JPS60162933A - Attaching apparatus of test piece for impact test - Google Patents
Attaching apparatus of test piece for impact testInfo
- Publication number
- JPS60162933A JPS60162933A JP1829284A JP1829284A JPS60162933A JP S60162933 A JPS60162933 A JP S60162933A JP 1829284 A JP1829284 A JP 1829284A JP 1829284 A JP1829284 A JP 1829284A JP S60162933 A JPS60162933 A JP S60162933A
- Authority
- JP
- Japan
- Prior art keywords
- test piece
- pedestal
- test
- holder
- center
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N3/30—Investigating strength properties of solid materials by application of mechanical stress by applying a single impulsive force, e.g. by falling weight
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
Abstract
Description
【発明の詳細な説明】
本発明は衝撃試験用試験片取付は装置に関する。更に詳
しくは衝撃試験用試験片を低温あるいは高温の一定温度
に保持した後、正確、迅速かつ安定に試験片を取付は位
置に取付けることを可能にした装置に関するものである
。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an apparatus for mounting specimens for impact testing. More specifically, the present invention relates to a device that makes it possible to accurately, quickly, and stably mount a test piece in a position after holding the test piece for an impact test at a constant temperature, either low or high.
金属材料などの靭性な判定する試験法とじて衝撃試験か
ある。その工業的試験法としては、一般に中央に切欠を
入れた３点曲げ衝撃のシャルピー衝撃試験法が用いられ
ている。室温においては、位置ゲージを用いて試験片を
正確に試験片支持台に取付ければよいが、材料の脆性挙
動をめるには、種々の温度で衝撃試験を行って、延性−
脆性遷移温度をめる必要がある。Impact testing is a test method for determining the toughness of metal materials. As an industrial test method, the Charpy impact test method, which involves a three-point bending impact with a notch in the center, is generally used. At room temperature, it is sufficient to accurately mount the test piece on the test piece support using a position gauge, but to understand the brittle behavior of the material, impact tests are performed at various temperatures to determine the ductility -
It is necessary to increase the brittle transition temperature.
わが国のＪＩＳでは（Ｚ−２２４２、金属材料衝撃試験
法）試験片を支持台に取付けた時の支持台間の中心と、
試験片の中心とのずれを０．４ｎ以内、室温以外の温度
による試験の場合には、試験温度に保持する時間を液槽
中では少なくとも１０分、気槽中では２０分間保持し、
液槽または気槽から取出して衝撃を与えるまでの時間は
５秒以内と規定されている。In Japan's JIS (Z-2242, Metallic Material Impact Testing Method), the center between the supports when the test piece is attached to the supports,
The deviation from the center of the test piece should be within 0.4n, and in the case of tests at temperatures other than room temperature, the test temperature should be maintained for at least 10 minutes in a liquid bath and 20 minutes in an air bath.
The time from when it is removed from the liquid or air tank to when it is subjected to impact is stipulated to be within 5 seconds.
従来の試験機においては、室温以外の温度における試験
では、位置ゲージによる取付けができないので、試験片
を案内材の手持ちホルダー上にのせ所定温度に保持した
後、ホルダーを持って試験片を支持台上に取付ける方法
が行われている。しかし、この方法では手持ちで手早く
取付けなければならないので、（１）案内部分のクリア
ランスを太きくしなければならないので取付は精度が悪
くなる。（２）ホルダーな堆除く時に試験片の位置ずれ
が生じ易い。（３）この動作には習熟を必要とする。（
４）ハンマーの下に身体を入れなければ試験片の取付け
を行うことができないので危険が伴うなどの欠点があっ
た。With conventional testing machines, when testing at temperatures other than room temperature, it is not possible to mount the test piece using a position gauge, so after placing the test piece on a hand-held guide holder and maintaining it at a predetermined temperature, hold the holder and place the test piece on the support stand. The method used is to attach it above. However, with this method, it is necessary to quickly mount it by hand, and (1) the clearance of the guide portion must be increased, resulting in poor mounting accuracy. (2) The test piece is likely to be misaligned when removing the deposit from the holder. (3) This operation requires skill. (
4) There was a drawback that the test piece could not be attached without putting one's body under the hammer, which was dangerous.
また、自動衝撃試験機では、試験片支持台の一端と試験
片との間に試験片位置ぎめ具を置き、取付は位置の決定
を行っているが、この方法では、（１）試験片を取付け
た後の位置ぎめ具を取外す際に、試験片位置ずれが生じ
易い。（２）試験片端面と切欠との間の距離を正確に仕
上げなければならないなどの欠点がある。In addition, in automatic impact testing machines, a test piece positioning tool is placed between one end of the test piece support stand and the test piece, and the mounting position is determined. When removing the positioning tool after installation, the test piece is likely to be misaligned. (2) There are drawbacks such as the need to accurately finish the distance between the end face of the test piece and the notch.
本発明は、これらの従来法の欠点を解消すべくなされた
もので、その目的は、迅速、正確、且つ安全に、試験片
を試験片支持台に取付けることができ、また、試験温度
も容易に変更し得られる装置を提供するにある。The present invention was made to eliminate these drawbacks of conventional methods, and its purpose is to quickly, accurately, and safely attach a test specimen to a test specimen support, and to easily control the test temperature. We are here to provide you with a device that can be modified to suit your needs.
本発明の衝撃試験機における試験片取付は装置を図面に
基いて説明すると、図面は本発明装置の実施態様を示す
もので、第１図及び第２図はガイドレール型の態様図で
、第１図はその平面図、第２図は第１図のＡ−Ｂにおけ
る断面図で、（ａ）は試験片受台押下げ前、（ｂ）は押
下げ後の状態を示す。第３図及び第４図は回転型の実施
態様図で、第３図はその平面図、第４図はその側面図で
、（ａｌは試験片押下げ前、（ｂ）は押下げ後の状態を
示す。第５図は恒温槽中に試験片を浸漬した状態図を示
す。The attachment of test pieces in the impact tester of the present invention will be explained based on the drawings. The drawings show embodiments of the apparatus of the present invention, and FIGS. 1 and 2 are guide rail type embodiments. 1 is a plan view thereof, and FIG. 2 is a cross-sectional view taken along line AB in FIG. 1, where (a) shows the state before the test piece holder is pressed down, and (b) shows the state after it is pressed down. Figures 3 and 4 show the embodiment of the rotary type, Figure 3 is its top view, and Figure 4 is its side view, (al is before pressing down the test piece, (b) is after pressing down. Fig. 5 shows a state diagram in which a test piece is immersed in a constant temperature bath.
１は試験片支持台、２は試験片、３は試験片受台、４は
受台支持具、５は試験片押え板、６は受台回転軸、７は
受台押上げバネ、８は受台反吐め、９は試験片送り具、
１０は浸漬用回転軸、１１は受台支持具ガイド棒、１２
は試験片受台戻しレバー、１３はガイドレール、１４は
レール支持台、１５は送り具止め、１６は受台固定具、
１７はハンドル、１８は回転軸、１９は回転アーム、２
０はセンターピン、２１は受台引下げ用斜面、２２は受
台引下げ用テコ、２３は姿勢安定用突起、２４は恒温槽
を示す。1 is a test piece support stand, 2 is a test piece, 3 is a test piece pedestal, 4 is a pedestal support, 5 is a test piece holding plate, 6 is a pedestal rotating shaft, 7 is a pedestal push-up spring, 8 is a 9 is a test piece feeder,
10 is a rotating shaft for immersion, 11 is a pedestal support guide rod, 12
13 is a test piece pedestal return lever, 13 is a guide rail, 14 is a rail support base, 15 is a feeder stop, 16 is a pedestal fixture,
17 is a handle, 18 is a rotating shaft, 19 is a rotating arm, 2
0 is a center pin, 21 is a slope for pulling down the pedestal, 22 is a lever for pulling down the pedestal, 23 is a projection for stabilizing the posture, and 24 is a constant temperature bath.
本発明の装置は、（１）ガイドレール１３とレール支持
台１４（第１図）または回転台１８と回転アーム１９（
第３図）からなる試験片の誘導部、（２）試験片送り具
９、試験片受台３、受台支持具４、及び試験片押え板５
からなる試験片取付は部、及び（３）試験片送り具９に
設けた試験片の浸漬用回転軸１００周りに回転し、試験
片２を試験片受台３と共に恒温槽２４中に浸漬するため
の回転機構部からなっている。The device of the present invention includes (1) a guide rail 13 and a rail support stand 14 (Fig. 1) or a rotating stand 18 and a rotating arm 19 (
(2) a test piece feeder 9, a test piece pedestal 3, a pedestal support 4, and a test piece holding plate 5;
(3) The test piece 2 is rotated around the test piece immersion rotating shaft 100 provided on the test piece feeder 9, and the test piece 2 is immersed together with the test piece holder 3 in the constant temperature bath 24. It consists of a rotating mechanism section for
試験片誘導部は、試験片２を試験片取付は位置に送るた
めに、試験片支持台１の前方にガイドレール１３を設け
、試験片送り具９が自由に走行し得るようにするか（第
１図）、ある〜・は試験機側方に設けた回転軸１８と回
転アーム１９によって誘導する（第３図）。ガイドレー
ル１３または回転軸１９を固定するときは、試験片受台
３の先端中央に取付けたセンターピン２０が試験片支持
台３の中央に来るように調整する。In order to send the test piece 2 to the test piece mounting position, the test piece guide section includes a guide rail 13 provided in front of the test piece support stand 1 so that the test piece feeder 9 can move freely ( (Fig. 1) and are guided by a rotating shaft 18 and a rotating arm 19 provided on the side of the test machine (Fig. 3). When fixing the guide rail 13 or the rotating shaft 19, adjust it so that the center pin 20 attached to the center of the tip of the test piece holder 3 comes to the center of the test piece support 3.
＝５−
試験片取付は部は、試験片受台３の前面中心にセンター
ピン２０を取付け、試験片２の切欠と一致させる。この
方法として次の方法が挙げられる。=5- For mounting the test piece, attach the center pin 20 to the center of the front surface of the test piece holder 3, aligning it with the notch of the test piece 2. Examples of this method include the following method.
（１）斜面押下げ型（第１図、第２図）試験片送り具９
中を貫通し、受台支持具ガイド棒１１の前方先端に受台
支持具４を固定し、この受台支持具４には受台回転軸６
を介して試験片受台３を取付ける。試験片受台３の後方
端は下面に対して約４５°傾斜させ、この面と接する試
験片送り具９の面を同様の角度の受台引下げ斜面２１と
する。試験片受台３の後方端上部を受台押上げバネ７で
押え、試験片受台３を水平に保つ。試験片受台３にのせ
た試験片２はバネを介して押え板５で固定する。(1) Slope push-down type (Fig. 1, Fig. 2) test piece feeder 9
A pedestal support 4 is fixed to the front end of the pedestal support guide rod 11 passing through the inside, and a pedestal rotation shaft 6 is attached to the pedestal support 4.
Attach the test piece holder 3 via the The rear end of the test piece holder 3 is inclined at an angle of about 45 degrees with respect to the lower surface, and the surface of the test piece feeder 9 in contact with this surface forms a pedestal lowering slope 21 having a similar angle. The upper rear end of the test piece holder 3 is held down by the holder push-up spring 7 to keep the test piece holder 3 horizontal. The test piece 2 placed on the test piece holder 3 is fixed with a holding plate 5 via a spring.
試験片２を取付けた試験片送り具９を試験機の方向へ送
り、試験片２が試験片支持台１の壁に達すると、試験片
２と試験片受台３及び受台支持具４は移動を止められる
。さらに試験片送り具９を送込むと、受台支持金具４６
一
と試験片送り具９との間隙が狭くなり、第２図（ｂ）に
示すように試験片受台３の後端部が試験片送り具９の引
下げ胴面２１に沿って押上げられる。これによって受台
回転軸６を中心に回転し、試験片受台３の先端は下方に
押下げられる。The test piece feeder 9 with the test piece 2 attached is sent in the direction of the testing machine, and when the test piece 2 reaches the wall of the test piece support stand 1, the test piece 2, the test piece holder 3, and the holder support 4 are You can stop moving. When the test piece feeder 9 is further fed, the pedestal support metal fitting 46
The gap between the test piece feeder 9 and the test piece feeder 9 becomes narrower, and the rear end of the test piece holder 3 is pushed up along the lowering body surface 21 of the test piece feeder 9, as shown in FIG. 2(b). . As a result, the test piece holder 3 rotates around the rotating shaft 6, and the tip of the test piece holder 3 is pushed down.
この時、受台支持具ガイド棒１１に付した溝の中に受台
笑止め８がバネによって押出され、試験片受台３の先端
が下方に押下げられた姿勢を保つ。試験片送り具９を引
戻すと、試験片２は試験片支持台１の正しい位置に取付
けられる。次に試験片送り具９を戻し、レール支持台１
４に押しつけると、受台笑止め８が外れて試験片受台３
は水平に復帰して試験片取付は準備状態になる。At this time, the pedestal retainer 8 is pushed out by the spring into the groove formed in the pedestal support guide rod 11, and the tip of the test piece holder 3 is maintained in a downwardly pressed position. When the test piece feeder 9 is pulled back, the test piece 2 is attached to the correct position on the test piece support 1. Next, return the test piece feeder 9, and
4, the pedestal stopper 8 will come off and the specimen holder 3 will come off.
returns to the horizontal position and the specimen is ready for installation.
（２） テコ押下げ型（第３図、第４図）浸漬用回転軸
１０によって試験片送り具９に取付けられた受台支持具
４に受台回転軸６を介して試験片受台２が固定され、受
台回転軸６を中心に試験片受台２の先端が上下に回転す
る。試験片受台３の後端には受台引下げ用テコ部２２と
姿勢安定用突起２３を有し、該突起２３の先端部分は受
台押上げバネ７によって押出された受台笑止め８と接触
している。試験片受台３の先端を上方に持上げると、姿
勢安定用突起２３０頂部を受台笑止め８で押し、テコ作
用で試験片受台３は水平位置に保つ。試験片受台３の先
端中央にセンタービン２０を取付は試験片位置決めとす
る。(2) Lever push-down type (Figures 3 and 4) The test piece holder 2 is attached to the holder support 4 attached to the test piece feeder 9 by the immersion rotating shaft 10 via the holder rotation shaft 6. is fixed, and the tip of the test piece holder 2 rotates up and down about the holder rotating shaft 6. The rear end of the test piece holder 3 has a lever part 22 for pulling down the pedestal and a projection 23 for stabilizing the posture, and the tip of the projection 23 has a pedestal stopper 8 pushed out by a pedestal push-up spring 7. are in contact. When the tip of the test piece holder 3 is lifted upward, the top of the posture stabilizing projection 230 is pushed by the holder stopper 8, and the test piece holder 3 is maintained in a horizontal position by lever action. A center bin 20 is attached to the center of the tip of the test piece holder 3 to position the test piece.
試験片受台３に取付けた試験片２は押え板５で固定する
。試験片送り具９を試験機の方へ送り試験片支持台１の
壁に達すると、試験片２の移動は止められ、受台引下げ
テコ部２２が試験片支持台１の前面に接する。さらに送
込むと、受台引下げ用テコ２２０作用で試験片受台３の
先端が押下げられ、試験片２が試験片支持台１上に残る
。また、試験片受台３の回転によって姿勢安定用突起２
３が受台笑止め８の先端から外れ、試験片受台３の先端
を押下げる状態に保つ（第４図（ｂ））。The test piece 2 attached to the test piece holder 3 is fixed with a holding plate 5. When the test piece feeder 9 is sent toward the testing machine and reaches the wall of the test piece support stand 1, the movement of the test piece 2 is stopped and the stand lowering lever portion 22 comes into contact with the front surface of the test piece support stand 1. When it is fed further, the tip of the test piece holder 3 is pushed down by the action of the holder lowering lever 220, and the test piece 2 remains on the test piece support 1. In addition, by rotating the test piece holder 3, the posture stabilizing protrusion 2
3 comes off from the tip of the pedestal stopper 8, and the tip of the test piece holder 3 is kept pressed down (FIG. 4(b)).
試験片送り具９を元の位置に戻す。Return the test piece feeder 9 to its original position.
試験片受台戻しレバー１２によって試験片受台戻し棒１
１を引戻すことによって試験片受台３を水平位置に戻し
、押え板５を引戻して試験片取付は準備状態となる。The test piece holder return rod 1 is operated by the test piece holder return lever 12.
1 returns the test piece holder 3 to the horizontal position, and the holding plate 5 is pulled back to prepare for test piece mounting.
試験片浸漬部、（第５図）は、試験片送り具９に取付け
た浸漬用回転軸１０を中心に、試験片送り具９の中央部
分または受台支持具４を回転することによって、試験片
受台３上に押え板５で固定した試験片２を下方に下げ、
恒温槽２４中に浸漬させる。一定時間浸漬した後、試験
片２を取付けたまま試験片送り具９の中央部（第１図）
、または受台支持具４（第３図）を回転させて送り込む
位置まで引上げると、バネによって押出された受台固定
具１６のツメに支持されて送り込まれる。The test specimen immersion section (FIG. 5) rotates the central part of the test specimen feeder 9 or the pedestal support 4 around the immersion rotating shaft 10 attached to the test specimen feeder 9. Lower the test piece 2 fixed on the single holder 3 with the presser plate 5,
It is immersed in a constant temperature bath 24. After being immersed for a certain period of time, the center part of the test piece feeder 9 with the test piece 2 still attached (Fig. 1)
, or when the pedestal support 4 (FIG. 3) is rotated and pulled up to the sending position, it is supported by the claws of the pedestal fixture 16 pushed out by the spring and sent in.
以上のように、本発明の装置は、試験片の誘導装置と、
試験片受台に設けたセンターピンで試験片の位置決めを
行うことにより、試験片を取付ける装置と、試験片を試
験片受台と共に恒９−
温槽中に浸漬した後、これを試験片の数句は位置に誘導
、取付ける装置とを設けた衝撃試験用試験片取付は装置
である。As described above, the apparatus of the present invention includes a test piece guiding device,
By positioning the test piece with the center pin provided on the test piece holder, a device for attaching the test piece and the test piece are immersed together with the test piece holder in a constant temperature bath. A few phrases are a device for guiding and installing impact test specimens into position.
本発明の装置によると、試験片を正確、迅速、安定に位
置することができ、また、室温以外の任童の温度におけ
る延性−脆性遷移をめることができ、これらの操作は熟
練を必要とせず、容易に行うことができるばかりでなく
、自動化することもできる優れた効果を有する。According to the apparatus of the present invention, the test piece can be accurately, quickly, and stably positioned, and the ductile-brittle transition can be observed at temperatures other than room temperature, and these operations require skill. Not only is it easy to perform, but it can also be automated and has excellent effects.
実施例
第１図の装置を使用して、］０分間試験試験上保持し、
衝撃試験を行った結果、打撃位置のずれ、試験時間は次
の通りであった。EXAMPLE Using the apparatus of FIG. 1, hold on the test for 0 minutes;
As a result of the impact test, the impact position deviation and test time were as follows.
本発明装置 従来装置 ＪＩＳ 試験時間（秒） ４ ３〜４ ５以内Device of the present invention Conventional device JIS Test time (seconds): Within 4 3 to 4 5
図面は本発明の装置の実施態様を示す図面で、第１図は
ガイドレール、傾斜面押下げ型平面図、第２図は第１図
Ａ−Ｂ部の断面図で、ｔａ）は試験１０−
片受台押下げ前、（ｂ）は押下げ後を示す。
第３図は回転軸テコ押下げ型平面図、第４図はその側面
図で、（ａｌは試験片受台押下げ前、（ｂｌは押下げ後
を示す。
第５図は恒温槽へ浸漬状態図を示す。
１：試験片支持台 ２：試験片
３：試験片受台 ４：受台支持具
５：試験片押え板 ６：受台回転軸
７：受台押上げバネ ８：受台反吐め
９：試験片送り具 １０：浸漬用回転軸１１：受台支持
具ガイド棒 Ｉ２：試験片受台戻しレバー１３ニガイド
レール １４：レール支持台］５：送り具止め １６：
受台固定具
イーｒ′〜
１７：ハンドル １８：回転軸 ；・The drawings are drawings showing an embodiment of the apparatus of the present invention, in which Fig. 1 is a plan view of the guide rail and inclined surface push-down type, Fig. 2 is a cross-sectional view of the section A-B in Fig. 1, and ta) is a test 10 test. - Before pushing down one pedestal, (b) shows after pushing down. Figure 3 is a plan view of the rotary shaft lever-down type, and Figure 4 is a side view of the same. The state diagram is shown. 1: Test piece support stand 2: Test piece 3: Test piece holder 4: holder support 5: Test piece holding plate 6: holder rotation shaft 7: holder push-up spring 8: holder Anti-discharge 9: Test piece feeding tool 10: Immersion rotating shaft 11: pedestal support guide rod I2: Test piece pedestal return lever 13 guide rail 14: Rail support] 5: Feeding tool stop 16:
Pedestal fixing tool E r'~ 17: Handle 18: Rotating shaft ;・
Claims (1)
験片受台、受台支持具、及び試験片押え板からなり、試
験片受台に設けたセンターピンで試験片の位置決めによ
り試験片を取付ける装置と、試験片を試験受台と共に恒
温槽中に浸漬した後、これを試験片の取付は位置に誘導
、取付ける装置を設けたことを特徴とする衝撃試験用試
験片取付は装置。Installation of the test piece consists of a position guiding device, a test piece feeder, a test piece holder, a holder support, and a test piece holding plate, and the test piece is positioned using a center pin provided on the test piece holder. A test piece mounting system for impact testing is characterized by having a device for mounting a test piece, and a device for guiding and mounting the test piece to a position after immersing the test piece together with a test pedestal in a constant temperature bath. Device.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1829284A JPS60162933A (en) | 1984-02-06 | 1984-02-06 | Attaching apparatus of test piece for impact test |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1829284A JPS60162933A (en) | 1984-02-06 | 1984-02-06 | Attaching apparatus of test piece for impact test |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS60162933A true JPS60162933A (en) | 1985-08-24 |
| JPH0336174B2 JPH0336174B2 (en) | 1991-05-30 |
Family
ID=11967535
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1829284A Granted JPS60162933A (en) | 1984-02-06 | 1984-02-06 | Attaching apparatus of test piece for impact test |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS60162933A (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100857704B1 (en) | 2006-10-24 | 2008-09-08 | 주식회사 포스코 | Fixing device of a fringeless specimen for use in a high speed collision test of a steel sheet for automobile use |
| CN102507330A (en) * | 2011-11-15 | 2012-06-20 | 煤炭科学研究总院 | Overall drawing test device for mining anchor rod |
| CN105403454A (en) * | 2015-12-21 | 2016-03-16 | 中国船舶重工集团公司第七○二研究所 | Jaw vice anchorage anchor device used for single-hole steel strand fatigue test |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS579725U (en) * | 1980-06-19 | 1982-01-19 |
-
1984
- 1984-02-06 JP JP1829284A patent/JPS60162933A/en active Granted
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS579725U (en) * | 1980-06-19 | 1982-01-19 |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100857704B1 (en) | 2006-10-24 | 2008-09-08 | 주식회사 포스코 | Fixing device of a fringeless specimen for use in a high speed collision test of a steel sheet for automobile use |
| CN102507330A (en) * | 2011-11-15 | 2012-06-20 | 煤炭科学研究总院 | Overall drawing test device for mining anchor rod |
| CN105403454A (en) * | 2015-12-21 | 2016-03-16 | 中国船舶重工集团公司第七○二研究所 | Jaw vice anchorage anchor device used for single-hole steel strand fatigue test |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0336174B2 (en) | 1991-05-30 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US6588083B2 (en) | Method for force-transmitting clamping of a tool | |
| EP2386845A1 (en) | Apparatus and method for testing of bonds of a semiconductor assembly | |
| US2804769A (en) | Hardness tester work piece clamping means | |
| JPS60162933A (en) | Attaching apparatus of test piece for impact test | |
| US5284049A (en) | Indentation hardness tester | |
| US4442705A (en) | Clamping nosepiece for hardness tester | |
| US2661641A (en) | Magnetic drilling and tapping alignment jig | |
| US6604395B2 (en) | Semi-automated probe bender | |
| CN114225798B (en) | Soil sample agitating unit with temperature measurement function | |
| US2258424A (en) | Hardness testing machine | |
| JPH06335893A (en) | Cross cut device | |
| CA2472676C (en) | Golf club grip alignment apparatus and method | |
| JP3304551B2 (en) | Fatigue test equipment for small test pieces | |
| JP3720073B2 (en) | Processing method and processing device for liquid inlet of bubble tube | |
| JPH0318549B2 (en) | ||
| JPS62162430A (en) | Small diameter rod type electrode guide device of electric discharge machine | |
| JPH08254489A (en) | Coating film life evaluating tester | |
| KR101739035B1 (en) | Tensile specimens setting device | |
| JPH01153225A (en) | Automatic shrinkage fitting device | |
| JPS6148745A (en) | Sample press type rockwell hardness tester | |
| KR0116805Y1 (en) | Hand drill supporter | |
| JPS593340A (en) | Apparatus of scratch test | |
| JPS63165078A (en) | Welding device for long-sized stud | |
| JPH0634048Y2 (en) | Automatic soldering equipment | |
| JPH033800A (en) | Cutting device for marking cloth and the like |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| EXPY | Cancellation because of completion of term |