JPS6049455U - X-ray analyzer - Google Patents
X-ray analyzerInfo
- Publication number
- JPS6049455U JPS6049455U JP14239183U JP14239183U JPS6049455U JP S6049455 U JPS6049455 U JP S6049455U JP 14239183 U JP14239183 U JP 14239183U JP 14239183 U JP14239183 U JP 14239183U JP S6049455 U JPS6049455 U JP S6049455U
- Authority
- JP
- Japan
- Prior art keywords
- detector
- voltage
- high voltage
- rays
- spectroscopic crystal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Analysing Materials By The Use Of Radiation (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
図面は本考案の一実施例を示す蛍光X線分析装置の構成
図である。
1・・・蛍光X線分析装置、2・・・試料、6・・・分
光結晶、8・・・検出器、14・・・計数器、16・・
・高電圧発生器、18・・・電圧調整器。The drawing is a configuration diagram of a fluorescent X-ray analyzer showing an embodiment of the present invention. DESCRIPTION OF SYMBOLS 1... Fluorescence X-ray analyzer, 2... Sample, 6... Spectroscopic crystal, 8... Detector, 14... Counter, 16...
- High voltage generator, 18...voltage regulator.
Claims (1)
光結晶で分光されたX線を検出する検出器と、この検出
器に高電圧を印加する高電圧発生器と、前記検出器から
の出力パルスを計数する計数器とを備えたものにおいて
、前記分光結晶の分光角度ならびに計数器で得られる計
数率の双方の値に基づき前記高電圧発生器の高電圧を調
整する電圧調整器を設け、この電圧調整器で検出器の印
加電圧をX線の入射エネルギーに反比例して、また、X
線強度に比例してそれぞれ設定するようにしたことを特
徴とするX線分析装置。A spectroscopic crystal that separates X-rays emitted from a sample, a detector that detects the X-rays separated by the spectroscopic crystal, a high-voltage generator that applies a high voltage to this detector, and a high-voltage generator that applies a high voltage to the detector. and a counter that counts output pulses, further comprising a voltage regulator that adjusts the high voltage of the high voltage generator based on the values of both the spectral angle of the spectroscopic crystal and the counting rate obtained by the counter. , this voltage regulator adjusts the voltage applied to the detector in inverse proportion to the incident energy of X-rays, and
An X-ray analyzer characterized in that each setting is made in proportion to the ray intensity.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14239183U JPS6049455U (en) | 1983-09-14 | 1983-09-14 | X-ray analyzer |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14239183U JPS6049455U (en) | 1983-09-14 | 1983-09-14 | X-ray analyzer |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS6049455U true JPS6049455U (en) | 1985-04-06 |
Family
ID=30318179
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP14239183U Pending JPS6049455U (en) | 1983-09-14 | 1983-09-14 | X-ray analyzer |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6049455U (en) |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS4834587A (en) * | 1971-09-07 | 1973-05-19 |
-
1983
- 1983-09-14 JP JP14239183U patent/JPS6049455U/en active Pending
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS4834587A (en) * | 1971-09-07 | 1973-05-19 |
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