JPS6128041U - Sample support for X-ray non-destructive testing equipment - Google Patents
Sample support for X-ray non-destructive testing equipmentInfo
- Publication number
- JPS6128041U JPS6128041U JP11176384U JP11176384U JPS6128041U JP S6128041 U JPS6128041 U JP S6128041U JP 11176384 U JP11176384 U JP 11176384U JP 11176384 U JP11176384 U JP 11176384U JP S6128041 U JPS6128041 U JP S6128041U
- Authority
- JP
- Japan
- Prior art keywords
- sample
- camera
- sample support
- ray
- clamp
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Analysing Materials By The Use Of Radiation (AREA)
- Sampling And Sample Adjustment (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
第１図はＸ線非破壊検査の構成図、第２図は被検査物り
形状を示す外形図、第３図は本考案の一実施例の試料支
持器の平面図、第４図は同じく正面図、第５図は同じく
クランパー部分の詳細図である。Fig. 1 is a configuration diagram of an X-ray non-destructive inspection, Fig. 2 is an outline drawing showing the shape of the object to be inspected, Fig. 3 is a plan view of a sample supporter according to an embodiment of the present invention, and Fig. 4 is the same. The front view and FIG. 5 are also detailed views of the clamper portion.
Claims (1)
料があり、この試料を画質向上の目的から常にカメラに
近づけるために、試料をつかむクランプ部分において、
クランプの９０度回転とこの９０度回転によって、高さ
を変化きせるカムとを連動させ、クランブの回転中心と
カメラ面との距離を変えることによって、ＩＣ等の厚さ
寸法と巾寸法の異なるもので、常にカメラ側に近づけら
れることを特徴としたＸ線非破壊掻査装置用試料支持器
。There is a sample to be inspected between the X-ray generator and the X-ray television camera, and in order to keep the sample close to the camera for the purpose of improving image quality, a clamp part that grips the sample is
By linking the 90-degree rotation of the clamp with a cam whose height can be changed by this 90-degree rotation, and changing the distance between the center of rotation of the clamp and the camera surface, ICs with different thickness and width dimensions can be created. A sample support for an X-ray non-destructive scraping device, which is characterized in that it can always be brought close to the camera side.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11176384U JPS6128041U (en) | 1984-07-25 | 1984-07-25 | Sample support for X-ray non-destructive testing equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11176384U JPS6128041U (en) | 1984-07-25 | 1984-07-25 | Sample support for X-ray non-destructive testing equipment |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS6128041U true JPS6128041U (en) | 1986-02-19 |
Family
ID=30670837
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP11176384U Pending JPS6128041U (en) | 1984-07-25 | 1984-07-25 | Sample support for X-ray non-destructive testing equipment |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6128041U (en) |
-
1984
- 1984-07-25 JP JP11176384U patent/JPS6128041U/en active Pending
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