JPS59155504U - depth micrometer - Google Patents
depth micrometerInfo
- Publication number
- JPS59155504U JPS59155504U JP5100383U JP5100383U JPS59155504U JP S59155504 U JPS59155504 U JP S59155504U JP 5100383 U JP5100383 U JP 5100383U JP 5100383 U JP5100383 U JP 5100383U JP S59155504 U JPS59155504 U JP S59155504U
- Authority
- JP
- Japan
- Prior art keywords
- spindle
- depth
- micrometer
- base
- depth micrometer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Length-Measuring Instruments Using Mechanical Means (AREA)
- A Measuring Device Byusing Mechanical Method (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
第１図は従来のデプスマイクロメータの外観図、第２図
は従来のデプスマイクロメータによる実施例図、第３図
はこの考案によるデプスマイクロメータの外観図、第４
図はこの考案によるデプスマイクロメータによる実施例
図であり、１はベース、２はベース基準面、３はスピン
ドル、４は測定面、５はシンプル、６はスリーブ、７は
被加工物、８はカエリ、９は凹部である。なお、図中同
一あるいは相当部分には、同一符号を付して示しである
。
第３図
耶龍
１、、、）１
駈 Ｌ
１ 七・
□□Fig. 1 is an external view of a conventional depth micrometer, Fig. 2 is an example of a conventional depth micrometer, Fig. 3 is an external view of a depth micrometer according to this invention, and Fig. 4 is an external view of a conventional depth micrometer.
The figure shows an example of a depth micrometer according to this invention, where 1 is a base, 2 is a base reference plane, 3 is a spindle, 4 is a measurement plane, 5 is a simple, 6 is a sleeve, 7 is a workpiece, and 8 is a The burr 9 is a concave portion. Note that the same or corresponding parts in the figures are indicated by the same reference numerals. Figure 3 Yaryu 1,,,) 1 Canter L 1 7・ □□
Claims (1)
面と直交する軸線方向にねじの回転によって移動するス
ピンドルと、スピンドルの動きを示す目盛を持つスリー
ブ及びシンプルとを備えて被加工物の深さ又は高さに対
応したベース基準面と測定面の距離を読み取ることがで
きるデプスマイクロメータにおいて、上記ベース基準面
のスピンドル周囲に、スピンドル径より大きい凹部を設
けたことを特徴とするデプスマイクロメータ。The workpiece is equipped with a base having a flat surface that serves as a reference for measurement, a spindle that moves by the rotation of a screw in an axial direction perpendicular to the reference surface, and a sleeve and simple sleeve that has a scale that indicates the movement of the spindle. A depth micrometer capable of reading the distance between a base reference surface and a measurement surface corresponding to the depth or height of the depth micrometer, characterized in that a recess larger than the spindle diameter is provided around the spindle on the base reference surface. Micrometer.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5100383U JPS59155504U (en) | 1983-04-06 | 1983-04-06 | depth micrometer |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5100383U JPS59155504U (en) | 1983-04-06 | 1983-04-06 | depth micrometer |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS59155504U true JPS59155504U (en) | 1984-10-18 |
Family
ID=30181433
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP5100383U Pending JPS59155504U (en) | 1983-04-06 | 1983-04-06 | depth micrometer |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS59155504U (en) |
-
1983
- 1983-04-06 JP JP5100383U patent/JPS59155504U/en active Pending
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