JPS61137058A - Apparatus for recording surface flaw - Google Patents
Apparatus for recording surface flawInfo
- Publication number
- JPS61137058A JPS61137058A JP59259655A JP25965584A JPS61137058A JP S61137058 A JPS61137058 A JP S61137058A JP 59259655 A JP59259655 A JP 59259655A JP 25965584 A JP25965584 A JP 25965584A JP S61137058 A JPS61137058 A JP S61137058A
- Authority
- JP
- Japan
- Prior art keywords
- signal
- defect
- inspection
- recording means
- recording
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
- G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
- G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
- G01N27/9013—Arrangements for scanning
- G01N27/902—Arrangements for scanning by moving the sensors
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- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Electrochemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
- Closed-Circuit Television Systems (AREA)
Abstract
Description
【発明の詳細な説明】
（産業上の利用分野）
本発明は金属表面等に存在するクラック、腐食等の表面
欠陥を検出するべく、テレビカメラ等の撮像機によって
全検査面を撮影しＶＴＲ等の記録手段に録画した後、欠
陥が存在する検査面の画像信号のみを他の記録手段に自
動的に録画、編集する為の装置に関する。Detailed Description of the Invention (Industrial Field of Application) The present invention is designed to detect surface defects such as cracks and corrosion existing on metal surfaces, etc. by photographing the entire inspection surface using an imaging device such as a television camera, etc. The present invention relates to a device for automatically recording and editing only an image signal of an inspection surface in which a defect exists on another recording means after recording it on a recording means.
（従来の技術）
出願人は以前に管内面の異常を検査するため、第２図に
示す如く走行機構＋１０１を具えて管中を移動する自走
車（１）の前部に、往復揺動可能に揺動腕（４Φを配備
し、該揺動腕（個の下端に渦流探傷器（４）を取付けて
、自走車を毎分約４１の速度で移行させつつ揺動腕を高
速で往復揺動させ、探傷器（４）によって管内面を走査
し検査する装置を提案した（特開昭５８．−２６２５６
）。(Prior Art) Previously, in order to inspect abnormalities on the inner surface of a pipe, the applicant installed a reciprocating rocker at the front of a self-propelled vehicle (1) that was equipped with a traveling mechanism +101 and moved inside the pipe, as shown in Fig. 2. It is possible to deploy a swinging arm (4Φ), attach an eddy current flaw detector (4) to the lower end of the swinging arm, and move the swinging arm at high speed while moving the self-propelled vehicle at a speed of approximately 41/min. We proposed a device that scans and inspects the inner surface of a tube with a flaw detector (4) by swinging it back and forth (Japanese Patent Laid-Open No. 58-26256
).
該装置は、更に前部にテレビカメラ（５）を装備するこ
とが可能で、これによって検査箇所を撮影し、渦流探傷
器（４）の検査信号及びテレビカメラ（５）の画像信号
は、自走車（１）に積載された信号処理部（６）によっ
て信号処理を施した後、伝送ケーブル（２）を介してモ
ニタ一部（３）へ送りペンレコーダ（晒及びＶＴＲ（８
１１に記録すると共にモニターテレビ（肋によって検査
面の状況を直接に監視する。The device can further be equipped with a television camera (5) at the front, which photographs the inspection area, and the inspection signal of the eddy current flaw detector (4) and the image signal of the television camera (5) are automatically transmitted. After signal processing is performed by the signal processing unit (6) mounted on the traveling vehicle (1), the signal is sent to the monitor part (3) via the transmission cable (2) and is sent to the pen recorder (exposed and VTR (8)).
11 and directly monitor the status of the inspection surface using a monitor TV (rib).
伝送ケーブル（２）は、弾性樹脂製のテーブル本体中に
電力線、光ファイバー及び補強線を埋設したものである
。The transmission cable (2) has a power line, an optical fiber, and a reinforcing wire embedded in the table body made of elastic resin.
渦流探傷器（４）は第３図に示す如く、小径の欠陥検出
コイルｆ４ｎと、該コイルよりも大径の励磁コイル（４
αとを同心に配備し、夫々ホルダー（４３［４５に固定
して一体化したものである。As shown in Fig. 3, the eddy current flaw detector (4) has a small diameter defect detection coil f4n and an excitation coil (4) with a larger diameter than the defect detection coil f4n.
α are arranged concentrically and fixed to the respective holders (43 and 45).
信号処理部（６）は励磁コイル（４Ｇに高周波励磁電流
を供給すると共に、検査面の走査によって検出コイル（
４υに生じるインピーダンスの変化を検出し、更に検出
信号に対して位相検波を施し探傷器（４）と検査面（９
）との距離（リフトオフ）の変動に起因するりフトオフ
信号Ｖｘと検査面（９）上の欠陥（９１１の存在に起因
する傷信号Ｖｙとを出力するものである。The signal processing unit (6) supplies a high frequency excitation current to the excitation coil (4G) and also supplies the detection coil (4G) by scanning the inspection surface.
It detects the change in impedance that occurs at 4υ, and then performs phase detection on the detection signal to connect the flaw detector (4) and the inspection surface (9).
) and outputs a lift-off signal Vx caused by a change in the distance (lift-off) from the test surface (9) and a flaw signal Vy caused by the presence of a defect (911) on the inspection surface (9).
上記リフトオフ信号ｖｘと傷信号Ｖｙはモニター 部＋
３１のペンレコーダ（８３に記録され、これによって管
内面の欠陥が発見される。欠陥のある検査面の状態はＶ
Ｔ Ｒ＋８１１によって記録された磁気テープを再生
し、前記ペンレコーダ（８３１のチャートと比較するこ
とにより確認することが出来る。The above lift-off signal vx and scratch signal Vy are monitored by the monitor section +
31 pen recorder (recorded in 83, defects on the inner surface of the tube are discovered. The condition of the inspection surface with the defect is V
This can be confirmed by reproducing the magnetic tape recorded by the TR+811 and comparing it with the chart of the pen recorder (831).
（解決しようとする問題点）
上記装置（こ於ては、テレビカメラ（５）及びＶＴＲ＋
８１１は走査期間中連続動作しているから、Ｖ Ｔ Ｒ
（８１）には欠陥の無い正常な検査面まで記録される。(Problem to be solved) The above equipment (in this case, a television camera (5) and a VTR+
Since 811 operates continuously during the scanning period, VTR
In (81), even normal inspection surfaces with no defects are recorded.
例えば検査依頼人に対して検査結果を報告する際、検査
面全体の画像が必要であることも多いが場合によっては
正常な箇所の画像は不要なこともある。そこで前記Ｖ
Ｔ Ｒ＋８旧こ編集用の他のＶＴＲを接続し、欠陥の存
在する検査面の画像のみを該ＶＴＲに編集、記録するこ
とが行なわれる。For example, when reporting test results to a test client, an image of the entire test surface is often required, but in some cases, an image of a normal area may not be necessary. Therefore, the V
Another VTR for editing is connected to this VTR, and only the image of the inspection surface where the defect exists is edited and recorded on the VTR.
ところが、上記編集作業に於てはペンレコーダ（８！Ｊ
の記録チャートとＶ Ｔ Ｒ＋８１１の再生画面とを照
合しつつ、手作業で編集用のＶＴＲのＯＮ−ＯＦＦを行
なわなければならず、時間と手間がかかる問題があった
。However, in the above editing work, a pen recorder (8!J) was used.
The editing VTR had to be turned on and off manually while checking the recording chart of the VTR+811 with the playback screen of the VTR+811, which was a time-consuming and troublesome problem.
（問題点を解決する為の手段）
本発明は上記問題を解決するべく、検査面の全ての画像
を記録した第１の記録手段に対し、編集記録用の第２の
記録手段を接続し、第２の記録手段のＯＮ−ＯＦＦを自
動的に行なう様にした。(Means for solving the problem) In order to solve the above problem, the present invention connects a second recording means for editing and recording to the first recording means that records all images of the inspection surface, The second recording means is automatically turned on and off.
第１の記録手段には、検査信号、画像信号及び検査面上
の走査位置を示す位置信号が記録されており、該記録手
段を再生して得られる検査信号は信号処理回路に入力さ
れて検査面の欠陥の存在を示す欠陥信号に変換される。The first recording means records an inspection signal, an image signal, and a position signal indicating the scanning position on the inspection surface, and the inspection signal obtained by reproducing the recording means is input to a signal processing circuit for inspection. This is converted into a defect signal indicating the presence of surface defects.
第２の記録手段は制御信号によってＯＮ −０ＦＦ制御
が可能であり、前記欠陥信号が制御信号として入力され
ている。The second recording means can be controlled ON-OFF by a control signal, and the defect signal is inputted as the control signal.
（作 用）
正常な検査面を走査して得られた検査信号、画像信号及
び位置信号が第１の記録手段によっ、て再生されている
場合、信号処理回路からレベルの高い欠陥信号が出力さ
れることはなく、第２の記録手段は駆動されず停止状態
のままである。(Function) When the inspection signal, image signal, and position signal obtained by scanning a normal inspection surface are reproduced by the first recording means, a high-level defect signal is output from the signal processing circuit. The second recording means is not driven and remains stopped.
検査面の欠陥箇所を走査して得られた検汗信号、画像信
号、位置信号が第１の記録手段によって再生されたとき
、信号処理回路からの欠陥信号のレベルは所定値を上回
り、第２の記録手段へＯＮ信号が送られる。When the sweat test signal, image signal, and position signal obtained by scanning the defect location on the inspection surface are reproduced by the first recording means, the level of the defect signal from the signal processing circuit exceeds a predetermined value, and the second An ON signal is sent to the recording means.
これによって第２の記録手段は駆動され、第１の記録手
段から入力される画像信号及び位置信号の記録を開始す
る。As a result, the second recording means is driven and starts recording the image signal and position signal input from the first recording means.
前記欠陥信号が発生してから一定時間経過後、或は信号
レベルか所定値よりも低下したとき、第２の記録手段は
動作を停止する。After a certain period of time has elapsed since the defect signal was generated, or when the signal level drops below a predetermined value, the second recording means stops its operation.
（発明の効果）
第２の記録手段には検査面の欠陥箇所のみの画像信号が
記録されるから、検査終了後の検査面の欠陥状態の確認
は迅速に行なうことが出来る。又欠陥の位置は欠陥の存
在する検査面の映像と共に記録された位置信号によって
知ることが出来る。(Effects of the Invention) Since the second recording means records the image signal of only the defective location on the inspection surface, the defect state of the inspection surface can be quickly confirmed after the inspection is completed. Further, the position of the defect can be known from the position signal recorded together with the image of the inspection surface where the defect exists.
（実施例）
第２図は前述の如（出願人が提案する管内面検査装置の
概略図であって、オイルタンカーに設備された貨曲管１
ｏＡの内部へ自走車（１）を配置して走行させ、甲板（
９上のモニタ一部（３）より自走車（１）の走行を制御
すると共に、検査信号及び画像信号はモニタ一部（３）
に送って監視する状況を示している。(Example) Fig. 2 is a schematic diagram of a pipe inner surface inspection device proposed by the applicant as described above, and shows a cargo bend pipe installed in an oil tanker.
A self-propelled vehicle (1) is placed inside the oA and driven, and the deck (
The driving of the self-propelled vehicle (1) is controlled from the monitor part (3) on the monitor 9, and the inspection signal and image signal are transmitted from the monitor part (3).
It shows the status to be sent to and monitored.
自走車（１）は無端ベルト及び複数のローラからなる走
行機構ａ０を両側に具え、電動機或はパルスモータ等の
駆動装置（図示省略）を各走行機構（１（Ｉに連繋して
おり、前記駆動装置はモニタ一部（３）の走行制御部（
７）からの信号に制御されて、自走車（１）の移動を前
進、停止、後進等に切り替えることか出来る。A self-propelled vehicle (1) is equipped with a running mechanism a0 consisting of an endless belt and a plurality of rollers on both sides, and a driving device (not shown) such as an electric motor or a pulse motor is connected to each running mechanism (1 (I). The drive device is a drive control section (3) of the monitor part (3).
Under the control of the signal from 7), the movement of the self-propelled vehicle (1) can be switched to forward, stop, reverse, etc.
自走車（１）の前部には前述の如（、揺動腕（４４１に
よって支持された渦流探傷器（４）と、探傷器（４）の
走頁範囲を撮影するテレビカメラ（５）及び照明灯団と
が装備されている。At the front of the self-propelled vehicle (1), as mentioned above, there is an eddy current flaw detector (4) supported by the swing arm (441) and a television camera (5) that photographs the range of the flaw detector (4). It is equipped with a lighting system.
渦流探傷器（４）は第３図に示す相互誘導型のプローブ
であるが、自己誘導型のプローブも使用可能である。The eddy current flaw detector (4) is a mutual induction type probe shown in FIG. 3, but a self-induction type probe can also be used.
更に自走車（１）には後述の信号処理部（６）が積載さ
れている。Furthermore, the self-propelled vehicle (1) is loaded with a signal processing section (6), which will be described later.
伝送ケーブル（２）は一端が自走車（１）に接続され、
管中へ繰り出す長さ分が甲板田土のドラムｔａに巻装さ
れており、更に該ドラム（２１１とモニタ一部（３）と
はコード側によって接続されている。One end of the transmission cable (2) is connected to the self-propelled vehicle (1),
The length to be fed into the pipe is wrapped around a drum ta of deck clay, and furthermore, the drum (211) and the monitor part (3) are connected by the cord side.
管（ＯＡの端部にはケーブル案内具（濶を固定して、ド
ラムｔ２１１から繰り出されるケーブル（２）を管中へ
案内する。A cable guide (2) is fixed at the end of the tube (OA) to guide the cable (2) fed out from the drum t211 into the tube.
甲板（色土に設置されたモニタ一部（３）は、自走車（
１）の前後進及び停止をコントロールする制御部（７）
と、テレビカメラ（５）からの画像信号に対し検査結果
等の数字或は文字データをスーパーインポーズする画像
合成回路（７２）と、信号表示記録装置（８）とから構
成される。信号表示記録装置（８）は検査結果を記録す
るデータレコーダ（霞及びペンレコーダ１０と、テレビ
カメラ（５）がとらえた画像信号を表示するモニターテ
レビ（ゆと、全ての画像信号を前記検査結果と共に記録
する第１のＶ Ｔ Ｒ＋８１）とから構成される。A part of the monitor (3) installed on the deck (colored soil) is a self-propelled vehicle (
Control unit (7) that controls forward/backward movement and stopping of 1)
, an image synthesis circuit (72) that superimposes numerical or character data such as test results on the image signal from the television camera (5), and a signal display/recording device (8). The signal display/recording device (8) includes a data recorder (Kasumi and pen recorder 10) that records the inspection results, and a monitor television (Yuto) that displays the image signals captured by the television camera (5). and the first VTR+81).
第４図は第２図に示す装置に装備される電気回路のブロ
ック図であって、以下該ブロック図の各構成要素につい
て詳述する。FIG. 4 is a block diagram of an electric circuit installed in the apparatus shown in FIG. 2, and each component of the block diagram will be described in detail below.
渦流探傷器（４）からの出力信号ｖｏが入力される信号
処理部（６）は、第５図に示す如く渦流探傷器（４）の
励磁コイル（４０）に高周波励磁電流を供給する発振器
田ト、検出コイル＋４１１のインピーダンス変化を検出
して検査信号Ｖｄを出力する差動増幅器（６３１と、夫
々一対の移相器（６１） ＋６３及び同期検波器６滲１
砲とを具えている。The signal processing unit (6) to which the output signal vo from the eddy current flaw detector (4) is inputted, as shown in FIG. A differential amplifier (631) that detects the impedance change of the detection coil +411 and outputs the test signal Vd, a pair of phase shifters (61) +63, and a synchronous detector 61.
It is equipped with a gun.
励磁コイル（４αに高周波電流を通じ、該コイルを検査
面（９）上に接近させると、コイルから生じる高周波交
番磁界が金属壁に渦電流を生起させ、この渦電流の影響
によってコイルに生じる誘起逆起電力を差動増幅器（６
３１等によって検出する。検査面の欠陥位置では渦電流
が乱れてこれか誘起逆起電力の変化となって現われるか
ら検査面（９）の欠陥＋９１）を検出することが出来る
のである。When a high-frequency current is passed through the excitation coil (4α) and the coil is brought close to the inspection surface (9), the high-frequency alternating magnetic field generated by the coil generates an eddy current on the metal wall, and the induced reverse that occurs in the coil due to the influence of this eddy current The electromotive force is converted to a differential amplifier (6
Detected by 31 etc. At the defect position on the inspection surface, the eddy current is disturbed and this appears as a change in the induced back electromotive force, so that the defect +91) on the inspection surface (9) can be detected.
ところが上記渦流探傷器（４）を用いた探傷法では検出
コイル（４１１の出力信号にリフトオフ変化が少なから
ず影響を及ぼすから、この影響を除去し傷信号のみを得
るべく、従来より位相解析回路が用いられている。However, in the flaw detection method using the eddy current flaw detector (4), the lift-off change has a considerable influence on the output signal of the detection coil (411), so in order to remove this influence and obtain only the flaw signal, a phase analysis circuit has been used conventionally. It is used.
第５図に示す実施例では、夫々一対の移相器１６１）（
６７Ｊ及び同期検波器＋６４１ ＋６５１によって前記
位相解析回路が構成されている。該回路によって検査信
号Ｖｄに対し位相解析が施される様子を第５図及び第８
図を用いて説明する。尚、第８図は発振器（叫からの励
磁高周波信号ＦＯを位相基準信号としてＲ軸にとり、こ
れに直交する方向の信号をＪ軸とするインピーダンス平
面である。In the embodiment shown in FIG. 5, a pair of phase shifters 161) (
67J and synchronous detectors +641 to +651 constitute the phase analysis circuit. Figures 5 and 8 show how the circuit performs phase analysis on the test signal Vd.
This will be explained using figures. FIG. 8 is an impedance plane in which the excitation high-frequency signal FO from the oscillator is taken as the phase reference signal on the R axis, and the signal in the direction orthogonal thereto is taken on the J axis.
位相解析の原理は、第８図に於て欠陥のない検査面を探
傷器が走査しているときのりフトオフの変動のみに起因
するコイルの出力Ｖ／は、Ｒ軸から位相θだけずれた標
塾位相の方向に生じるが、検査面に欠陥があるときのコ
イル出力Ｖｄは位相が微小角度ｄθだけ偏倚することを
利用するものである。The principle of phase analysis is that, as shown in Figure 8, when the flaw detector is scanning a defect-free inspection surface, the coil output V/, which is caused only by fluctuations in slope and lift-off, is a target shifted by phase θ from the R axis. Although this occurs in the direction of the cram phase, the coil output Vd when there is a defect on the inspection surface utilizes the fact that the phase is shifted by a minute angle dθ.
検出コイル（４１１によって検出され差動増幅器（（３
によって増幅された検査信号Ｖｄは、第１同期検波器１
圓及び第２同期検波器（（５）に入力される。発振器（
のからの高周波信号ＦＯは３６０度移相器（６１）及び
９０度移相器（６２１に導かれる。３６０度移相器（６
υは高周波信号ＦＯを位相基準信号として、標準位相方
向（Ｘ軸方向）の制御信号を出力し、又９０度移相器＋
６２１は標準位相より９０’進相した方向（Ｙ軸方向）
の制御信号を出力する様に予め設定されている。第１同
期検波器（圓は９０度移相器（面の設定によって検査信
号Ｖｄの制御信号方向の成分、即ち傷信号Ｖｙを出力す
る。第２同期検波器（８５１は３６０度移相器（６１１
の設定によって検査信号Ｖｄの制御信号方向の成分、即
ちリフトオフ信号Ｖｘを出力する。It is detected by the detection coil (411) and the differential amplifier ((3
The test signal Vd amplified by the first synchronous detector 1
input to the circle and the second synchronous detector ((5).The oscillator (
The high frequency signal FO from is guided to a 360 degree phase shifter (61) and a 90 degree phase shifter (621).
υ uses the high frequency signal FO as a phase reference signal, outputs a control signal in the standard phase direction (X-axis direction), and also uses a 90 degree phase shifter +
621 is the direction 90' ahead of the standard phase (Y-axis direction)
It is set in advance to output a control signal. The first synchronous detector (851 is a 90-degree phase shifter (Depending on the surface settings, outputs the component in the control signal direction of the test signal Vd, that is, the flaw signal Vy). The second synchronous detector (851 is a 360-degree phase shifter) 611
By setting , a component of the test signal Vd in the control signal direction, that is, a lift-off signal Vx is output.
前記傷信号Ｖｙ及びリフトオフ信号ｖｘは伝送ケーブル
（２）を介して甲板田土のモニタ一部（３）へ送られ、
データレコーダ＋８１ｍ及びペンレコーダ（８３１に全
データが記録される。The damage signal Vy and the lift-off signal Vx are sent to a monitor part (3) of the deck field via a transmission cable (2),
All data is recorded on data recorder +81m and pen recorder (831).
第４図に示す位置検出器＋Ｉｌｌは自走車（１）を走行
駆動するパルスモータの回転数に応じてパルスａを出力
するロータリエンコーダであって、該パルスａはカウン
ター（６１に入力されて走行距離がカウントされる。カ
ウンター（（至）から得られる距離信号すはデータレコ
ーダｔｔｎに入力されると共に、後述の合成回路（５１
１に入力される。The position detector +Ill shown in FIG. 4 is a rotary encoder that outputs a pulse a according to the number of rotations of a pulse motor that drives the self-propelled vehicle (1), and the pulse a is input to a counter (61). The distance traveled is counted.The distance signal obtained from the counter ((to)) is input to the data recorder ttn, and is also input to the synthesis circuit (51
1 is input.
テレビカメラ（５）によってとらえた画像信号Ｃは前記
距離信号すと共に合成回路！５１１に入力され、これに
よって両信号す及びＣはスーパーインポーズされ画像信
号ｄとして第１ＶＴＲ［Ｆ］υの記録信号入力端子へ接
続される。The image signal C captured by the television camera (5) is sent to the synthesis circuit along with the distance signal! 511, whereby both signals S and C are superimposed and connected as an image signal d to the recording signal input terminal of the first VTR[F]υ.
上記装置によって検査面を走査し、データレコーダ頓及
び第１ Ｖ Ｔ Ｒｔ８旧こ検査結果を記録した後、第
１図に示す本発明の表面欠陥記録装置によって欠陥が存
在する検査面のみの画像信号及び検査デーータを第２
Ｖ Ｔ Ｒ（ＩＢへ編集記録する。After the inspection surface is scanned by the above device and the inspection results are recorded on the data recorder and the first VT Rt8, an image signal of only the inspection surface where defects are present is recorded by the surface defect recording device of the present invention shown in FIG. and test data as a second
Edit and record to VTR (IB).
データレコーダ（８１を再生して得られるリフトオフ信
号Ｖｘ及び傷信号Ｖｙは欠陥信号作成回路■へ入力され
、距離信号すは制御回路（ト）へ入力される。The lift-off signal Vx and the flaw signal Vy obtained by reproducing the data recorder (81) are input to the defect signal generation circuit (2), and the distance signal is input to the control circuit (7).
制御回路（（５）は前記距離信号すから同期信号ｇを作
成する。該同期信号ｇは再生モードの第１ＶＴＲ１８１
）へ駆動制御信号として送られ、第１ Ｖ Ｔ Ｒ＋８
１１に記録されている距離信号との位相差がゼロとなる
様に再生速度の同期が図られる。第１ＶＴＲ１８υを再
生して得られる画像信号りは第２ｖＴ Ｒ＋８４１の記
録信号入力端子に接続されている。The control circuit ((5) creates a synchronization signal g from the distance signal.The synchronization signal g
) as a drive control signal to the first VTR+8
The reproduction speed is synchronized so that the phase difference with the distance signal recorded in 11 becomes zero. The image signal obtained by reproducing the first VTR 18υ is connected to the recording signal input terminal of the second VTR+841.
欠陥信号作成回路のは第６図に示す如く、夫々一対のフ
ィルタｔ７４１園及び波形整形回路（７６１（７７１と
、論理積回路（７８）とから構成される。リフトオフ信
号Ｖｘ及び傷信号Ｖ、は、夫々フィルタ閥■に入力され
て渦流探傷器（４）の揺動に基づくりフトオフ変動の低
互いの論理積がとられる。検査面（９）に欠陥（９υが
存在した場合、リフトオフ信号Ｖｙ及び傷信号Ｖｘには
同時にピークが現われるから、矩形波ＶにＶｙ／は共に
Ｈレベルとなり、論理積回路（至）からはｔｅルス状の
欠陥信号Ｖｐが得られる。As shown in FIG. 6, the defect signal generation circuit is composed of a pair of filters 741 and a waveform shaping circuit (761 (771), and an AND circuit (78).The lift-off signal Vx and the defect signal V are , are respectively input to the filter group ■, and the logical product of the lift-off fluctuation based on the swinging of the eddy current flaw detector (4) is taken.If a defect (9υ) exists on the inspection surface (9), the lift-off signal Vy Since peaks appear simultaneously in the defect signal Vx and the defect signal Vx, both the rectangular wave V and Vy/ become H level, and a telus-like defect signal Vp is obtained from the AND circuit.
尚、欠陥信号作成回路面は他の電気回路によって構成す
ることも可能であり、更にマイクロコンピュータのソフ
トウェアに置き変えることも出来るのは勿論である。It should be noted that the defect signal generation circuit surface can be constructed by other electric circuits, and it goes without saying that it can also be replaced by microcomputer software.
制御信号作成回路０は第７図に示す如く、リトリガブル
モノマルチ（７３ａ）を具えたワンショットマルチバイ
ブレータであって、前記欠陥信号Ｖ。The control signal generation circuit 0 is a one-shot multivibrator equipped with a retriggerable monomulti (73a), as shown in FIG.
が入力されると抵抗Ｒ及びコンデンサＣの値で規定され
る時定数Ｔのパルス信号が端子Ｑから得られ、反転出力
端子Ｑから得られる信号が制御信号Ｖｃとして第２ＶＴ
Ｒ（財）のポーズ入力端子へ入力される。is input, a pulse signal with a time constant T defined by the values of the resistor R and the capacitor C is obtained from the terminal Q, and the signal obtained from the inverted output terminal Q is sent to the second VT as the control signal Vc.
It is input to the pause input terminal of R (goods).
第２ Ｖ Ｔ Ｒ＋８１はポーズモードに設定維持され
ており、前記制御信号ＶＣが入力されることにより、該
（Ｎ 号Ｖ ｃがＬレベルの間、ポーズモードか解除さ
れて録画モードとなる。The second VTR+81 is set and maintained in the pause mode, and when the control signal VC is input, the pause mode is canceled and the recording mode is set while the (N) Vc is at the L level.
斯くして第２ Ｖ Ｔ Ｒ＋８４１には欠陥が存在する
検査面の映像と、検査開始位置から該欠陥が存在する位
置までの距離を示す数字がスーパーインポーズされて記
録される。従って検査終了後に該ＶＴＲ（８４１を再生
することにより、欠陥状況を迅速に把握することが出来
る。In this way, the second VTR+841 records an image of the inspection surface where the defect exists and a number indicating the distance from the inspection start position to the position where the defect exists, superimposed thereon. Therefore, by reproducing the VTR (841) after the inspection is completed, the defect situation can be quickly grasped.
尚、本発明に係る表面欠陥検出装置は図示した実施例に
限らず、特許請求の範囲に記載された技術範囲内で種々
の変形が可能であるのは勿論である。例えば上記実施例
では、傷信号Ｖｙ及びリフトオフ信号Ｖｘはデータレコ
ーダ（帥に、画像信号ｄはＶ Ｔ Ｒ＋８Ｄに記録して
いるが、検査信号と画像信号とを同時収録出来るビジュ
アルデータレコーダにこれらの信号を記録することも可
能である。It should be noted that the surface defect detection device according to the present invention is not limited to the illustrated embodiment, and it goes without saying that various modifications can be made within the technical scope described in the claims. For example, in the above embodiment, the flaw signal Vy and the lift-off signal Vx are recorded on the data recorder (in particular, the image signal d is recorded on the VTR+8D, but these signals are recorded on the visual data recorder that can simultaneously record the inspection signal and the image signal). It is also possible to record the signal.
又、上記実施例では第１図に示す欠陥記録装置と第４図
に示す欠陥検出装置とが分離独立して構成されているが
、同装置をオンラインで接続し、全検査面の録画と欠陥
箇所のみの編集録画とを同時に行なうことも可能である
。Furthermore, in the above embodiment, the defect recording device shown in FIG. 1 and the defect detection device shown in FIG. It is also possible to edit and record only a portion at the same time.
第１図は本発明に係る表面欠陥記録装置のブロック図、
第２図は管内面検査装置のｅ略図、第３図は渦流探傷器
の断面図、第４図は第２図の検査装置に装備される電気
回路のブロック図、第５図は信号処理部のブロック図、
第６図は欠陥信号作成回路のブロック図、第７図は制御
信号作成回路のブロック図、第８図は位相解析の原理を
説明す図
るインピーダンス平面である。
△FIG. 1 is a block diagram of a surface defect recording device according to the present invention;
Figure 2 is an e-schematic diagram of the pipe inner surface inspection device, Figure 3 is a cross-sectional view of the eddy current flaw detector, Figure 4 is a block diagram of the electric circuit installed in the inspection equipment shown in Figure 2, and Figure 5 is the signal processing unit. Block diagram of
FIG. 6 is a block diagram of a defect signal generation circuit, FIG. 7 is a block diagram of a control signal generation circuit, and FIG. 8 is an impedance plane for explaining the principle of phase analysis. △
Claims (1)
査信号と、該検出器の走査箇所を撮影する撮像機によっ
て得られた画像信号と、検査面上の走査位置を示す位置
信号とが記録されている第１の記録手段に対し、ＯＮ−
ＯＦＦ制御の可能な第２の記録手段を接続して、第１の
記録手段の再生信号の内、少なくとも画像信号と位置信
号とを第２の記録手段に入力し、検査信号は信号処理回
路に入力されて検査面の欠陥の存在を示す欠陥信号に変
換され、該欠陥信号は前記第２の記録手段に制御信号と
して接続されている表面欠陥記録装置。 ［２］欠陥検出器は渦流探傷器（４）である特許請求の
範囲第１項に記載の表面欠陥記録装置。 ［３］第１の記録手段は検査信号及び位置信号が記録さ
れているデータレコーダ（８０）と、画像信号が記録さ
れている第１ＶＴＲ（８１）とからなる特許請求の範囲
第１項又は第２項の表面欠陥記録装置。 ［４］第２の記録手段は第２ＶＴＲ（８４）である特許
請求の範囲第３項に記載の表面欠陥記録装置。 ［５］第１の記録手段に記録されている検査信号は渦流
探傷器（４）と検査面（９）との距離の変動に基づくリ
フトオフ信号Ｖｘと、検査面上の欠陥（９１）に基づく
傷信号Ｖｙとからなり、信号処理回路は前記両信号Ｖｘ
及びＶｙから欠陥の存在を示すパルスを発生する欠陥信
号作成回路（７２）と、該パルスの発生と同時に出力レ
ベルが切り替わり所定時間中該レベルが維持される制御
信号作成回路（７３）とからなる特許請求の範囲第２項
に記載の表面欠陥記録装置。[Claims] [1] An inspection signal obtained by scanning the inspection surface with a defect detector, an image signal obtained by an imaging device that photographs the scanned area of the detector, and an inspection signal obtained by scanning the inspection surface with a defect detector; The ON-
A second recording means capable of OFF control is connected, at least an image signal and a position signal of the reproduction signal of the first recording means are inputted to the second recording means, and a test signal is inputted to the signal processing circuit. A surface defect recording device, wherein the input signal is converted into a defect signal indicating the presence of a defect on the inspection surface, and the defect signal is connected to the second recording means as a control signal. [2] The surface defect recording device according to claim 1, wherein the defect detector is an eddy current flaw detector (4). [3] The first recording means comprises a data recorder (80) on which inspection signals and position signals are recorded, and a first VTR (81) on which image signals are recorded. 2. Surface defect recording device. [4] The surface defect recording device according to claim 3, wherein the second recording means is a second VTR (84). [5] The inspection signal recorded in the first recording means is based on the lift-off signal Vx based on the variation in the distance between the eddy current flaw detector (4) and the inspection surface (9), and the defect (91) on the inspection surface. The signal processing circuit consists of a flaw signal Vy, and the signal processing circuit
and a defect signal generation circuit (72) that generates a pulse indicating the existence of a defect from Vy, and a control signal generation circuit (73) whose output level is switched at the same time as the generation of the pulse and the level is maintained for a predetermined period of time. A surface defect recording device according to claim 2.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP59259655A JPS61137058A (en) | 1984-12-06 | 1984-12-06 | Apparatus for recording surface flaw |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP59259655A JPS61137058A (en) | 1984-12-06 | 1984-12-06 | Apparatus for recording surface flaw |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS61137058A true JPS61137058A (en) | 1986-06-24 |
| JPH0453257B2 JPH0453257B2 (en) | 1992-08-26 |
Family
ID=17337065
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP59259655A Granted JPS61137058A (en) | 1984-12-06 | 1984-12-06 | Apparatus for recording surface flaw |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS61137058A (en) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS63201513A (en) * | 1987-02-18 | 1988-08-19 | Hitachi Ltd | In-tube running device |
| JPH01308950A (en) * | 1988-06-08 | 1989-12-13 | Shikoku Sogo Kenkyusho:Kk | Detector and detecting system for damage in conveyor belt |
| JPH0351756A (en) * | 1989-07-19 | 1991-03-06 | P-Puru:Kk | Apparatus for detecting corrosion condition of bottom plate of pool |
| JP2010078487A (en) * | 2008-09-26 | 2010-04-08 | Omron Corp | Appearance inspection apparatus and program |
| JP6768990B1 (en) * | 2019-02-21 | 2020-10-14 | 株式会社テイエルブイ | probe |
-
1984
- 1984-12-06 JP JP59259655A patent/JPS61137058A/en active Granted
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS63201513A (en) * | 1987-02-18 | 1988-08-19 | Hitachi Ltd | In-tube running device |
| JPH01308950A (en) * | 1988-06-08 | 1989-12-13 | Shikoku Sogo Kenkyusho:Kk | Detector and detecting system for damage in conveyor belt |
| JPH0351756A (en) * | 1989-07-19 | 1991-03-06 | P-Puru:Kk | Apparatus for detecting corrosion condition of bottom plate of pool |
| JP2010078487A (en) * | 2008-09-26 | 2010-04-08 | Omron Corp | Appearance inspection apparatus and program |
| JP6768990B1 (en) * | 2019-02-21 | 2020-10-14 | 株式会社テイエルブイ | probe |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0453257B2 (en) | 1992-08-26 |
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