JPS61248548A - Voltage stabilized integrated circuit device - Google Patents
Voltage stabilized integrated circuit deviceInfo
- Publication number
- JPS61248548A JPS61248548A JP9007185A JP9007185A JPS61248548A JP S61248548 A JPS61248548 A JP S61248548A JP 9007185 A JP9007185 A JP 9007185A JP 9007185 A JP9007185 A JP 9007185A JP S61248548 A JPS61248548 A JP S61248548A
- Authority
- JP
- Japan
- Prior art keywords
- voltage
- integrated circuit
- circuit device
- elements
- resistance
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000000087 stabilizing effect Effects 0.000 claims abstract description 19
- 239000004065 semiconductor Substances 0.000 claims abstract description 7
- 239000000758 substrate Substances 0.000 claims abstract description 5
- 238000001514 detection method Methods 0.000 claims description 32
- 230000003321 amplification Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000003199 nucleic acid amplification method Methods 0.000 description 2
- 239000003795 chemical substances by application Substances 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/04—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body
- H01L27/08—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including only semiconductor components of a single kind
- H01L27/0802—Resistors only
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Semiconductor Integrated Circuits (AREA)
Abstract
Description
【発明の詳細な説明】
産業上の利用分野
本発明は、電圧安定化回路を集積化した電圧安定化集積
回路装置に関する。DETAILED DESCRIPTION OF THE INVENTION Field of the Invention The present invention relates to a voltage stabilizing integrated circuit device in which a voltage stabilizing circuit is integrated.
従来の技術
近年、各種の回路が集積化されておシ、その１つに、電
圧安定化回路を集積化した電圧安定化集積回路装置があ
る。ところで、この電圧安定化集積回路装置の基本的な
回路部分の構成と回路定数は固定したままで複数の出力
電圧が取り出せるようにして、その機能を高めるため、
個々の出力電圧を定める検出抵抗を予め複数個配置し、
必要とする抵抗の結線を可能にした回路配置が採られて
いる。2. Description of the Related Art In recent years, various types of circuits have been integrated, and one of them is a voltage stabilizing integrated circuit device that integrates a voltage stabilizing circuit. By the way, in order to increase the functionality of this voltage stabilizing integrated circuit device by making it possible to obtain multiple output voltages while keeping the basic circuit configuration and circuit constants fixed,
Multiple detection resistors are placed in advance to determine individual output voltages,
The circuit layout is designed to allow the necessary resistance connections.
第３図は、このような回路配置を有する電圧安定化集積
回路装置の等何回路を示す図であシ、誤差電圧増幅部１
、制御素子であるトランジスタ２、基準電圧発生部３お
よび定電流源４とで構成された回路部の出力電圧端子６
に検出抵抗ＲＡおよび複数個の検出抵抗ＲＢとで構成さ
れる誤差電圧検出部６が付加された回路構成となってい
る。なお、７は入力電圧端子である。FIG. 3 is a diagram showing the circuits of a voltage stabilizing integrated circuit device having such a circuit arrangement.
, an output voltage terminal 6 of a circuit section comprising a transistor 2 as a control element, a reference voltage generating section 3, and a constant current source 4.
The circuit has a circuit configuration in which an error voltage detection section 6 composed of a detection resistor RA and a plurality of detection resistors RB is added. Note that 7 is an input voltage terminal.
この回路の誤差電圧検出部５を構成する検出抵抗ＲＡと
ＲＢは、第２図で示すように、形状ならびに抵抗値の双
方がほぼ等しく設定された複数個の抵抗要素を半導体集
積回路の所定域に作り込み、これらを結線して所望の値
の検出抵抗を得ている。As shown in FIG. 2, the detection resistors RA and RB constituting the error voltage detection section 5 of this circuit are composed of a plurality of resistive elements having approximately the same shape and resistance value set in a predetermined area of the semiconductor integrated circuit. A detection resistor with a desired value is obtained by connecting these.
図示する結線は、たとえば、１個の抵抗要素の抵抗値が
２にΩに選定され、これらを用いて検出抵抗ＲＡおよび
ＲＢとして５にΩおよび３にΩの値を得る場合の結線で
あ）、抵抗Ｒ５，Ｒ１２，Ｒ１３およびＲ２１で５にΩ
の検出抵抗ＲＡが、また、抵抗Ｒ２，Ｒ３およびＲ４で
３にΩの検出抵抗ＲＢが形成されている。The illustrated connection is for example when the resistance value of one resistor element is selected to be 2Ω, and these are used to obtain values of 5Ω and 3Ω as the detection resistors RA and RB.) , resistors R5, R12, R13 and R21 to 5Ω
Furthermore, a detection resistor RB of 3 Ω is formed by resistors R2, R3, and R4.
このような検出抵抗の構成によれば、半導体集積回路化
に際して是認しなければならない接触抵抗の影響を減ら
し、出力電圧を高い精度で設定することができる。According to such a configuration of the detection resistor, it is possible to reduce the influence of contact resistance, which must be accepted when implementing a semiconductor integrated circuit, and to set the output voltage with high accuracy.
発明が解決しようとする問題点
このような従来の電圧安定化集積回路装置中に発熱量の
大きな素子が含まれていた場合、動作時にこの素子から
生じた熱によシ半導体集積回路基板内に温度差が生じる
ところとなシ、検出抵抗用の抵抗要素間でも抵抗値に差
が生じる。このため、検出抵抗要素の組み合わせを変化
させて広い範囲にわたる出力電圧を得た場合の温度変化
率が不均一となる。Problems to be Solved by the Invention When such a conventional voltage stabilizing integrated circuit device includes an element that generates a large amount of heat, the heat generated from this element during operation causes damage to the semiconductor integrated circuit board. In addition to where there is a temperature difference, there is also a difference in resistance value between the resistance elements for the detection resistor. For this reason, the rate of temperature change becomes non-uniform when output voltages over a wide range are obtained by changing the combination of detection resistor elements.
すなわち、複数種の出力電圧を発生することができる機
能は具備するものの、出力電圧を変化させると、この変
化に追随して温度変化率が変化する。That is, although the device has a function of generating a plurality of types of output voltages, when the output voltage is changed, the temperature change rate changes in accordance with this change.
本発明は、このような問題の排除を意図してなされたも
ので、広い電圧範囲に及ぶ出力電圧の発生が可能で、し
かも、発生させた出力電圧の温度変化率を電圧値の変化
に関係なくほぼ一定値に保つことができる電圧安定化集
積回路装置を実現するものである。The present invention was made with the intention of eliminating such problems, and it is possible to generate an output voltage over a wide voltage range, and moreover, the temperature change rate of the generated output voltage is related to the change in voltage value. The purpose of this invention is to realize a voltage stabilizing integrated circuit device that can maintain a voltage at a substantially constant value.
問題点を解決するだめの手段
本発明の電圧安定化集積回路装置は、出力端子に誤差電
圧検出部が付加される電圧安定化回路か集積化されると
ともに、前記誤差電圧検出部が形状および抵抗値の等し
い多数個の抵抗要素で構成され、さらＫ、同抵抗要素の
すべてもしくは大半を結線して検出抵抗を形成した構造
となっている。Means for Solving the Problems The voltage stabilizing integrated circuit device of the present invention integrates a voltage stabilizing circuit in which an error voltage detecting section is added to the output terminal, and the error voltage detecting section has a shape and a resistance. It is composed of a large number of resistance elements having the same value, and furthermore, all or most of the resistance elements are connected to form a detection resistor.
作用
このように構成された本発明の電圧安定化集積回路装置
では、誤差電圧検出部の抵抗要素を最大限に利用して検
出抵抗を形成するため、抵抗値を変化させても使用する
抵抗要素の数はほぼ等しく、温度変化率の変動が抑えら
れる。Function: In the voltage stabilizing integrated circuit device of the present invention configured as described above, the resistance element of the error voltage detection section is fully utilized to form the detection resistor, so even if the resistance value is changed, the resistance element used is The number of is approximately equal, and fluctuations in the rate of temperature change are suppressed.
実施例
第１図は、本発明の電圧安定化集積回路装置内に作り込
まれた誤差電圧検出部形成用の抵抗群とこれを結線した
状態を示す平面図であシ、抵抗群はＲ１−Ｒ２４で示す
２４個の抵抗要素からなっている。なお、個々の抵抗要
素は、図示するようにその形状がほぼ同一である矩形で
あり、しかも、近接して作９込まれている。Embodiment FIG. 1 is a plan view showing a resistor group for forming an error voltage detection section built in a voltage stabilizing integrated circuit device of the present invention and a state in which the resistor group is connected. It consists of 24 resistive elements designated R24. As shown in the figure, the individual resistance elements have substantially the same rectangular shape and are built close to each other.
図示する結ａは、第３図で示した検出抵抗ＲＡとよＪｓ
ＫΩの値の検出抵抗ＲＡと３にΩの値の検出抵抗ＲＢと
が得られる。The illustrated connection a is the detection resistor RA and Js shown in FIG.
A detection resistor RA with a value of KΩ and a detection resistor RB with a value of 3Ω are obtained.
すなわち、検出抵抗ＲＡは、抵抗要素Ｒ５、並列接続さ
れた抵抗要素Ｒ１□とＲ１３および抵抗要素Ｒ２１との
直列接続体で形成され、その合成抵抗として定まる検出
抵抗ＲＡの値は、
ＲＡ ＝Ｒ＋ ＝ ＋ Ｒ＝２．５ Ｒ＝５ （Ｋ Ｑ
）となる。That is, the detection resistor RA is formed by a series connection body of a resistance element R5, resistance elements R1□ and R13 connected in parallel, and a resistance element R21, and the value of the detection resistance RA determined as the combined resistance is as follows: RA = R+ = + R=2.5 R=5 (K Q
).
をそれぞれ並列に接続するとともにさらに抵抗要素Ｒ９
とＲｌｏを並列に接続し、さらにこれらを直列に接続し
た構成とされ、これらの合成抵抗として定まる検出抵抗
ＲＢの値は、
ＲＲＲＲ
１（Ｂ＝＝ ＋ ＋ ＋ ＋−：１．Ｓ
Ｒ：３（ＫΩ）となる。are connected in parallel, and further a resistance element R9 is connected in parallel.
and Rlo are connected in parallel, and these are further connected in series, and the value of the detection resistor RB determined as their combined resistance is RRRR 1 (B== + + + +-: 1.S
R: 3 (KΩ).
すなわち、２４個の抵抗要素のうち、Ｒ８とＲ２４を除
く２２個の抵抗要素を用いて検出抵抗ＲＡとＲＢが形成
されている。ところで、このような構成とされた誤差電
圧検出部における接触抵抗の出力電圧への影響は皆無に
近いものとなる。That is, the detection resistors RA and RB are formed using 22 resistive elements out of the 24 resistive elements excluding R8 and R24. By the way, the influence of contact resistance on the output voltage in the error voltage detection section having such a configuration is almost nil.
すなわち、抵抗要素Ｒ１〜Ｒ２４の抵抗値はすべて等し
くその値をＲ，また、検出抵抗ＲＡ、！：ＲＢを形成す
るために使用した抵抗要素数をｎとｍ、基準電圧をＶ、
接触抵抗をＲｃとすると、第３図で示した回路の出
力電圧端子６に生じる出方電圧ｖ０は次式で与えられる
。That is, the resistance values of the resistance elements R1 to R24 are all equal, R, and the detection resistor RA, ! :The number of resistance elements used to form RB is n and m, the reference voltage is V,
When the contact resistance is Rc, the output voltage v0 generated at the output voltage terminal 6 of the circuit shown in FIG. 3 is given by the following equation.
この式から明らかなように、出力電圧ｖ０は使用した抵
抗要素数ｎとｍとの比で定まシ、接触抵抗ＲＣは出力電
圧には関係しないものとなる。As is clear from this equation, the output voltage v0 is determined by the ratio of the number of resistive elements used n to m, and the contact resistance RC is not related to the output voltage.
発明の効果
本発明の電圧安定化集積回路装置では、誤差電圧検出部
を複数個の抵抗要素が配設された半導体基板部分となし
、この抵抗要素の利用を最大限まで高めているため、検
出抵抗の値を変化させても使用する抵抗要素数はほぼ一
定であり、したがって、動作時に生じる半導体基板内温
度差の影響が個々の抵抗要素に及んでも、このことによ
って温度変化率が変動するおそれはない。Effects of the Invention In the voltage stabilizing integrated circuit device of the present invention, the error voltage detection section is formed as a semiconductor substrate portion on which a plurality of resistance elements are arranged, and the use of these resistance elements is maximized. Even if the resistance value is changed, the number of resistor elements used remains almost constant; therefore, even if the individual resistor elements are affected by temperature differences within the semiconductor substrate that occur during operation, this will cause the rate of temperature change to fluctuate. There's no fear.
また、検出抵抗の値を変化させても、上記のように温度
変化率がほぼ一定であるため、検出抵抗の抵抗値制御に
より、広い電圧範囲にわたる出力以上、−例を示して本
発明を説明したが、作り込む抵抗要素数あるいは形状な
どに限定はない。Furthermore, even if the value of the detection resistor is changed, the temperature change rate remains almost constant as described above. However, there is no limit to the number or shape of resistor elements to be fabricated.
第１図は本発明Ｋかかる電圧安定化集積回路装置内へ作
り込まれた誤差電圧検出部形成用の抵抗群とこれを結線
した状態を示す平面図、第２図は従来の電圧安定化集積
回路装置内へ作り込まれた誤差電圧検出部形成用の抵抗
群とこれを結線した状態を示す平面図、第３図は電圧安
定化集積回路装置の等価回路図である。
１・・・・−誤差電圧増幅部、２・・・・・トランジス
タ、３・・・・・基準電圧発生部、４・・・・・定電流
源、５・・・・・・誤差電圧増幅部、６・・・・・・出
力電圧端子、７・・・・・・入力電圧端子。
代理人の氏名 弁理士 中 尾 敏 男 ほか１名第１
図
萬 ２ 図
第 ３ 図
（−７訣崖４を圧ν訃１（
２−−−＞ランジスタ
３−−一基準τ色欠生静
４−−一定１ヒ′シに已シタに
ｓ−＠秀Ａｔ圧ま土杼
６ｉ−一一宙力！°圧塙ド
アー 人μ ′・FIG. 1 is a plan view showing a resistor group for forming an error voltage detection section built into a voltage stabilizing integrated circuit device according to the present invention and a state in which these are connected, and FIG. 2 is a plan view of a conventional voltage stabilizing integrated circuit device. FIG. 3 is a plan view showing a resistor group for forming an error voltage detection section built into the circuit device and the state in which these are connected, and FIG. 3 is an equivalent circuit diagram of the voltage stabilizing integrated circuit device. 1...-Error voltage amplification section, 2...Transistor, 3...Reference voltage generation section, 4...Constant current source, 5...Error voltage amplification part, 6...output voltage terminal, 7...input voltage terminal. Name of agent: Patent attorney Toshio Nakao and 1 other person No. 1
Fig. 2 Fig. 3 (-7 pressure cliff 4 ν 1 (2---> transistor 3--one standard Hide At Pressure Earth Shuttle 6i-11 Aerodynamics!° Pressure Bunch Door Person μ ′・
Claims (1)
れた電圧安定化回路が集積化されるとともに、前記誤差
電圧検出部を形状および抵抗値が等しく選定された多数
個の抵抗要素を近接して作り込み、さらに、同抵抗要素
のすべてもしくは大半を結線して形成した検出抵抗で構
成したことを特徴とする電圧安定化集積回路装置。A voltage stabilizing circuit with an error voltage detection section added to the output terminal is integrated into the semiconductor substrate, and the error voltage detection section is connected to a large number of resistance elements having the same shape and resistance value in close proximity. What is claimed is: 1. A voltage stabilizing integrated circuit device, characterized in that it is constructed with a detection resistor formed by fabricating the same resistance elements, and further connecting all or most of the same resistance elements with wires.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9007185A JPS61248548A (en) | 1985-04-26 | 1985-04-26 | Voltage stabilized integrated circuit device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9007185A JPS61248548A (en) | 1985-04-26 | 1985-04-26 | Voltage stabilized integrated circuit device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS61248548A true JPS61248548A (en) | 1986-11-05 |
Family
ID=13988299
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP9007185A Pending JPS61248548A (en) | 1985-04-26 | 1985-04-26 | Voltage stabilized integrated circuit device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS61248548A (en) |
-
1985
- 1985-04-26 JP JP9007185A patent/JPS61248548A/en active Pending
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