JPS6024724A - Radiation resisting iil integrated circuit device - Google Patents

Radiation resisting iil integrated circuit device

Info

Publication number
JPS6024724A
JPS6024724A JP58131957A JP13195783A JPS6024724A JP S6024724 A JPS6024724 A JP S6024724A JP 58131957 A JP58131957 A JP 58131957A JP 13195783 A JP13195783 A JP 13195783A JP S6024724 A JPS6024724 A JP S6024724A
Authority
JP
Japan
Prior art keywords
circuit
iil
current
irradiation
integrated circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP58131957A
Other languages
Japanese (ja)
Other versions
JPH0218772B2 (en
Inventor
Takahiro Okabe
岡部 隆博
Toru Nakamura
徹 中村
Yuzo Kida
喜田 祐三
Minoru Nagata
永田 「穣」
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
National Institute of Advanced Industrial Science and Technology AIST
Original Assignee
Agency of Industrial Science and Technology
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agency of Industrial Science and Technology filed Critical Agency of Industrial Science and Technology
Priority to JP58131957A priority Critical patent/JPS6024724A/en
Publication of JPS6024724A publication Critical patent/JPS6024724A/en
Publication of JPH0218772B2 publication Critical patent/JPH0218772B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K19/00Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
    • H03K19/003Modifications for increasing the reliability for protection
    • H03K19/0033Radiation hardening

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Computing Systems (AREA)
  • General Engineering & Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Bipolar Integrated Circuits (AREA)
  • Logic Circuits (AREA)

Abstract

PURPOSE:To stabilize the circuit operation by changing the bias current of an IIL circuit in accordance with the variation of characteristics due to irradiation of gamma-rays. CONSTITUTION:If a current gain parameter of a transistor (TR) T3 is used as a sensor of the quantity of gamma-ray irradiation, a signal which increases an output current I is generated by a converting circuit 1 when the current gain of the TR T3 is reduced (from 7 to 9 in figure) and a collector potential V2 of the TR T3 is raised by irradiation. When this signal is generated from a circuit block 4, the bias current to an IIL circuit 3 is changed from I1' to I2' by the variation of characteristics due to irradiation of gamma-rays in a current supply circuit consisting of two TRs T1 and T2, and the current gain at a point 8 is used to stabilize the circuit operation.

Description

【発明の詳細な説明】 本発明はI I L (Integrated Inj
ectionLogi c )回路に関するものである
。特にそのγ線に対する耐放射線特性を改善するもので
ある。
DETAILED DESCRIPTION OF THE INVENTION The present invention is an integrated inj.
It is related to the ectionLogic circuit. In particular, it improves its radiation resistance against gamma rays.

IILは少数キャリア注入用のインジェクタとスイッチ
ングトランジスタが組み合わされてなるこれまでのII
L回路はγ線等放射線が照射された場合の素子特性の劣
化は考慮されていない。
IIL is a conventional II that combines an injector for minority carrier injection and a switching transistor.
The L circuit does not take into account deterioration of element characteristics when irradiated with radiation such as gamma rays.

時代の進展と共に半導体装置を原子力装置や宇宙での装
置に用いることが考慮され、こうした放射線照射のある
環境下でのγ線損失対策が重要となってきた。
As time progresses, consideration is given to using semiconductor devices in nuclear power equipment and equipment in space, and countermeasures against gamma ray loss in such radiation irradiation environments have become important.

本発明の目的はγ線照射があっても回路動作を安定に保
ち得る補償回路を有するIIL集積回路を提供するもの
である。
An object of the present invention is to provide an IIL integrated circuit having a compensation circuit that can maintain stable circuit operation even in the presence of γ-ray irradiation.

以下、実施例を用いて本発明の詳細な説明する。Hereinafter, the present invention will be explained in detail using Examples.

本発明の基本的概念は、γ線照射によって生じた特性変
化の分だけ、IIL回路のバイアス電流を変化させ回路
動作の安定化をはかるものである。
The basic concept of the present invention is to stabilize the circuit operation by changing the bias current of the IIL circuit by the amount of change in characteristics caused by γ-ray irradiation.

この動作を第1図に示したr線センサー回路2と4の部
分に設けられるものである。
This operation is provided in the r-ray sensor circuits 2 and 4 shown in FIG.

回路ブロック3は対象とするIIL回路である。Circuit block 3 is the target IIL circuit.

図示された2つのトランジスタT+、Tzによって電流
を供給する回路が構成され、回路ブロック4はγ線によ
って生じた照射量に対応した電気量を、前記電流を供給
する回路に入力する回路である。
The illustrated two transistors T+ and Tz constitute a circuit for supplying current, and circuit block 4 is a circuit that inputs an amount of electricity corresponding to the amount of irradiation generated by γ-rays to the circuit for supplying current.

たとえばγ線の照射量が増大すると、回路ブロック3の
動作余裕が低減するので、電流供給回路よシの電流値を
増大せしめれば良い。
For example, when the amount of γ-ray irradiation increases, the operating margin of the circuit block 3 decreases, so the current value of the current supply circuit may be increased.

第3図はIILの電流利得とコレクタ電流の関係を示す
図である。
FIG. 3 is a diagram showing the relationship between the current gain of IIL and the collector current.

曲線5が照射前、曲線6が照射後の電流利得−コレクタ
電流特性曲線である。素子には電流工、/にバイアスさ
れ点7に示す電流利得があったのが、放射線照射後では
9に低下したため、十分な回路の動作ができなくなって
、回路誤動作が生じる。
Curve 5 is the current gain-collector current characteristic curve before irradiation, and curve 6 is the current gain-collector current characteristic curve after irradiation. The element had a current gain shown at point 7 due to the current bias, but this decreased to 9 after radiation irradiation, making it impossible for the circuit to operate satisfactorily, resulting in circuit malfunction.

そこで本発明の基本的概念は、放射線照射によって生じ
た特性変化の分だけ、IILのバイアス電流を変化させ
、回路動作の安定化をはかろうとT3の電流利得パラメ
ータをγ線照射量のセンサとして用いている。すなわち
、照射によってT3の電流利得が低下し、T3のコレク
タ電位v2が上昇すると、変換回路1によって出力の電
流工が増大するという信号を発生させるものである。
Therefore, the basic concept of the present invention is to change the bias current of IIL by the characteristic change caused by radiation irradiation, and use the current gain parameter of T3 as a gamma ray irradiation dose sensor in order to stabilize the circuit operation. I am using it. That is, when the current gain of T3 decreases due to irradiation and the collector potential v2 of T3 increases, the conversion circuit 1 generates a signal indicating that the output current is increased.

なお、第1図においてトランジスタT3は、利得を大き
くとるために直接エミッタ接地の回路構成とし、几、は
トランジスタT、を能動領域に設定するための調整抵抗
であシ、R2はT3の負荷抵抗でおる。また変換回路1
は、差動増幅回路Aと抵抗R3,R4からなる電圧−電
流変換回路で、T3のコレクタ電圧の上昇に伴ない、出
力電流Iを増大させるものである。
In Fig. 1, the transistor T3 has a direct emitter-grounded circuit configuration in order to obtain a large gain, 几 is an adjustment resistor for setting the transistor T to the active region, and R2 is the load resistance of T3. I'll go. Also, conversion circuit 1
is a voltage-current conversion circuit consisting of a differential amplifier circuit A and resistors R3 and R4, which increases the output current I as the collector voltage of T3 increases.

以上述べた如く、本発明によればγ線照射によって生じ
た回路特性の変化を電流を調整することによって自動的
に復帰させ、安定な動作をはかることができる。
As described above, according to the present invention, changes in circuit characteristics caused by γ-ray irradiation can be automatically restored by adjusting the current, and stable operation can be achieved.

【図面の簡単な説明】[Brief explanation of drawings]

第1図はγ線量を検知し電気信号に変換する回路を示す
図、第2図はγ線損傷を補償する回路を設けたIIL回
路、第3図はIIL回路の電流側TI、’I”2.T3
・・・トランジスタ、R□、 R1,、R3、R4・・
・抵抗。 特許出願人 工業技術院長 川田裕部 Q χ 1 図 2 ′fI2 目 ′fI:3 図 JLリ (フレフタ1陳)しン(A)
Figure 1 is a diagram showing a circuit that detects the gamma ray dose and converts it into an electrical signal, Figure 2 is an IIL circuit equipped with a circuit to compensate for gamma ray damage, and Figure 3 is the current side TI of the IIL circuit, 'I'. 2.T3
...Transistor, R□, R1,, R3, R4...
·resistance. Patent applicant: Director of the Agency of Industrial Science and Technology Hirobe Kawata Q

Claims (1)

【特許請求の範囲】[Claims] 照射されるγ線量を電気信号に変換する手段と該手段か
らの電気信号に基づいてIIL回路の動作電流を制御す
る手段を有する耐放射線IIL集積回路装置であって、
前記照射されるγ線量を電気信号に変換する手段が所定
のバイポーラ・トランジスタのベースとコレクタの各々
に第1および第2の抵抗が接続され、これらの抵抗はそ
の他端で相互に接続され、前記バイポーラ・トランジス
タのエミッタが直接接地デれ、前記コレクタがIIL回
路の動作電流を制御する手段に接続されて成ることを特
徴とする耐放射線IIL集積回路装置。
A radiation-resistant IIL integrated circuit device comprising means for converting an irradiated γ-ray dose into an electrical signal and means for controlling an operating current of an IIL circuit based on the electrical signal from the means, the device comprising:
The means for converting the irradiated gamma ray dose into an electrical signal includes first and second resistors connected to the base and collector of the predetermined bipolar transistor, respectively, these resistors being connected to each other at the other end, A radiation-resistant IIL integrated circuit device, characterized in that the emitter of a bipolar transistor is directly connected to ground, and the collector is connected to means for controlling the operating current of the IIL circuit.
JP58131957A 1983-07-21 1983-07-21 Radiation resisting iil integrated circuit device Granted JPS6024724A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58131957A JPS6024724A (en) 1983-07-21 1983-07-21 Radiation resisting iil integrated circuit device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58131957A JPS6024724A (en) 1983-07-21 1983-07-21 Radiation resisting iil integrated circuit device

Publications (2)

Publication Number Publication Date
JPS6024724A true JPS6024724A (en) 1985-02-07
JPH0218772B2 JPH0218772B2 (en) 1990-04-26

Family

ID=15070160

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58131957A Granted JPS6024724A (en) 1983-07-21 1983-07-21 Radiation resisting iil integrated circuit device

Country Status (1)

Country Link
JP (1) JPS6024724A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5325697A (en) * 1991-05-06 1994-07-05 Morgan Construction Company Method and apparatus for continuously hot rolling ferrous long products

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5325697A (en) * 1991-05-06 1994-07-05 Morgan Construction Company Method and apparatus for continuously hot rolling ferrous long products

Also Published As

Publication number Publication date
JPH0218772B2 (en) 1990-04-26

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