JPS6128051U - ultrasonic probe - Google Patents

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Abstract] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【図面の簡単な説明】 第１図は従来装置の説明をするための図、第２図は従来
装置における探触子位置と検出エコー高さの関係や示す
図、第３図は従来装置における欠陥面エコーの検出波形
を示す図、第４図は本考案の一実施例を示す概略的な構
成区、第５図は本考案装置における欠陥面エコー検出用
探触子による欠陥面エコーの検出波形を示す図である。 １・・・端部ピークエコー検出用の深触子、２・・・被
検体、２１・・・欠陥面エコー検出用の探触子。[Brief explanation of the drawings] Fig. 1 is a diagram for explaining the conventional device, Fig. 2 is a diagram showing the relationship between the probe position and detected echo height in the conventional device, and Fig. 3 is a diagram for explaining the relationship between the probe position and detected echo height in the conventional device. A diagram showing the detection waveform of a defective surface echo, FIG. 4 is a schematic configuration diagram showing an embodiment of the present invention, and FIG. 5 is a diagram showing the detection of a defective surface echo by a probe for detecting defective surface echoes in the device of the present invention. FIG. 3 is a diagram showing waveforms. 1... Deep probe for edge peak echo detection, 2... Test object, 21... Probe for defect surface echo detection.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 超音波による端部ピークエコー法により被検体の欠陥測
定を行うための探触子として、所定屈折角を有する端部
エコーピーク検出用の第１の探触子と、この第１の探触
子の走査方向前方側に所定間隔を存して配され、前記被
検体の欠陥面からのエコーを検出する前記第１の探触子
より屈折角の大なる第２の探触子とを具備してなる超音
波探触子。A first probe for detecting an edge echo peak having a predetermined refraction angle, which is used as a probe for measuring defects in a specimen by an edge peak echo method using ultrasonic waves, and this first probe. a second probe that is arranged at a predetermined interval on the front side in the scanning direction of the object and has a larger refraction angle than the first probe that detects an echo from the defective surface of the object. An ultrasonic probe.