JPS60164761U - Sample holding devices such as electron microscopes - Google Patents

Sample holding devices such as electron microscopes

Info

Publication number
JPS60164761U
JPS60164761U JP5270984U JP5270984U JPS60164761U JP S60164761 U JPS60164761 U JP S60164761U JP 5270984 U JP5270984 U JP 5270984U JP 5270984 U JP5270984 U JP 5270984U JP S60164761 U JPS60164761 U JP S60164761U
Authority
JP
Japan
Prior art keywords
sample
sample holding
main body
holding part
holding
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP5270984U
Other languages
Japanese (ja)
Other versions
JPH0243091Y2 (en
Inventor
亀割　健彦
榎本　進
繁 鈴木
Original Assignee
株式会社トプコン
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 株式会社トプコン filed Critical 株式会社トプコン
Priority to JP5270984U priority Critical patent/JPS60164761U/en
Publication of JPS60164761U publication Critical patent/JPS60164761U/en
Application granted granted Critical
Publication of JPH0243091Y2 publication Critical patent/JPH0243091Y2/ja
Granted legal-status Critical Current

Links

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【図面の簡単な説明】[Brief explanation of drawings]

第１図は、従来からの電子顕微鏡の一般的な構造例を示
す断面図、第２図及び第３図は従来の試料保持部を示す
断面図、第４図乃至第６図は本考案の第１の実施例に係
る試料保持装置を示す断面図、第７図は上記第１実施例
における試料保持装置の載置台下部からアーム制御部材
を通した状態を示す断面図、第８図は本考案の第２の実
施例を示す断面図である。゛ ２０・・・試料保持装置、２１・・・保持部本体、２２
・・・試料保持アーム、２３・・・試料保持部、２４・
・・アーム制御部材、２６・・・電子通過孔、２７・・
・試料載置部、２９・・・試料。 ２０ −　　　＼ 第５図 １ 第６図 ０FIG. 1 is a sectional view showing a general structural example of a conventional electron microscope, FIGS. 2 and 3 are sectional views showing a conventional sample holder, and FIGS. 4 to 6 are sectional views of a conventional electron microscope. A cross-sectional view showing the sample holding device according to the first embodiment, FIG. 7 is a cross-sectional view showing the state where the arm control member is passed from the lower part of the mounting table of the sample holding device in the first example, and FIG. FIG. 3 is a sectional view showing a second embodiment of the invention.゛20... Sample holding device, 21... Holding section main body, 22
...Sample holding arm, 23...Sample holding part, 24.
...Arm control member, 26...Electron passage hole, 27...
- Sample placement section, 29... sample. 20 - ＼ Figure 5 1 Figure 6 0

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 電子通過孔２６おキび該電子通過孔２６の上方に試料２
９を載置する試料載置部２７を設けた保持部本体２１と
、該保持部本体２１に一端が回動自在に軸支され、他端
に試料２９の周縁部を上方から押圧固定する試料保持部
２３を形成した試料保持アーム２２とからなる試料保持
装置２０において、上記保持部本体２１から上方に突出
して、下方へ回動する試料保持アーム２２を試料２９の
上方で受は止め制止した後該試料保持アーム２２を緩降
下させるアーム制御部材２４を設けたことを特徴とする
電子顕微鏡等の試料保持装置。The electron passing hole 26 and the sample 2 are placed above the electron passing hole 26.
A holding part main body 21 is provided with a sample mounting part 27 on which a sample 9 is placed, and a sample holding part main body 21 has one end rotatably supported on the holding part main body 21 and the other end presses and fixes the peripheral edge of the sample 29 from above. In a sample holding device 20 consisting of a sample holding arm 22 forming a holding part 23, the sample holding arm 22, which protrudes upward from the holding part main body 21 and rotates downward, is stopped by a receiver above the sample 29. A sample holding device for an electron microscope or the like, characterized in that an arm control member 24 for slowly lowering the sample holding arm 22 is provided.
JP5270984U 1984-04-12 1984-04-12 Sample holding devices such as electron microscopes Granted JPS60164761U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5270984U JPS60164761U (en) 1984-04-12 1984-04-12 Sample holding devices such as electron microscopes

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5270984U JPS60164761U (en) 1984-04-12 1984-04-12 Sample holding devices such as electron microscopes

Publications (2)

Publication Number Publication Date
JPS60164761U true JPS60164761U (en) 1985-11-01
JPH0243091Y2 JPH0243091Y2 (en) 1990-11-16

Family

ID=30572903

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5270984U Granted JPS60164761U (en) 1984-04-12 1984-04-12 Sample holding devices such as electron microscopes

Country Status (1)

Country Link
JP (1) JPS60164761U (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011514651A (en) * 2008-03-17 2011-05-06 プロトチップス，インコーポレイテッド Specimen holder used to mount a sample on an electron microscope
EP2458616A3 (en) * 2010-11-29 2013-11-27 Leica Microsystems (Schweiz) AG Holder for an electron microscopic sample carrier
JP2015056395A (en) * 2013-09-13 2015-03-23 日立ハイテクノロジーズコリア株式会社 Sample holder used for surface observation of sample and control method thereof
US9312097B2 (en) 2007-05-09 2016-04-12 Protochips, Inc. Specimen holder used for mounting samples in electron microscopes

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9312097B2 (en) 2007-05-09 2016-04-12 Protochips, Inc. Specimen holder used for mounting samples in electron microscopes
JP2011514651A (en) * 2008-03-17 2011-05-06 プロトチップス，インコーポレイテッド Specimen holder used to mount a sample on an electron microscope
US8853646B2 (en) 2008-03-17 2014-10-07 Protochips, Inc. Specimen holder used for mounting samples in electron microscopes
US8859991B2 (en) 2008-03-17 2014-10-14 Protochips, Inc. Specimen holder used for mounting samples in electron microscopes
USRE48201E1 (en) 2008-03-17 2020-09-08 Protochips, Inc. Specimen holder used for mounting samples in electron microscopes
EP2458616A3 (en) * 2010-11-29 2013-11-27 Leica Microsystems (Schweiz) AG Holder for an electron microscopic sample carrier
JP2015056395A (en) * 2013-09-13 2015-03-23 日立ハイテクノロジーズコリア株式会社 Sample holder used for surface observation of sample and control method thereof

Also Published As

Publication number Publication date
JPH0243091Y2 (en) 1990-11-16

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