JPS5944056A - Photoreceptor - Google Patents

Photoreceptor

Info

Publication number
JPS5944056A
JPS5944056A JP15424582A JP15424582A JPS5944056A JP S5944056 A JPS5944056 A JP S5944056A JP 15424582 A JP15424582 A JP 15424582A JP 15424582 A JP15424582 A JP 15424582A JP S5944056 A JPS5944056 A JP S5944056A
Authority
JP
Japan
Prior art keywords
halogen
photoreceptor
layer
charge
cgl
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP15424582A
Other languages
Japanese (ja)
Inventor
Tadashi Kaneko
兼子 正
Shigeru Ueda
茂 上田
Hiroyuki Nomori
野守 弘之
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Konica Minolta Inc
Original Assignee
Konica Minolta Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Konica Minolta Inc filed Critical Konica Minolta Inc
Priority to JP15424582A priority Critical patent/JPS5944056A/en
Publication of JPS5944056A publication Critical patent/JPS5944056A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03GELECTROGRAPHY; ELECTROPHOTOGRAPHY; MAGNETOGRAPHY
    • G03G5/00Recording members for original recording by exposure, e.g. to light, to heat, to electrons; Manufacture thereof; Selection of materials therefor
    • G03G5/02Charge-receiving layers
    • G03G5/04Photoconductive layers; Charge-generation layers or charge-transporting layers; Additives therefor; Binders therefor
    • G03G5/08Photoconductive layers; Charge-generation layers or charge-transporting layers; Additives therefor; Binders therefor characterised by the photoconductive material being inorganic

Landscapes

  • Chemical & Material Sciences (AREA)
  • Inorganic Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Photoreceptors In Electrophotography (AREA)

Abstract

PURPOSE:To increase a range of each hole in a charge transfer layer, and to improve residual charge characteristics without deteriorating acceptance potential characteristics, by forming a charge generating layer and the charge transfer layer both made of Se-Te alloy contg. specified amts. of halogen and Te. CONSTITUTION:An electrophotographic receptor or a photoreceptor for use in a photoelectric conversion element is obtained by forming the charge generating layer 3 made of Se-Te alloy contg. halogen, and the charge transfer layer 2 made of Se-Te alloy contg. more halogen and less Te than the layer 3 on a conductive substrate 1 made of aluminum or the like.

Description

【発明の詳細な説明】 本発明は、例えば電子写真又は光電変換素子等に好適な
感光体に関するものである。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a photoreceptor suitable for, for example, electrophotography or photoelectric conversion elements.

従来、電子写真用の感光体として、セレンにテルルを添
加したセレン−テルル合金(8e  Te )からなる
感光体が知られている。このSe −Te感光体はテル
ルの含有によって特長波長光の吸収による光キャリアの
生成機能が向上し、長波長域で良好な感度を示す。
Conventionally, as a photoreceptor for electrophotography, a photoreceptor made of a selenium-tellurium alloy (8eTe) in which tellurium is added to selenium is known. This Se--Te photoreceptor improves the ability to generate photocarriers by absorbing light of a characteristic wavelength by containing tellurium, and exhibits good sensitivity in a long wavelength region.

例えばζ特開昭56−12647号においては、Se 
−Teからなる電荷輸送層(以下CTLと称する。)の
表面に、このCTLよりTe含有量の多いSe −Te
からなる電荷発生層(以下、CGLと称する。)が設け
られてなる感光体が記載されている。
For example, in ζ Japanese Patent Publication No. 56-12647, Se
The surface of the charge transport layer (hereinafter referred to as CTL) made of -Te is coated with Se -Te, which has a higher Te content than this CTL.
A photoreceptor is described in which a charge generation layer (hereinafter referred to as CGL) is provided.

一方、Se −T’e層中にハロゲン、例えば塩素原子
を5〜500 ppmの濃度で均一に含有せしめた感光
体が特開昭55−1599445号及び特開昭55−1
59446号において開示されている。しかしながら、
この塩素含有Se −Teを上記のCTL及びCGLか
らなる複合感光体に用いた場合、次の如き致命的な欠陥
が生じることが判明した。
On the other hand, photoreceptors in which halogen, for example, chlorine atoms are uniformly contained in the Se-T'e layer at a concentration of 5 to 500 ppm, are disclosed in JP-A-55-1599445 and JP-A-55-1.
No. 59446. however,
It has been found that when this chlorine-containing Se--Te is used in the above-mentioned composite photoreceptor consisting of CTL and CGL, the following fatal defects occur.

即ち、均一に塩素原子が含有されていると、光を吸収し
て光キャリアを発生するCGLにおいては、塩素原子は
ホールの移動に対しては効果があるが、ホールに比べて
17100程度の移動度しかもたない電子の移動を妨げ
、そのライフタイムを短かくしてしまう。この結果、電
子の飛程がホールに比べて著しく小さくなり、CGL中
での電子のトラップされる確率が大きくなり、残留電位
の増大、更には帯電電位の保持性の劣化を生ぜしめる。
In other words, when chlorine atoms are uniformly contained, in CGL that absorbs light and generates photocarriers, the chlorine atoms are effective for the movement of holes, but the movement is about 17,100 compared to the holes. This prevents the movement of electrons, which only have a certain amount of energy, and shortens their lifetime. As a result, the range of electrons becomes significantly smaller than that of holes, increasing the probability that electrons will be trapped in the CGL, resulting in an increase in residual potential and further deterioration in retention of charged potential.

本発明は、上記の如き欠陥を是正すべくなされたもので
あって、CGL中の電子の飛程を小さくすることなしに
CTL中のホールの飛程を増大させ、残霜特性を向上さ
せることを目的としている。
The present invention has been made to correct the above-mentioned defects, and aims to increase the range of holes in the CTL without reducing the range of electrons in the CGL, and improve the frost retention characteristics. It is an object.

また、繰返し使用時の帯電電位特性を劣化させることな
く、残′#i特性を良好にすることも目的としている。
Another object is to improve the residual '#i characteristics without deteriorating the charging potential characteristics during repeated use.

これらの目的は、本発明による感光体即ち、ハロゲン(
例えば塩素原子)を5 ppm未満含有するセレン−テ
ルル合金からなる電荷発生層(CGL)と、ハロゲン(
例えは塩素原子)を前記電荷発生層(CG−テルル合金
からなる電荷輸送層(C’l’L)とを有することを特
徴とする感光体によって達成される。
These objectives are achieved by using a photoreceptor according to the present invention, that is, a halogen (
For example, a charge generating layer (CGL) made of a selenium-tellurium alloy containing less than 5 ppm of chlorine atoms) and a charge generating layer (CGL) containing less than 5 ppm of halogen atoms (
This is achieved by a photoconductor characterized in that it has a charge generation layer (a charge transport layer (C'l'L) made of a CG-tellurium alloy) and a charge transport layer (C'l'L) made of a CG-tellurium alloy.

ドープされていると同時に、CGL中には市;子の移動
の妨げとならない量(5ppm未満)のハロゲンが含有
されるようにしているので、光照射時に発生するキャリ
アはすべて容易に移動できることになり、残留電位の上
昇を大幅に抑制できる。しかも、繰返し使用時での残留
′電位の蓄積を防止できる上に、CGL中で電子がトラ
ップされる確率を小さくでき、繰返し時の帯電電位の低
下を小さくすることが可能である。
At the same time as being doped, CGL contains an amount of halogen (less than 5 ppm) that does not impede the movement of molecules, so all carriers generated during light irradiation can be easily moved. Therefore, the increase in residual potential can be significantly suppressed. Moreover, it is possible to prevent the accumulation of residual potential during repeated use, reduce the probability that electrons will be trapped in the CGL, and reduce the drop in charging potential during repeated use.

こうした顕著な効果を得るためには、CGL中のハロゲ
ン量を5 pprn未満に抑え、かつCTL中のハロゲ
ン量をCGL中のハロゲン含有量よりも多く(好ましく
はio ppm以上)することが必須不可欠である。C
GL中のノ・ロゲン量が51)pmを越えると、電子の
移動が妨げられるからである。
In order to obtain such remarkable effects, it is essential to suppress the amount of halogen in CGL to less than 5 pprn and to make the amount of halogen in CTL higher than the halogen content in CGL (preferably io ppm or more). It is. C
This is because, if the amount of nitrogen in GL exceeds 51) pm, the movement of electrons will be hindered.

以下、本発明を実施例について図面参照下に詳細に説明
する。
DESCRIPTION OF THE PREFERRED EMBODIMENTS The present invention will be described in detail below with reference to the drawings.

第1図に例示するSe −Te感光体によれば、アルミ
ニウム等の導電性支持基板1上に、Te含有量が3〜8
重isで厚さ30〜701Lmの8e −’reからな
るCTL2と、Te含有量が10−25重量%で厚さ2
〜10μmのSe = TeからなるCGL3  とが
設けられている。CTL2には10 ppm以上(望ま
しくは15〜100 pptn )の塩素原子が含有さ
れ、かつCGL3には5 ppm未満の塩素原子が含有
されている。
According to the Se-Te photoreceptor illustrated in FIG. 1, a Te content of 3 to 8
CTL2 consisting of 8e-'re with a weight of 30-701 Lm and a thickness of 2 with a Te content of 10-25 wt%.
~10 μm of CGL3 made of Se=Te is provided. CTL2 contains 10 ppm or more (preferably 15 to 100 pptn) of chlorine atoms, and CGL3 contains less than 5 ppm of chlorine atoms.

このように、CT Lの塩素濃度を多くし、CGLの塩
素濃度を少なくすることによって、上記した如く、CT
L中でのホールの移動がスムーズに行なわれると同時に
、CGL中での電子の移動(表面側への移動)が妨げら
れることがない。
In this way, by increasing the chlorine concentration of CT L and decreasing the chlorine concentration of CGL, as described above, CT
The movement of holes in L is carried out smoothly, and at the same time, the movement of electrons in CGL (movement toward the surface side) is not hindered.

また、上記CT LのTe含有量は一般に低くするのが
電荷輸送能(更には電荷保持能)を良好にする上で効果
があり、この意味で3〜8重量係とすべきである。CG
LのTe含有量は感光層としての光感度を良くする上で
重要であり、このために10重量%以上とすべきである
が、その上限はCGLの暗抵抗が電荷保持能に支障をき
たさない範囲にすることを考慮して5重1t%とするの
がよい。これ以上のTe含有量とすると、感光層の電荷
保持能が著しく低下し、実用に供せなくなる。厚みにつ
いては、CTLは30〜70μmにしないとその機能が
不充分となり、他方CGLは光感度の面から2〜10μ
mとするのが望ましい。その厚さを10μm以上とする
と、帯電能力の低下とその温度依存性を大きくしてしま
い、電子写真感光体として実用に供せなくなる。
Further, it is generally effective to lower the Te content of the CTL to improve charge transport ability (and charge retention ability), and in this sense, it should be in the range of 3 to 8 weight ratios. CG
The Te content of L is important for improving the photosensitivity of the photosensitive layer, and for this reason it should be 10% by weight or more, but the upper limit is set so that the dark resistance of CGL interferes with the charge retention ability. It is preferable to set the amount to 1 t% for 5 layers in consideration of keeping the amount within a range where there is no problem. If the Te content is higher than this, the charge retention ability of the photosensitive layer will be significantly reduced, making it unusable. Regarding the thickness, CTL needs to be 30 to 70 μm in order to function properly, while CGL needs to be 2 to 10 μm in terms of photosensitivity.
It is desirable to set it to m. If the thickness is 10 μm or more, the charging ability will decrease and its temperature dependence will increase, making it impossible to use it practically as an electrophotographic photoreceptor.

次に、上記したC ’I” L及びCGLO製膜方法を
第2図について説明する。この図においては、上記した
構造及び組成の感光体(但、ドラム状)を作製するため
の蒸着装置の要部が概略的に示されている。
Next, the above-mentioned C 'I'' L and CGLO film forming methods will be explained with reference to FIG. Main parts are schematically shown.

この蒸着装置では、ペルジャー(図示せず)内に蒸発源
5とこれに対向した被蒸着用アルミニウムドラム1とが
配される。蒸発源5は、容器7内に例えばTe#度が5
重量%、塩素濃度が10〜50ppnl (7)第1の
Se −Te −C4蒸発材料8と、例えばTe濃度が
22.5重量%、塩素濃度が0,5〜3ppmの第2の
Se −Te −C4蒸発材料9とを収容している。こ
のSe −Te −C4蒸発材料中のCfi含有量の測
定にはチオシアン酸第22に銀法を採用した。
In this vapor deposition apparatus, an evaporation source 5 and an aluminum drum 1 for being vaporized are placed in a pelger (not shown). For example, the evaporation source 5 has a Te# degree of 5 in the container 7.
(7) The first Se-Te-C4 evaporation material 8 and the second Se-Te-C4 evaporation material 8 with a Te concentration of 22.5 wt% and a chlorine concentration of 0.5-3 ppm, for example. -C4 evaporation material 9. The silver method for thiocyanate No. 22 was used to measure the Cfi content in this Se-Te-C4 evaporated material.

口12から制御されながらドラム1に向って飛翔するよ
うになされている。
It is designed to fly toward the drum 1 while being controlled from the mouth 12.

蒸着操作に際しては、まず低Tei度の蒸発材料8をヒ
ーター10で所定温度(例えば290℃)に例えば40
分間加熱すると、蒸発材料8の揮発度がほぼ1となって
液相と気相とが平衡になった状態で蒸気が生じるので、
第3図に示す如(Te濃度が低く(はぼ5重量%)てほ
ぼ一定な(4(10I)I)m以上)含有CTLを蒸着
することができる。次に、この第1の蒸発材料8の蒸着
終了後に第2の蒸発材料9をヒーター11で更に高温(
例えば300°C)に加熱すると第3図の如く、蒸気中
のTe9度が急激に増加し、Te濃度が高くてほぼ平担
なCM (5ppm未満)含有CGLが得られる。CG
LのTe濃度が平担となる理由は、第2の蒸発材料9か
らまず蒸発し易いSeが優先的に蒸発するが、蒸発材料
9中のSe量が減るに従ってその内部にSe蒸発量とS
e供給量とが均衡するレベルが生じるからである。即ち
、この均衡レベルによって、84発量が抑えられ(或い
はほぼ一定となV)’)、 Te蒸発量が相対的に増大
し、ついには一定となるから、得られたCGLのTe濃
度を少なくとも表面側で一定にすることができる。この
ためには蒸発の目安となるレイリー数を例えば1700
以下に設定して蒸発材料中に対流を生じないようにする
必要がある。
In the vapor deposition operation, first, the evaporation material 8 with a low Tei degree is heated to a predetermined temperature (e.g. 290°C) with a heater 10, for example, 40°C.
When heated for a minute, the volatility of the evaporative material 8 becomes approximately 1, and vapor is generated in a state where the liquid phase and the gas phase are in equilibrium.
As shown in FIG. 3, it is possible to deposit a CTL containing a low Te concentration (approximately 5% by weight) and a substantially constant content (4(10I)I)m or more). Next, after the vapor deposition of the first evaporative material 8 is completed, the second evaporative material 9 is heated to a higher temperature (
For example, when heated to 300° C.), the Te9 degree in the steam increases rapidly as shown in FIG. 3, and a CGL containing CM (less than 5 ppm) with a high Te concentration and an almost even level is obtained. CG
The reason why the Te concentration of L becomes flat is that Se, which is easy to evaporate, is preferentially evaporated from the second evaporation material 9, but as the amount of Se in the evaporation material 9 decreases, the amount of evaporated Se and S
This is because a level is created where the amount of e supply is balanced. That is, this equilibrium level suppresses the amount of 84 emitted (or keeps it almost constant V)'), and the amount of Te evaporation increases relatively and eventually becomes constant, so the Te concentration of the obtained CGL is at least It can be made constant on the surface side. For this purpose, the Rayleigh number, which is a guideline for evaporation, must be set to, for example, 1700.
It is necessary to set the following so that convection does not occur in the evaporation material.

次に、本発明による感光体(実施例1,2.3.4)の
優位性を比較例と比べた゛結果を下記表に示す。この試
験では、感光体を電子写真複写機UBix 3000 
(小西六写真工業物製)に装着し1000回の繰返し帯
′市テストを行ない、1回目と1000回目の帯電電位
の変化量ΔVB100Oと1000回目の残留電位VR
1000を測定した。
Next, the superiority of the photoreceptor according to the present invention (Examples 1, 2, 3, 4) was compared with that of a comparative example, and the results are shown in the table below. In this test, the photoreceptor was transferred to an electrophotographic copier UBix 3000.
(manufactured by Konishiroku Photo Industries) and repeated the strip test 1000 times.
1000 was measured.

この結果から明らかなように、CGL中の0℃−lを少
なくし、特に5 I)pm以下とすれば、連続コピーに
おける帯電電位の低下を小さく抑えかつ残留電位特性を
大幅に向上し、かつC’II” LではCGLよりもc
p、情を多くすることにより、更に良好な残留電位特性
が得られることが分る。
As is clear from this result, if the 0°C-l in CGL is reduced, especially to 5 I) pm or less, the drop in charging potential during continuous copying can be suppressed to a small level, and the residual potential characteristics can be greatly improved. C'II"L is more c than CGL
It can be seen that even better residual potential characteristics can be obtained by increasing the amount of p.

以上、本発明を例示したが、上述の例は本発明の技術的
思想に基いて更に変形が可能である。
Although the present invention has been illustrated above, the above-mentioned example can be further modified based on the technical idea of the present invention.

【図面の簡単な説明】[Brief explanation of the drawing]

図面は本発明の実施例を示すものであって、第1図は感
光体の断面図、 第2図は真空蒸着装置の要部概略図、 第3図は感光体のTe9度プロファイルを示す図、であ
る。 なお、図面に示されている符号において、1・・・・導
電性基体 2・・・・電荷輸送層(CTL) 3・・・・IK荷発生層(CGL) 8・・・・第1の蒸発材料 9・・・・番2の蒸発材料 10、11−・ヒーター 12・・・・開口 である。 第110 第21図 第31羽 Rh (P7rL1
The drawings show embodiments of the present invention, in which Fig. 1 is a cross-sectional view of a photoreceptor, Fig. 2 is a schematic diagram of main parts of a vacuum evaporation apparatus, and Fig. 3 is a diagram showing a Te9 degree profile of the photoreceptor. , is. In addition, in the symbols shown in the drawings, 1... Conductive substrate 2... Charge transport layer (CTL) 3... IK charge generation layer (CGL) 8... First layer Evaporation material 9...No. 2 evaporation material 10, 11--Heater 12...Opening. 110 Figure 21 31st wing Rh (P7rL1

Claims (1)

【特許請求の範囲】 1、ハロゲンt 599m未満含有するセレン−テルル
合金からなる電荷発生層と、この電荷発生層よりもハロ
ゲン含有量が多くかつテルル含有量が少ないセレン−テ
ルル合金からなる電荷輸送層とを有することを特徴とす
る感光体。 2、ハロゲンが塩素原子である、特許請求の範囲の第1
項に記載した感光体。 3、電荷輸送層のテルル含有量が3〜8N量嗟であり、
電荷発生層のテルル含有量が10〜25重量%である、
特許請求の範囲の第1項又は第2項に記載した感光体。 4、  ’tk;、荷輸送層の厚みが30〜70μmで
あり、電荷発生層の厚みが2〜10μmである、特許請
求の範囲の第1項〜第3項のいずれか1項に記載した感
光体。
[Claims] 1. A charge generation layer made of a selenium-tellurium alloy containing less than 599 m of halogen t, and a charge transporting layer made of a selenium-tellurium alloy containing more halogen and less tellurium than this charge generation layer. A photoconductor characterized by having a layer. 2. The first claim in which the halogen is a chlorine atom
Photoreceptor described in section. 3. The tellurium content of the charge transport layer is 3 to 8N,
The charge generation layer has a tellurium content of 10 to 25% by weight.
A photoreceptor according to claim 1 or 2. 4, 'tk;, as described in any one of claims 1 to 3, wherein the cargo transport layer has a thickness of 30 to 70 μm, and the charge generation layer has a thickness of 2 to 10 μm. Photoreceptor.
JP15424582A 1982-09-04 1982-09-04 Photoreceptor Pending JPS5944056A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15424582A JPS5944056A (en) 1982-09-04 1982-09-04 Photoreceptor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15424582A JPS5944056A (en) 1982-09-04 1982-09-04 Photoreceptor

Publications (1)

Publication Number Publication Date
JPS5944056A true JPS5944056A (en) 1984-03-12

Family

ID=15580002

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15424582A Pending JPS5944056A (en) 1982-09-04 1982-09-04 Photoreceptor

Country Status (1)

Country Link
JP (1) JPS5944056A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61204637A (en) * 1985-03-04 1986-09-10 ゼロツクス コーポレーシヨン Multi-layer type image forming member
JPS61273550A (en) * 1985-05-25 1986-12-03 リツエンツイア・パテント−フエルヴアルツングス−ゲゼルシヤフト・ミツト・ベシユレンクテル・ハフツング Recording material for xerography

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61204637A (en) * 1985-03-04 1986-09-10 ゼロツクス コーポレーシヨン Multi-layer type image forming member
JPS61273550A (en) * 1985-05-25 1986-12-03 リツエンツイア・パテント−フエルヴアルツングス−ゲゼルシヤフト・ミツト・ベシユレンクテル・ハフツング Recording material for xerography

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