JPS6078366A - Testing method of driving element - Google Patents
Testing method of driving elementInfo
- Publication number
- JPS6078366A JPS6078366A JP58185912A JP18591283A JPS6078366A JP S6078366 A JPS6078366 A JP S6078366A JP 58185912 A JP58185912 A JP 58185912A JP 18591283 A JP18591283 A JP 18591283A JP S6078366 A JPS6078366 A JP S6078366A
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- JP
- Japan
- Prior art keywords
- load
- drive element
- driving element
- power
- supplied
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- Testing Electric Properties And Detecting Electric Faults (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
Description
【発明の詳細な説明】
〔技術分■〕
不発明は、トランジスタによる駆動素子を用いた回路の
駆動素子が故障した場合に発生する２次障害の防止に関
する。DETAILED DESCRIPTION OF THE INVENTION [Technical Part (1)] The present invention relates to prevention of secondary failures that occur when a drive element of a circuit using a transistor drive element fails.
以下に、図面を基に従来技術を説明すると共に、その欠
点を述べる。Below, the prior art will be explained based on the drawings, and its drawbacks will be described.
第１図は第１従来例を示す回路図であり、１は電力供給
端子、２は電力供給を受ける負荷、３は開及び閉を行々
い負荷２に電力を供給するか否かを決定するトランジス
タによる駆動素子、４は負荷２に設けた温度検出器、５
は温度検出器４の異常温度検出端子である。FIG. 1 is a circuit diagram showing a first conventional example, in which 1 is a power supply terminal, 2 is a load to which power is supplied, and 3 is repeatedly opened and closed to determine whether or not to supply power to load 2. 4 is a temperature detector provided in the load 2;
is an abnormal temperature detection terminal of the temperature detector 4.
この回路構成においては、駆動素子３が開と々ると電力
供給端子１から負荷２へ電力は供給され、閉となると負
荷２へは電力は供給されない。この、駆動素子３に伴な
う負荷２の異常温度を温度検出器４にて検出し、駆動素
子３の異常に対応している。In this circuit configuration, when the drive element 3 is opened, power is supplied from the power supply terminal 1 to the load 2, and when the drive element 3 is closed, no power is supplied to the load 2. This abnormal temperature of the load 2 caused by the drive element 3 is detected by the temperature detector 4, and the abnormality of the drive element 3 is dealt with.
第２図は第２従来例を示す回路図であり、１は電力供給
端子、２は負荷、３は駆動素子であり、これ等は前記第
１従来例と同様である。FIG. 2 is a circuit diagram showing a second conventional example, in which 1 is a power supply terminal, 2 is a load, and 3 is a driving element, which are the same as in the first conventional example.
６は電力供給端子１と負荷２間に設けた電流検出抵抗、
７は電流検出抵抗６に設けた過電流検出回路、８は過電
流検出回路７の過電流検出端子である。6 is a current detection resistor installed between power supply terminal 1 and load 2;
7 is an overcurrent detection circuit provided in the current detection resistor 6, and 8 is an overcurrent detection terminal of the overcurrent detection circuit 7.
ここでも、前記第１従来例のように駆動素子３の開閉に
よって電力供給端子１がら負荷２への電力の通断を行な
っているが、駆動素子３の異状は電流検出抵抗６の過電
流を過電流検出回路７によって検出することによシ行な
っている。Here, as in the first conventional example, power is passed from the power supply terminal 1 to the load 2 by opening and closing the drive element 3. This is done by detecting it with the overcurrent detection circuit 7.
尚、駆動素子３の異常とは負荷２に電力が供給されない
状態、すなわち駆動素子３が閉状態となりつづける故障
の場合と、負荷−２に電力が供給されつづける状態、す
なわち駆動素子３が開状態となりつづける故障の場合で
ある。Incidentally, an abnormality in the drive element 3 refers to a state in which power is not supplied to the load 2, that is, a failure in which the drive element 3 continues to be in a closed state, and a state in which power is continued to be supplied to load-2, that is, a state in which the drive element 3 is in an open state. This is a case of a continuous failure.
このように、第１及び第２従来例では負荷２側を主体に
した駆動素子３の異常検出となっているので、まず負荷
２への電流の供給いがん、あるいは供給状態に頼ること
となるので、次のような欠点が生じてくる。In this way, in the first and second conventional examples, abnormality detection of the drive element 3 is mainly performed on the load 2 side, so the detection depends first on whether or not the current is being supplied to the load 2, or on the supply state. , the following drawbacks arise.
それは、駆動素子３の開状態となシつづける場合には負
荷２への電力は供給されないので負荷２に故障は発生し
ないが、駆動素子３の閉状態となりつづける場合には負
荷２へ過電力が印加され、負荷２の発熱や断線そして性
能劣化等の２次障害が発生するという欠点である。If the driving element 3 continues to be in the open state, no power will be supplied to the load 2, so no failure will occur in the load 2, but if the driving element 3 continues to be in the closed state, overpower will be applied to the load 2. This is a drawback in that secondary failures such as heat generation, wire breakage, and performance deterioration occur in the load 2.
本発明の目的は、駆動素子の異状を直接検出する駆動素
子テスト方法の採用によって従来の欠点全解決すること
にある。SUMMARY OF THE INVENTION An object of the present invention is to overcome all the drawbacks of the conventional method by employing a driving element testing method that directly detects abnormalities in the driving element.
その、本発明の回路構成は次の通シである。 The circuit configuration of the present invention is as follows.
駆動素子のコレクタ電圧レベルを検出する検出回路を駆
動素子に設けると共に、電力供給端子と負荷間に電力の
通断を行なう開閉機構を設ける回路構成とすることであ
る。The circuit configuration is such that the drive element is provided with a detection circuit that detects the collector voltage level of the drive element, and an opening/closing mechanism that connects and disconnects power between the power supply terminal and the load.
このような構成とすることによシ、開閉機構により負荷
への電力を断っておき、検出回路にて駆動素子の開閉を
テストして正常か異常かを知ることができる。With this configuration, it is possible to cut off power to the load using the opening/closing mechanism, and then test the opening/closing of the drive element using the detection circuit to determine whether it is normal or abnormal.
以下に、前記のような目的と構成を特徴とした本発明に
よる駆動素子テスト方法について図面を基に説明すると
共に、その効果を述べる。尚、前記第１及び第２従来例
と同一部品についてはその符号全使用する。Hereinafter, the driving element testing method according to the present invention, which has the above-mentioned object and configuration, will be explained based on the drawings, and its effects will be described. Incidentally, for parts that are the same as those in the first and second conventional examples, all the reference numbers will be used.
第３図は、本発明による第１の方法を示す回路図であり
、１は電力供給端子、２は負荷、３は開閉動作を行ない
負荷２への電力の供給をなすか否かを決定するトランジ
スタによる駆動素子である。FIG. 3 is a circuit diagram showing the first method according to the present invention, in which 1 is a power supply terminal, 2 is a load, and 3 is a circuit that performs an opening/closing operation to determine whether or not to supply power to the load 2. This is a drive element using a transistor.
以下は、本発明によシ付加される回路構成部である。Below are the circuit components added according to the present invention.
９は駆動素子３に接続した電力供給指示端子、１０は駆
動素子３の故障検出端子、１１は故障端子１０に接続し
た比較器、１２は比較器１１に接続した基準電圧、１３
はバイアス電圧、１４は抵抗であり、前記バイアス電圧
１３は該抵抗１４を介して前記比較器１１に接続しであ
る。１５はダイオードであシ、前記比較回路１１は該ダ
イオード１５を介して駆動素子３に接続しである。以上
が本発明による駆動素子３のテストを行なう検出回路で
ある。9 is a power supply instruction terminal connected to the drive element 3; 10 is a failure detection terminal of the drive element 3; 11 is a comparator connected to the failure terminal 10; 12 is a reference voltage connected to the comparator 11;
is a bias voltage, 14 is a resistor, and the bias voltage 13 is connected to the comparator 11 via the resistor 14. 15 is a diode, and the comparison circuit 11 is connected to the driving element 3 via the diode 15. The above is the detection circuit for testing the drive element 3 according to the present invention.
１６は前記電力供給端子１と負荷２間に設けた電力の通
断を行なう開閉機構である。該開閉機構１６の開閉によ
って駆動素子３の正常時には電力を通し異常時には電力
を遮断するのである。駆動素子３の正常、異常の検出は
前記検出回路にて行なう。Reference numeral 16 denotes an opening/closing mechanism provided between the power supply terminal 1 and the load 2 for connecting and disconnecting power. By opening and closing the opening/closing mechanism 16, power is passed through the drive element 3 when it is normal, and power is cut off when it is abnormal. Detection of whether the drive element 3 is normal or abnormal is performed by the detection circuit.
このように構成する、第１の方法による回路動作は次の
通りである。The circuit operation according to the first method configured as described above is as follows.
まず、開閉機構１６を開状態として負荷２への電流の供
給を遮断する。これによって、駆動素子３がいかなる状
態でも負荷２へ電力は供給されない。First, the opening/closing mechanism 16 is opened to cut off the supply of current to the load 2 . As a result, power is not supplied to the load 2 no matter what state the drive element 3 is in.
そして、バイアス電圧１３の電圧を抵抗１４及びダイオ
ード１５を通して、駆動素子３のコレクタ部へ印加する
。これと共に、基準電圧１２の電圧を、駆動素子３のコ
レクターエミッタ間飽和電圧」−ダイオード１５の順電
圧〈基準電圧１２〈バイアス電圧１３に維持する。Then, the bias voltage 13 is applied to the collector portion of the drive element 3 through the resistor 14 and the diode 15. At the same time, the voltage of the reference voltage 12 is maintained at the collector-emitter saturation voltage of the drive element 3 - the forward voltage of the diode 15 (reference voltage 12 < bias voltage 13).
この状態で、電力供給指示端子９がら負信号及び正信号
を駆動素子３に供給し、駆動素子３のコレクタ電圧と基
準電圧１２の電圧比較を比較器１１で行ない、それを故
障検出端子１０に出力して駆動素子３の正常、異常を検
出することと々る。In this state, a negative signal and a positive signal are supplied to the drive element 3 from the power supply instruction terminal 9, a voltage comparison between the collector voltage of the drive element 3 and the reference voltage 12 is performed by the comparator 11, and the voltage is sent to the failure detection terminal 10. It is possible to output the signal to detect whether the drive element 3 is normal or abnormal.
次に、前記のようにして電力供給指示端子９から負信号
及び正信号を駆動素子３に供給し、駆動素足３の正常及
び異常時における故障検出端子１０の出力状態を表にし
て述べると共に、そのフローチャートを第４図に示す。Next, a negative signal and a positive signal are supplied from the power supply instruction terminal 9 to the driving element 3 as described above, and the output state of the failure detection terminal 10 when the driving bare foot 3 is normal and abnormal is described in a table. The flowchart is shown in FIG.
第４図は第１の方法による駆動素子３の各状態のフロー
チャートである。FIG. 4 is a flow chart of each state of the drive element 3 according to the first method.
このように、電力供給指示端子９からの負信号及び正信
号の入力で故障検出端子１０に表われる出力状態により
駆動素子３の状態を知ることができるのである。In this way, the state of the drive element 3 can be known from the output state appearing at the failure detection terminal 10 upon input of the negative signal and positive signal from the power supply instruction terminal 9.
■の正常な場合には、開閉機構１６を閉じて負荷２に電
力を供給することとする。In the normal case (2), the opening/closing mechanism 16 is closed and power is supplied to the load 2.
■の開となり遮断状態の場合の故障には、開閉機構１６
を閉じても負荷２に電力は供給され寿い。■If the opening/closing mechanism 16 is open and the failure occurs,
Even if it is closed, power is supplied to load 2 for a long time.
■の閉となり導通状態の場合の故障には、開閉機構１６
を閉じると負荷２へ電力は供給されつづけることとカリ
負荷２の故障という２次障害の発生となる。１
第１の方法では、前記駆動素子３のテスト結果を基に■
の正常な場合にのみ開閉機構１６を閉じて電力を負荷２
へと供給することとするのである。■If the opening/closing mechanism 16 is closed and is in a conductive state, the opening/closing mechanism 16
If it is closed, power will continue to be supplied to the load 2, and a secondary failure will occur in which the potash load 2 will fail. 1 In the first method, based on the test results of the drive element 3,
The opening/closing mechanism 16 is closed only when the power is normally applied to the load 2.
The plan is to supply it to the following people.
次に、前記駆動素子３のテスト結果を基に第２の方法に
ついて第５図に示すフローチャートを加えて述べる。Next, a second method will be described based on the test results of the drive element 3, with the addition of a flowchart shown in FIG.
第５図は第２の方法による駆動素子３の各フローチャー
トである。尚、■■■においては前記第１の方法に示す
駆動素子３の各状態をいう。FIG. 5 is a flow chart of the drive element 3 according to the second method. Note that ■■■ refers to each state of the drive element 3 shown in the first method.
この、第２の方法では負荷２が過電力状態となる駆動素
子３の導通状態と々りつづける故障のみを検出すること
とし、駆動素子３が正常な場合には負荷２へ電力を供給
することとする方法である。In this second method, only a failure in which the drive element 3 continues to be in a conductive state that causes the load 2 to be in an overpower state is detected, and when the drive element 3 is normal, power is supplied to the load 2. This is the method to do so.
続いて、第：３の方法として複数の負荷に対応する複数
の駆動素子のテスト方法について述べる。Next, as a third method, a method of testing a plurality of driving elements corresponding to a plurality of loads will be described.
第６図は第３の方法を示す複数の駆動素子テスト方法の
回路図である。尚、前記第１図で示した部品と同一のも
のについては同一符号を図示するのみとして改ためた説
明は省略する。FIG. 6 is a circuit diagram of a plurality of driving element testing methods showing a third method. Components that are the same as those shown in FIG. 1 are designated by the same reference numerals, and no further explanation will be given.
図において、２．２ａ 、２ｂ 、２ｃは負荷、３゜３
ａ、３ｂ、３ｃは各負荷２ 、２ａ ＋ ２ｂ 、 ２
ｃに対応して夫れそれ設けた駆動素子、９１９ａ１９ｂ
、９ｃは＠１駆動素子３．’３ａ、３ｂ、３ｃに対応し
て設けた電力供給指示端子、１５ 、１５ａ。In the figure, 2.2a, 2b, 2c are loads, 3°3
a, 3b, 3c are each load 2, 2a + 2b, 2
Driving elements 919a19b provided corresponding to c.
, 9c are @1 drive elements 3. Power supply instruction terminals 15, 15a provided corresponding to '3a, 3b, 3c.
１５ｂ 、 １５ｃは各駆動素子ｊ、３ａ 、３ｂ、３
ｃとバイアス電圧１３間に設けたダイオードである。15b and 15c are each drive element j, 3a, 3b, 3
This is a diode provided between C and bias voltage 13.
このように、増加した１駆動素子３ ａ 、 ３ｂ、３
ｃの数景分だけダイオード１５ａ、１５ｂ、１５ｃを設
け、１駆動素子３ａ、３ｂ、３ｃの夫れぞれにおいての
コレクターエミッタ間電圧の比較器１１への入力部分に
てワイヤードオア構成とすれば、各、駆動素子３．３ａ
、３ｂ、３ｃにおけるテストを前記と同じ動作にて、同
時に複数の駆動素子３゜３ａ、３ｂ、３ｃに対して導通
状態となりつづける故障を調べ、そのうちの１つの、駆
動素子が導通状態となりつづける故障を検出することが
でき、従来技術における異常過電流の検出では検出困難
であった多数の駆動素子３，３ａ、３ｂ、３ｃにおける
１つの駆動素子の導通状態となりつづける故障検出も容
易に実現できるものでおる。。In this way, 1 drive element 3 a , 3 b , 3 increased
If diodes 15a, 15b, 15c are provided for several views of c, and a wired-OR configuration is formed at the input portion of the collector-emitter voltage of each of one drive element 3a, 3b, 3c to the comparator 11. , each drive element 3.3a
, 3b, and 3c were conducted in the same manner as above to check for failures in which multiple drive elements 3a, 3b, and 3c continued to be in a conductive state at the same time. It is possible to easily detect a failure in which one drive element among a large number of drive elements 3, 3a, 3b, and 3c continues to be in a conductive state, which was difficult to detect with abnormal overcurrent detection in conventional technology. I'll go. .
以上、詳細に説明したように本発明では駆動素子独自に
駆動素子のテストを行なう検出回路を設けたので、９荷
側へ電力を供給する以前に駆動素子のテストを行なえる
ので次のような効果を発揮することができる。As explained in detail above, in the present invention, since a detection circuit is provided to test the drive element independently of the drive element, the drive element can be tested before supplying power to the load side. It can be effective.
それは、負荷が過電力となり負荷の故障という２次障害
を発生する駆動素子の導通状態と々りつづける駆動素子
の故障において、従来は負荷側主体の検出構成であった
ので負荷へ電力を供給しないと駆動素子の故障が発見で
き彦いので、前記２次障害の発生と々る欠点があつブｔ
が、本発明では負荷に電力を供給しないで１駆動素子独
自に駆動素子のテストを行なえるので負荷の故障という
２次障害の発生を防止する効果である。Conventionally, when the load is overpowered and the drive element fails, which causes a secondary fault called load failure, the drive element continues to be in a conductive state. Conventionally, the detection configuration was mainly on the load side, so power was not supplied to the load. Since the failure of the drive element can be detected easily, the secondary failure mentioned above can occur.
However, in the present invention, it is possible to test each drive element independently without supplying power to the load, which has the effect of preventing the occurrence of secondary failures such as load failures.
このような効果により、発熱、特性劣化、断線等が発生
する危険性のある負荷を有するモータのドライブ回路、
プリンタ等におけるヘッドのドライブ回路、ハンマドラ
イバ回路、ソレノイドドライバ回路等において有益に利
用することができる。Due to such effects, motor drive circuits with loads that are at risk of generating heat, deterioration of characteristics, disconnection, etc.
It can be usefully used in head drive circuits, hammer driver circuits, solenoid driver circuits, etc. in printers and the like.
第１図は第１従来例を示す回路図、第２図は第２従来例
を示す回路図、第３図は本発明による第１の方法を示す
回路図、第４図は第１の方法による駆動素子の各状態の
フローチャート、第５図は第２の方法による駆動素子の
各状態のフローチャート、第６図は第３の方法を示す複
数の駆動素子テスト方法の回路図である。
１・・電力供給端子 ２・・・負荷 ３・・駆動素子９
・・・電力供給指示端子 １０・・・故障検出端子 １
１・・・比較器 １２・・・基準電圧 １３・・・バイ
アス電圧１４・・・抵抗 １５・・・ダイオード １６
・・・開閉機構＠１−
輪３−
６
轟４区
＠５−
〇■の場合
■の場合Fig. 1 is a circuit diagram showing a first conventional example, Fig. 2 is a circuit diagram showing a second conventional example, Fig. 3 is a circuit diagram showing a first method according to the present invention, and Fig. 4 is a circuit diagram showing a first method. FIG. 5 is a flowchart of each state of the driving element according to the second method, and FIG. 6 is a circuit diagram of a plurality of driving element testing methods showing the third method. 1...Power supply terminal 2...Load 3...Drive element 9
...Power supply instruction terminal 10...Failure detection terminal 1
1... Comparator 12... Reference voltage 13... Bias voltage 14... Resistor 15... Diode 16
...Opening/closing mechanism @1- Wheel 3-6 Todoroki 4th ward @5- In the case of 〇■ In the case of ■
Claims (1)
荷へ電力を供給するか否かを決定する回路構成において
、前記駆動素子のコレクタ電圧を検出する検出回路を設
けると共に、電力を負荷へ供給あるいは遮断する開閉機
構を設は該開閉機構を開として負荷への電力を遮断して
おいて、駆動素子の開閉動作のテストを行ない、その際
の駆動素子のコレクタ電圧によシ駆動素子の閉状態ある
いは開状態となりつづける故障を検出することを特徴と
した駆動素子テスト方法。] In a circuit configuration that determines whether or not to supply power to a load by opening and closing operations of a drive element using a transistor, a detection circuit that detects a collector voltage of the drive element is provided, and a switching mechanism that supplies or cuts off power to the load is provided. To test the opening/closing operation of the drive element, open the opening/closing mechanism to cut off power to the load, and check whether the drive element is in the closed or open state depending on the collector voltage of the drive element at that time. A driving element testing method characterized by detecting continuous failures.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP58185912A JPS6078366A (en) | 1983-10-06 | 1983-10-06 | Testing method of driving element |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP58185912A JPS6078366A (en) | 1983-10-06 | 1983-10-06 | Testing method of driving element |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6078366A true JPS6078366A (en) | 1985-05-04 |
| JPH0588430B2 JPH0588430B2 (en) | 1993-12-22 |
Family
ID=16179049
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP58185912A Granted JPS6078366A (en) | 1983-10-06 | 1983-10-06 | Testing method of driving element |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6078366A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9126808B2 (en) | 2010-05-18 | 2015-09-08 | Mitsubishi Electric Corporation | Elevator control device |
-
1983
- 1983-10-06 JP JP58185912A patent/JPS6078366A/en active Granted
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9126808B2 (en) | 2010-05-18 | 2015-09-08 | Mitsubishi Electric Corporation | Elevator control device |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0588430B2 (en) | 1993-12-22 |
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