JPS589568B2 - Kahentei Kokensa Souchi - Google Patents
Kahentei Kokensa SouchiInfo
- Publication number
- JPS589568B2 JPS589568B2 JP49121161A JP12116174A JPS589568B2 JP S589568 B2 JPS589568 B2 JP S589568B2 JP 49121161 A JP49121161 A JP 49121161A JP 12116174 A JP12116174 A JP 12116174A JP S589568 B2 JPS589568 B2 JP S589568B2
- Authority
- JP
- Japan
- Prior art keywords
- section
- output
- voltage
- signal
- slider
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Apparatuses And Processes For Manufacturing Resistors (AREA)
- Measurement Of Resistance Or Impedance (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Description
【発明の詳細な説明】
本発明は可変抵抗器の性能検査とくに回転トルクあるい
は移動操作力の検査装置に関する。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an apparatus for testing the performance of a variable resistor, particularly for testing rotational torque or moving operating force.
可変抵抗器には組立作業の仕方あるいは各部品等の精度
によりシャフトの回転あるいは操作レバーの移動がなめ
らかに行なえないものがある。Some variable resistors do not allow smooth rotation of the shaft or movement of the operating lever due to the method of assembly or the precision of each component.
このようななめらかに作動しない可変抵抗器は使用困難
であり、回転トルクあるいは移動操作力を測定検査し良
品および不良品を分類しなければならない。It is difficult to use such a variable resistor that does not operate smoothly, and the rotating torque or moving operation force must be measured and inspected to classify good products and defective products.
従来回路トルクあるいは移動操作力の検査は手動で練作
手段を動かし、手に伝わる感覚により被検査可変抵抗器
の良品、不良品を分類していたが個人により誤差を生じ
る上、摺動部分全域にわたり均一に力を加えることがで
きなかったので正確な測定が不可能だった。Conventionally, testing of circuit torque or moving operation force was carried out manually by moving a practice means and classifying good and bad variable resistors to be tested based on the feeling transmitted to the hand. Accurate measurements were impossible because force could not be applied uniformly over the entire area.
また他の方法としてトルクメータあるいは圧力計で読み
取り予め定められた値以内か否かを判別する方法がある
が、測定検査に時間がかかる上、トルクメークあるいは
圧力計の取付け方によって誤差を生じ正確に良品、不良
品を分類することができなかった。Another method is to read it with a torque meter or pressure gauge and determine whether it is within a predetermined value, but it takes time to inspect the measurement, and errors may occur depending on the way the torque make or pressure gauge is installed. It was not possible to classify good products and defective products.
本発明の目的は上述の諸欠点を除去し、電子回路で構成
することにより容易にかつ正確に回転トルクあるいは移
動操作力を検査することのできる可変抵抗検査装置を提
供することにある。SUMMARY OF THE INVENTION An object of the present invention is to eliminate the above-mentioned drawbacks and to provide a variable resistance testing device that can easily and accurately test rotational torque or moving operating force by using an electronic circuit.
本発明によれば、摺動子を有する可変抵抗器の検査装置
において、被検査可変抵抗器の操作手段に一定の力を加
える規定力発生部と、全抵抗値に対応した電圧を保持す
る電圧記憶部と、電圧記憶部の出力を分割する下限発生
部と、摺動子の位置に比例した電圧と前記下限発生部の
出力とを比較する比較部と、比較部と出力信号を反転す
るインバータ部と、インバータ部の出力をセット信号と
し、比較部の出力をリセット信号とする信号記憶部とで
構成した可変抵抗検査装置が得られる。According to the present invention, in a variable resistor testing device having a slider, there is provided a prescribed force generating section that applies a constant force to the operating means of the variable resistor to be tested, and a voltage that maintains a voltage corresponding to the total resistance value. a storage section, a lower limit generation section that divides the output of the voltage storage section, a comparison section that compares a voltage proportional to the position of the slider with the output of the lower limit generation section, and an inverter that inverts the comparison section and the output signal. A variable resistance testing device is obtained, which includes a signal storage section that uses the output of the inverter section as a set signal and the output of the comparison section as a reset signal.
以下本発明について図面を参照して詳細に説明する。The present invention will be described in detail below with reference to the drawings.
図は本発明の一実施例を示す構成図で、1は上端子a、
摺動端子b、下端子c、シャフトあるいは操作レバーで
構成する操作手段dおよび摺動子eを有する被検査可変
抵抗器で端子a,cと並列に定電流電源2を接続する。The figure is a configuration diagram showing one embodiment of the present invention, in which 1 is an upper terminal a;
A variable resistor to be tested has a sliding terminal b, a lower terminal c, an operating means d consisting of a shaft or an operating lever, and a slider e, and a constant current power source 2 is connected in parallel with terminals a and c.
4は操作手段dに加えるあらかじめ定められた一定の力
を発生する規定力発生部で、発生した出力を操作手段d
に伝える駆動部3に接続する。4 is a prescribed force generating section that generates a predetermined constant force to be applied to the operating means d, and the generated output is applied to the operating means d.
It is connected to the drive unit 3 that transmits the information to the driver.
電圧記憶5は被検査可変抵抗器1の端子a,c間に発生
する全抵抗値に対応した電圧を電圧記憶制御部6のセッ
ト信号により保持あるいはリセット信号により放電する
よう接続し、電圧記憶部5の出力は電圧記憶部5に保持
された電圧を分割し零附近に8ける定められた領域の限
界値を発生する下限発生部7の入力に接続する。The voltage memory 5 is connected so that a voltage corresponding to the total resistance value generated between the terminals a and c of the variable resistor 1 to be tested is held by the set signal of the voltage memory controller 6 or discharged by the reset signal. The output of 5 is connected to the input of a lower limit generator 7 which divides the voltage held in the voltage storage 5 and generates a limit value in a predetermined region around zero.
比較部8は下限発生部7の出力を一力の入力とし、被検
査可変抵抗器1の端子b,c間に発生する摺動子eの位
置に比例した電圧を他力の入力として比較するよう接続
するとともに比較した出力信号を反転するインバータ部
9の入力に接続する信号記憶部10はインバータ部9の
出力をセット信号とし比較部8の出力をリセット信号と
するよう接続する。The comparison section 8 uses the output of the lower limit generation section 7 as one input, and compares the voltage generated between the terminals b and c of the variable resistor 1 to be tested, which is proportional to the position of the slider e, as another input. A signal storage section 10 is connected to the input of an inverter section 9 that inverts the compared output signal, and is connected so that the output of the inverter section 9 is used as a set signal and the output of the comparison section 8 is used as a reset signal.
次に図を参照して作動を説明する。Next, the operation will be explained with reference to the drawings.
まず被検査可変抵抗器1の摺動子eを端子a側に配置す
るとともに電圧記憶部5の出力を電圧記憶制御部6のリ
セット信号により零電圧にする。First, the slider e of the variable resistor 1 to be tested is placed on the terminal a side, and the output of the voltage storage section 5 is brought to zero voltage by a reset signal from the voltage storage control section 6.
更に規定力発生部4の出力を基準値にセントする。Further, the output of the specified force generating section 4 is set to the reference value.
第一工程として電圧記憶制御部6のセット信号により被
検査可変抵抗器1の端子a,c間に発生する全抵抗値に
対応した電圧を電圧記憶部5に保持させる。As a first step, a set signal from the voltage storage control section 6 causes the voltage storage section 5 to hold a voltage corresponding to the total resistance value generated between the terminals a and c of the variable resistor 1 to be tested.
第二工程として操作手段dに力を加えて摺動子eを端子
aの位置から端子Cに向って動かす。As a second step, a force is applied to the operating means d to move the slider e from the position of the terminal a toward the terminal C.
第二工程において規定力発生部4から得られた操作手段
dに加える力よりも被検査可変抵抗器1の回転トルクあ
るいは移動操作力が太きいと摺動子eは動かず端子a側
に止まっている。In the second step, if the rotational torque or moving operating force of the variable resistor 1 to be tested is greater than the force applied to the operating means d obtained from the prescribed force generating section 4, the slider e does not move and remains on the terminal a side. ing.
従って端子b,c間に発生する摺動子eの位置に比例し
た電圧が下限発生部7の出力電圧よりも高く比較部8の
出力には電圧が発生しないので比較部8の出力はインバ
ーク部9により反転された信号記憶部10のセット信号
となり信号が記憶される。Therefore, the voltage proportional to the position of the slider e generated between terminals b and c is higher than the output voltage of the lower limit generator 7, and no voltage is generated at the output of the comparator 8, so the output of the comparator 8 is the inverter. 9 becomes the set signal of the signal storage section 10, and the signal is stored.
操作手段dにカロえる力よりも被検査可変抵抗器1の回
電トルクあるいは移動操作力が小さいと摺動子eは端子
Cに向って動き出す。When the recirculating torque or moving operating force of the variable resistor 1 to be tested is smaller than the force exerted on the operating means d, the slider e begins to move toward the terminal C.
摺動子eが端子a例にある時は端子b,c間の電圧は下
限発生部7の出力電圧よりも高いので信号記憶部10に
信号が記憶される。When the slider e is at the terminal a example, the voltage between the terminals b and c is higher than the output voltage of the lower limit generating section 7, so the signal is stored in the signal storage section 10.
さらに摺動子eが端子C附近まで動くと端子b,c間の
電圧は下限発生部7の出力電圧よりも低くなり比較部8
の出力には電圧が発生するので比較部8の出力は信号記
憶部10のリセット信号となり信号記憶部に記憶されて
いる信号がリセットされる。Further, when slider e moves close to terminal C, the voltage between terminals b and c becomes lower than the output voltage of lower limit generator 7, and comparator 8
Since a voltage is generated at the output of the comparator 8, the output of the comparison section 8 becomes a reset signal for the signal storage section 10, and the signal stored in the signal storage section is reset.
従って第二工程終了後、信号記憶部10の出力に信号が
発生していれば被検査可変抵抗器1の回転トルクあるい
は移動操作力は規定値よりも大きく、信号が発生してい
なければ回転トルクあるいは移動操作力は規定値よりも
・小さいことが分り被検査可変抵抗器1の良品、不良品
を判別することができる。Therefore, after the completion of the second step, if a signal is generated at the output of the signal storage section 10, the rotational torque or moving operation force of the variable resistor 1 to be tested is greater than the specified value, and if no signal is generated, the rotational torque Alternatively, it is found that the moving operation force is smaller than the specified value, and it is possible to determine whether the variable resistor 1 to be inspected is good or defective.
上述では摺動子eを端子aから端子Cに向って動かす場
合の検査について説明したが、摺動子eを端子Cから端
子aに向って動かす場合の検査は電圧記憶部5に保持さ
れた電圧を分割し、全抵抗値に対応した電圧附近におけ
る領域の限界値を発生する上限発生部、比較部、インバ
ーク部、信号記憶部を設け2つの信号記憶部から発生す
る出力信号の論理和を求めれば摺動子eの往復における
検査が可能であるこ;とは容易に推察できる。In the above, the test when moving the slider e from the terminal a to the terminal C has been explained, but the test when moving the slider e from the terminal C toward the terminal a is stored in the voltage storage section 5. An upper limit generation section, a comparison section, an inverting section, and a signal storage section are provided to divide the voltage and generate a limit value in the vicinity of the voltage corresponding to the total resistance value, and the logical sum of the output signals generated from the two signal storage sections is provided. It can be easily inferred that it is possible to inspect the slider e when it is moving back and forth.
以上説明したように、本発明によれば規定力発生部、比
較部8よび信号記憶部等で構成しているため、被検査可
変抵抗器の回転トルクあるいは移動操作力を計器等で測
定しなくとも容易に良品、不良品の判別ができる上、常
に一定の力で操作手段を動かすことにより正確に良品、
不良品の判別ができると同時に信号記憶部の出力を論理
信号とすることにより自動化等が容易にできる。As explained above, according to the present invention, since it is composed of a prescribed force generation section, a comparison section 8, a signal storage section, etc., it is not necessary to measure the rotational torque or moving operation force of the variable resistor to be tested with a meter or the like. In addition to easily distinguishing between good and defective products, by always moving the operating means with a constant force, you can accurately distinguish between good and defective products.
Defective products can be determined, and at the same time, automation can be easily achieved by making the output of the signal storage part a logic signal.
更に上限発生部および下限発生部と、比較部、インバー
[タ部および信号記憶部を2組にすることにより摺動子
の往復における回転トルクあるいは移動操作力の検査が
できる等多くの効果を奏する。Furthermore, by forming two sets of the upper limit generating section, the lower limit generating section, the comparison section, the inverter section, and the signal storage section, many effects such as the ability to inspect the rotational torque or moving operation force during reciprocating of the slider can be achieved. .
図は本発明の一実施例を示す構成図で、1は被検査可変
抵抗器、2は定電流電源部、3は駆動部、4は規定力発
生部、5は電圧記憶部、6は電圧記憶制御部、7は下限
発生部、8は比較部、9はインバータ、10は信号記憶
部を示す。The figure is a configuration diagram showing an embodiment of the present invention, in which 1 is a variable resistor to be tested, 2 is a constant current power supply section, 3 is a drive section, 4 is a specified force generation section, 5 is a voltage storage section, and 6 is a voltage A storage control section, 7 a lower limit generation section, 8 a comparison section, 9 an inverter, and 10 a signal storage section.
Claims (1)
検査可変抵抗器の操作手段に一定の力を加える規定力発
生部と、全抵抗値に対応した電圧を保持する電圧記憶部
と、この電圧記憶部の出力を分割し零附近の限界値を発
生する下限発生部と、摺動子の位置に比例した電圧と前
記下限発生部の出力とを比較する比較部と、比較部の出
力信号を反転するインバータ部と、インバータ部の出力
をセット信号とし比較部の出力をリセット信号とする信
号記憶部とで構成したことを特徴とする可変抵抗検査装
置。1. An inspection device for a variable resistor having a slider, which includes a prescribed force generation section that applies a constant force to the operating means of the variable resistor to be inspected, a voltage storage section that holds a voltage corresponding to the total resistance value, and a voltage storage section that holds a voltage corresponding to the total resistance value. a lower limit generating section that divides the output of the voltage storage section and generates a limit value near zero; a comparing section that compares a voltage proportional to the position of the slider with the output of the lower limit generating section; and an output signal of the comparing section. What is claimed is: 1. A variable resistance testing device comprising: an inverter section that inverts the output of the inverter section; and a signal storage section that uses the output of the inverter section as a set signal and the output of the comparison section as a reset signal.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP49121161A JPS589568B2 (en) | 1974-10-21 | 1974-10-21 | Kahentei Kokensa Souchi |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP49121161A JPS589568B2 (en) | 1974-10-21 | 1974-10-21 | Kahentei Kokensa Souchi |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5147256A JPS5147256A (en) | 1976-04-22 |
JPS589568B2 true JPS589568B2 (en) | 1983-02-22 |
Family
ID=14804344
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP49121161A Expired JPS589568B2 (en) | 1974-10-21 | 1974-10-21 | Kahentei Kokensa Souchi |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS589568B2 (en) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5151121A (en) * | 1974-10-30 | 1976-05-06 | Taisei Corp | FUREKISHIBURUTETSUKIN NYORU TETSUKINKON KURIITOKOHO |
US4961140A (en) * | 1988-06-29 | 1990-10-02 | International Business Machines Corporation | Apparatus and method for extending a parallel synchronous data and message bus |
-
1974
- 1974-10-21 JP JP49121161A patent/JPS589568B2/en not_active Expired
Also Published As
Publication number | Publication date |
---|---|
JPS5147256A (en) | 1976-04-22 |
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