JPS62102175A - Superconductive circuit - Google Patents
Superconductive circuitInfo
- Publication number
- JPS62102175A JPS62102175A JP60241469A JP24146985A JPS62102175A JP S62102175 A JPS62102175 A JP S62102175A JP 60241469 A JP60241469 A JP 60241469A JP 24146985 A JP24146985 A JP 24146985A JP S62102175 A JPS62102175 A JP S62102175A
- Authority
- JP
- Japan
- Prior art keywords
- current
- circuit
- magnetic flux
- superconducting circuit
- dcfp
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
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- Measuring Magnetic Variables (AREA)
- Superconductor Devices And Manufacturing Methods Thereof (AREA)
- Logic Circuits (AREA)
- Electronic Switches (AREA)
Abstract
Description
【発明の詳細な説明】
〔発明の利用分野〕
本発明はジョセフソンデバイスを用いた磁束計は当技術
分野では公知であり、ＳＱ！ＪＩＬ）磁束計に代表され
る。従来のＳ Ｑ ＩＪ Ｉ Ｄ磁束計は外界からの熱
雑音や信号の増幅に使う前置増幅器の雑音によりＳ Ｑ
Ｕ １１’）が本来持つ感度を十分に活用できなかっ
た。この５ＱＵＩＤ磁束計の欠点を補い、更に高感度の
磁束計を実現するために、直流磁束パラメトロン（Ｄ
ＣＦ ｌｕｘ Ｐ ａｒａｍｅｔ、ｒｏｎ ；以下１’
） ＣＦＰと呼ぶ）回路を使う方法が提案されている。DETAILED DESCRIPTION OF THE INVENTION [Field of Application of the Invention] The present invention provides a magnetometer using a Josephson device, which is well known in the art, and is based on the SQ! JIL) magnetometer. Conventional S Q IJ I D magnetometers suffer from S Q due to thermal noise from the outside world and noise from the preamplifier used to amplify the signal.
The inherent sensitivity of U 11') could not be fully utilized. In order to compensate for the shortcomings of this 5QUID magnetometer and realize a magnetometer with even higher sensitivity, we developed a DC flux parametron (D
CF lux parameter, ron; hereinafter 1'
) A method using a circuit called CFP has been proposed.
このＤＣＦＰ回路を使う磁束計は特願昭６０−１２２５
２６に詳細に記載されている。A magnetic flux meter using this DCFP circuit was patented in 1986-1225.
26 is described in detail.
ＤＣＦＰ回路は磁束に鋭敏で、高い回路利得を持ち、磁
束計の比較回路として優れた特性を持っている。しかし
Ｄ ＣＦ）’回路の動作エネルギーは１、０−２’ Ｊ
極めて小さいため、ＤＣＦＰ回路の電流を検出する際に
検出回路に流す電流がトランス結合を介して該Ｄ ＣＦ
Ｐ回路に影響し、Ｄ ＣＦＰ回路の保守する信号極性
を反転させる誤動作を起し、情報を破壊するおそれがあ
ることが分かった。The DCFP circuit is sensitive to magnetic flux, has high circuit gain, and has excellent characteristics as a comparison circuit for a magnetometer. However, the operating energy of the D CF)' circuit is 1,0-2' J
Because it is extremely small, the current flowing through the detection circuit when detecting the current of the DCFP circuit is connected to the DCFP circuit through the transformer coupling.
It was found that this could affect the P circuit, causing a malfunction that would reverse the polarity of the signal maintained by the DCFP circuit, potentially destroying information.
本発明の目的はＤＣＦＰ回等の回路の出力電流を該１）
ＣＦＰ回路等の回路の情報を破壊すること無く検出す
るのに適した超電導回路を提供することにある。
−
〔発明の概要〕
この目的を達成するために本発明では電流検出回路の影
響を相殺する為の回路を新たに付加するか、二つの電流
検出回路を差動に動作させて、該Ｄ ＣＦＰ回路等の回
路への影響を無くす方法を採用する。The purpose of the present invention is to reduce the output current of circuits such as DCFP circuits.
The object of the present invention is to provide a superconducting circuit suitable for detecting information in a circuit such as a CFP circuit without destroying it.
- [Summary of the Invention] In order to achieve this object, the present invention adds a new circuit to cancel the influence of the current detection circuit, or operates two current detection circuits differentially, and Adopt a method that eliminates the effect on other circuits.
以下、本発明を実施例を用いて詳細に説明する。 Hereinafter, the present invention will be explained in detail using Examples.
第２図（ａ）は本発明で使う電流検出回路に使う磁束結
合層量子干渉素子を示す。この素子は２個のジョセフソ
ン接合１，２インダクタ３，４で超電導ループを構成し
ている。該超電導ループにはバイアス線５によりバイア
ス電流が供給される。FIG. 2(a) shows a magnetic flux coupling layer quantum interference device used in the current detection circuit used in the present invention. This element comprises two Josephson junctions 1, 2 and inductors 3, 4 forming a superconducting loop. A bias current is supplied to the superconducting loop by a bias line 5.
また該超電導ループの近傍には二つの制御線６゜７が設
己され、該制御線６，７に流れる電流により発生する磁
束は該超電導ループに鎖交し、該制御線の電流は磁束結
合層量子干渉素子の最大超電導電流を制御する。以降こ
の磁束結合層量子干渉素子を第２図（ｂ）のシンボル１
０で表わす。第３図は電流検出回路の動作原理を示す図
である。Further, two control lines 6 and 7 are installed near the superconducting loop, and the magnetic flux generated by the current flowing through the control lines 6 and 7 interlinks with the superconducting loop, and the current in the control line is magnetic flux coupled. Control the maximum superconducting current of a layered quantum interference device. Hereinafter, this magnetic flux coupling layer quantum interference device will be referred to as symbol 1 in Fig. 2(b).
Represented by 0. FIG. 3 is a diagram showing the operating principle of the current detection circuit.
電流検出回路の磁束結合層量子干渉素子１０では、第１
°の制御線６には被測定電流Ｉｓを、第２の制御線７に
は参照電流Ｉｒを流す。第２図には磁束結合層量子干渉
素子の閾値特性を示している。この図で磁束結合層量子
干渉素子のバイアス電流を１ｇに固定すれば、該磁束結
合層量子干渉素子を超電導状態から電圧状態にスイッチ
させるために必要な制御電流Ｉｆは一意的に決る。この
電流Ｉｆが第１．第２の制御線に流れる電流Ｉｓ。In the magnetic flux coupling layer quantum interference device 10 of the current detection circuit, the first
The current to be measured Is is passed through the control line 6 of 0.degree., and the reference current Ir is passed through the second control line 7. FIG. 2 shows the threshold characteristics of the magnetic flux coupling layer quantum interference device. In this figure, if the bias current of the magnetic flux coupling layer quantum interference device is fixed at 1 g, the control current If required to switch the magnetic flux coupling layer quantum interference device from the superconducting state to the voltage state is uniquely determined. This current If is the first current If. Current Is flowing through the second control line.
Ｉｒの和であることは明らかである。従ってＩｒをスキ
ャンし、該磁束結合量子干渉回路がスイッチするの１ｒ
をサンプリングすればそれから■ｓの値を知ることがで
きる。このことから電流検出回路では参照電流Ｉｒから
被測電流Ｉｓの値を知るこが出来る。従来技術では、こ
の電流検出回路のバイアス電流１ピ、参照電流Ｉｒによ
り発生した磁束が制御線６に重畳され、これがＤＣＦ）
１回路に影響を与えた。It is clear that it is the sum of Ir. Therefore, when Ir is scanned, the flux-coupled quantum interference circuit switches to 1r.
If we sample , then we can know the value of s. From this, the current detection circuit can determine the value of the measured current Is from the reference current Ir. In the conventional technology, the magnetic flux generated by the bias current 1 pin and the reference current Ir of this current detection circuit is superimposed on the control line 6, and this is the DCF).
1 circuit was affected.
第１図は本発明の第１の実施例である。この実施例では
ジョセフソン接合１０１，１０２、励振インダクタ１０
３，１０４、励振線１０５、入力端子１０６、出力線１
０８からなるＤＣＦＰ回路の負荷インダクタとしてトラ
ンス１０９、電流検出回路１０の制御線６が接続されて
いる。電流検出回路の磁束結合量子干渉回路１０はパル
ス電流源２００より電流１ｇが供給され、その両端の電
圧は電圧計２０１でモニタされる。参照電流Ｉｒはスキ
ャン電流源３００′より供給される。この回路構成でキ
ャンセル電流Ｉｇ′をトランス１０９に配線１１０を介
してバイアス電流Ｉｇと参照電流１ｒに対して逆方向に
流せば、バイアス電流Ｉｇ参照電流１ｒにより制御線６
に重畳される磁束キャンセル電流Ｉｇ／で打ち消すこと
ができる。FIG. 1 shows a first embodiment of the invention. In this embodiment, Josephson junctions 101 and 102, an excitation inductor 10
3, 104, excitation line 105, input terminal 106, output line 1
A transformer 109 as a load inductor of a DCFP circuit consisting of 08 and a control line 6 of a current detection circuit 10 are connected. The flux-coupled quantum interference circuit 10 of the current detection circuit is supplied with 1 g of current from a pulse current source 200, and the voltage across it is monitored by a voltmeter 201. Reference current Ir is supplied from scan current source 300'. With this circuit configuration, if the canceling current Ig' is caused to flow through the transformer 109 through the wiring 110 in the opposite direction to the bias current Ig and the reference current 1r, the bias current Ig and the reference current 1r cause the control line 6
It can be canceled by a magnetic flux canceling current Ig/ superimposed on the magnetic flux canceling current Ig/.
キャンセル電流Ｉｇ′は電流Ｉｇ、Ｉｒとトランス１０
９の結合係数によりＱ適な電流値を選択することができ
る。The canceling current Ig' is the current Ig, Ir and the transformer 10.
A current value suitable for Q can be selected by the coupling coefficient of 9.
第４図は本発明による第２の実施例である。この実施例
では第１図の第１の実施例のトランス１０９に流れる電
流をバイアス電流１ｇと同じになるように、トランス１
０９と電流検出回路のバイアス線５を直列接続した形と
なっている。またトランス１０９で発生する磁束と電流
検出回路１０が発生する磁束が互いに打ち消し合う様に
電流の向きが反対になるよう接続されている。この構成
ではトランス１０９の結合係数を電流検出回路の結合係
数と同じにすることにより磁束を打ち消しあうことがで
きる。またこの実施例ではバイアス電流による磁束を打
ちけす事ができる回路構成であるが、障害となる磁束は
ほとんどこのバイアス電流から発生するため、この回路
構成で十分実用に供することができる。更に参照電流に
よる磁束を打ち消すためには第５図に示す様に、参照電
流による磁束をトランス１０９′により打ち消す構成と
すればよい事は明らかである。FIG. 4 shows a second embodiment of the present invention. In this embodiment, the current flowing through the transformer 109 in the first embodiment shown in FIG.
09 and the bias line 5 of the current detection circuit are connected in series. Further, the magnetic flux generated by the transformer 109 and the magnetic flux generated by the current detection circuit 10 are connected so that the directions of the currents are opposite so that they cancel each other out. In this configuration, the magnetic fluxes can be canceled by making the coupling coefficient of the transformer 109 the same as that of the current detection circuit. Furthermore, although this embodiment has a circuit configuration that can overcome the magnetic flux caused by the bias current, since most of the magnetic flux that causes interference is generated from this bias current, this circuit configuration can be sufficiently put to practical use. Furthermore, in order to cancel out the magnetic flux due to the reference current, it is obvious that the magnetic flux due to the reference current may be canceled by a transformer 109' as shown in FIG.
第６図は本発明による第３の実施例である。この実施例
では二つの電流検出回路１０ａ、１０ｂをＤ ＣＦ’
Ｐ回路の負荷とし、該２個の電流検出回路のバイアス電
流Ｉｇ、参照電流１ｒの向きを互いに逆方向に流す様な
差動接続した構成になっている。この構成で該２個の電
流検出回路により発生した磁束は互いに打ち消し合うた
め、電流検出回路のＩ） ＣＦ Ｐ回路に与えるリアク
ションは皆無である。この場合２個の電流検出回路のう
ち一方だけが有効に電流検出として使われ、他方は使わ
れていない。第７図は第６図に示す実施例の変形で、２
個の電流検出回路に同じバイアス電流流すように、２個
のバイアス線５ａ、５ｂを直列に接続した構成となって
いる。この実施例では２個の電流検出回路は発生する磁
束が互いに逆方向になる様に、バイアス電流の方向を逆
向きにしである。FIG. 6 shows a third embodiment of the present invention. In this embodiment, two current detection circuits 10a and 10b are connected to D CF'
The P circuit is used as a load, and the bias current Ig and reference current 1r of the two current detection circuits are differentially connected so that they flow in directions opposite to each other. With this configuration, the magnetic fluxes generated by the two current detection circuits cancel each other out, so there is no reaction given to the I) CF P circuit of the current detection circuit. In this case, only one of the two current detection circuits is effectively used for current detection, and the other is not used. FIG. 7 is a modification of the embodiment shown in FIG.
Two bias lines 5a and 5b are connected in series so that the same bias current flows through the two current detection circuits. In this embodiment, the two current detection circuits have bias currents directed in opposite directions so that the magnetic fluxes generated are in opposite directions.
以上の説明は電流検出回路に２接合磁束結合形量子干？
＄索子を使った例で説明したが、発明の原理から２接合
以上の磁束結合形素子を使って本発明を実施できるり１
は明らかである。Is the above explanation a two-junction magnetic flux coupled quantum transistor in the current detection circuit?
Although the explanation has been given using an example using a $ cable, based on the principle of the invention, the present invention can be implemented using a magnetic flux coupling type element with two or more junctions.
is clear.
本発明によれば、極めて微弱なエネルギーで動作するＤ
ＣＦ’Ｐｌ！ｌ！回路の信号を検出回路の影響を除外し
た形で取りだすことができる。このため微小な信号を安
定した形で検出するＩＪＧができ、Ｄ ＣＦ Ｐ回路の
測定精度、さらには測定速度を大幅に向上させるルがで
き、ひいては高感度、高精度の磁束計を提供するのに役
立つ。According to the present invention, the D
CF'Pl! l! The circuit signal can be extracted without the influence of the detection circuit. This makes it possible to create an IJG that detects minute signals in a stable manner, and to greatly improve the measurement accuracy and measurement speed of the DCF P circuit, thereby providing a highly sensitive and highly accurate magnetometer. useful for.
第１図は本発明による第１の実施例、第２図は本発明の
電流検出口に使う磁束結合形素子とそのシンボル、第３
図は電流検出回路の動作原理図、第４図は本発明の第２
の実施例、第５図は第４回の実施例の変形例、第６＠は
本発明の第３の実施例、第７図は第６図の実施例の変形
例である。
１．２・°゛ジヨセフソン接合３，４・・・インダクタ
、５・・・バイアス線、６，７・・・制御線、１０・・
・磁束結合層量子干渉素子のシンボル、
１０１．１０２・・・ジョセフソン接合。
１０３．１０４・・・励振インダクタ、１０５・・・励
振線、１０６・・・入力端子、１０８・・・出力線、１
０９・・・トランス、１１Ｏ・・・配線、２００・・・
パルス電流源、２０１・・・電圧計、３００・・・スキ
ャン電流源。
代理人 ア□ヤ４１，１１カ烏、］
’ｆ、 ／国
茗２図
葛３圀
躬４図
ノｔ〜≦Fig. 1 shows the first embodiment of the present invention, Fig. 2 shows the magnetic flux coupling type element used in the current detection port of the present invention and its symbol, and Fig. 3
The figure is a diagram of the operating principle of the current detection circuit, and Figure 4 is the second embodiment of the present invention.
FIG. 5 is a modification of the fourth embodiment, No. 6 is a third embodiment of the present invention, and FIG. 7 is a modification of the embodiment of FIG. 1.2・° Josephson junction 3, 4... Inductor, 5... Bias line, 6, 7... Control line, 10...
・Symbol of magnetic flux coupling layer quantum interference device, 101.102...Josephson junction. 103.104...Excitation inductor, 105...Excitation line, 106...Input terminal, 108...Output line, 1
09...Transformer, 11O...Wiring, 200...
Pulse current source, 201... Voltmeter, 300... Scan current source. Agent A□Ya 41, 11 Kakarasu,] 'f, / Kunimi 2, Kuzu 3, Kuni, 4, No. t~≦
Claims (1)
該信号線に接続され、該信号電流に応答する磁束結合形
素子を含む第２の超伝導回路からなる超電導回路におい
て、該磁束結合素子に流す動作電流により該信号線に重
畳して発生される磁束を打ち消す磁束を該信号線に重畳
させる手段を有する超電導回路。 ２、特許請求項目第１項の超電導回路において、該磁束
重畳手段は、該磁束結合形素子に流す該動作電流に対応
する値の電流を流すための、該信号線に磁気結合された
トランス結合素子からなることを特徴とする超電導回路
。 ３、特許請求項目第１項の超伝導回路において、該磁束
重畳手段は、該信号線に接続され、該磁束結合形素子と
同一構造を有し、該動作電流と逆の方向の動作電流が流
される他の磁束結合形素子からなることを特徴とする超
電導回路。 ４、特許請求の範囲第１項から第３項のいずれかの超電
導回路において、該第１の超電導回路は、直流磁束パラ
メトロン回路であることを特徴とする超電導回路。 ５、特許請求の範囲第１項から第４項のいずれかの超電
導回路において、該第２の超電導回路は該信号電流の大
きさに依存して該動作電流の大きさを制御する手段を有
する超電導回路。[Claims] 1. A first superconducting circuit that outputs a current signal to a signal line;
In a superconducting circuit consisting of a second superconducting circuit including a magnetic flux coupling type element connected to the signal line and responsive to the signal current, a superconducting circuit is generated superimposed on the signal line by an operating current flowing through the magnetic flux coupling element. A superconducting circuit having means for superimposing magnetic flux that cancels magnetic flux on the signal line. 2. In the superconducting circuit according to claim 1, the magnetic flux superimposing means is a transformer coupling magnetically coupled to the signal line for flowing a current having a value corresponding to the operating current flowing through the magnetic flux coupling type element. A superconducting circuit characterized by consisting of elements. 3. In the superconducting circuit according to claim 1, the magnetic flux superimposing means is connected to the signal line, has the same structure as the magnetic flux coupling element, and has an operating current in the opposite direction to the operating current. A superconducting circuit characterized in that it consists of other flux-coupled elements. 4. A superconducting circuit according to any one of claims 1 to 3, wherein the first superconducting circuit is a DC magnetic flux parametron circuit. 5. In the superconducting circuit according to any one of claims 1 to 4, the second superconducting circuit has means for controlling the magnitude of the operating current depending on the magnitude of the signal current. superconducting circuit.
Priority Applications (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP60241469A JPH0644033B2 (en) | 1985-10-30 | 1985-10-30 | Superconducting circuit |
| EP86107693A EP0205120B1 (en) | 1985-06-07 | 1986-06-05 | Superconducting current detecting circuit employing DC flux parametron circuit |
| CA000510927A CA1268815A (en) | 1985-06-07 | 1986-06-05 | Superconducting current detecting circuit employing dc flux parametron circuit |
| DE3650062T DE3650062T2 (en) | 1985-06-07 | 1986-06-05 | Superconducting current sensor circuit. |
| US07/291,338 US4866373A (en) | 1985-06-07 | 1988-12-28 | Superconducting current detecting circuit employing DC flux parametron circuit |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP60241469A JPH0644033B2 (en) | 1985-10-30 | 1985-10-30 | Superconducting circuit |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS62102175A true JPS62102175A (en) | 1987-05-12 |
| JPH0644033B2 JPH0644033B2 (en) | 1994-06-08 |
Family
ID=17074774
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP60241469A Expired - Lifetime JPH0644033B2 (en) | 1985-06-07 | 1985-10-30 | Superconducting circuit |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0644033B2 (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6435285A (en) * | 1987-07-30 | 1989-02-06 | Japan Res Dev Corp | Method for detecting signal of quantum flux parametron |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP6563239B2 (en) * | 2015-04-10 | 2019-08-21 | 国立大学法人横浜国立大学 | Adiabatic quantum flux parametron circuit and superconducting logic device |
-
1985
- 1985-10-30 JP JP60241469A patent/JPH0644033B2/en not_active Expired - Lifetime
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6435285A (en) * | 1987-07-30 | 1989-02-06 | Japan Res Dev Corp | Method for detecting signal of quantum flux parametron |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0644033B2 (en) | 1994-06-08 |
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