JPS6136704B2 - - Google Patents

Info

Publication number: JPS6136704B2
Authority: JP; Japan
Prior art keywords: chip; mark; camera; signal; detection circuit
Prior art date: 1979-03-22
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.): Expired

Application number

JP3374579A

Other languages

English (en)

Japanese (ja)

Other versions

JPS55125641A (en

Inventor

Masayuki Naruse

Shige Yamada

Isao Tokumaru

Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)

NEC Corp

Original Assignee

Nippon Electric Co Ltd

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

1979-03-22

Filing date

1979-03-22

Publication date

1986-08-20

1979-03-22 Application filed by Nippon Electric Co Ltd filed Critical Nippon Electric Co Ltd

1979-03-22 Priority to JP3374579A priority Critical patent/JPS55125641A/ja

1980-09-27 Publication of JPS55125641A publication Critical patent/JPS55125641A/ja

1986-08-20 Publication of JPS6136704B2 publication Critical patent/JPS6136704B2/ja

Status Granted legal-status Critical Current

Links

238000001514 detection method Methods 0.000 claims description 18
230000003287 optical effect Effects 0.000 claims description 12
238000005286 illumination Methods 0.000 claims description 7
230000002950 deficient Effects 0.000 description 14
239000004065 semiconductor Substances 0.000 description 6
238000010586 diagram Methods 0.000 description 5
238000006243 chemical reaction Methods 0.000 description 2
230000000694 effects Effects 0.000 description 2
238000004519 manufacturing process Methods 0.000 description 2
239000011159 matrix material Substances 0.000 description 2
238000000034 method Methods 0.000 description 2
238000011179 visual inspection Methods 0.000 description 2
241001061260 Emmelichthys struhsakeri Species 0.000 description 1

Classifications

- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor

Landscapes

Engineering & Computer Science (AREA)
Manufacturing & Machinery (AREA)
Computer Hardware Design (AREA)
Microelectronics & Electronic Packaging (AREA)
Power Engineering (AREA)
Testing Or Measuring Of Semiconductors Or The Like (AREA)

JP3374579A 1979-03-22 1979-03-22 Automatic chip selection apparatus Granted JPS55125641A (en)

Priority Applications (1)

Application Number	Priority Date	Filing Date	Title
JP3374579A JPS55125641A (en)	1979-03-22	1979-03-22	Automatic chip selection apparatus

Applications Claiming Priority (1)

Application Number	Priority Date	Filing Date	Title
JP3374579A JPS55125641A (en)	1979-03-22	1979-03-22	Automatic chip selection apparatus

Publications (2)

Publication Number	Publication Date
JPS55125641A JPS55125641A (en)	1980-09-27
JPS6136704B2 true JPS6136704B2 (ko)	1986-08-20

Family

ID=12394945

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
JP3374579A Granted JPS55125641A (en)	1979-03-22	1979-03-22	Automatic chip selection apparatus

Country Status (1)

Country	Link
JP (1)	JPS55125641A (ko)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
JP2007258482A (ja) *	2006-03-23	2007-10-04	Fujitsu Ltd	半導体装置の検査装置及び検査方法

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
JPS5897844A (ja) *	1981-12-07	1983-06-10	Shinkawa Ltd	ダイ詰め換え装置
JPS58165339A (ja) *	1982-03-26	1983-09-30	Nec Corp	半導体ペレツトのマウント方法及びその装置
JPS59211239A (ja) *	1983-05-17	1984-11-30	Nec Corp	半導体ペレツト配列機
JPS6127652A (ja) *	1984-07-18	1986-02-07	Shinkawa Ltd	ウエハ位置決め装置
SG148902A1 (en) *	2007-07-09	2009-01-29	Generic Power Pte Ltd	Die ejector with illuminating unit

1979
- 1979-03-22 JP JP3374579A patent/JPS55125641A/ja active Granted

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
JP2007258482A (ja) *	2006-03-23	2007-10-04	Fujitsu Ltd	半導体装置の検査装置及び検査方法

Also Published As

Publication number	Publication date
JPS55125641A (en)	1980-09-27

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