JPS59104145U - photo mask - Google Patents

photo mask

Info

Publication number
JPS59104145U
JPS59104145U JP1982201602U JP20160282U JPS59104145U JP S59104145 U JPS59104145 U JP S59104145U JP 1982201602 U JP1982201602 U JP 1982201602U JP 20160282 U JP20160282 U JP 20160282U JP S59104145 U JPS59104145 U JP S59104145U
Authority
JP
Japan
Prior art keywords
photo mask
thin metal
photomask
metal film
transparent substrate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1982201602U
Other languages
Japanese (ja)
Inventor
奥田 聰
Original Assignee
株式会社東芝
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 株式会社東芝 filed Critical 株式会社東芝
Priority to JP1982201602U priority Critical patent/JPS59104145U/en
Publication of JPS59104145U publication Critical patent/JPS59104145U/en
Pending legal-status Critical Current

Links

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は従来のフォトマスクの構造を示す断面図、第2
図は第1図のフォトマスクを珀いた露光工程を示す断面
図、第3図はこの考案の一実施例に係るフォトマスクの
構造を示す断面図、第4図は第3図のフォトマスクを用
いた露光工程を示す断面図である。 11・・・フォトマスク、12・・・透明ガラス基板、
13・・・クロムi膜、14・・・透明ガラス膜、15
・・・シリコンウェハ、16・・・レジス)、17.1
8・・・埃。
Figure 1 is a sectional view showing the structure of a conventional photomask, Figure 2 is a cross-sectional view showing the structure of a conventional photomask.
The figure is a sectional view showing the exposure process using the photomask shown in Fig. 1, Fig. 3 is a sectional view showing the structure of a photomask according to an embodiment of this invention, and Fig. 4 is a sectional view showing the photomask shown in Fig. 3. FIG. 3 is a cross-sectional view showing the exposure process used. 11... Photomask, 12... Transparent glass substrate,
13...Chromium i film, 14...Transparent glass film, 15
...Silicon wafer, 16...Regis), 17.1
8...Dust.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 透明基板と、この透明基板上に形成された金属薄膜のパ
ターンと、この金属薄膜上に形成された透明性膜とを具
備したことを特徴とするフォトマスク。
A photomask comprising a transparent substrate, a pattern of a thin metal film formed on the transparent substrate, and a transparent film formed on the thin metal film.
JP1982201602U 1982-12-27 1982-12-27 photo mask Pending JPS59104145U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1982201602U JPS59104145U (en) 1982-12-27 1982-12-27 photo mask

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1982201602U JPS59104145U (en) 1982-12-27 1982-12-27 photo mask

Publications (1)

Publication Number Publication Date
JPS59104145U true JPS59104145U (en) 1984-07-13

Family

ID=30427096

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1982201602U Pending JPS59104145U (en) 1982-12-27 1982-12-27 photo mask

Country Status (1)

Country Link
JP (1) JPS59104145U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61182042A (en) * 1985-02-07 1986-08-14 Mitsubishi Electric Corp Photomask

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61182042A (en) * 1985-02-07 1986-08-14 Mitsubishi Electric Corp Photomask

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