JPS6070852A - Continuity test equipment - Google Patents
Continuity test equipmentInfo
- Publication number
- JPS6070852A JPS6070852A JP17797183A JP17797183A JPS6070852A JP S6070852 A JPS6070852 A JP S6070852A JP 17797183 A JP17797183 A JP 17797183A JP 17797183 A JP17797183 A JP 17797183A JP S6070852 A JPS6070852 A JP S6070852A
- Authority
- JP
- Japan
- Prior art keywords
- circuit
- pattern
- data
- continuity
- test data
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04M—TELEPHONIC COMMUNICATION
- H04M3/00—Automatic or semi-automatic exchanges
- H04M3/22—Arrangements for supervision, monitoring or testing
- H04M3/24—Arrangements for supervision, monitoring or testing with provision for checking the normal operation
- H04M3/244—Arrangements for supervision, monitoring or testing with provision for checking the normal operation for multiplex systems
Landscapes
- Engineering & Computer Science (AREA)
- Signal Processing (AREA)
- Monitoring And Testing Of Exchanges (AREA)
Abstract
Description
【発明の詳細な説明】
〔発明の利用分野〕
時分割交換１浅の時分割接続経路（例えば、時分割通話
路、制御信号経路など）の導通試験を行うための導通試
験装置に関するものである。[Detailed Description of the Invention] [Field of Application of the Invention] This invention relates to a continuity test device for conducting a continuity test of a shallow time-division connection path (for example, a time-division communication path, a control signal path, etc.). .
この種の従来の導通試験装置において、−例として、そ
の試験データには その発生１判定が簡単なことから、
”’ １０１０１０１０ ” （１６進表示”？’ＡＡ
）と”０１０１”０１０１”（１６進表示で５５）との
各８ピントを時分割接続経路の各フレーム（またはサン
プリング）ごとに交互に送信（または受信）するように
した交互パターンか専ら利用されている。この交互パタ
ーンは、ＡＡ１５５試験データと呼ばれている。In this type of conventional continuity test equipment, for example, the test data includes the following:
``'10101010'' (hexadecimal display)?'AA
) and "0101" and "0101" (55 in hexadecimal notation) are used in an alternating pattern in which 8 pinpoints each are sent (or received) alternately for each frame (or sampling) of the time-division connection path. This alternating pattern is called AA155 test data.
ここで、第１図は、従来の導通試験装置の一例のブロッ
ク図である。Here, FIG. 1 is a block diagram of an example of a conventional continuity test device.
すなわち、ＡＡ１５５発生回路４で発生されたＡＡ１５
５試験データは、制御回路１の指定によシ、ハイウェイ
選択回路２．タイムスロット選択回路３の制御で、指定
されたノ・イウエイ上のタイムスロットに挿入され、受
信回路５から導通試験対象の時分割接続経路へ送出され
る。That is, the AA15 generated by the AA155 generation circuit 4
5 test data is sent to the highway selection circuit 2 according to the specification of the control circuit 1. Under the control of the time slot selection circuit 3, the signal is inserted into the time slot on the designated way, and sent from the receiving circuit 5 to the time-division connection path to be tested for continuity.
このＡ Ａ１５５試験データは、上記時分割接続経路を
通シ、受信回路６に受信されろ。This AA155 test data is received by the receiving circuit 6 through the time division connection path.
受信回路６は、制御回路１の指定により、／・イウェイ
選択回路２．タイムスロット選択回路３の制御で、上述
のように送信側で指定されたハイウェイ上のタイムスロ
ットのデータを抽出する。According to the designation of the control circuit 1, the receiving circuit 6 selects /.iway selection circuit 2. Under the control of the time slot selection circuit 3, data of the time slot on the highway designated by the transmitting side is extracted as described above.
判定回路７Ａは、このデータを受け、その０″と１″と
が交互に現われるべき規則性から、正しいＡ Ａ１５５
試験データであるか否かの判定をすることによシ、時分
割接続経路の導通試験結果を得て、それを制御回路１へ
報告するようにしている。The judgment circuit 7A receives this data and determines the correct A from the regularity that 0'' and 1'' should appear alternately.
By determining whether or not the data is test data, the continuity test result of the time-division connection path is obtained and reported to the control circuit 1.
このような従来装置妬おりでは、時分割接続経路の導通
に関して交互パターンの繰返しデータの規則性の判定に
のみ頼ってｂるので、導通障害の発生時に当該障害位置
の検出を行おうとしても。In this type of conventional device, the continuity of the time-division connection path relies solely on the determination of the regularity of the repeating data of the alternating pattern, so even when an attempt is made to detect the location of the fault when a continuity fault occurs.
どのビットの位置がずれてｂるのか、スタック障害を起
しているビットはどこか、などにつｂてビット検出の区
分、切分けが不可能で必シ、迅速に障害検出をし、また
導通試験の信頼性を向上するのが困難であった。It is impossible to classify or isolate bit detection such as which bit is misaligned or which bit is causing a stack failure, so it is necessary to quickly detect failures and It has been difficult to improve the reliability of continuity tests.
本発明の目的は、上記した従来技術の欠点をなくシ、導
通障害の発生時における試験データのビットの位置ずれ
の検出およびスタック障害になっているビットの検出を
確実に行うことができる導通試験装置を提供することに
ある。An object of the present invention is to provide a continuity test that eliminates the above-mentioned drawbacks of the prior art, and that can reliably detect the misalignment of bits of test data when a continuity fault occurs and detect the bit that is a stuck fault. The goal is to provide equipment.
本発明に係る導通試験装置の構成は、交互パターンまた
は任意パターンの試験データのいずれかを選択して導通
試験に係る時分割接続経路へ送信する送信部と、上記時
分割接続経路を通して上記試縁データを受信し、その送
信の原データとの照合をして導通試験結果を得る受信部
と、上Ｈピ送信部および受信部に関して、導通試験に係
る時分割接続経路のハイウェイおよびタイムスロットの
選択制御ならびに交互パターン貰た幻任惹パターンの試
験データの送信・受信制御迎を行う制卸部とからなるよ
うにしたものである。The configuration of the continuity test device according to the present invention includes a transmitter that selects either alternating pattern or arbitrary pattern test data and transmits it to the time-sharing connection path related to the continuity test, and Selection of the highway and time slot of the time-division connection route related to the continuity test for the receiving section that receives data and compares it with the original data of the transmission to obtain the continuity test result, and the upper Hpi transmitting section and the receiving section. The control section is configured to perform control, transmission and reception control of the test data of the phantom attraction pattern obtained from the alternating pattern.
なお、これを詳述すれば１例えば、送信部においては交
互パターンの発生回路のほかに任意パターン発生回路を
設け、交互パターン、任意パターンのＫＭデータいずれ
かをパターンセレクタによって選択（〜で送信しうるよ
うにして試験データの内容の拡張、充実をはかるととも
に、受部においては照合回路が受信データと送信データ
とを照合して導通試験結果を得るようにしたものである
。To explain this in detail, 1. For example, in the transmitter, in addition to the alternating pattern generating circuit, an arbitrary pattern generating circuit is provided, and either the alternating pattern or the arbitrary pattern KM data is selected by the pattern selector (transmitted with ~). In addition to expanding and enriching the content of the test data by making it possible to transmit data, a verification circuit in the receiving section verifies the received data and the transmitted data to obtain a continuity test result.
それによシ、ビットの位置ずれ、スタック障害を確実釦
検出しうるようにするものである。In addition, it is possible to reliably detect bit misalignment and stack failure.
以下１本発明の実施例を図に基づいて説明する。 An embodiment of the present invention will be described below with reference to the drawings.
第２図は、本発明に係る導通試験装置の一実施例のブロ
ック図である。FIG. 2 is a block diagram of an embodiment of the continuity test device according to the present invention.
ここで、１は制御部に係る制御回路、２は同ハイウェイ
選択回路、３は同タイムスロット選択回路、４は送信部
に係るＡ Ａ１５５発生回路、５は同送信回路、８け同
任意パターン発生回路、９ｉｄ同パターンセレクタ、６
は受信部に係る受信回路、７は同照合回路である。なお
、符号１〜６は、第１図における同符号のものと均等な
ものである。Here, 1 is the control circuit related to the control section, 2 is the highway selection circuit, 3 is the same time slot selection circuit, 4 is the A155 generation circuit related to the transmission section, 5 is the same transmission circuit, and 8 arbitrary pattern generation Circuit, 9id same pattern selector, 6
7 is a receiving circuit related to the receiving section, and 7 is a matching circuit. Note that numerals 1 to 6 are equivalent to those with the same numerals in FIG.
まず１通常においては、試験データとして、前述の従来
例と同様に交互パターンのＡ Ａ１５５試験データが用
いられる。First, in the first normal case, alternating pattern AA155 test data is used as the test data, similar to the conventional example described above.
このデータは、ＡＡ１５５発生回烙４で発生され、制御
回路１からの制御により、パターンセレクタ９を通過し
て送信回路５から時分割接続経路へ送信される。This data is generated by the AA155 generation circuit 4, passes through the pattern selector 9 under the control of the control circuit 1, and is transmitted from the transmitting circuit 5 to the time division connection path.
受信回路６け、このデータを上記時分割接続経路から試
験データとして受信して照合回路７へ与える。The receiving circuit 6 receives this data as test data from the time-division connection path and supplies it to the verification circuit 7.
照合回路７は、そのデータと上記の送信データとを照合
し、一致して込れば導通良好、また不一致であれば導通
不良、と−う導通試験結果を制御回路１へ報告する。The collation circuit 7 collates the data with the above-mentioned transmission data, and reports the continuity test result to the control circuit 1: if they match, the continuity is good; if they do not match, the continuity is poor.
制御回路１は、この導通試験結果例基づき、その障害表
示その他必要な処理を行う。The control circuit 1 performs the fault display and other necessary processing based on this continuity test result example.
次に、交互パターンの試験データによる導通不良が検出
された場合について説明する。Next, a case where a conduction failure is detected based on test data of an alternating pattern will be described.
その場合、制御回路１は、任意パターン発生回路８に対
して再試験用として適切な任意パターンの試験データを
設定するとともに、パターンセレクタ９を任意パターン
発生回路８側に切シ替える。In that case, the control circuit 1 sets appropriate arbitrary pattern test data for retesting in the arbitrary pattern generation circuit 8, and switches the pattern selector 9 to the arbitrary pattern generation circuit 8 side.
これＫよ）、任意パターンの試験データは、送倍回路５
から送信され、時分割接続経路を経て受信回路６で受信
される。This is K), the test data of any pattern is the multiplier circuit 5
, and is received by the receiving circuit 6 via a time-division connection path.
この任意パターンの試験データは、１種類に限らずに所
望種類数のものを順次に送信、受信することができる。This arbitrary pattern of test data is not limited to one type, but a desired number of types can be sequentially transmitted and received.
したがって１位置ずれ、スタック障害を起こしているピ
ントについて、その位置を多くのデータから確実に検出
することができる。Therefore, the position of a focal point that is out of position by one position or has a stack failure can be reliably detected from a large amount of data.
すなわち、導通試験の結果、障害となった装置の探索が
容易となる。That is, as a result of the continuity test, it becomes easy to search for the device that has caused the failure.
なお、上記の実施例において、交互パターンとしてＡＡ
１５５パターンを用いるように説明したが、不発ＢＡは
、これに限定されるものではなく１規則性を有する互に
異なる内容のパターンが交互に繰勺返されるものであれ
ばより０ また、ＡＡ１５５発生回路４．パターンセレ
クタ９は、必ずしも必要ではなく、任意パターン発生回
路８に対して制御回路１から交互パターンを設定するよ
う虻してもよい。In addition, in the above embodiment, AA is used as the alternating pattern.
Although we have explained that the AA155 pattern is used, the AA155 occurrence is not limited to this, but is more likely to be a pattern in which patterns with different content are repeated alternately with a certain regularity. Circuit 4. The pattern selector 9 is not necessarily required, and the control circuit 1 may instruct the arbitrary pattern generation circuit 8 to set alternate patterns.
以上、詳細に説明したように、本発明によれば、導通障
害の発生時に障害ビットの位置ずれ、スタック障害のビ
ット検出を確実に行うことができるので、障害検出の探
索時間を短縮するとともに、導通試験の信頼性を向上せ
しめるという顕著な効果が得られる。As described above in detail, according to the present invention, when a continuity fault occurs, it is possible to reliably detect the misalignment of faulty bits and bits of stack faults, thereby shortening the search time for fault detection, and A remarkable effect of improving the reliability of continuity tests can be obtained.
第１図は、従来の導通試験装置の一例のブロック図、第
２図は、本発明に係る導通試験装置の一実施例のプロ／
り図である。
１・・・制御回路、２・・・ハイウェイ選択回路、３・
・タイムスロット選択回路、４・・・ＡＡ１５５発生回
路、５・・・送信回路、６・・・受信回路、７・・・照
合回路、８・・・任意パターン発生回路、９・・パター
ンセレクタ。
（＼
＼５、− ・
代理人弁理士 高 橋 明 夫FIG. 1 is a block diagram of an example of a conventional continuity test device, and FIG. 2 is a block diagram of an example of a continuity test device according to the present invention.
This is a diagram. 1... Control circuit, 2... Highway selection circuit, 3.
-Time slot selection circuit, 4...AA155 generation circuit, 5...transmission circuit, 6...reception circuit, 7...verification circuit, 8...arbitrary pattern generation circuit, 9...pattern selector. (＼＼５、- ・Representative Patent Attorney Akio Takahashi
Claims (1)
ずれかを選択して導通試験に係る時分割接続経路へ送出
する送信部と、上記時分割接続経路を通して上記試験デ
ータを受信し、その送信の原データとの照合をして導通
試験結果を得る受信部と、上記送信部および受信部に関
して、導通試験に係る時分割接続経路の・・イウエイお
よびタイムスロットの選択制御ならびに交互ノくターン
または任意パターンの試験データの送信・受信制御を行
う制御部とから構成するようにした導通試験装置。1. A transmitter that selects either alternating pattern or arbitrary pattern test data and sends it to the time-sharing connection path related to the continuity test, and receiving the test data through the time-sharing connection path and combining it with the original data of the transmission. Concerning the transmitting section and the receiving section, the transmitting section and the receiving section perform selection control of the time division connection path and time slot for the continuity test, as well as alternating turn or arbitrary pattern testing. A continuity test device consisting of a control section that controls data transmission and reception.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP17797183A JPS6070852A (en) | 1983-09-28 | 1983-09-28 | Continuity test equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP17797183A JPS6070852A (en) | 1983-09-28 | 1983-09-28 | Continuity test equipment |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS6070852A true JPS6070852A (en) | 1985-04-22 |
Family
ID=16040278
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP17797183A Pending JPS6070852A (en) | 1983-09-28 | 1983-09-28 | Continuity test equipment |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6070852A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS62204653A (en) * | 1986-03-05 | 1987-09-09 | Hitachi Ltd | Pseudo call test system |
| JPH0329551A (en) * | 1989-06-27 | 1991-02-07 | Fujitsu Ltd | Test processing system for communication equipment |
-
1983
- 1983-09-28 JP JP17797183A patent/JPS6070852A/en active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS62204653A (en) * | 1986-03-05 | 1987-09-09 | Hitachi Ltd | Pseudo call test system |
| JPH0329551A (en) * | 1989-06-27 | 1991-02-07 | Fujitsu Ltd | Test processing system for communication equipment |
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