JPS5927205A - Method for detecting applied film - Google Patents
Method for detecting applied filmInfo
- Publication number
- JPS5927205A JPS5927205A JP13710982A JP13710982A JPS5927205A JP S5927205 A JPS5927205 A JP S5927205A JP 13710982 A JP13710982 A JP 13710982A JP 13710982 A JP13710982 A JP 13710982A JP S5927205 A JPS5927205 A JP S5927205A
- Authority
- JP
- Japan
- Prior art keywords
- light
- thickness
- coating film
- applied film
- wavelengths
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
- G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
Abstract
Description
【発明の詳細な説明】
この発明は接着剤等の塗膜の厚さ検出方法に関するもの
である。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a method for detecting the thickness of a coating film such as an adhesive.
従来より、人工化粧単板の製造においては、素材単板上
に接着剤を一定の厚さで塗布し、ついで素材単板を多数
枚積層し、金星で圧締接着してフリッチを得、このフ′
リッチをスフイスして板目模様または柾目模様を有する
化粧単板を得ていた。Conventionally, in the production of artificial decorative veneers, adhesive is applied to a material veneer at a certain thickness, then a large number of material veneers are laminated, and the material is pressed and bonded with Venus to obtain a flitch. centre'
A decorative veneer with a grain pattern or a straight grain pattern was obtained by swissing the rich material.
これらの一連の工程における１つの問題点は接着剤を意
図したとおシの塗膜で素材単板に均一に塗布するのが困
難であるという点にある。とくに、接着剤の塗布を連続
的に行なう場合、単板上の膜厚が不均一になシやすい。One problem with these series of steps is that it is difficult to uniformly apply a film intended for adhesive to the veneer material. In particular, when adhesive is applied continuously, the film thickness on the veneer tends to become uneven.
そのため、接着剤塗布作業の間、絶えず塗膜の厚さを管
理しなければならない。Therefore, the thickness of the coating must be constantly controlled during the adhesive application process.
ところが、連続的な塗布作業の間に塗膜の厚さを速やか
にかつ正確に検出することは困難であり、また塗膜表面
に腸って触れたりするなどの問題があった。However, it is difficult to quickly and accurately detect the thickness of the coating film during continuous coating operations, and there are also problems such as touching the surface of the coating film.
したがって、この発明の目的は、塗膜の厚さを自動的に
かつ非接触で検出でき、膜厚の管理を著しく容易に行な
うことができる塗膜の厚さ検出方法を提供することであ
る。Therefore, an object of the present invention is to provide a method for detecting the thickness of a coating film that can automatically and non-contactly detect the thickness of the coating film and that can significantly facilitate the management of the coating thickness.
この発明の一実施例を第１図に基づいて説明する。すな
わち、この塗膜の厚さ検出方法は、第１図に示すように
、塗布ロール１上の接着剤の塗膜２に所定波長の赤外線
を照射し、その反則光を受光器３で受けて塗膜の厚さを
検出するものである。An embodiment of the present invention will be described based on FIG. That is, as shown in FIG. 1, this coating film thickness detection method irradiates the adhesive coating 2 on the coating roll 1 with infrared rays of a predetermined wavelength, and receives the reflected light with the receiver 3. It detects the thickness of the coating film.
すなわち、前記赤外ｔａｈ接着剤である塗布物のみに吸
＋１．ｇされ塗布ロールＩＫ吸収されない波長λ□と、
塗布物および塗布ロールのいずれにも吸収されない波長
λ２とを含む。このような２つの波長λ、。That is, only the infrared tah adhesive applied has +1. wavelength λ□ which is not absorbed by the coating roll IK,
wavelength λ2 that is not absorbed by either the coating material or the coating roll. Two such wavelengths λ,.
λ２の光を塗布ロール１上の塗膜２に照射することによ
り、それらの反射した光の比（反射出力比）で塗膜２の
厚さを検出するものである。By irradiating the coating film 2 on the coating roll 1 with light of λ2, the thickness of the coating film 2 is detected by the ratio of the reflected lights (reflection output ratio).
塗イ１ｊ物がポリウレタン接着剤である場合、前記波長
λ□はポリウレタン中のＮＣＯ基の吸収波長である２３
７５ｃｍ とし、この波長を含む２４００ｃｍ 付
近の赤外線を赤外線投光器より照射する。赤外線の照射
は投光器を塗布ロール１上の塗膜２のほぼ全幅にわたっ
て往復動させて行なう。塗膜２がら反射した光は放物面
鏡４で反射され、回転ミツ−５によって集光レンズ６を
経て波長セレクタ７に到達する。波長セレクタ７は波長
λ、の光を透過させ、波長λ２の光を反射して両波長λ
□、λ２を分割する。第１図において、８は反射ミツ−
である。When the coating material is a polyurethane adhesive, the wavelength λ□ is the absorption wavelength of the NCO group in the polyurethane23
75 cm, and infrared light around 2400 cm, which includes this wavelength, is irradiated from an infrared projector. The infrared rays are irradiated by reciprocating the projector over almost the entire width of the coating film 2 on the coating roll 1. The light reflected from the coating film 2 is reflected by the parabolic mirror 4 and reaches the wavelength selector 7 via the condensing lens 6 by the rotating mirror 5. The wavelength selector 7 transmits light of wavelength λ, reflects light of wavelength λ2, and selects both wavelengths λ.
□, divide λ2. In Fig. 1, 8 is a reflection point.
It is.
分割された波長λ□。λ２の光はそれぞれの受光累子（
ＰｂＳｅ） ９ 、１０によって検出される。各受光累
子９．１０はそれぞれの増幅回路１１．１２に接続され
、さらに割算回路１３で波長λ、とλ、との反射出力比
を検出し、ついで比較回路１４により基準ＭＬ（Ｌ、き
い値）と比較する。Divided wavelength λ□. The light of λ2 is transmitted through each light-receiving crystal (
PbSe) 9,10. Each photodetector 9.10 is connected to its own amplifier circuit 11.12, and a dividing circuit 13 detects the reflected output ratio of the wavelengths λ and λ, and then a comparison circuit 14 detects the reference ML (L, threshold).
このようＫすると、反射出力比が基準値より大なるとき
は、単板１５に塗布むらが生じていると判断することが
できる。したがって、これをロールコータ１６にフィー
ドバック［、，３１１ｍロール１１トクタロール１′間
のギャップやロールスピードを変えて適正な塗布量にＶ
＠整することができるのである。When K is determined in this manner, it can be determined that coating unevenness has occurred on the veneer 15 when the reflection output ratio is greater than the reference value. Therefore, this is fed back to the roll coater 16 [,, 311m by changing the gap between the rolls 11 and the roll speed and the roll speed to adjust the coating amount to an appropriate amount.
@It is possible to adjust.
この発明の他の実施例を第２図に基づいて説明する。す
なわち、この塗膜の厚さ検出方法は、第２図に示すよう
に、接着剤の塗膜厚の検出を単板１５′」二で行なうも
のである。Another embodiment of the invention will be described based on FIG. That is, in this coating film thickness detection method, as shown in FIG. 2, the adhesive coating thickness is detected using a single plate 15'.
この場合、位置決めの容易さから単板１５′が塗布ロー
ルｌを脱出した直後で塗膜２′の厚さを検出してｈる。In this case, for ease of positioning, the thickness of the coating film 2' is detected immediately after the veneer 15' escapes from the coating roll l.
その他は前述の実施例と同様である。The rest is the same as the previous embodiment.
この発明のさら（支）他の実施例を＄３図ないし第６図
に基づいて説明する。すなわち、この捗膜の厚さ検出方
法は、第３図ないし第６図に示すように、レーザ発Ｊ辰
器１６よυ集光レンズ１７を経てレーザ（以下、単に光
という）を所定の入射角で塗布ロールｌ上の塗膜２′に
照射し、塗膜表面で反射した光と、塗膜裏面で反射した
光との間隙を求め、この間隙から演算によって塗膜２′
の厚さを得るものである。Further embodiments of the present invention will be described with reference to Figures 3 to 6. That is, as shown in FIGS. 3 to 6, this method of detecting the thickness of the film is performed by injecting a laser (hereinafter simply referred to as light) into a laser beam through a laser emitting device 16 and a condensing lens 17. The coating film 2' on the coating roll l is irradiated at the corner, and the gap between the light reflected on the surface of the coating film and the light reflected on the back side of the coating film is calculated, and the coating film 2' is calculated from this gap.
thickness.
すな６ち、第５図に示すように、塗布ロール１上の塗膜
２’に光を入射角θで照射すると、入射光は塗膜２′の
表面反射光１８と裏面反射光１９とに分かれる。その際
、塗膜２′内に入る裏面反射光１９は屈折し、その屈折
率ｎは
・く■
で表わされる。塗膜２の厚さをｔとすると表面反射光１
８と裏面反射光１９との間隙ｔはｔ ＝ ２ ｔ −Ｌ
Ｊｎδｍ５ｉｎ（−！−θ）となる。したがって、塗膜
２′の厚さｔはｔ＝−、ｔ−−−一−
２００１１θ９ ｓｉｎδ
となる、そのため、入射角θと塗膜２′の屈折率ｎが既
知であれば、塗膜２′の検出が可能となる。In other words, as shown in FIG. 5, when light is irradiated onto the coating film 2' on the coating roll 1 at an incident angle θ, the incident light is divided into a surface reflected light 18 and a back surface reflected light 19 of the coating film 2'. Divided into. At this time, the back-reflected light 19 entering the coating film 2' is refracted, and its refractive index n is expressed by . When the thickness of the coating film 2 is t, the surface reflected light 1
The gap t between 8 and the back reflected light 19 is t = 2 t - L
Jnδm5in(-!-θ). Therefore, the thickness t of the coating film 2' is t=-, t-----20011θ9 sin δ. Therefore, if the incident angle θ and the refractive index n of the coating film 2' are known, the coating film 2' detection becomes possible.
そこで、第３図に示すように、光を塗布ロール−上の塗
膜２’に所定の入射角で入射し、反射光１８゜１９をワ
インセンサカメラ２０により電気出力として取出す。ワ
インセンサカメラ２０Ｉの入力信号は比較回路２１によ
＃）２値化し、カウンタ回路２２によυ第６図に示すＡ
からＢ゛までをクロック２３からのパルスでカウントし
、それを平均北口１路で何回かくり返して平均化し、演
算回路２４で前述の式に基づく演算を行なって出力信号
を表示器２５で表示する。第６図において曲線Ｃはスフ
イスレベルを示している。また、Ａ点より立上る曲線の
ピークは表面反射光１８の光を、さらにＢ点より立上る
曲線のピークは裏面反射板１９の出力をそれぞれ示して
いる。なお、第４図において、２６は積分回路である。Therefore, as shown in FIG. 3, light is incident on the coating film 2' on the coating roll at a predetermined angle of incidence, and the reflected light 18° 19 is extracted as an electrical output by a wine sensor camera 20. The input signal of the wine sensor camera 20I is binarized by the comparator circuit 21, and is converted into a binary signal by the counter circuit 22 as shown in FIG.
The count from B to B is counted using pulses from the clock 23, and this is repeated and averaged several times using the average north exit 1 road.The arithmetic circuit 24 performs a calculation based on the above-mentioned formula, and the output signal is displayed on the display 25. do. In FIG. 6, curve C shows the Swiss level. Further, the peak of the curve rising from point A indicates the light of the front surface reflected light 18, and the peak of the curve rising from point B indicates the output of the back reflector 19, respectively. In addition, in FIG. 4, 26 is an integrating circuit.
膜厚の検出位置は、第３図に示すように位置決めの容易
さから塗布ロール１とし、このロール１の左右２点以上
を観測点として選べばよい。単板１５′に塗布した膜厚
を知るには単板１５′通過前の膜厚ｔ□と単板１５′通
過後の膜厚ｔ２とをそれぞれ検出し、ｔ□−１２を行な
うことにより、単板１５’に塗布した塗膜の厚さを知る
ことができる。As shown in FIG. 3, the film thickness detection position is set to the coating roll 1 for ease of positioning, and two or more points on the left and right sides of this roll 1 may be selected as observation points. To know the thickness of the film applied to the veneer 15', detect the film thickness t□ before passing through the veneer 15' and the film thickness t2 after passing through the veneer 15', and perform t□-12. It is possible to know the thickness of the coating film applied to the veneer 15'.
このようにして、塗膜の厚さを非接触でかつ速やかに検
出することができるので、・ロールコータ１６’にフィ
ードバックしロールギャップ、ロールスピードをコント
ロールすることにより、膜厚の管理を容易に行なうこと
ができるのである。In this way, the thickness of the coating film can be detected quickly and non-contact, so the film thickness can be easily managed by feeding back to the roll coater 16' and controlling the roll gap and roll speed. It can be done.
以上のように、この発明の塗膜の厚さ検出方法は、塗膜
に光を照射し、その反射光を受光器を受けて塗膜の厚さ
を検出することにより、塗膜の厚さを自動的に速やかに
かつ非接触で検出することができ、塗膜の厚さ管理を著
しく容易にするという効果がある。As described above, the coating film thickness detection method of the present invention irradiates the coating film with light and detects the thickness of the coating film by receiving the reflected light using a light receiver. can be detected automatically, quickly, and in a non-contact manner, and has the effect of significantly facilitating coating film thickness control.
この発明に関連する塗膜の厚さを検出する他の方法を第
７図に基づいて以下に説明する。すなわち、ロールコー
タ１６′通過前の単板１５′にその両面からレーザ発振
器（、Ｈｅ−Ｎｅ ） ２７よυレーザをそれぞれ照射
し、反射光をフィンセンサカメフ２日で受けてそれぞれ
の出力から接着剤塗布前の単板１５′の厚さｔｌを検出
する。ついで、ロールコータ１６′通過後の単板１５′
に同様にしてレーザを照射し接着剤塗布後の厚さｔ２を
検出し、ｔ２−ｔｌより塗膜２′の厚さを検出するもの
である。Another method for detecting the thickness of a coating film related to the present invention will be described below with reference to FIG. That is, the veneer 15' before passing through the roll coater 16' is irradiated with a laser oscillator (He-Ne) 27 and υ laser from both sides of the veneer 15', and the reflected light is received by a fin sensor camera for 2 days and the output of each is calculated. The thickness tl of the veneer 15' before adhesive application is detected. Next, the veneer 15' after passing through the roll coater 16'
Similarly, a laser is irradiated to detect the thickness t2 after applying the adhesive, and the thickness of the coating film 2' is detected from t2-tl.
このようにしたため、前述の各実施例と同様に、塗膜２
′の厚さを速やかにかつ非接触で検出し、塗膜２′の厚
さ管理を容易に行なうことができるのである。Because of this, the coating film 2
The thickness of the coating film 2' can be detected quickly and without contact, and the thickness of the coating film 2' can be easily controlled.
第１図はこの発明の一実施例を示す説明図、第２図はこ
の発明の他の実施例を示す説明図、第３図はこの発明の
さらに他の実施例を示す説明図、瀉４図はその検出か法
を示す説明図、第５図はその厚さ検出のＷＬ理を示す説
明図、第６商は２値化された出力？ｌＩＩ］Ｅを示すグ
ラフ、第７図は厚さ検出のために採用可能な他の方法を
示す説明図である。
１・・・塗布ロール、２・・・塗膜、３・・・受光器、
７・・・波長セレクタ、９．１０・・・受光素子、１８
・・・表面反射光、１９・・・裏面反射光、２０・・・
ワインセンサカメワ
第３図
２日
１ 第６図
第５図
第７図FIG. 1 is an explanatory diagram showing one embodiment of this invention, FIG. 2 is an explanatory diagram showing another embodiment of this invention, and FIG. 3 is an explanatory diagram showing still another embodiment of this invention. The figure is an explanatory diagram showing the detection method, Figure 5 is an explanatory diagram showing the WL principle of thickness detection, and the 6th quotient is the binarized output? FIG. 7 is an explanatory diagram showing another method that can be adopted for thickness detection. 1... Coating roll, 2... Coating film, 3... Light receiver,
7... Wavelength selector, 9.10... Light receiving element, 18
...Surface reflected light, 19...Back surface reflected light, 20...
Wine Sensor Kamewa Fig. 3 Fig. 2 Day 1 Fig. 6 Fig. 5 Fig. 7
Claims (3)
けて塗膜の厚さを検出することを特徴とする塗膜の厚さ
検出方法。(1) A method for detecting the thickness of a coating film, which comprises irradiating the coating film with light and detecting the thickness of the coating film by receiving the inverse A=1 light with a light receiver.
収されない波長とを含み、これらの波長の光を塗膜に照
射し、反Ａ、１シた光を波長セレクタによって分割して
それぞれの受光素子で受け、これらの反射出力比を求め
る特許請求の範囲第（１）項記載の塗膜の厚さ検出方法
。(2) The 111 ill 13 light includes wavelengths that are absorbed by the paint film and wavelengths that are not absorbed, and the paint film is irradiated with light of these wavelengths, and the anti-A and 1-shi lights are divided by a wavelength selector and each is received. A method for detecting the thickness of a coating film according to claim (1), which receives the reflected light from an element and determines the ratio of reflected outputs thereof.
膜表面で反射した光と、塗膜裏面で反射した光との間隙
ｔ４求め、式： （式中、ｔは塗膜の厚さ、θは入射角、δは屈折角）に
より塗膜の厚さを検出する特許請求の範囲第（１）項記
載の塗膜の厚さ検出方法。(3) The above-mentioned light is incident on the coating film at a predetermined angle of incidence, and the gap t4 between the light reflected on the coating film surface and the light reflected on the back surface of the coating film is calculated using the formula: The method for detecting the thickness of a coating film according to claim (1), wherein the thickness of the coating film is detected based on the thickness, θ is the angle of incidence, and δ is the angle of refraction.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13710982A JPS5927205A (en) | 1982-08-05 | 1982-08-05 | Method for detecting applied film |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13710982A JPS5927205A (en) | 1982-08-05 | 1982-08-05 | Method for detecting applied film |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS5927205A true JPS5927205A (en) | 1984-02-13 |
Family
ID=15191047
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP13710982A Pending JPS5927205A (en) | 1982-08-05 | 1982-08-05 | Method for detecting applied film |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5927205A (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH02108905A (en) * | 1988-09-07 | 1990-04-20 | Texas Instr Inc <Ti> | Two laser interferometer for measuring growth of film at site |
| EP0428717A1 (en) * | 1989-05-09 | 1991-05-29 | WENIGER, Richard Joseph | Optical sensor for detecting quantity of protective coating |
| JPH03199942A (en) * | 1989-12-27 | 1991-08-30 | Chino Corp | Coating-amount measuring apparatus |
| JP2002022417A (en) * | 2000-07-13 | 2002-01-23 | Disco Abrasive Syst Ltd | Thickness measuring device |
-
1982
- 1982-08-05 JP JP13710982A patent/JPS5927205A/en active Pending
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH02108905A (en) * | 1988-09-07 | 1990-04-20 | Texas Instr Inc <Ti> | Two laser interferometer for measuring growth of film at site |
| EP0428717A1 (en) * | 1989-05-09 | 1991-05-29 | WENIGER, Richard Joseph | Optical sensor for detecting quantity of protective coating |
| EP0428717A4 (en) * | 1989-05-09 | 1993-06-09 | Richard Joseph Weniger | Optical sensor for detecting quantity of protective coating |
| JPH03199942A (en) * | 1989-12-27 | 1991-08-30 | Chino Corp | Coating-amount measuring apparatus |
| JP2002022417A (en) * | 2000-07-13 | 2002-01-23 | Disco Abrasive Syst Ltd | Thickness measuring device |
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