JPS5937446A - Irradiance monitor device for light-proof test equipment - Google Patents
Irradiance monitor device for light-proof test equipmentInfo
- Publication number
- JPS5937446A JPS5937446A JP14874882A JP14874882A JPS5937446A JP S5937446 A JPS5937446 A JP S5937446A JP 14874882 A JP14874882 A JP 14874882A JP 14874882 A JP14874882 A JP 14874882A JP S5937446 A JPS5937446 A JP S5937446A
- Authority
- JP
- Japan
- Prior art keywords
- irradiance
- light
- ultraviolet
- monitor
- lamp
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N17/00—Investigating resistance of materials to the weather, to corrosion, or to light
- G01N17/004—Investigating resistance of materials to the weather, to corrosion, or to light to light
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- Life Sciences & Earth Sciences (AREA)
- Biodiversity & Conservation Biology (AREA)
- Ecology (AREA)
- Environmental & Geological Engineering (AREA)
- Environmental Sciences (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Testing Resistance To Weather, Investigating Materials By Mechanical Methods (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
Abstract
Description
【発明の詳細な説明】
本発明は、人工光源を用い友耐光性試験装置において光
源から試験片にあたる特定波長の紫外線の分光放射照度
の経時変化および試験中の積算値を求めると共に、ラン
プの点灯条件が適正に保たれているか否かを監視するた
めの耐光性試験装置用放射照度モニター装置に関するも
のである。DETAILED DESCRIPTION OF THE INVENTION The present invention uses an artificial light source to determine the change over time in the spectral irradiance of ultraviolet rays of a specific wavelength that hits a test piece from the light source and the integrated value during the test. The present invention relates to an irradiance monitor device for a light resistance test device for monitoring whether conditions are being maintained appropriately.
このような目的のために従来から光電式光センサーを用
いた光モニター装置が用いらｎているが、種々な欠点を
持っている。例えば光電式光センサーの分光感度が温度
の影響全骨けその影響が波長によって異ること、又暗電
流が温度によって変ること１等が知られているにもかか
わらず従来のものは光センサーの温度について注意が払
われていなかった。Although optical monitoring devices using photoelectric optical sensors have been used for this purpose, they have various drawbacks. For example, although it is known that the spectral sensitivity of photoelectric photosensors is affected by temperature, the effects of whole bones differ depending on the wavelength, and that dark current changes depending on temperature, conventional photosensors No attention was paid to temperature.
本発明においては光センサーの温度を一定に調節制御す
ることによってこのような欠点を除いたものである。The present invention eliminates this drawback by controlling the temperature of the optical sensor to be constant.
また従来のものは耐光性を試験する材料が表化する波長
領域の紫外線の放射照度またはその時間積算値をモニタ
ーしているが、可視部の狭い特定波長のモニターは行な
われていない、一般に人工光源の放射照度は点灯条件を
一定に保った場合に点灯時間の経過に従って低下するが
、その傾向すなわち動程曲線は第１図のようである。可
視部のある波長の放射照度は第１図のａのようにわずか
の低下を示し、紫外部のある波長は第１３図すのように
可視部にくらべてはるかに大きな低下を示す。In addition, conventional methods monitor the irradiance of ultraviolet rays in the wavelength range expressed by the material being tested for light resistance, or its time-integrated value, but monitoring of specific wavelengths in the narrow visible region is not carried out.Generally, artificial When the lighting conditions are kept constant, the irradiance of the light source decreases as the lighting time elapses, and the tendency, that is, the movement curve, is as shown in FIG. The irradiance at a certain wavelength in the visible region shows a slight decrease as shown in a in FIG. 1, and the irradiance at a certain wavelength in the ultraviolet region shows a much larger decrease compared to the visible region as shown in FIG. 13.
点灯条件が一定に保たれない場合、例えば電源電圧が変
動する場合には放射照度は電源電圧の二乗秒度に比例し
て変化するので、可視部でも第１図のａにくらべて大き
な変動を示す。更に光源として紫外線螢光ランプを用い
た場合にはランプの周囲温度と風速とによってランプ温
度が変化し、全波長域の放射温度の影響を受ける。If the lighting conditions are not kept constant, for example if the power supply voltage fluctuates, the irradiance will change in proportion to the square second of the power supply voltage, so even in the visible area there will be large fluctuations compared to a in Figure 1. show. Furthermore, when an ultraviolet fluorescent lamp is used as a light source, the lamp temperature changes depending on the ambient temperature of the lamp and the wind speed, and is affected by the radiation temperature in the entire wavelength range.
このように点灯条件を監視するためには紫外部だけでな
く可視部の変化の少ない波長の光をモニターする必要が
あり、そのためには可視部全領域でなく変化の少ない波
長領域をモニターしなければならない。In order to monitor the lighting conditions in this way, it is necessary to monitor not only the ultraviolet region but also the visible region, which has wavelengths that do not change much.To do this, it is necessary to monitor not only the entire visible region but also the wavelength region that does not change much. Must be.
これらを満足させるために、本発明においては２個以上
の光電式光センサーを、自動温度制御装置を備えた同一
の例へばアルミニウム製の金属ノコツク中に取付けるこ
とによって、全ての光センサーが一定温度に保之れるよ
うにして複数波長での放射照度を同時に測定し、可視部
の一波長での測定を点灯条件の監視に利用し、紫外部の
一波長または複数波長での測定をランプの劣化の監視と
試験試料の受光部のモニターに利用し次。又、放射照度
とその時間積算値は共に重要なので、両者を同時にモニ
ターできるようにしｔものである。In order to satisfy these requirements, in the present invention, two or more photoelectric light sensors are installed in the same example, such as a metal saw socket made of aluminum, equipped with an automatic temperature control device, so that all the light sensors can be kept at a constant temperature. The irradiance can be measured at multiple wavelengths at the same time, and measurements at one wavelength in the visible range can be used to monitor lighting conditions, and measurements at one or multiple wavelengths in the ultraviolet range can be used to monitor lamp deterioration. Used for monitoring and monitoring of the light receiving part of the test sample. Furthermore, since both the irradiance and its time integrated value are important, it is desirable to be able to monitor both at the same time.
以下に第２図及び第８図に基いて本発明の実施例を具体
的に説明する。Embodiments of the present invention will be specifically described below with reference to FIGS. 2 and 8.
第２図は本発明に係る受光部の断面であって、本実施例
では紫外部と可視部と全夫々−波長づつの放射照度を測
定することが出来るものである。FIG. 2 is a cross section of the light receiving section according to the present invention, and in this embodiment, it is possible to measure the irradiance of each wavelength in the ultraviolet region and the visible region.
■及び１′は受光部のコサイン特性改善のための拡散板
で、焼結アルミナ板又は砂すり石英板を採用しである。2 and 1' are diffuser plates for improving the cosine characteristics of the light receiving section, which are made of sintered alumina or sanded quartz.
２及びτはモニターすべき波長の光を通過させる友めの
干渉フィルターで、該干渉フィルター２としては紫外用
で最大透過波長の誤差土面以内、透過中値幅１０ｎｍ程
度のものを用いである。2 and τ are companion interference filters that allow light of the wavelength to be monitored to pass through. The interference filter 2 is for ultraviolet use, and has a maximum transmission wavelength within an error range of about 10 nm, and a median transmission width of about 10 nm.
最大透過波長は光源の分光特性、試験試料の光劣化の作
用波長、フィルターの入手し易さ、などから決定するも
のである。３１８ｎｍ、 ８６５ｎｍなど水銀輝線スペ
クトルに相当する波長のものが入手し易い。光源として
紫外線螢光ランプを使う場合には螢光体から発光する連
続スペクトル光と上記輝線スペクトル光とをまとめて測
定することになる。ここでは８１８ｎｍのものを用いた
が、３１３土１０ｎｍすなわち８０８ｎｍ から８２８
ｎｍまでの紫外線放射照度を求めるとは考えず、８１８
ｎｍにおける分光放射照度ｖｉ−１０ｎｍの波長幅で測
定するものと考えて値付けした・ただし紫外部干渉フィ
ルターの分光透過率は最大透過波長を中心として左右不
対称である。The maximum transmission wavelength is determined based on the spectral characteristics of the light source, the wavelength at which the test sample undergoes photodegradation, the availability of filters, etc. Those with wavelengths corresponding to the mercury emission line spectrum, such as 318 nm and 865 nm, are easily available. When an ultraviolet fluorescent lamp is used as a light source, the continuous spectrum light emitted from the fluorescent material and the bright line spectrum light described above are measured together. Here, 818 nm was used, but 313 nm is 10 nm, or 808 nm to 828 nm.
Without thinking of finding the ultraviolet irradiance down to 818 nm,
The spectral irradiance in nm was determined based on the assumption that it was measured in a wavelength width of vi - 10 nm.However, the spectral transmittance of an ultraviolet interference filter is asymmetrical with respect to the maximum transmission wavelength.
前記した干渉フィルターゾは可視部用干渉フィルターで
、紫外線螢光ランプ光源の場合に最大透過波長５４６±
ｌｎｍ、透過中値幅８ｎｍ透過率の左右対称性のよいも
のを用いた。これは螢光ランプの株色の水銀輝線に相当
する波長を監視するもので、この波長の光は第１図で示
すようにランプの劣化にともなう経時変化が少ない。The interference filter mentioned above is an interference filter for the visible region, and has a maximum transmission wavelength of 546± when using an ultraviolet fluorescent lamp light source.
1 nm, transmission median width 8 nm, and good left-right symmetry of transmittance were used. This monitors the wavelength corresponding to the mercury emission line of the stock color of a fluorescent lamp, and as shown in FIG. 1, light of this wavelength changes little over time as the lamp deteriorates.
紫外線螢光ランプではこの領域に螢光体発光はなく５５
４６簡における輝線の放射照度だけを測定していること
になる。In ultraviolet fluorescent lamps, there is no phosphor emission in this region55
This means that only the irradiance of the bright line at 46 points is measured.
８及びぎは光センサーへの斜入射を防止するための光ガ
イドでハニカム状に形成しである。干渉フィルター２及
びτは斜入射によって透過波長が変るので、測定する波
長領域を正確に保ち九い場合に必要であるが、相対的モ
ニターで充分な場合には省略することもできる。The eighth beam is a light guide formed in a honeycomb shape to prevent oblique incidence on the light sensor. Since the transmission wavelength of the interference filter 2 and τ changes due to oblique incidence, they are necessary to accurately maintain the wavelength range to be measured, but can be omitted if relative monitoring is sufficient.
４及び４′は光センサーとしてのシリコンフォトダイオ
ードで、同一性能のものを前記干渉フィルター２及びゾ
との組合せによって４は紫外部４′は可視部用とする。Reference numerals 4 and 4' designate silicon photodiodes as optical sensors, which have the same performance and are combined with the interference filters 2 and 2 for use in the ultraviolet region and 4' in the visible region.
可視部の放射照度が大きすぎる場合には干渉フィルター
２′と光センサ−４′との間にフォトエツチングによる
金属減光板（図示せず）を入れて入射光を調節できる。If the irradiance in the visible region is too large, a photo-etched metal attenuation plate (not shown) may be inserted between the interference filter 2' and the optical sensor 4' to adjust the incident light.
更に紫外部の測定波長の数をふやす場合には金属ブロッ
ク７としてのアルミニウムブロック内に上記と同様な受
光系を増設すればよい。Furthermore, if the number of measurement wavelengths in the ultraviolet region is to be increased, a light receiving system similar to the above may be added within the aluminum block serving as the metal block 7.
５＃′ｉ温度センサー、６け半導体発熱体であり、金属
ブロック７としてのアルミニウムブロック内の温度を一
定に保つために用いられる。８けシリカゲルであって、
アルミニウムブロック内を乾燥させるものである。紫外
用干渉フィルター２に組合された黒色のバンドパスフィ
ルター（図示せず）は特に水蒸気によって加水分解劣化
するので、ブロック７内ｔｆｉＯリングとハーメチック
シール９で完全に防湿構造としである。5#'i temperature sensor, 6 semiconductor heating elements, used to keep the temperature inside the aluminum block as the metal block 7 constant. 8 silica gel,
This is to dry the inside of the aluminum block. Since the black bandpass filter (not shown) combined with the ultraviolet interference filter 2 is particularly susceptible to hydrolytic deterioration due to water vapor, it has a completely moisture-proof structure with the TFIO ring inside the block 7 and the hermetic seal 9.
１０はブロック支持および測定回路を通すためのパイプ
である。１１は熱絶縁用高分子発泡体で、表面は光劣化
を防止するためアルミニウム箔などで包んである。10 is a pipe for passing the block support and measurement circuit. 11 is a heat insulating polymer foam whose surface is wrapped with aluminum foil or the like to prevent photodeterioration.
第８図は測光回路および温度調節回路のブロックダイヤ
グラムである。FIG. 8 is a block diagram of the photometric circuit and temperature control circuit.
１８及び１８′は光センサ−（４，４′）の光電流を電
圧に変換する光電流−電圧変換回路であり、電流測定用
ＩＣの負帰還抵抗を変えることにより又次段増幅回路の
増幅率を変えることによって感度を調整するよう成しで
ある。又感度の値付（７）
けは分光放射照度標準ランプによって値付けされたハロ
ゲンランプを用いて行なう。18 and 18' are photocurrent-to-voltage conversion circuits that convert the photocurrent of the optical sensor (4, 4') into voltage, and by changing the negative feedback resistance of the current measurement IC, the amplification of the next stage amplifier circuit is The sensitivity can be adjusted by changing the ratio. Sensitivity valuation (7) is carried out using a halogen lamp whose spectral irradiance is rated according to a standard lamp.
１２及び１２′は光電流−電圧変換回路（１８，１８’
）で測定さ几た電圧値全周波数に変換する電圧−周波数
変換回路、１８及び１３′は短時間の積分で瞬間の放射
照度を計算する演算回路、１４及び１（は照射の開始か
ら終了まで積分をっｙけて積算放射照度を計算する積分
回路である。１５薦１５’はそれらをディジタル表示す
る表示器である。12 and 12' are photocurrent-voltage conversion circuits (18, 18'
18 and 13' are arithmetic circuits that calculate the instantaneous irradiance by short-time integration. This is an integration circuit that calculates the integrated irradiance by taking the integrals.15 and 15' is a display that digitally displays them.
又必要に応じてディジタルプリントすることもできる。It can also be digitally printed if necessary.
１６はアナログ除算回路であり、紫外／可視の比率を求
めることができるように成しである。Reference numeral 16 denotes an analog division circuit, which is constructed so that the ultraviolet/visible ratio can be determined.
温度センサー６としては絶対温度測定用ＩＣを用い、温
度調節回路１７によって半導体発熱体６の発熱を自動制
御してアルミニウムブロック７を一定温度に保つように
成しである。As the temperature sensor 6, an IC for absolute temperature measurement is used, and the temperature control circuit 17 automatically controls the heat generation of the semiconductor heating element 6 to maintain the aluminum block 7 at a constant temperature.
光センサ一温度は暗電流減少の点からは低い方が望まし
いが、簡易化のため加熱保温としである。設定温度は周
囲の窒気湛度の予想最高値と（８）
しである。Although it is desirable that the temperature of the optical sensor be low from the point of view of reducing dark current, it is heated and kept warm for the sake of simplicity. The set temperature is the expected maximum value of the ambient nitrogen content (8).
次に叙上の構成から成る本発明の作用について説明する
。Next, the operation of the present invention having the above configuration will be explained.
一定温度に制御され友金属ブロック７内の光センサ−４
に拡散板１、干渉フィルター２．光ガイド８を介して光
源（図示せず）からの紫外部の特定波長を入射せしめる
と同時に光センサーイに拡散板１′、干渉フィルター２
′、光ガイド８′を介して光源からの可視部の特定波長
を入射せしめる。Optical sensor 4 inside friend metal block 7 controlled to a constant temperature
A diffuser plate 1, an interference filter 2. A specific wavelength of ultraviolet light from a light source (not shown) is made incident through a light guide 8, and at the same time a diffuser plate 1' and an interference filter 2 are applied to the light sensor.
', a specific wavelength in the visible range from the light source is made incident through the light guide 8'.
光センサ−（４，４’）に入射した光は光電流−電圧変
換回路（１８，１８’ ）により電気信号に変換され、
次段で電圧−周波数変換回路（１２゜１２′）により周
波数に変換さｎ１演算回路ｏ８．１ Ｂ’ ） 、積分
回路（１４，１４Ｊｔ−介して表示器（１５，１５’
） に放射照度がデジタル表示せしめらｎる。The light incident on the optical sensor (4, 4') is converted into an electrical signal by the photocurrent-voltage conversion circuit (18, 18'),
In the next stage, the voltage is converted into a frequency by the voltage-frequency conversion circuit (12°12'), the n1 arithmetic circuit (o8.1B'), and the display (15,15')
) The irradiance is displayed digitally.
而して１本発明は叙上の如き構成及び作用を有するもの
で、特に温度調節をした光センサーに少なくとも紫外部
と可視部の２つの特定波長の光を同時に入射すべく成し
たので、高精度の測定を簡単に行い得る等の効果がある
。Therefore, 1. the present invention has the structure and function as described above, and is designed to allow light of at least two specific wavelengths, ultraviolet and visible, to simultaneously enter a temperature-controlled optical sensor. This has advantages such as being able to easily measure accuracy.
第１図は螢光灯から放射される紫外部ａ及び可視部すの
放射照度の時間に対する一般的変化を表わす図で、横軸
に時間ｔ１縦軸に放射照度Ｑを採っである。
第２図は本発明に係るモニター装置の概略図、第８図は
同じくその電気回路のブロックダイヤグラムである。
４．４’・ｉセンサー ５・・・温度センサー７・・
・金属ブロック １５．１５’・・・表示器特許出願
人 峰 松 陽 −
第１図
命嘔 １−−
第２図
第３図
６FIG. 1 is a diagram showing general changes over time in the irradiance of ultraviolet a and visible light emitted from a fluorescent lamp, with time t1 plotted on the horizontal axis and irradiance Q plotted on the vertical axis. FIG. 2 is a schematic diagram of a monitor device according to the present invention, and FIG. 8 is a block diagram of its electric circuit. 4.4'・i sensor 5...temperature sensor 7...
・Metal block 15.15'...Display patent applicant Hiroshi Minematsu - Figure 1 Meiyo 1-- Figure 2 Figure 3 Figure 6
Claims (1)
化の小さい可視部の特定波長の放射照度とを、一定温度
に調節制御された金属ブロックケース内においた二個又
はそれ以上の数の光電光センサーによって同時に測定し
、可視部を基準にして紫外部の放射照度の経時低下およ
び光源ランプの点灯条件の維持状態をモニターすること
を特徴とする耐光性試験機用放射照度モニター装置The irradiance of a specific wavelength in the ultraviolet region, which has a large change over time, and the irradiance at a specific wavelength in the visible region, which has a small change over time, can be controlled by two or more photoelectrons placed in a metal block case whose temperature is controlled to a constant temperature. An irradiance monitoring device for a light fastness tester, characterized in that the irradiance is simultaneously measured by a light sensor and the irradiance in the ultraviolet region is monitored over time with respect to the visible region, and the lighting conditions of the light source lamp are maintained.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14874882A JPS5937446A (en) | 1982-08-26 | 1982-08-26 | Irradiance monitor device for light-proof test equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14874882A JPS5937446A (en) | 1982-08-26 | 1982-08-26 | Irradiance monitor device for light-proof test equipment |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5937446A true JPS5937446A (en) | 1984-02-29 |
| JPH0216982B2 JPH0216982B2 (en) | 1990-04-19 |
Family
ID=15459738
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP14874882A Granted JPS5937446A (en) | 1982-08-26 | 1982-08-26 | Irradiance monitor device for light-proof test equipment |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5937446A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH02115726A (en) * | 1988-10-25 | 1990-04-27 | Matsushita Electric Works Ltd | Measuring instrument for quantity of reception light |
| JP2016038387A (en) * | 2014-08-07 | 2016-03-22 | アトラス マテリアル テスティング テクノロジー ゲゼルシャフト ミット ベシュレンクテル ハフツング | Sensor device including a plurality of sensors for exposure device |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0415783U (en) * | 1990-05-29 | 1992-02-07 |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5429034U (en) * | 1977-07-29 | 1979-02-26 |
-
1982
- 1982-08-26 JP JP14874882A patent/JPS5937446A/en active Granted
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5429034U (en) * | 1977-07-29 | 1979-02-26 |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH02115726A (en) * | 1988-10-25 | 1990-04-27 | Matsushita Electric Works Ltd | Measuring instrument for quantity of reception light |
| JPH0529857B2 (en) * | 1988-10-25 | 1993-05-06 | Matsushita Electric Works Ltd | |
| JP2016038387A (en) * | 2014-08-07 | 2016-03-22 | アトラス マテリアル テスティング テクノロジー ゲゼルシャフト ミット ベシュレンクテル ハフツング | Sensor device including a plurality of sensors for exposure device |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0216982B2 (en) | 1990-04-19 |
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