JPS6138759U - Sample temperature control probe - Google Patents
Sample temperature control probeInfo
- Publication number
- JPS6138759U JPS6138759U JP12391784U JP12391784U JPS6138759U JP S6138759 U JPS6138759 U JP S6138759U JP 12391784 U JP12391784 U JP 12391784U JP 12391784 U JP12391784 U JP 12391784U JP S6138759 U JPS6138759 U JP S6138759U
- Authority
- JP
- Japan
- Prior art keywords
- temperature control
- sample
- control probe
- sample temperature
- stand
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Analysing Materials By The Use Of Radiation (AREA)
- Control Of Temperature (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
第1図は本考案の一実施例である試料温度調節プローブ
の内部構造を示す部分断面図、第2図は真空中での測定
を行う場合の分析機器の構成を示す概略図、第3図は従
来の試料温度調節プローブ1の内部構造を示す部分断面
図である。
1・・・分析計本体、2・・・試料室、4a,4b・・
・真空排気装置、5・・・挿入口、10・・・試料温度
調節プローブ、13・・・冷却パイプ、14・・・熱電
対、17.・・・試料、22・・・ヒータブロック、2
3・・・差込みプラグ、24・・・差込みソケット、2
5・・・熱電対挿入穴。Figure 1 is a partial sectional view showing the internal structure of a sample temperature control probe that is an embodiment of the present invention, Figure 2 is a schematic diagram showing the configuration of an analytical instrument when performing measurements in vacuum, and Figure 3. 1 is a partial cross-sectional view showing the internal structure of a conventional sample temperature control probe 1. FIG. 1... Analyzer body, 2... Sample chamber, 4a, 4b...
- Vacuum exhaust device, 5... Insertion port, 10... Sample temperature adjustment probe, 13... Cooling pipe, 14... Thermocouple, 17. ...Sample, 22...Heater block, 2
3...Plug-in plug, 24...Plug-in socket, 2
5...Thermocouple insertion hole.
Claims (1)
中の分析計本体に挿入して前記試料を加熱または冷却す
る試料温度調節プロー7において、前記試料台を内部に
熱電対挿入穴を設けた差し込み式のヒータブロックとし
たことを特徴とする試料温度調節プローブ。In a sample temperature control probe 7 that has a sample stand on the top for placing a sample and heats or cools the sample by inserting the sample stand into the analyzer body in vacuum, a thermocouple is inserted into the sample stand. A sample temperature control probe characterized by a plug-in heater block with a hole.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP12391784U JPS6138759U (en) | 1984-08-13 | 1984-08-13 | Sample temperature control probe |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP12391784U JPS6138759U (en) | 1984-08-13 | 1984-08-13 | Sample temperature control probe |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS6138759U true JPS6138759U (en) | 1986-03-11 |
Family
ID=30682648
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP12391784U Pending JPS6138759U (en) | 1984-08-13 | 1984-08-13 | Sample temperature control probe |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6138759U (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2005221363A (en) * | 2004-02-05 | 2005-08-18 | Rigaku Corp | Sample support device for x-ray analysis, and x-ray analyzer |
-
1984
- 1984-08-13 JP JP12391784U patent/JPS6138759U/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2005221363A (en) * | 2004-02-05 | 2005-08-18 | Rigaku Corp | Sample support device for x-ray analysis, and x-ray analyzer |
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