JPS59162689A - Word line discharge circuit of semiconductor memory - Google Patents

Word line discharge circuit of semiconductor memory

Info

Publication number
JPS59162689A
JPS59162689A JP58037028A JP3702883A JPS59162689A JP S59162689 A JPS59162689 A JP S59162689A JP 58037028 A JP58037028 A JP 58037028A JP 3702883 A JP3702883 A JP 3702883A JP S59162689 A JPS59162689 A JP S59162689A
Authority
JP
Japan
Prior art keywords
circuit
pnp
word
word line
transistor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP58037028A
Other languages
Japanese (ja)
Inventor
Yasusuke Yamamoto
庸介 山本
Hiroshi Miyanaga
博史 宮永
Tetsushi Sakai
徹志 酒井
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Telegraph and Telephone Corp
Original Assignee
Nippon Telegraph and Telephone Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Telegraph and Telephone Corp filed Critical Nippon Telegraph and Telephone Corp
Priority to JP58037028A priority Critical patent/JPS59162689A/en
Publication of JPS59162689A publication Critical patent/JPS59162689A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Static Random-Access Memory (AREA)

Abstract

PURPOSE:To realize an RAM of low power consumption at high speed by detecting delay of fall of potential to decoder output waveform by a circuit regarding a word line discharge circuit of a bipolar static memory of semiconductor emitter coupled type and enabling to let flow discharge current in a self matching state to shorten the delay. CONSTITUTION:When a fall signal (a) from a decoder enters an input terminal 7, a signal (b) lower in voltage by 2XVBE is outputted from the output terminal 8 of a level shift circuit 1, and this is inputted to the base of a PNP transistor (TR) 2. When a word plus line rises up after a decoder signal, the larger the width of delay, the stronger the forward bias between the base and emitter of the PNP TR2. Vd shows over biased state between the base and emitter of the PNP TR2. Consequently, the larger the width of delay of the word line, the larger the collector current of the PNP TR2, and parasitic capacity CS of the word plus line is charged and discharged at high speed. Thus, the word plus line 4 can fall at high speed.

Description

【発明の詳細な説明】 本発明は、消費電力が小さく動作速度の速い半導体エミ
ッタ結合形パイボーラスタティクメモリのワード線放電
回路に関するものである。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a word line discharge circuit for a semiconductor emitter-coupled pieborous static memory that has low power consumption and high operating speed.

従来のエミッタ結合形バイポーラメモリにおし・て、そ
のワード線放電回路は、第1図Tal 、 fblO様
7ノードが接続されたダイオードによって最高電位にあ
るワード線にのみ放電電流が供給されるようになってい
る。従って、選択から非選択に移るワード線W1は非選
択から選択に移るワー、ド線w2の電位とクロスする寸
では大きな放電電流が流れて高速で立ち下がってくるが
、クロスした後は遅くなってしまう。これはりpス後の
最高電位のワード線はワード線W2になるので、放電電
流がワード線W2に供給されるようになるためである。
In a conventional emitter-coupled bipolar memory, the word line discharge circuit is configured so that a discharge current is supplied only to the word line at the highest potential by diodes connected to seven nodes as shown in Figure 1 Tal and fblO. It has become. Therefore, when the word line W1 that goes from selected to unselected crosses the potential of the word line W2 that goes from unselected to selected, a large discharge current flows and falls at a high speed, but after the crossing, it falls slowly. I end up. This is because the word line with the highest potential after the ps is the word line W2, so the discharge current is supplied to the word line W2.

クロスした後のワード線W1は保持電流IHのみで放電
するので、IHの小さなRAMでは非選択レベルに安定
する捷でに非常に長い時間を必要とし、RAMのサイク
ルタイムを遅くする要因となっていた。
After crossing, the word line W1 is discharged only by the holding current IH, so in a RAM with a small IH, it takes a very long time to stabilize to the non-select level, which is a factor that slows down the RAM cycle time. Ta.

第1図(b)の回路では、容量と抵抗のCR時定数によ
って放電時間を設計できるので、ワード線が非選択のレ
ベルに安定するまで放電電流を流し続けることができる
。しかし、各ワード線に大きな容量を付ける必要があり
チップ面積が増えてしまうこと、回路が複雑で電力を多
く必要とし、又CR時定数をワード線の立ち下がり時間
の様子をみながら設計しなければならない等の理由で最
適設計が難しいと℃・う問題があった。
In the circuit shown in FIG. 1(b), since the discharge time can be designed by the CR time constant of the capacitance and resistance, the discharge current can continue to flow until the word line is stabilized at a non-selected level. However, it is necessary to attach a large capacitance to each word line, which increases the chip area, the circuit is complex and requires a lot of power, and the CR time constant must be designed while considering the fall time of the word line. There was a problem that optimal design was difficult for various reasons such as:

この様な放電回路は、特に保持電流が小さく、かつ多(
の記憶セルが一本のワード線に繋っている大容量低消費
電力メモリの場合、保持電流だけでワード線をドライブ
しきれず重要である。
Such a discharge circuit has a particularly small holding current and a large number of
In the case of a large-capacity, low-power memory in which several memory cells are connected to a single word line, this is important because the word line cannot be driven by the holding current alone.

本発明の目的はテコータ出力波形に対する電位の立ち下
がりの遅れを回路で検知し、遅れを短かくする様に自己
整合状態で放電電流を流せる事を特徴とし高速で低消費
電力のRAMを実現することのできる半導体メモリのワ
ード線放電回路を提供することにある。
The purpose of the present invention is to realize a high-speed RAM with low power consumption, which is characterized in that a circuit detects a delay in the fall of a potential with respect to a Tecoator output waveform, and allows a discharge current to flow in a self-aligned state so as to shorten the delay. An object of the present invention is to provide a word line discharge circuit for a semiconductor memory that can be used.

以下本発明の詳細な説明する。The present invention will be explained in detail below.

第2図は本発明の実施例であって、1は電圧レベルシフ
ト回路、2ばPNP)ランジスタ、3はワードドライバ
用NPN)ランジスタ、4はワードプラス線、5はワー
ドマイナス線、6は保持電流■Hの保持電流源、7はデ
コーダ信号の入力端子、8はレベルシフト出力端子、C
sはソートプラス線4と半導体基板間に存在する寄生容
量で、配線谷On +メモリセルの素子間分離容量等が
含」れろ。又、9はデコーダ回路、10はメモリセルで
ある。本発明の放電回路は電圧レベルシフト回路1と、
PNPトラ/ジスタ2によって構成されている。
FIG. 2 shows an embodiment of the present invention, in which 1 is a voltage level shift circuit, 2 is a PNP) transistor, 3 is a word driver NPN) transistor, 4 is a word plus line, 5 is a word minus line, and 6 is a hold Holding current source of current ■H, 7 is decoder signal input terminal, 8 is level shift output terminal, C
s is a parasitic capacitance existing between the sort plus line 4 and the semiconductor substrate, and includes the wiring valley On + inter-element isolation capacitance of the memory cell, etc. Further, 9 is a decoder circuit, and 10 is a memory cell. The discharge circuit of the present invention includes a voltage level shift circuit 1,
It is composed of two PNP controllers/registers.

これを動作させるには、VCC端子を零ハ・イ7ス、V
EE端子を−5,2V 、 VRA端子を−3,8Vに
バイアスした状態で入力端子7にデコーダ信号を入力す
る。デコーダ信号の立ち上がり時には、ワード線寄生容
iCsはデコーダの出力抵抗Rとワードドライバ3を通
して充放電するので、ワード線は元来高速に追従する。
To operate this, set the VCC terminal to zero high,
A decoder signal is input to the input terminal 7 with the EE terminal biased at -5, 2V and the VRA terminal biased at -3, 8V. When the decoder signal rises, the word line parasitic capacitance iCs is charged and discharged through the output resistor R of the decoder and the word driver 3, so the word line originally follows at high speed.

一方、デコーダ信号の立ち下がり時にはワードドライバ
30ベース・エミッタ間電圧がカットオフ状態に追い込
まれるので、ワード線寄生容量Csは、保持電流IHと
本発明放電回路を通して充放電することになる。大官M
RAMになるほどCsが太きくIHが小さくなるので、
はぼ放電回路を通して充放電すると考えて良い。
On the other hand, when the decoder signal falls, the base-emitter voltage of the word driver 30 is forced into a cutoff state, so the word line parasitic capacitance Cs is charged and discharged through the holding current IH and the discharge circuit of the present invention. Daikan M
The more RAM it becomes, the thicker the Cs and the smaller the IH, so
You can think of it as charging and discharging through the Habo discharge circuit.

本発明の放電回路の動作を説明するための主要な回路端
子の電圧波形を第3図に示す。デコーダからの立ち下が
り信号〔第3図(a)〕が入力端子7に入ってくると、
レベルシフト回路1の出力端−r−8からは2 X V
BEだけ電圧の下がった信号〔第3図(b)〕が出力さ
れ、これがPNP )ランンスタ2のベースに入力され
る。そこで、ワードプラス線4がデコーダ信号より遅れ
て立ち下がると〔第3図(C)〕、遅れ幅が大きいほど
PNP)ランジスタ2のベース・エミッタ間は強く順方
向バイアスされる。
FIG. 3 shows voltage waveforms at main circuit terminals for explaining the operation of the discharge circuit of the present invention. When the falling signal from the decoder [Fig. 3 (a)] enters the input terminal 7,
From the output terminal -r-8 of level shift circuit 1, 2 X V
A signal whose voltage is lowered by BE (FIG. 3(b)) is output, and this is input to the base of the PNP run star 2. Therefore, when the word plus line 4 falls later than the decoder signal (FIG. 3(C)), the larger the delay width (PNP), the stronger the forward bias between the base and emitter of the transistor 2 becomes.

VdはPNP l−ランジメタ20ベース・エミッタ間
が過バイアスされて℃・る状態を示す。その結果、この
PNP トランジスタ2のコレクタ電流はワード線の遅
れ幅が大きいほど多く流れてワードプラス線4の寄生容
量Csを高速に充放電するので〔第3図(d)〕、ワー
ドプラス線4は高速に立ち下がることができる。ワード
プラス線4の電圧が立ち丁がりを終了しヱ非選択の安定
状態になると、PNP )う、ンジスタ20ベース・エ
ミッタ間は自動的にカットオフされ、放電電流は流れな
くなる。
Vd indicates a state in which the base-emitter of the PNP l-range metal 20 is overbiased. As a result, the larger the delay width of the word line, the more the collector current of the PNP transistor 2 flows, charging and discharging the parasitic capacitance Cs of the word plus line 4 at a high speed [Fig. 3(d)]. can fall quickly. When the voltage on the word plus line 4 finishes rising and reaches a non-selected stable state, the base-emitter of the PNP resistor 20 is automatically cut off and no discharge current flows.

第4図は本発明の別の実施例である。第3図の回路と基
本的には同じ構成だが、PNP )ランジスタ2に流れ
る電流なNPN l−ランジスタ110ベースに流し増
幅するので、さらに大きな充放電電流をワードプラス線
4かも引きぬくことができる。なお、このNPN トラ
ンジスタ11のコレクタをワードマイナス線5に接続し
てワードマイナス線5につながっている寄生容量を充電
することもできる。
FIG. 4 shows another embodiment of the invention. The circuit has basically the same configuration as the circuit shown in Figure 3, but since the current flowing through the PNP transistor 2 is passed through the base of the NPN l transistor 110 and amplified, an even larger charge/discharge current can be drawn out from the word plus line 4 as well. . Note that the parasitic capacitance connected to the word minus line 5 can be charged by connecting the collector of the NPN transistor 11 to the word minus line 5.

なお、本発明ではレベルシフト回路1の出力電圧として
、ワード線が選択から非選択に移行する立ち下がり時の
みPNP )ランジスク2がオンする様に調整すること
が必要であるが、これは、このレベルシフト回路IK用
いられているダイオードとして、ワードドライバ3やP
NPトランジスタ2と同じかあるいはそれより大きめの
トランジスタのコレクタ・ベースをショートして7ノー
ドとし、エミッタをカソードとしたダイオードを用い、
保持電流IHに比べて充分小さな電流を流す等の方法で
容易に実現することができる。
In addition, in the present invention, it is necessary to adjust the output voltage of the level shift circuit 1 so that the PNP transistor 2 is turned on only at the falling edge when the word line transitions from selection to non-selection. Word driver 3 and P
Short-circuit the collector and base of a transistor that is the same as or larger than NP transistor 2 to form a 7 node, and use a diode with the emitter as the cathode.
This can be easily achieved by a method such as passing a sufficiently smaller current than the holding current IH.

本発明の放電回路は、基本的には電圧レベルシフト回路
1とPNPトランジスタ2によって構成され、さらにN
PNトランジスタ11を加えて大きな放電電流を流すこ
とができる。
The discharge circuit of the present invention basically consists of a voltage level shift circuit 1 and a PNP transistor 2, and further includes a voltage level shift circuit 1 and a PNP transistor 2.
By adding the PN transistor 11, a large discharge current can flow.

以上説明したように、本発明の放電回路はワード線の立
ち下がり電圧を検出しながら基阜電圧と比較して立ち下
がりが遅れていることを自動的に検知し、ワード線が完
全に非選択のレベルで安定するまで自己整合的に放電電
流を流すことができる。又、回路構成も簡単で大きな容
量も不要であり、様々な回路パラメータの整合をとる必
要もないので設計が容易である。従って、従来回路と比
べて高速で低消費電力のR’AMを容易に実現すること
ができる。
As explained above, the discharge circuit of the present invention detects the falling voltage of the word line and automatically detects that the falling voltage is delayed compared to the reference voltage, and the word line is completely unselected. The discharge current can be allowed to flow in a self-aligned manner until it stabilizes at the level of . Further, the circuit configuration is simple, no large capacitance is required, and there is no need to match various circuit parameters, so the design is easy. Therefore, R'AM that is faster and consumes less power than conventional circuits can be easily realized.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図(al (b)は従来のワード線放電回路の例を
示す回路図、第2図は本発明によるワード線放電回路の
一実施例を示す回路図、第3図(a) (bi (ci
 (d)は本路図である。 1・・電圧レベルソフト回路、  2・・PNPトラ7
ジスタ、  3 ワードドライバ用NPN l−ラ/ジ
スタ、  4・・・ワードプラス線、  5・・・ワー
ドマイナス線、 6・・・保持電流源、 7・・・デコ
ーダ信号の入力端子、  8ルベルシフト出カ端子、C
s・・ワードプラス線と半導体基板間に存在する寄生容
量、  9・・・デコーダ回路、 1o・・・メモリセ
ル、 11・・・NPN トランジスタ。 特許出願人  日本電信電話公社 代  理  人   白  水  常  雄外1名 481
FIG. 1(b) is a circuit diagram showing an example of a conventional word line discharge circuit, FIG. 2 is a circuit diagram showing an embodiment of a word line discharge circuit according to the present invention, and FIG. 3(a) (bi (ci
(d) is the main route map. 1... Voltage level soft circuit, 2... PNP tiger 7
register, 3 NPN l-ra/register for word driver, 4...word plus line, 5...word minus line, 6...holding current source, 7...decoder signal input terminal, 8 level shift Output terminal, C
s... Parasitic capacitance existing between the word plus line and the semiconductor substrate, 9... Decoder circuit, 1o... Memory cell, 11... NPN transistor. Patent applicant: Nippon Telegraph and Telephone Public Corporation Representative: Tsune Hakumizu and one other person 481

Claims (1)

【特許請求の範囲】 fil テコーダ回路の出力電圧をレベルシフトするレ
ベルラフ1−回路と、PNP)ランジスタから成り、前
記PNP )ランンスタのエミッタはワードプラス線に
接続され、そのベースは前記レベルソフト回路の出力端
子に接続され、そのコレクタは前記各回路の最低電源端
子に接続され、さらに前記ワード線が選択から非選択に
移行する、立ち下がり時にのみ前記PNP トランジス
タがオンになる様に前記レベルシフト回路の電圧シフト
量が定められたことを特徴とす・る半導体メモリのワー
ド線放電回路。 (2)テコーダ回路の出力電圧をレベルシフトするレベ
ルシフト回路と、PNPトランジスタ及びNりのエミッ
タはワードプラス線にそのベースは前記レベルソフト回
路の出力端子にそのコレクタは前記各回路の最低電源端
子にそれぞれ接続され、前記NPN )ランジスタのコ
レクタは前記ワードグラス線にそのベースは前記PNP
 l−ランンスタのコレクタにそのエミッタは前記最低
電源端子にそれぞれ接続され、さらに前記ワード線が選
択から非選択に移行する立ち下がり時にのみ前記PNP
 l−ランジスタ及び前記NPNトランジスタがオンに
なる様に前記レベルシフト回路の電圧シフト量が定めら
れたことを特徴とする半導体メモリのワード線放電回路
[Claims] Consisting of a level rough 1-circuit for level-shifting the output voltage of the fil tecoder circuit, and a PNP) transistor, the emitter of the PNP) transistor is connected to the word plus line, and its base is connected to the level soft circuit. The level shift circuit is connected to an output terminal, and its collector is connected to the lowest power supply terminal of each of the circuits, and the level shift circuit is configured such that the PNP transistor is turned on only at the falling edge when the word line transitions from selected to non-selected. A word line discharge circuit for a semiconductor memory, characterized in that a voltage shift amount is determined. (2) A level shift circuit that level-shifts the output voltage of the Tecoder circuit, and the emitters of the PNP transistor and N are connected to the word plus line, its base is the output terminal of the level soft circuit, and its collector is the lowest power supply terminal of each of the circuits. the collectors of the NPN transistors are connected to the word glass wires, and the bases of the transistors are connected to the PNP transistors, respectively;
The collector and emitter of the L-run star are respectively connected to the lowest power supply terminal, and the PNP is connected only at the falling edge when the word line transitions from selection to non-selection.
A word line discharge circuit for a semiconductor memory, characterized in that a voltage shift amount of the level shift circuit is determined so that the L-transistor and the NPN transistor are turned on.
JP58037028A 1983-03-07 1983-03-07 Word line discharge circuit of semiconductor memory Pending JPS59162689A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58037028A JPS59162689A (en) 1983-03-07 1983-03-07 Word line discharge circuit of semiconductor memory

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58037028A JPS59162689A (en) 1983-03-07 1983-03-07 Word line discharge circuit of semiconductor memory

Publications (1)

Publication Number Publication Date
JPS59162689A true JPS59162689A (en) 1984-09-13

Family

ID=12486182

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58037028A Pending JPS59162689A (en) 1983-03-07 1983-03-07 Word line discharge circuit of semiconductor memory

Country Status (1)

Country Link
JP (1) JPS59162689A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6418571A (en) * 1987-07-13 1989-01-23 Oki Electric Ind Co Ltd Automatic brazing device

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58175190A (en) * 1982-02-26 1983-10-14 エヌ・ベ−・フイリツプス・フル−イランペンフアブリケン Semiconductor memory

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58175190A (en) * 1982-02-26 1983-10-14 エヌ・ベ−・フイリツプス・フル−イランペンフアブリケン Semiconductor memory

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6418571A (en) * 1987-07-13 1989-01-23 Oki Electric Ind Co Ltd Automatic brazing device

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