.34.42・・・比較器、33.41・・・レベ
ルシフト回路、35.3G、43.44・・・ナンド回
路。 出願人代理人 弁理士 鈴江武彦 第3図 第4図 (C) 第5図 第6図 第7図
Fig. 1 is a circuit diagram showing one embodiment of the present invention, Fig. 2 is a time chart of Fig. 1, Fig. 3 is a circuit diagram showing another embodiment of the invention, and Fig. 4 is a circuit diagram of Fig. 3. Time chart, 5th
The figure shows an example of a rotation detection device for a video tape recorder, FIG. 6 shows a conventional waveform shaping circuit, and FIG.
3 is a timing chart of the figure. 32.34.42... Comparator, 33.41... Level shift circuit, 35.3G, 43.44... NAND circuit. Applicant's representative Patent attorney Takehiko Suzue Figure 3 Figure 4 (C) Figure 5 Figure 6 Figure 7

Claims (2)

【特許請求の範囲】[Claims] (1)入力信号の第1の直流レベルを抽出する手段と、
前記入力信号と第1の直流レベルとを比較し双方の大小
期間を示す第1の信号を得る第1の比較器と、前記入力
信号と前記直流レベルをシフトした第2の直流レベルと
を、前記第1の比較器が比較した極性とは逆の極性で比
較し、前記入力信号と第2の直流レベルとの大小期間を
示す第2の信号を得る第2の比較器手段と、前記第1の
信号と第2の信号が第1、第2の入力端子にトリガとし
て供給されるフリップフロップ手段とを具備したことを
特徴とする波形整形回路。
(1) means for extracting a first DC level of an input signal;
a first comparator that compares the input signal and a first DC level to obtain a first signal indicating the magnitude period of both; and a second DC level obtained by shifting the input signal and the DC level, a second comparator means that compares with a polarity opposite to the polarity compared by the first comparator and obtains a second signal indicating a magnitude period between the input signal and the second DC level; 1. A waveform shaping circuit comprising flip-flop means for supplying a first signal and a second signal as triggers to first and second input terminals.
(2)前記第2の比較器手段は、前記第1の直流レベル
を所定レベル高いほうへシフトする第1のレベルシフト
回路と、前記第1の直流レベルを所定レベル低いほうへ
シフトする第2のレベルシフト回路とを有し、前記第2
の直流レベルとして2つの出力を得るとともに、各第2
の直流レベルをそれぞれ前記入力信号と比較する2つの
比較器を含み、前記フリップフロップ手段は前記2つの
比較器の出力でそれぞれ駆動される2つのフリップフロ
ップとこの2つのフリップフロップの出力の論理積を得
る論理回路とを具備したことを特徴とする特許請求の範
囲第1項記載の波形整形回路。
(2) The second comparator means includes a first level shift circuit that shifts the first DC level to a predetermined level higher, and a second level shift circuit that shifts the first DC level to a predetermined level lower. and a level shift circuit of the second level shift circuit.
to obtain two outputs as DC levels, and each second
The flip-flop means includes two comparators each of which compares the DC level of the input signal with the input signal, and the flip-flop means performs a logical product of two flip-flops each driven by the outputs of the two comparators and the outputs of the two flip-flops. 2. The waveform shaping circuit according to claim 1, further comprising a logic circuit for obtaining the following.
JP60295007A 1985-12-26 1985-12-26 Wave shaping circuit Expired - Lifetime JP2542575B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP60295007A JP2542575B2 (en) 1985-12-26 1985-12-26 Wave shaping circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP60295007A JP2542575B2 (en) 1985-12-26 1985-12-26 Wave shaping circuit

Publications (2)

Publication Number Publication Date
JPS62154813A true JPS62154813A (en) 1987-07-09
JP2542575B2 JP2542575B2 (en) 1996-10-09

Family

ID=17815127

Family Applications (1)

Application Number Title Priority Date Filing Date
JP60295007A Expired - Lifetime JP2542575B2 (en) 1985-12-26 1985-12-26 Wave shaping circuit

Country Status (1)

Country Link
JP (1) JP2542575B2 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0738871A2 (en) * 1995-04-19 1996-10-23 Hewlett-Packard Company Circuit and method for dealing with false zero crossings on low intensity signals
JP2020008509A (en) * 2018-07-12 2020-01-16 アズビル株式会社 Zero-point detection device

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5030510A (en) * 1973-06-25 1975-03-26
JPS5246748A (en) * 1975-10-09 1977-04-13 Mitsubishi Electric Corp Schmidt circuit
JPS55130262A (en) * 1979-03-30 1980-10-08 Nec Corp Bipolarity discrimination circuit

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5030510A (en) * 1973-06-25 1975-03-26
JPS5246748A (en) * 1975-10-09 1977-04-13 Mitsubishi Electric Corp Schmidt circuit
JPS55130262A (en) * 1979-03-30 1980-10-08 Nec Corp Bipolarity discrimination circuit

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0738871A2 (en) * 1995-04-19 1996-10-23 Hewlett-Packard Company Circuit and method for dealing with false zero crossings on low intensity signals
EP0738871A3 (en) * 1995-04-19 1997-04-16 Hewlett Packard Co Circuit and method for dealing with false zero crossings on low intensity signals
JP2020008509A (en) * 2018-07-12 2020-01-16 アズビル株式会社 Zero-point detection device

Also Published As

Publication number Publication date
JP2542575B2 (en) 1996-10-09

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