JPS6049455U - X-ray analyzer - Google Patents

X-ray analyzer

Info

Publication number
JPS6049455U
JPS6049455U JP14239183U JP14239183U JPS6049455U JP S6049455 U JPS6049455 U JP S6049455U JP 14239183 U JP14239183 U JP 14239183U JP 14239183 U JP14239183 U JP 14239183U JP S6049455 U JPS6049455 U JP S6049455U
Authority
JP
Japan
Prior art keywords
detector
voltage
high voltage
rays
spectroscopic crystal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP14239183U
Other languages
Japanese (ja)
Inventor
浩 角田
大原　隆雄
Original Assignee
株式会社島津製作所
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 株式会社島津製作所 filed Critical 株式会社島津製作所
Priority to JP14239183U priority Critical patent/JPS6049455U/en
Publication of JPS6049455U publication Critical patent/JPS6049455U/en
Pending legal-status Critical Current

Links

Landscapes

  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【図面の簡単な説明】[Brief explanation of the drawing]

図面は本考案の一実施例を示す蛍光Ｘ線分析装置の構成
図である。 １・・・蛍光Ｘ線分析装置、２・・・試料、６・・・分
光結晶、８・・・検出器、１４・・・計数器、１６・・
・高電圧発生器、１８・・・電圧調整器。The drawing is a configuration diagram of a fluorescent X-ray analyzer showing an embodiment of the present invention. DESCRIPTION OF SYMBOLS 1... Fluorescence X-ray analyzer, 2... Sample, 6... Spectroscopic crystal, 8... Detector, 14... Counter, 16...
- High voltage generator, 18...voltage regulator.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 試料から放射されるＸ線を分光する分光結晶と、この分
光結晶で分光されたＸ線を検出する検出器と、この検出
器に高電圧を印加する高電圧発生器と、前記検出器から
の出力パルスを計数する計数器とを備えたものにおいて
、前記分光結晶の分光角度ならびに計数器で得られる計
数率の双方の値に基づき前記高電圧発生器の高電圧を調
整する電圧調整器を設け、この電圧調整器で検出器の印
加電圧をＸ線の入射エネルギーに反比例して、また、Ｘ
線強度に比例してそれぞれ設定するようにしたことを特
徴とするＸ線分析装置。A spectroscopic crystal that separates X-rays emitted from a sample, a detector that detects the X-rays separated by the spectroscopic crystal, a high-voltage generator that applies a high voltage to this detector, and a high-voltage generator that applies a high voltage to the detector. and a counter that counts output pulses, further comprising a voltage regulator that adjusts the high voltage of the high voltage generator based on the values of both the spectral angle of the spectroscopic crystal and the counting rate obtained by the counter. , this voltage regulator adjusts the voltage applied to the detector in inverse proportion to the incident energy of X-rays, and
An X-ray analyzer characterized in that each setting is made in proportion to the ray intensity.
JP14239183U 1983-09-14 1983-09-14 X-ray analyzer Pending JPS6049455U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14239183U JPS6049455U (en) 1983-09-14 1983-09-14 X-ray analyzer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14239183U JPS6049455U (en) 1983-09-14 1983-09-14 X-ray analyzer

Publications (1)

Publication Number Publication Date
JPS6049455U true JPS6049455U (en) 1985-04-06

Family

ID=30318179

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14239183U Pending JPS6049455U (en) 1983-09-14 1983-09-14 X-ray analyzer

Country Status (1)

Country Link
JP (1) JPS6049455U (en)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4834587A (en) * 1971-09-07 1973-05-19

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4834587A (en) * 1971-09-07 1973-05-19

Similar Documents

Publication Publication Date Title
JPS6049455U (en) X-ray analyzer
JPS55112553A (en) Xxray spectroscope
Riviere et al. Energy Resolution of CsI (T1) Scintillation Counter for 12.5‐to 100‐keV Protons
Fischer Decay of Pm 150
JPS6347285U (en)
JPS58184762U (en) multi-channel analyzer
JPS5969476U (en) Photoelectron spectrometer
JPS5866348U (en) Fluorescent X-ray measuring device
Dousse et al. Gamma-ray diffraction properties of quartz and piezoelectricity
Kiley Methods to Increase X-ray Sensitivity
Borisov et al. On the all-union comparison of neutron-activation means and measuring methods of intensive neutron field characteristics
Rozenblyum et al. Direct charging detectors (Modern state)
Green et al. Size-spectrum of extensive air showers of the cosmic radiation: II.—Experimental results from a single scintillator
GB1175626A (en) Improvements in or relating to Liquid Scintillation Spectral Analysis
JPS604934U (en) Relative brightness measuring device for X-ray image intensifier
Zhilkin et al. Method for disposal of residual gamma-background when measuring neutron spectra
JPS58116649U (en) macro analyzer device
Kroshkin et al. Gas scintillation detectors of fission fragments
JPS5846156U (en) Void ratio measuring device
JPS6138550U (en) potassium detector
JPS60100630U (en) Spectrometer for high brightness light source
JPS59100253U (en) Atomization device for flame atomic absorption spectrometry
JPS5990876U (en) Pulsed electron beam time width measuring device
JPS5953290U (en) radiation detector
JPS60187548U (en) light emitting semiconductor device